KR940019623U - 아이씨 테스트 소켓의 구조 - Google Patents

아이씨 테스트 소켓의 구조

Info

Publication number
KR940019623U
KR940019623U KR2019930000665U KR930000665U KR940019623U KR 940019623 U KR940019623 U KR 940019623U KR 2019930000665 U KR2019930000665 U KR 2019930000665U KR 930000665 U KR930000665 U KR 930000665U KR 940019623 U KR940019623 U KR 940019623U
Authority
KR
South Korea
Prior art keywords
test socket
socket
test
Prior art date
Application number
KR2019930000665U
Other languages
English (en)
Other versions
KR950006932Y1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to KR2019930000665U priority Critical patent/KR950006932Y1/ko
Publication of KR940019623U publication Critical patent/KR940019623U/ko
Application granted granted Critical
Publication of KR950006932Y1 publication Critical patent/KR950006932Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019930000665U 1993-01-19 1993-01-19 아이씨 테스트 소켓의 구조 KR950006932Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930000665U KR950006932Y1 (ko) 1993-01-19 1993-01-19 아이씨 테스트 소켓의 구조

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930000665U KR950006932Y1 (ko) 1993-01-19 1993-01-19 아이씨 테스트 소켓의 구조

Publications (2)

Publication Number Publication Date
KR940019623U true KR940019623U (ko) 1994-08-22
KR950006932Y1 KR950006932Y1 (ko) 1995-08-23

Family

ID=19349808

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930000665U KR950006932Y1 (ko) 1993-01-19 1993-01-19 아이씨 테스트 소켓의 구조

Country Status (1)

Country Link
KR (1) KR950006932Y1 (ko)

Also Published As

Publication number Publication date
KR950006932Y1 (ko) 1995-08-23

Similar Documents

Publication Publication Date Title
KR950701186A (ko) 집적 회로용 테스트 소켓(integrated circuit test socket)
KR920701830A (ko) Ic 시험장치
KR960015836A (ko) 집적회로 시험장치
KR900021177U (ko) Tab번인 시험용 소켓
KR970703044A (ko) Ic 소켓(ic socket)
DE69430725D1 (de) Testen von Halbleiterbauelementen
KR940019623U (ko) 아이씨 테스트 소켓의 구조
DE59407860D1 (de) Prüfgerät
DE69117097D1 (de) Testvorrichtungen
KR950015123U (ko) 확관시험 장치
KR950021580U (ko) 아이씨 소켓의 컨택트 핀 구조
KR950021204U (ko) 소켓 검사장치
KR950007405U (ko) Ic 소켓
KR920017220U (ko) Ic 테스트용 소켓
KR950021177U (ko) 소켓 접속 검사회로
KR930020457U (ko) 격리기능을 가진 번인보드용 ic소켓
KR950025868U (ko) 아이씨 소켓
KR940004408U (ko) Ic 소켓
KR900014996U (ko) Ic용 소켓
KR900014997U (ko) Ic용 소켓
KR950015134U (ko) 반도체장치의 테스트소켓
KR940019729U (ko) 반도체 장치의 테스트 소켓
KR920013838U (ko) 디바이스 테스터용 소켓의 구조
KR930018542U (ko) Ic 칩 테스터기
KR940023575U (ko) 테스터 핸들러의 디바이스 이송장치

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20060720

Year of fee payment: 12

LAPS Lapse due to unpaid annual fee