KR930009122A - Manufacturing Method of Semiconductor Device - Google Patents

Manufacturing Method of Semiconductor Device Download PDF

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Publication number
KR930009122A
KR930009122A KR1019910018947A KR910018947A KR930009122A KR 930009122 A KR930009122 A KR 930009122A KR 1019910018947 A KR1019910018947 A KR 1019910018947A KR 910018947 A KR910018947 A KR 910018947A KR 930009122 A KR930009122 A KR 930009122A
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South Korea
Prior art keywords
manufacturing
lift
semiconductor device
metal
forming
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KR1019910018947A
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Korean (ko)
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박운용
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김광호
삼성전자 주식회사
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Priority to KR1019910018947A priority Critical patent/KR930009122A/en
Publication of KR930009122A publication Critical patent/KR930009122A/en

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Abstract

본 발명은 박막트랜지스터의 제조방법에 관한 것으로, 박막트랜지스터의 제조방법에 있어서 통상적인 리프트오프법을 이용하여 기판상에 게이트전극을 형성하는 공정과, 상기 리프트오프법에서 게이트전극으로 사용되는 금속을 리프트오프하기 전에 상기 금속을 양극산화함으로써 제1금속산화막을 형성하는 공정을 구비하는 것을 특징으로 한다. 따라서 트랜지스터의 게이트전극을 절연시키기 위한 게이트절연막을, 리프트오프공정을 이용하여 포토레지스트 패턴과, 이 포토레지스트 패턴위의 금속층을 리프트오프하기 전에 양극산화하여 형성함으로써 상기 게이트전극의 단차에 영향을 받지 않고 피복력이 양호한 게이트절연막을 형성할 수 있다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a thin film transistor, the method of forming a gate electrode on a substrate using a conventional lift-off method, and a metal used as a gate electrode in the lift-off method. And forming a first metal oxide film by anodizing the metal before lift-off. Therefore, a gate insulating film for insulating the gate electrode of the transistor is formed by anodizing the photoresist pattern and the metal layer on the photoresist pattern by using a lift-off process, thereby not being affected by the step difference of the gate electrode. It is possible to form a gate insulating film having good covering force without.

Description

반도체 장치의 제조방법Manufacturing Method of Semiconductor Device

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제2A도 내지 제2D도는 본 발명에 의한 액정용 박막트랜지스터의 제조공정의 일 실시예를 나타낸 일부 공정순서도.2A to 2D are some process flowcharts showing one embodiment of a process for manufacturing a thin film transistor for liquid crystal according to the present invention.

Claims (9)

번도체장치의 제조방법에 있어서, 통상적인 리프트오프법을 이용하여 기판상에 금속막을 형성하는 공정과, 상기 리프트오프법에서 상기 금속막을 리프트오프하기 전에 상기 금속막을 양극산화함으로써 제1금속산화막을 형성하는 공정을 구비하는 것을 특징으로 하는 반도체장치의 제조방법.A method of manufacturing a semiconductor device, comprising: forming a metal film on a substrate using a conventional lift-off method; and forming a first metal oxide film by anodizing the metal film before lift-off of the metal film by the lift-off method. A method of manufacturing a semiconductor device, comprising the step of forming. 제1항에 있어서, 상기 반도체장치는 MOS 트랜지스터인 것을 특징으로 하는 반도체장치의 제조방법.The method of manufacturing a semiconductor device according to claim 1, wherein said semiconductor device is a MOS transistor. 제1항에 있어서, 상기 반도체장치의 제조방법은 금속배선공정에 적용되는 것을 특징으로 하는 반도체장치의 제조방법.The method of manufacturing a semiconductor device according to claim 1, wherein the manufacturing method of the semiconductor device is applied to a metal wiring process. 제1항에 있어서, 상기 리프트오프법에 사용되는 포토레지스트 패턴은 포토레지스트가 1층, 혹은 그 이상으로 형성되어 만들어지는 것을 특징으로 하는 반도체장치의 제조방법.The method of manufacturing a semiconductor device according to claim 1, wherein the photoresist pattern used in the lift-off method is formed by forming one or more layers of photoresist. 제1항에 있어서, 상기 제1금속산화막의 형성전에 상기 금속막을 테이퍼 에칭하는 공정이 추가되는 것을 특징으로 하는 반도체장치의 제조방법.The method of manufacturing a semiconductor device according to claim 1, further comprising a step of tapering etching the metal film before forming the first metal oxide film. 제1항에 있어서, 상기 기파은 Si 기판, 혹은 GaAs 기판, 혹은 상기 Si(GaAs) 기판위에 절연막이 증착된 기판인 것을 특징으로 하는 반도체장치의 제조방법.The method of claim 1, wherein the wave is a Si substrate, a GaAs substrate, or a substrate on which an insulating film is deposited on the Si (GaAs) substrate. 박막트랜지스터의 제조방법에 있어서, 통상적인 리프트오프법을 이용하여 기판상에 게이트전극을 형성하는 공정과, 상기 리프트오프법에서 게이트전극으로 사용되는 금속을 리프트오프하기 전에 상기 금속을 양극산화함으로써 제1금속산화막을 형성하는 공정을 구비하는 것을 특징으로 하는 박막트랜지스터의 제조방법.A method of manufacturing a thin film transistor, the method comprising forming a gate electrode on a substrate using a conventional lift-off method, and anodizing the metal before lifting off the metal used as the gate electrode in the lift-off method. A method for manufacturing a thin film transistor, comprising the step of forming a metal oxide film. 제7항에 있어서, 상기 리프트오프법에서 사용되는 포토레지스터 패턴은 포토레지스트가 1층, 혹은 그 이상으로 형성되어 만들어지는 것을 특징으로 하는 박막트랜지스터의 제조방법.The method of manufacturing a thin film transistor according to claim 7, wherein the photoresist pattern used in the lift-off method is formed by forming one or more layers of photoresist. 제7항에 있어서, 상기 제1금속산화막의 형성전에 상기 게이트전극으로 사용되는 금속을 테이퍼 에칭하는 공정이 추가되는 것을 특징으로 하는 박막트랜지스터의 제조방법.8. The method of claim 7, wherein the step of tapering etching the metal used as the gate electrode before the formation of the first metal oxide film is added. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019910018947A 1991-10-26 1991-10-26 Manufacturing Method of Semiconductor Device KR930009122A (en)

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Application Number Priority Date Filing Date Title
KR1019910018947A KR930009122A (en) 1991-10-26 1991-10-26 Manufacturing Method of Semiconductor Device

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KR1019910018947A KR930009122A (en) 1991-10-26 1991-10-26 Manufacturing Method of Semiconductor Device

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