KR960024609A - Liquid crystal display device test device - Google Patents
Liquid crystal display device test device Download PDFInfo
- Publication number
- KR960024609A KR960024609A KR1019940037854A KR19940037854A KR960024609A KR 960024609 A KR960024609 A KR 960024609A KR 1019940037854 A KR1019940037854 A KR 1019940037854A KR 19940037854 A KR19940037854 A KR 19940037854A KR 960024609 A KR960024609 A KR 960024609A
- Authority
- KR
- South Korea
- Prior art keywords
- data
- test
- pad
- liquid crystal
- gate
- Prior art date
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Abstract
본 발명은 액정표시장치에 관한 것으로서 보다 상세하게는 액정주입 봉지후 온/오프시험에서 시험용 데이타 및 게이트입력신호의 입력시 RC시정수에 의한 신호왜곡을 줄여 온/오프시 화면 전체의 블랙상태 휘도가 고르게 할 수 있는 액정표시 소자의 테스트장치에 관한 것이다.The present invention relates to a liquid crystal display device, and more particularly, to reduce signal distortion caused by RC time constant when inputting test data and gate input signal in on / off test after liquid crystal injection encapsulation. The present invention relates to a test apparatus for a liquid crystal display element that can be evenly.
특징적인 구성으로는 각각의 데이타 패드 사이의 데이타라인 쇼팅바상에 신호를 인가하기 위한 데이타라인 테스트패드를 형성하고 각각의 게이트라인테스트패드 사이의 게이트라인 쇼팅바상에 신호를 인가하기 위한 게이트패드를 형성하여 추가된 테스트패드를 통해 각각의 데이타 패드 및 게이트 라인패드에 직접 시험신호를 인가시킬 수 있도록 함에 있다.A characteristic configuration is to form a data line test pad for applying a signal on a data line shorting bar between each data pad and a gate pad for applying a signal on a gate line shorting bar between each gate line test pad. Therefore, the test signal can be directly applied to each data pad and gate line pad through the added test pad.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제4도는 본 발명에 의한 액정표시 소자의 테스트장치의 온/오프시험용 쇼팅바 및 패드구조도.4 is a shorting bar and pad structure diagram for an on / off test of a test apparatus for a liquid crystal display device according to the present invention.
Claims (2)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019940037854A KR960024609A (en) | 1994-12-28 | 1994-12-28 | Liquid crystal display device test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019940037854A KR960024609A (en) | 1994-12-28 | 1994-12-28 | Liquid crystal display device test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR960024609A true KR960024609A (en) | 1996-07-20 |
Family
ID=66769823
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019940037854A KR960024609A (en) | 1994-12-28 | 1994-12-28 | Liquid crystal display device test device |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR960024609A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100462378B1 (en) * | 1997-12-22 | 2005-06-07 | 비오이 하이디스 테크놀로지 주식회사 | Liquid crystal display device and its contact resistance measuring method |
| KR100480860B1 (en) * | 1997-03-28 | 2005-08-05 | 삼성전자주식회사 | LCD Display |
| KR100796619B1 (en) * | 2007-01-08 | 2008-01-22 | 삼성에스디아이 주식회사 | Array substrate for organic light emitting diode display |
| KR101137863B1 (en) * | 2005-08-30 | 2012-04-23 | 엘지디스플레이 주식회사 | Thin Film Transistor Array Substrate |
-
1994
- 1994-12-28 KR KR1019940037854A patent/KR960024609A/en not_active Application Discontinuation
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100480860B1 (en) * | 1997-03-28 | 2005-08-05 | 삼성전자주식회사 | LCD Display |
| KR100462378B1 (en) * | 1997-12-22 | 2005-06-07 | 비오이 하이디스 테크놀로지 주식회사 | Liquid crystal display device and its contact resistance measuring method |
| KR101137863B1 (en) * | 2005-08-30 | 2012-04-23 | 엘지디스플레이 주식회사 | Thin Film Transistor Array Substrate |
| KR100796619B1 (en) * | 2007-01-08 | 2008-01-22 | 삼성에스디아이 주식회사 | Array substrate for organic light emitting diode display |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| N231 | Notification of change of applicant | ||
| WITN | Withdrawal due to no request for examination |