KR930703585A - 홀로그램 간섭법을 이용한 구조 검사방법 - Google Patents

홀로그램 간섭법을 이용한 구조 검사방법

Info

Publication number
KR930703585A
KR930703585A KR1019930701909A KR930701909A KR930703585A KR 930703585 A KR930703585 A KR 930703585A KR 1019930701909 A KR1019930701909 A KR 1019930701909A KR 930701909 A KR930701909 A KR 930701909A KR 930703585 A KR930703585 A KR 930703585A
Authority
KR
South Korea
Prior art keywords
zone
film
photographic
glass plates
laser beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1019930701909A
Other languages
English (en)
Korean (ko)
Inventor
존 패트릭 베어드
로버트 케이스 클라크
Original Assignee
데이비드 로만 호크
유니서치 리미티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Publication of KR930703585A publication Critical patent/KR930703585A/ko
Application filed by 데이비드 로만 호크, 유니서치 리미티드 filed Critical 데이비드 로만 호크
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/164—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by holographic interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/021—Interferometers using holographic techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
KR1019930701909A 1990-12-20 1993-12-20 홀로그램 간섭법을 이용한 구조 검사방법 Withdrawn KR930703585A (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
AUPK403490 1990-12-20
ATPK4034 1990-12-20
AUPK777991 1991-08-16
ATPK7779 1991-08-16
PCT/AU1991/000595 WO1992011506A1 (en) 1990-12-20 1991-12-20 Structural examination using holographic interferometry

Publications (1)

Publication Number Publication Date
KR930703585A true KR930703585A (ko) 1993-11-30

Family

ID=25643992

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019930701909A Withdrawn KR930703585A (ko) 1990-12-20 1993-12-20 홀로그램 간섭법을 이용한 구조 검사방법

Country Status (7)

Country Link
US (1) US5519486A (enExample)
EP (1) EP0563196A1 (enExample)
JP (1) JPH06504121A (enExample)
KR (1) KR930703585A (enExample)
AU (1) AU646124B2 (enExample)
CA (1) CA2098852A1 (enExample)
WO (1) WO1992011506A1 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
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US6101884A (en) * 1997-04-10 2000-08-15 Mcdonnell Douglas Corporation Fastener equipped with an untethered fiber-optic strain gauge and related method of using the same
GB2326470B (en) * 1997-06-10 1999-06-09 British Aerospace Improvements in structural deflection measurement
US6094260A (en) * 1998-08-12 2000-07-25 General Electric Company Holographic interferometry for monitoring and controlling laser shock peening
US5948293A (en) * 1998-12-03 1999-09-07 General Electric Company Laser shock peening quality assurance by volumetric analysis of laser shock peened dimple
JP3709430B2 (ja) * 2000-02-02 2005-10-26 独立行政法人産業技術総合研究所 応力発光材料を用いた応力または応力分布の測定方法
US6580053B1 (en) * 2000-08-31 2003-06-17 Sharp Laboratories Of America, Inc. Apparatus to control the amount of oxygen incorporated into polycrystalline silicon film during excimer laser processing of silicon films
US20050092111A1 (en) * 2003-11-04 2005-05-05 Schmaling David N. Non-destructive diagnostic apparatus for identifying defect type in core composite structures
JP4568883B2 (ja) * 2006-01-20 2010-10-27 独立行政法人産業技術総合研究所 応力・歪みの解析方法及び装置
EP2018546A1 (en) * 2006-05-10 2009-01-28 National Research Council of Canada Method of assessing bond integrity in bonded structures
US7765853B2 (en) 2007-06-04 2010-08-03 The Boeing Company Determining seal feature integrity by testing for deformation upon air pressure excitation
US8928316B2 (en) * 2010-11-16 2015-01-06 Jentek Sensors, Inc. Method and apparatus for non-destructive evaluation of materials
US9488620B2 (en) 2011-03-15 2016-11-08 Purdue Research Foundation Weak bond detection
US10160163B2 (en) 2011-08-11 2018-12-25 The Boeing Company Heating system for composite rework of aircraft
US10137651B2 (en) 2011-08-11 2018-11-27 The Boeing Company Heating system for composite rework of aircraft
CN102679923B (zh) * 2012-05-09 2014-05-07 南京航空航天大学 航空铝合金壁板铆接结构干涉量非破坏性检测方法
DE102014202598B4 (de) * 2014-02-13 2024-04-11 Bayerische Motoren Werke Aktiengesellschaft Verfahren zur qualitativen Analsyse von Verbindungen von Fügepartnern
US10328530B2 (en) * 2016-09-27 2019-06-25 The Boeing Company Flexible and local laser shroud
CN119164315B (zh) * 2024-11-25 2025-02-25 成都思越智能装备股份有限公司 一种板状产品载具变形检测装置及检测方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3587301A (en) * 1968-12-19 1971-06-28 Atomic Energy Commission Holographic interferometer for isopachic stress analysis
US3860346A (en) * 1970-02-18 1975-01-14 Gco Method of compensating for gross object motion in real time holographic interferometry
US3822107A (en) * 1970-11-20 1974-07-02 Engel Kg L Improvements in or relating to an injection mold
US3828126A (en) * 1973-04-13 1974-08-06 American Express Invest Real time interferometry
US3911733A (en) * 1974-04-01 1975-10-14 Trw Inc Optical signature method and apparatus for structural integrity verification
US4139302A (en) * 1977-02-17 1979-02-13 Dr. Ralph M. Grant Engineering Consultants, Inc. Method and apparatus for interferometric deformation analysis
JPS54148082A (en) * 1978-05-12 1979-11-19 Asahi Chem Ind Co Ltd Shaped laminate and its production
US4302416A (en) * 1979-09-25 1981-11-24 Guy Rudolf Method and apparatus for molding polyurethane soles for footwear
US4464052A (en) * 1981-05-04 1984-08-07 Neumann Don B Differential holographic interferometry
US5065331A (en) * 1981-05-18 1991-11-12 Vachon Reginald I Apparatus and method for determining the stress and strain in pipes, pressure vessels, structural members and other deformable bodies
US4425039A (en) * 1982-05-07 1984-01-10 Industrial Holographics, Inc. Apparatus for the practice of double exposure interferometric non-destructive testing
JPH01192551A (ja) * 1988-01-29 1989-08-02 Agency Of Ind Science & Technol 多層複合射出成形品
US5257088A (en) * 1992-03-27 1993-10-26 Laser Technology, Inc. Apparatus and method for nondestructive inspection of a vehicle

Also Published As

Publication number Publication date
JPH06504121A (ja) 1994-05-12
EP0563196A1 (en) 1993-10-06
US5519486A (en) 1996-05-21
WO1992011506A1 (en) 1992-07-09
EP0563196A4 (enExample) 1994-04-13
AU9107291A (en) 1992-07-22
CA2098852A1 (en) 1992-06-21
AU646124B2 (en) 1994-02-10

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Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 19930621

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid