KR930001745B1 - 전원 멀티플렉서 스위치 및 그 스위칭방법 - Google Patents
전원 멀티플렉서 스위치 및 그 스위칭방법 Download PDFInfo
- Publication number
- KR930001745B1 KR930001745B1 KR1019840007193A KR840007193A KR930001745B1 KR 930001745 B1 KR930001745 B1 KR 930001745B1 KR 1019840007193 A KR1019840007193 A KR 1019840007193A KR 840007193 A KR840007193 A KR 840007193A KR 930001745 B1 KR930001745 B1 KR 930001745B1
- Authority
- KR
- South Korea
- Prior art keywords
- voltage line
- switching means
- stb
- multiplexer switch
- line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title claims description 12
- 230000008878 coupling Effects 0.000 claims description 16
- 238000010168 coupling process Methods 0.000 claims description 16
- 238000005859 coupling reaction Methods 0.000 claims description 16
- 238000010586 diagram Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/28—Modifications for introducing a time delay before switching
- H03K17/284—Modifications for introducing a time delay before switching in field effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K17/6871—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the output circuit comprising more than one controlled field-effect transistor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
Landscapes
- Electronic Switches (AREA)
- Power Sources (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US83-552933 | 1983-11-17 | ||
| US552,933 | 1983-11-17 | ||
| US06/552,933 US4556804A (en) | 1983-11-17 | 1983-11-17 | Power multiplexer switch and method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR850003645A KR850003645A (ko) | 1985-06-20 |
| KR930001745B1 true KR930001745B1 (ko) | 1993-03-12 |
Family
ID=24207412
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019840007193A Expired - Lifetime KR930001745B1 (ko) | 1983-11-17 | 1984-11-16 | 전원 멀티플렉서 스위치 및 그 스위칭방법 |
Country Status (3)
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4686388A (en) * | 1985-03-12 | 1987-08-11 | Pitney Bowes Inc. | Integrated circuit substrate bias selection circuit |
| JP2628631B2 (ja) * | 1986-04-09 | 1997-07-09 | アポロ精工株式会社 | ワイヤストリツパー装置及びこれを用いた自動配線装置 |
| US5272393A (en) * | 1987-11-24 | 1993-12-21 | Hitachi, Ltd. | Voltage converter of semiconductor device |
| US4937477A (en) * | 1988-01-19 | 1990-06-26 | Supertex, Inc. | Integrated mos high-voltage level-translation circuit, structure and method |
| JP2600753B2 (ja) * | 1988-02-03 | 1997-04-16 | 日本電気株式会社 | 入力回路 |
| WO1991002408A1 (en) * | 1989-07-28 | 1991-02-21 | Dallas Semiconductor Corporation | Line-powered integrated circuit transceiver |
| US5107149A (en) * | 1990-12-18 | 1992-04-21 | Synaptics, Inc. | Linear, continuous-time, two quadrant multiplier |
| ATE134082T1 (de) * | 1991-11-11 | 1996-02-15 | Philips Electronics Nv | Anordnung zum liefern elektrischer energie zu einer last |
| DE69417622T2 (de) * | 1993-04-30 | 1999-09-09 | Stmicroelectronics | Spannungskomparator mit einer Summierung von auf dem Bandgap-Prinzip beruhenden Gleichströmen und diesen enthaltender Versorgungsspannungsschalter |
| US5406140A (en) * | 1993-06-07 | 1995-04-11 | National Semiconductor Corporation | Voltage translation and overvoltage protection |
| JP2727921B2 (ja) * | 1993-08-13 | 1998-03-18 | 日本電気株式会社 | 半導体集積回路装置 |
| JP3566745B2 (ja) * | 1994-01-25 | 2004-09-15 | 新日本製鐵株式会社 | 電圧変換装置 |
| US5594381A (en) * | 1994-04-29 | 1997-01-14 | Maxim Integrated Products | Reverse current prevention method and apparatus and reverse current guarded low dropout circuits |
| US5650672A (en) * | 1995-09-25 | 1997-07-22 | Xilinx Inc | High-voltage power multiplexor |
| US6163044A (en) | 1998-02-18 | 2000-12-19 | Micron Technology, Inc. | Method and circuit for lowering standby current in an integrated circuit |
| US6859074B2 (en) * | 2001-01-09 | 2005-02-22 | Broadcom Corporation | I/O circuit using low voltage transistors which can tolerate high voltages even when power supplies are powered off |
| US6847248B2 (en) * | 2001-01-09 | 2005-01-25 | Broadcom Corporation | Sub-micron high input voltage tolerant input output (I/O) circuit which accommodates large power supply variations |
| SE520306C2 (sv) * | 2001-01-31 | 2003-06-24 | Ericsson Telefon Ab L M | Regulator för en halvledarkrets |
| US7138836B2 (en) * | 2001-12-03 | 2006-11-21 | Broadcom Corporation | Hot carrier injection suppression circuit |
| CN112100117A (zh) * | 2019-06-18 | 2020-12-18 | 北京小米移动软件有限公司 | 电源复用电路、数据信号的切换方法及装置、电子设备 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3936676A (en) * | 1974-05-16 | 1976-02-03 | Hitachi, Ltd. | Multi-level voltage supply circuit for liquid crystal display device |
| JPS5227400A (en) * | 1975-08-27 | 1977-03-01 | Sharp Corp | Power source device |
| JPS55149871A (en) * | 1978-07-31 | 1980-11-21 | Fujitsu Ltd | Line voltage detector |
| US4295176A (en) * | 1979-09-04 | 1981-10-13 | Bell Telephone Laboratories, Incorporated | Semiconductor integrated circuit protection arrangement |
| US4463270A (en) * | 1980-07-24 | 1984-07-31 | Fairchild Camera & Instrument Corp. | MOS Comparator circuit |
| US4384350A (en) * | 1980-11-03 | 1983-05-17 | Fairchild Camera & Instrument Corp. | MOS Battery backup controller for microcomputer random access memory |
| EP0061513B1 (de) * | 1981-04-01 | 1984-10-10 | Deutsche ITT Industries GmbH | Integrierte Auswahlschaltung in CMOS-Technik für vier Potentiale und deren Vereinfachung für drei Potentiale |
| US4513212A (en) * | 1982-07-22 | 1985-04-23 | Electronics Pty. Ltd. | Automatic P-well clamping for CMOS integrated circuit |
| US4473758A (en) * | 1983-02-07 | 1984-09-25 | Motorola Inc. | Substrate bias control circuit and method |
-
1983
- 1983-11-17 US US06/552,933 patent/US4556804A/en not_active Expired - Lifetime
-
1984
- 1984-11-15 JP JP59241563A patent/JPS60120420A/ja active Granted
- 1984-11-16 KR KR1019840007193A patent/KR930001745B1/ko not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60120420A (ja) | 1985-06-27 |
| JPH0451093B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1992-08-18 |
| US4556804A (en) | 1985-12-03 |
| KR850003645A (ko) | 1985-06-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19841116 |
|
| PG1501 | Laying open of application | ||
| A201 | Request for examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 19891116 Comment text: Request for Examination of Application Patent event code: PA02011R01I Patent event date: 19841116 Comment text: Patent Application |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 19920929 Patent event code: PE09021S01D |
|
| G160 | Decision to publish patent application | ||
| PG1605 | Publication of application before grant of patent |
Comment text: Decision on Publication of Application Patent event code: PG16051S01I Patent event date: 19930212 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 19930524 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 19930611 Patent event code: PR07011E01D |
|
| PR1002 | Payment of registration fee |
Payment date: 19930611 End annual number: 3 Start annual number: 1 |
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| PR1001 | Payment of annual fee |
Payment date: 19960112 Start annual number: 4 End annual number: 4 |
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| PR1001 | Payment of annual fee |
Payment date: 19961228 Start annual number: 5 End annual number: 5 |
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| PR1001 | Payment of annual fee |
Payment date: 19971230 Start annual number: 6 End annual number: 6 |
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| PR1001 | Payment of annual fee |
Payment date: 19990112 Start annual number: 7 End annual number: 7 |
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| PR1001 | Payment of annual fee |
Payment date: 20000108 Start annual number: 8 End annual number: 8 |
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| PR1001 | Payment of annual fee |
Payment date: 20010118 Start annual number: 9 End annual number: 9 |
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| PR1001 | Payment of annual fee |
Payment date: 20020128 Start annual number: 10 End annual number: 10 |
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| PR1001 | Payment of annual fee |
Payment date: 20030123 Start annual number: 11 End annual number: 11 |
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| FPAY | Annual fee payment |
Payment date: 20040113 Year of fee payment: 12 |
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| PR1001 | Payment of annual fee |
Payment date: 20040113 Start annual number: 12 End annual number: 12 |
|
| EXPY | Expiration of term | ||
| PC1801 | Expiration of term |