KR920003477A - 금속 배선층 형성 방법 - Google Patents

금속 배선층 형성 방법

Info

Publication number
KR920003477A
KR920003477A KR1019900010027A KR900010027A KR920003477A KR 920003477 A KR920003477 A KR 920003477A KR 1019900010027 A KR1019900010027 A KR 1019900010027A KR 900010027 A KR900010027 A KR 900010027A KR 920003477 A KR920003477 A KR 920003477A
Authority
KR
South Korea
Prior art keywords
wiring layer
metal wiring
formation method
layer formation
metal
Prior art date
Application number
KR1019900010027A
Other languages
English (en)
Other versions
KR930005485B1 (ko
Inventor
박창수
Original Assignee
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자 주식회사 filed Critical 삼성전자 주식회사
Priority to KR1019900010027A priority Critical patent/KR930005485B1/ko
Priority to DE4028776A priority patent/DE4028776C2/de
Priority to IT02151590A priority patent/IT1244563B/it
Priority to JP2254053A priority patent/JPH0465831A/ja
Priority to GB9020519A priority patent/GB2245596B/en
Priority to FR9011624A priority patent/FR2664295B1/fr
Publication of KR920003477A publication Critical patent/KR920003477A/ko
Priority to US07/897,294 priority patent/US5318923A/en
Application granted granted Critical
Publication of KR930005485B1 publication Critical patent/KR930005485B1/ko

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Electrodes Of Semiconductors (AREA)
KR1019900010027A 1990-07-03 1990-07-03 금속 배선층 형성 방법 KR930005485B1 (ko)

Priority Applications (7)

Application Number Priority Date Filing Date Title
KR1019900010027A KR930005485B1 (ko) 1990-07-03 1990-07-03 금속 배선층 형성 방법
DE4028776A DE4028776C2 (de) 1990-07-03 1990-09-11 Verfahren zur Bildung einer metallischen Verdrahtungsschicht und Füllen einer Kontaktöffnung in einem Halbleiterbauelement
IT02151590A IT1244563B (it) 1990-07-03 1990-09-19 Un metodo per formare uno strato di metallo in un dispositivo a semiconduttore.
JP2254053A JPH0465831A (ja) 1990-07-03 1990-09-20 金属配線層形成方法
GB9020519A GB2245596B (en) 1990-07-03 1990-09-20 A method of forming a metal wiring layer
FR9011624A FR2664295B1 (fr) 1990-07-03 1990-09-20 Procede de formation d'une couche metallique a travers un trou de contact.
US07/897,294 US5318923A (en) 1990-07-03 1992-06-11 Method for forming a metal wiring layer in a semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019900010027A KR930005485B1 (ko) 1990-07-03 1990-07-03 금속 배선층 형성 방법

Publications (2)

Publication Number Publication Date
KR920003477A true KR920003477A (ko) 1992-02-29
KR930005485B1 KR930005485B1 (ko) 1993-06-22

Family

ID=19300844

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019900010027A KR930005485B1 (ko) 1990-07-03 1990-07-03 금속 배선층 형성 방법

Country Status (2)

Country Link
KR (1) KR930005485B1 (ko)
IT (1) IT1244563B (ko)

Also Published As

Publication number Publication date
IT1244563B (it) 1994-07-28
IT9021515A0 (it) 1990-09-19
KR930005485B1 (ko) 1993-06-22
IT9021515A1 (it) 1992-03-19

Similar Documents

Publication Publication Date Title
KR890004402A (ko) 실리콘 함유 금속층을 선택적으로 형성하는 방법
TR23951A (tr) Kaplanmis metal tabaka
DE69321543T2 (de) Gefärbte Schicht
KR930703332A (ko) 금속 배위 착화합물의 제조방법
DE69221327T2 (de) Schmierhölherstellungsverfahren
DE69534965D1 (de) Abscheidungsverfahren
DE69314450D1 (de) Bohrlochzementierung
NO951007L (no) Fremgangsmåte for bestemmelse av resistiviteten til en formasjon
NO963570L (no) Fremgangsmåte for fremstilling av kobberpyrition
GB2245596B (en) A method of forming a metal wiring layer
KR850000781A (ko) 패턴 형성 방법
NO921218D0 (no) Reseptor-rensemetode
DE69128667D1 (de) Positionsbestimmungsmethode
ITTO911046A0 (it) Metodo di sgrassaggio-pulitura
IT1270841B (it) Metodo per produrre formilimidazoli
DK96392D0 (da) Modifikationsmetode
ID870B (id) Metode pembuatan ritsleting
DE3850176D1 (de) Verdrahtungsverfahren.
DE69312082D1 (de) Elektronisches steuerungsverfahren
KR920003477A (ko) 금속 배선층 형성 방법
FI924208A (fi) Bestrykningsanordning
KR910017574A (ko) 층간배선 금속의 제조방법
FI925074A0 (fi) Hierarkkinen synkronointimenetelmä
KR900008633A (ko) 더블메탈배선방법
KR920008913A (ko) 금속배선 공정에서의 패턴 형성방법

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20100528

Year of fee payment: 18

EXPY Expiration of term