KR910013492A - 배선층간의 절연막 평탄화방법 - Google Patents
배선층간의 절연막 평탄화방법 Download PDFInfo
- Publication number
- KR910013492A KR910013492A KR1019890020709A KR890020709A KR910013492A KR 910013492 A KR910013492 A KR 910013492A KR 1019890020709 A KR1019890020709 A KR 1019890020709A KR 890020709 A KR890020709 A KR 890020709A KR 910013492 A KR910013492 A KR 910013492A
- Authority
- KR
- South Korea
- Prior art keywords
- insulating film
- wiring layers
- heat treatment
- planarization method
- treatment process
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 8
- 238000010438 heat treatment Methods 0.000 claims 5
- 238000007796 conventional method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/34—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups H01L21/0405, H01L21/0445, H01L21/06, H01L21/16 and H01L21/18 with or without impurities, e.g. doping materials
- H01L21/46—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428
- H01L21/461—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/469—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After-treatment of these layers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Formation Of Insulating Films (AREA)
Abstract
내용 없음.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 이상적으로 배선층간의 절연막을 평탄화시킨 단면도,
제2A도 및 제2B도는 종래 배선층간의 절연막 평탄화 방법을 도시한 공정순서도,
제3도는 제2B도의 공정조건을 나타낸 도면.
Claims (2)
- 열처리 공정에 의한 배선층간의 절연막 평탄화 방법에 있어서, 상기 열처리 공정은 저온 열처리 공정과, 고온 열처리 공정의 2단계로 이루어짐을 특징으로 하는 배선층간의 절연막 평탄화방법.
- 제1항에 있어서, 상기 고운 열처리 공정은 O2분위기에서 이루어지는 것을 특징으로 하는 배선층간의 절연막 평탄화방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019890020709A KR940011742B1 (ko) | 1989-12-30 | 1989-12-30 | 배선층간의 절연막 평탄화방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019890020709A KR940011742B1 (ko) | 1989-12-30 | 1989-12-30 | 배선층간의 절연막 평탄화방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR910013492A true KR910013492A (ko) | 1991-08-08 |
KR940011742B1 KR940011742B1 (ko) | 1994-12-23 |
Family
ID=19294762
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019890020709A KR940011742B1 (ko) | 1989-12-30 | 1989-12-30 | 배선층간의 절연막 평탄화방법 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR940011742B1 (ko) |
-
1989
- 1989-12-30 KR KR1019890020709A patent/KR940011742B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR940011742B1 (ko) | 1994-12-23 |
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