KR950022109A - Noise Characterization Circuit of Semiconductor Device - Google Patents

Noise Characterization Circuit of Semiconductor Device Download PDF

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Publication number
KR950022109A
KR950022109A KR1019930027236A KR930027236A KR950022109A KR 950022109 A KR950022109 A KR 950022109A KR 1019930027236 A KR1019930027236 A KR 1019930027236A KR 930027236 A KR930027236 A KR 930027236A KR 950022109 A KR950022109 A KR 950022109A
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KR
South Korea
Prior art keywords
input terminal
circuit
delay circuit
output node
nmos transistor
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Application number
KR1019930027236A
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Korean (ko)
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KR960008137B1 (en
Inventor
박기우
Original Assignee
김주용
현대전자산업 주식회사
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Application filed by 김주용, 현대전자산업 주식회사 filed Critical 김주용
Priority to KR1019930027236A priority Critical patent/KR960008137B1/en
Priority to DE4443954A priority patent/DE4443954C2/en
Priority to JP6306437A priority patent/JP2857590B2/en
Publication of KR950022109A publication Critical patent/KR950022109A/en
Application granted granted Critical
Publication of KR960008137B1 publication Critical patent/KR960008137B1/en

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Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K5/00Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/125Discriminating pulses
    • H03K5/1252Suppression or limitation of noise or interference

Abstract

본 발명은 피드백 PMOS형 트랜지스터 또는 NMOS형 트랜지스터를 사용하여 입력단에 발생한 좁은 폭의 노이즈를 충분한 폭을 갖는 신호로 출력함으로써, 노이즈 특성 강화회로를 통해 입력신호를 받아들이는 특정회로에서 노이즈에 의한 오동작이 발생하는 것을 방지한 노이즈 특성 강화회로에 관한 기술이다.The present invention outputs narrow noise generated at the input stage as a signal having a sufficient width by using a feedback PMOS transistor or an NMOS transistor, thereby preventing malfunctions caused by noise in a specific circuit that receives an input signal through a noise characteristic enhancement circuit. It is a technique related to a noise characteristic reinforcement circuit which prevented generation.

Description

반도체 소자의 노이즈 특성 강화회로Noise Characterization Circuit of Semiconductor Device

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제7도는 본 발명의 노이즈 특성 강화회로의 제1실시예를 도시한 회로도,7 is a circuit diagram showing a first embodiment of the noise characteristic enhancement circuit of the present invention;

제8도는 제7도의 회로에 좁은 폭의 신호가 입력될 때의 신호 파형도,8 is a signal waveform diagram when a narrow width signal is input to the circuit of FIG.

제9도는 제7도의 회로에 넓은 폭의 신호가 입력될 때의 신호 파형도.9 is a signal waveform diagram when a wide signal is input to the circuit of FIG.

Claims (3)

반도체 소자의 노이즈 특성 강화회로에 있어서, 반전 게이트 구조의 제1 PMOS형 트랜지스터 및 NMOS형 트랜지스터로 이루어진 입력단과, 전원전위와 상기 입력단의 제1 PMOS형과 트랜지스터 사이에 접속된 제2 PMOS형 트랜지스터와, 상기 입력단의 출력노드의 로직 상태를 일정 시간 지연시키는 지연회로와, 상기 입력단의 출력노드와 지연회로에 접속되어 상기 입력단으로 입력되는 신호의 로직 상태가 로우인 경우에 상기 출력노드의 전위가 하이 상태로 플로팅(floating)되는 것을 방지하기 위한한 래치회로를 포함하며, 상기 제2PMOS형 트랜지스터의 게이트를 상기 지연회로의 출력으로 제어하고, 상기 지연회로에서의 신호 지연시간은 본 노이즈 특성 강화회로를 필요로 하는 특정회로가 충분히 프리차지될 수 있는 시간 이상으로 유지시키는 것을 특징으로 하는 노이즈 특성 강화회로.A noise characteristic enhancement circuit of a semiconductor device, comprising: an input terminal comprising a first PMOS transistor and an NMOS transistor having an inverted gate structure; a second PMOS transistor connected between a power supply potential and the first PMOS type and the transistor of the input terminal; A delay circuit for delaying a logic state of an output node of the input terminal for a predetermined time, and a potential of the output node is high when the logic state of a signal input to the input terminal connected to the output node and the delay circuit of the input terminal is low; A latch circuit for preventing floating to a state, wherein the gate of the second PMOS transistor is controlled as an output of the delay circuit, and a signal delay time in the delay circuit Characterized in that the required circuitry is maintained for more than enough time to be precharged. Enhance the noise characteristic circuit. 반전 게이트 구조의 PMOS형 트랜지스터 및 제1 NMOS형 트랜지스터로 이루어진 입력단과, 상기 입력단의 제1 NMOS형 트랜지스터와 접지전위 사이에 접속된 제2 NMOS형 트랜지스터와 상기 입력단의 출력노드의 로직 상태를 일정 시간 지연시키는 지연회로와, 상기 입력단의 출력노드와 지연회로에 접속되어 상기 입력단으로 입력되는 신호의 로직 상태가 하이인 경우에 상기 출력노드의 전위가 로우 상태로 플로팅되는 것을 방지하기 위한 래치회로를 포함하며, 상기 제2 PMOS형 트랜지스터의 게이트를 상기 지연회로의 출력으로 제어하고, 상기 지연회로에서의 신호 지연시간은 본 노이즈 특성 강화회로를 필요로 하는 특정 회로가 충분히 프리차지될 수 있는 시간 이상으로 유지시키는 것을 특징으로 하는 노이즈 특성 강화회로.A logic state of an input terminal including a PMOS transistor and a first NMOS transistor having an inverted gate structure, a second NMOS transistor connected between the first NMOS transistor and the ground potential of the input terminal, and an output node of the input terminal is a predetermined time. A delay circuit for delaying and a latch circuit connected to an output node of the input terminal and a delay circuit to prevent the potential of the output node from floating to a low state when a logic state of a signal input to the input terminal is high; The gate of the second PMOS transistor is controlled by the output of the delay circuit, and the signal delay time in the delay circuit is equal to or more than a time sufficient for a specific circuit requiring this noise characteristic enhancement circuit to be sufficiently precharged. And a noise characteristic reinforcement circuit characterized in that it is maintained. 반전 게이트 구조의 제1 PMOS형 트랜지스터 및 제1 NMOS형 트랜지스터로 이루어진 입력단과, 전원전위와 상기 입력단의 제1 PMOS형 트랜지스터 사이에 접속된 제2 NMOS형 트랜지스터와, 상기 입력단의 제1 NMOS형 트랜지스터와 접지전위 사이에 접속된 제2NMOS형 트랜지스터와, 상기 입력단의 출력노드의 로직 상태를 일정 시간 지연시키는 지연회로와, 상기 입력단의 출력노드와 지연회로에 접속되어 상기 출력노드의 전위가 플로팅되는 것을 방지하기 위한 래치회로를 포함하며, 상기 제2 PMOS형 트랜지스터 및 제2 NMOS형 트랜지스터의 게이트를 상기 지연회로의 출력으로 제어하고, 상기 지연회로에서의 신호 지연시간은 본 노이즈 특성 강화회로를 필요로 하는 특정회로가 충분히 프리차지될 수 있는 시간 이상으로 유지시키는 것을 특징으로하는 노이즈 특성 강화회로.An input terminal comprising a first PMOS transistor and a first NMOS transistor having an inverted gate structure, a second NMOS transistor connected between a power supply potential and a first PMOS transistor of the input terminal, and a first NMOS transistor of the input terminal A second NMOS transistor connected between the ground and the ground potential, a delay circuit for delaying the logic state of the output node of the input terminal for a predetermined time, and a potential of the output node being floated by being connected to the output node and the delay circuit of the input terminal. And a latch circuit to prevent the gates of the second PMOS transistor and the second NMOS transistor from the output of the delay circuit, and the signal delay time in the delay circuit requires the noise characteristic enhancement circuit. Noise characteristics, characterized in that it is maintained for more than the time that a specific circuit can be sufficiently precharged. Generating circuit. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019930027236A 1993-12-10 1993-12-10 Noise characteristics enhancement circuit of semiconductor element KR960008137B1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1019930027236A KR960008137B1 (en) 1993-12-10 1993-12-10 Noise characteristics enhancement circuit of semiconductor element
DE4443954A DE4443954C2 (en) 1993-12-10 1994-12-09 Equalizer for improving the noise characteristics of a semiconductor circuit
JP6306437A JP2857590B2 (en) 1993-12-10 1994-12-09 Circuit for enhancing noise characteristics of semiconductor devices.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019930027236A KR960008137B1 (en) 1993-12-10 1993-12-10 Noise characteristics enhancement circuit of semiconductor element

Publications (2)

Publication Number Publication Date
KR950022109A true KR950022109A (en) 1995-07-26
KR960008137B1 KR960008137B1 (en) 1996-06-20

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KR1019930027236A KR960008137B1 (en) 1993-12-10 1993-12-10 Noise characteristics enhancement circuit of semiconductor element

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JP (1) JP2857590B2 (en)
KR (1) KR960008137B1 (en)
DE (1) DE4443954C2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100407842B1 (en) * 1997-09-30 2005-05-09 지멘스 악티엔게젤샤프트 Pulse shaper circuit

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6134252A (en) * 1997-04-11 2000-10-17 Advanced Micro Devices, Inc. Enhanced glitch removal circuit
CN116232280A (en) * 2023-05-10 2023-06-06 广东巨风半导体有限公司 Common-mode transient anti-interference filter and control method thereof

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59172826A (en) * 1983-03-22 1984-09-29 Hitachi Ltd Digital input circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100407842B1 (en) * 1997-09-30 2005-05-09 지멘스 악티엔게젤샤프트 Pulse shaper circuit

Also Published As

Publication number Publication date
JPH07221615A (en) 1995-08-18
JP2857590B2 (en) 1999-02-17
DE4443954A1 (en) 1995-06-14
DE4443954C2 (en) 1998-02-26
KR960008137B1 (en) 1996-06-20

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