KR950032651A - Device for discontinuously determining the thickness of the film on the molten metal phase - Google Patents

Device for discontinuously determining the thickness of the film on the molten metal phase Download PDF

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Publication number
KR950032651A
KR950032651A KR1019950001399A KR19950001399A KR950032651A KR 950032651 A KR950032651 A KR 950032651A KR 1019950001399 A KR1019950001399 A KR 1019950001399A KR 19950001399 A KR19950001399 A KR 19950001399A KR 950032651 A KR950032651 A KR 950032651A
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KR
South Korea
Prior art keywords
sensor
signal
film
distance
molten metal
Prior art date
Application number
KR1019950001399A
Other languages
Korean (ko)
Inventor
죠아힘 뮐러
하르트무트 하우브리히
Original Assignee
줄리우스 에드문트
아메파 엔지니어링 게엠베하
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 줄리우스 에드문트, 아메파 엔지니어링 게엠베하 filed Critical 줄리우스 에드문트
Publication of KR950032651A publication Critical patent/KR950032651A/en

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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B22—CASTING; POWDER METALLURGY
    • B22D—CASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
    • B22D2/00—Arrangement of indicating or measuring devices, e.g. for temperature or viscosity of the fused mass
    • B22D2/003—Arrangement of indicating or measuring devices, e.g. for temperature or viscosity of the fused mass for the level of the molten metal
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27—FURNACES; KILNS; OVENS; RETORTS
    • F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D21/00—Arrangements of monitoring devices; Arrangements of safety devices
    • F27D21/02—Observation or illuminating devices
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27—FURNACES; KILNS; OVENS; RETORTS
    • F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D21/00—Arrangements of monitoring devices; Arrangements of safety devices
    • F27D21/0028—Devices for monitoring the level of the melt
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

센서구조를 가지는 장치가 용융된 금속(1)상의 막의 두께를 결정하기 위하여 제공된다. 센서구조는 바람직하게로는 최소한 두개의 센서(5,6)를 가지며, 그중 제1센서(5)는 전자기 센서로서 구성된다. 용융된 금속(1)으로부터 현재거리를 결정할 수신호가 제1센서(5)에 의하여 발생된다. 막(2)으로부터 규정된 거리에서 제2센서(6)에 의하여 신호가 발생될 수 있다. 제1센서(5)의 신호는, 막(2)으로부터 규정된 거리를 나타내는 신호를 제2센서(6)가 발생할 때 평가 장치에 의하여 평가된다.A device having a sensor structure is provided for determining the thickness of the film on the molten metal 1. The sensor structure preferably has at least two sensors 5, 6, of which the first sensor 5 is configured as an electromagnetic sensor. A male signal for determining the present distance from the molten metal 1 is generated by the first sensor 5. A signal can be generated by the second sensor 6 at a defined distance from the membrane 2. The signal of the first sensor 5 is evaluated by the evaluation device when the second sensor 6 generates a signal representing the distance defined from the film 2.

Description

용융된 금속상의 막의 두께를 불연속적으로 결정하는 장치Device for discontinuously determining the thickness of the film on the molten metal phase

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 센서 구조를 나타내는 도, 제2도는 신호값을 나타내는 도.1 is a diagram showing a sensor structure, and FIG. 2 is a diagram showing a signal value.

Claims (6)

막쪽으로 이동가능하며, 최소한 하나의 평가 장치에 접속되고, 결정될 각 막에 대하여 특성 신호를 제공하는 센서장치를 사용하여, 용융된 금속상의 막의 두께를 불연속적으로 측정하는 장치에 있어서, 센서구조를 사용하여, 최소한 하나의 신호가 막의 계면들의 하나로부터 전자기 센서의 거리신호로서 발생되는 것을 특징으로 하고, 측정범위내의 신호와 거리간의 명백한 상호관계가 존재하고, 결정될 각 막에 대하여 최소한 하나의 부가 신호가 발생되며, 각각의 경우에 결정될 막으로부터 제2센서구조의 최소한 하나의 거리에서 신호와 거리간의 명백한 상호관계가 존재하고, 막두께가 신호로부터 평가장치에서 결정되는 용융된 금속상의 막의 두께를 불연속적으로 측정하는 장치.A device for discontinuously measuring the thickness of a film on a molten metal, using a sensor device that is movable towards the film and is connected to at least one evaluation device and provides a characteristic signal for each film to be determined. Use, characterized in that at least one signal is generated as the distance signal of the electromagnetic sensor from one of the interfaces of the membrane, there is a clear correlation between the signal and the distance within the measurement range, and at least one additional signal for each membrane to be determined. In each case there is a clear correlation between the signal and the distance at least one distance of the second sensor structure from the film to be determined, and the film thickness determines the thickness of the film on the molten metal that is determined in the evaluation device from the signal. Continuous measuring device. 제1항에 있어서, 센서구조가 최소한 두개의 센서(5,6)를 포함하고 용융된 금속(1)으로부터 센서의 현재거리를 결정하는 신호가 제1전자기 센서(5)에 의하여 발생될 수 있고, 막(2)으로부터 규정된 거리에서 제2센서(6)에 의하여 신호가 발생될 수 있고, 제2센서(6)가 막(2)으로부터 규정된 거리를 나타내는 신호를 발생할 때 제1센서(5)으로부터 신호가 평가장치에 의하여 평가될 수 있는 장치.The method according to claim 1, wherein the sensor structure comprises at least two sensors (5, 6) and a signal for determining the present distance of the sensor from the molten metal (1) can be generated by the first electromagnetic sensor (5) and , A signal may be generated by the second sensor 6 at a defined distance from the membrane 2, and when the second sensor 6 generates a signal representing a defined distance from the membrane 2, the first sensor ( A device from which the signal from 5) can be evaluated by the evaluation device. 제1또는 2항에 있어서, 하나의 센서(5,6)가 가속 센서로서 구성되는 것에 의하여, 제2센서구조가 최상층의 막(2)에 도달할 때 신호가 방출될 수 있는 장치.Apparatus according to claim 1 or 2, wherein one sensor (5,6) is configured as an acceleration sensor, so that a signal can be emitted when the second sensor structure reaches the uppermost layer (2). 제1항 또는 제2항에 있어서 모든 센서(5,6)가 전자기 센서로서 구성되는 장치.Apparatus according to claim 1 or 2, wherein all sensors (5,6) are configured as electromagnetic sensors. 제1항∼제4항중의 어느 한 항에 있어서, 센서구조가 막의 방향으로 수동으로 이동될 수 있는 장치.The device according to claim 1, wherein the sensor structure can be moved manually in the direction of the membrane. 제1항∼제5항중의 어느 한 항에 있어서, 센서구조가 랜스(3)상에 교체가능한 유니트로서 제공되는 장치.The device according to any one of claims 1 to 5, wherein the sensor structure is provided as a replaceable unit on the lance (3). ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950001399A 1994-01-28 1995-01-26 Device for discontinuously determining the thickness of the film on the molten metal phase KR950032651A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4402463A DE4402463C2 (en) 1994-01-28 1994-01-28 Device for discontinuous detection of the thickness of a layer on a molten metal
DEP4402463.0 1994-01-28

Publications (1)

Publication Number Publication Date
KR950032651A true KR950032651A (en) 1995-12-22

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ID=6508854

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950001399A KR950032651A (en) 1994-01-28 1995-01-26 Device for discontinuously determining the thickness of the film on the molten metal phase

Country Status (7)

Country Link
JP (1) JP2854256B2 (en)
KR (1) KR950032651A (en)
CN (1) CN1109584A (en)
BE (1) BE1010228A5 (en)
DE (1) DE4402463C2 (en)
FR (1) FR2715722B1 (en)
GB (1) GB2286051B (en)

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DE19836844C2 (en) * 1998-08-14 2001-07-05 Sms Demag Ag Method for determining the level of the bath of an electric arc furnace
DE10233052A1 (en) * 2002-07-19 2004-02-05 Giesecke & Devrient Gmbh Multiple document pull-off detection system for a document, especially banknote or check, processing system, whereby the documents are illuminated in their most sensitive areas and the transmitted radiation measured
DE102006003950A1 (en) 2006-01-26 2007-08-30 Heraeus Electro-Nite International N.V. Device for determining an interface of a slag layer
JP5065614B2 (en) * 2006-04-14 2012-11-07 株式会社アルバック Eddy current film thickness meter
US8482295B2 (en) * 2009-02-23 2013-07-09 Hatch Ltd. Electromagnetic bath level measurement for pyrometallurgical furnaces
CN101666614B (en) * 2009-10-20 2011-08-10 北京科技大学 Device and method for measuring thickness of molten slag layer of mold flux of continuous casting crystallizer
US9057146B2 (en) * 2010-08-24 2015-06-16 Varian Semiconductor Equipment Associates, Inc. Eddy current thickness measurement apparatus
CN107401996B (en) * 2017-09-25 2023-10-20 江苏省水利科学研究院 Silt detecting rod
CN107504892B (en) * 2017-10-13 2023-04-28 中国恩菲工程技术有限公司 Device and method for detecting thickness of submerged arc furnace slag layer
CN118149744A (en) * 2024-05-13 2024-06-07 山东华韵新材料有限公司 Metal sheet production thickness detection device

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Publication number Priority date Publication date Assignee Title
US4223552A (en) * 1979-03-21 1980-09-23 Emhart Industries, Inc. Apparatus and method for sensing a substance on a liquid surface
JPS60183503A (en) * 1984-03-02 1985-09-19 Nippon Kokan Kk <Nkk> Method for measuring thickness of molten slag
JPS61212702A (en) * 1985-03-18 1986-09-20 Nippon Kokan Kk <Nkk> Slag thickness measuring method
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JPH02247539A (en) * 1989-03-20 1990-10-03 Nippon Steel Corp Method for measuring slag thickness on molten metal
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Also Published As

Publication number Publication date
DE4402463C2 (en) 1998-01-29
GB9426412D0 (en) 1995-03-01
JP2854256B2 (en) 1999-02-03
GB2286051B (en) 1998-03-04
FR2715722B1 (en) 1997-08-29
FR2715722A1 (en) 1995-08-04
GB2286051A (en) 1995-08-02
JPH07225105A (en) 1995-08-22
CN1109584A (en) 1995-10-04
BE1010228A5 (en) 1998-04-07
DE4402463A1 (en) 1995-08-03

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WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid