KR910018808A - 아날로그 ic의 노이즈 테스트장치 - Google Patents
아날로그 ic의 노이즈 테스트장치 Download PDFInfo
- Publication number
- KR910018808A KR910018808A KR1019900005122A KR900005122A KR910018808A KR 910018808 A KR910018808 A KR 910018808A KR 1019900005122 A KR1019900005122 A KR 1019900005122A KR 900005122 A KR900005122 A KR 900005122A KR 910018808 A KR910018808 A KR 910018808A
- Authority
- KR
- South Korea
- Prior art keywords
- noise
- outputs
- analog
- receives
- ics
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제2도는 본 발명에 따른 아날로그 IC의 노이즈 테스트 장치구성도.
Claims (1)
- 병렬로 연결된 8개의 측정용 IC(1)의 각 노이즈 출력을 받아 각 노이즈 성분중 오디오 주파수 범위의 노이즈만을 검출하는 밴드패스필터(2)와, 상기 각 밴드패스필터(2)의 출력을 각각 받아 증폭하는 앰프(3)와, 상기 각 앰프(3)의 출력을 각각 인가받아 특성판정 비교전압과 비교하여 IC의 양품/불량품을 판정선별하는 로직비교기(5)를 포함하여 구성된 것을 특징으로 하는 아날로그 IC의 노이즈 테스트장치.※ 참고사항 : 최초출원내용에 의하여 공개하는 것임.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019900005122A KR930002447B1 (ko) | 1990-04-13 | 1990-04-13 | 아날로그 ic의 노이즈 테스트 장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019900005122A KR930002447B1 (ko) | 1990-04-13 | 1990-04-13 | 아날로그 ic의 노이즈 테스트 장치 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR910018808A true KR910018808A (ko) | 1991-11-30 |
| KR930002447B1 KR930002447B1 (ko) | 1993-03-30 |
Family
ID=19297966
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019900005122A KR930002447B1 (ko) | 1990-04-13 | 1990-04-13 | 아날로그 ic의 노이즈 테스트 장치 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR930002447B1 (ko) |
-
1990
- 1990-04-13 KR KR1019900005122A patent/KR930002447B1/ko not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR930002447B1 (ko) | 1993-03-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| E902 | Notification of reason for refusal | ||
| G160 | Decision to publish patent application | ||
| E701 | Decision to grant or registration of patent right | ||
| GRNT | Written decision to grant | ||
| FPAY | Annual fee payment |
Payment date: 20050221 Year of fee payment: 13 |
|
| LAPS | Lapse due to unpaid annual fee |