KR940007589A - PAD for TEST of LCD - Google Patents
PAD for TEST of LCD Download PDFInfo
- Publication number
- KR940007589A KR940007589A KR1019920017814A KR920017814A KR940007589A KR 940007589 A KR940007589 A KR 940007589A KR 1019920017814 A KR1019920017814 A KR 1019920017814A KR 920017814 A KR920017814 A KR 920017814A KR 940007589 A KR940007589 A KR 940007589A
- Authority
- KR
- South Korea
- Prior art keywords
- drive circuit
- output
- pad
- gate drive
- extending
- Prior art date
Links
Abstract
본 발명은 액정표시장치의 테스트용 패드에 관한 것으로, 특히 각출력버스라인을 연장시켜서 출력패드(PAD)를 형성하여 판넬의 상, 하판을 합착한 후에도 구동회로의 출력측정이 가능하도록한 액정표시장치의 테스트용 패드에 관한 것으로서, 이러한 본 발명의 목적은 게이트 구동회로의 출력을 장치외부에서 측정하도록 게이트 구동회로출력버스라인을 연장시켜서 접속한 게이트 구동회로 출력패드(7)와 데이타 구동회로의 출력을 장치외부에서 측정하도록 데이타 구동회로 출력 버스라인을 연장시켜서 접속한 데이타 구동회로 출력패드(8)를 구성함으로써 달성되어진다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test pad of a liquid crystal display device. In particular, an output pad (PAD) is formed by extending each output bus line so that the output circuit of the driving circuit can be measured even after the upper and lower panels of the panel are bonded. The present invention relates to a test pad of a device, and an object of the present invention is to provide a gate drive circuit output pad (7) and a data drive circuit connected by extending a gate drive circuit output bus line to measure the output of the gate drive circuit from outside the device. This is achieved by constructing a data drive circuit output pad 8 connected by extending the data drive circuit output busline to measure the output outside the apparatus.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제2도는 본 발명 액정표시장치의 테스트용 패드 구성도,2 is a configuration diagram for a test pad of the liquid crystal display of the present invention;
제3도는 제2도의 게이트 구동회로단 상세도,3 is a detailed view of a gate driving circuit stage of FIG.
제4도는 제2도의 데이타 구동회로단 상세도.4 is a detailed view of a data driving circuit stage of FIG.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019920017814A KR940007589A (en) | 1992-09-29 | 1992-09-29 | PAD for TEST of LCD |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019920017814A KR940007589A (en) | 1992-09-29 | 1992-09-29 | PAD for TEST of LCD |
Publications (1)
Publication Number | Publication Date |
---|---|
KR940007589A true KR940007589A (en) | 1994-04-27 |
Family
ID=67147854
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019920017814A KR940007589A (en) | 1992-09-29 | 1992-09-29 | PAD for TEST of LCD |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR940007589A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100455860B1 (en) * | 1997-06-26 | 2005-01-05 | 엘지.필립스 엘시디 주식회사 | Probing pad of an lcd panel |
KR100488888B1 (en) * | 1999-04-30 | 2005-05-11 | 가부시끼가이샤 도시바 | Array substrate plate for display device |
KR100462378B1 (en) * | 1997-12-22 | 2005-06-07 | 비오이 하이디스 테크놀로지 주식회사 | Liquid crystal display device and its contact resistance measuring method |
-
1992
- 1992-09-29 KR KR1019920017814A patent/KR940007589A/en not_active Application Discontinuation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100455860B1 (en) * | 1997-06-26 | 2005-01-05 | 엘지.필립스 엘시디 주식회사 | Probing pad of an lcd panel |
KR100462378B1 (en) * | 1997-12-22 | 2005-06-07 | 비오이 하이디스 테크놀로지 주식회사 | Liquid crystal display device and its contact resistance measuring method |
KR100488888B1 (en) * | 1999-04-30 | 2005-05-11 | 가부시끼가이샤 도시바 | Array substrate plate for display device |
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WITN | Withdrawal due to no request for examination |