KR930005169Y1 - A/d 변환기의 자기진단 및 고장 검출회로 - Google Patents
A/d 변환기의 자기진단 및 고장 검출회로 Download PDFInfo
- Publication number
- KR930005169Y1 KR930005169Y1 KR2019890002491U KR890002491U KR930005169Y1 KR 930005169 Y1 KR930005169 Y1 KR 930005169Y1 KR 2019890002491 U KR2019890002491 U KR 2019890002491U KR 890002491 U KR890002491 U KR 890002491U KR 930005169 Y1 KR930005169 Y1 KR 930005169Y1
- Authority
- KR
- South Korea
- Prior art keywords
- converter
- computer
- reference voltage
- latch circuit
- output
- Prior art date
Links
- 238000001514 detection method Methods 0.000 claims description 4
- 238000004092 self-diagnosis Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 description 7
- 230000000052 comparative effect Effects 0.000 description 3
- 230000007257 malfunction Effects 0.000 description 3
- 238000003745 diagnosis Methods 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
- H03M1/1076—Detection or location of converter hardware failure, e.g. power supply failure, open or short circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
- H03M1/108—Converters having special provisions for facilitating access for testing purposes
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
Abstract
Description
Claims (1)
- 기준전압 발생기(4)의 기준전압이 인가되는 A/D 변환기(3)의 출력을 버퍼회로(2)를 통하여 컴퓨터(1)에 입력되도록 한 통상의 컴퓨터 시스템에 있어서 각 래치회로(5)(7)(10)를 동작시킬 수 있도록 컴퓨터(1)에 연결하고 버퍼회로(2)의 출력단에는 각 래치회로(5)(7)(10)의 데이터를 변화할 수 있게 접속하는 한편 래치회로(5)에는 기준전압 발생기(4)를 연결하여 다른 래치회로(10)는 멀티플렉스(9)에 연결하여 기준전압발생기(4)의 출력 전압을 전류원 발생기(6)에 인가하고 상기 전류원 발생기(6)의 출력전류를 저항(R)과 비교 증폭기(OP)를 통하여 멀티플렉스(9)에 인가되도록 하며, 상기 멀티플렉스(9)의 출력 신호는 입력장치(8)를 거쳐 A/D변환기(3)에 인가한 것을 특징으로 하는 A/D변환기의 자기 진단 및 고장 검출회로.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019890002491U KR930005169Y1 (ko) | 1989-03-04 | 1989-03-04 | A/d 변환기의 자기진단 및 고장 검출회로 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019890002491U KR930005169Y1 (ko) | 1989-03-04 | 1989-03-04 | A/d 변환기의 자기진단 및 고장 검출회로 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR900017912U KR900017912U (ko) | 1990-10-05 |
KR930005169Y1 true KR930005169Y1 (ko) | 1993-08-09 |
Family
ID=19284178
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019890002491U KR930005169Y1 (ko) | 1989-03-04 | 1989-03-04 | A/d 변환기의 자기진단 및 고장 검출회로 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR930005169Y1 (ko) |
-
1989
- 1989-03-04 KR KR2019890002491U patent/KR930005169Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR900017912U (ko) | 1990-10-05 |
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Comment text: Application for Utility Model Registration Patent event code: UA01011R08D Patent event date: 19890304 |
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