KR20250105374A - 감광성 수지 조성물, 경화물, 및 반도체 소자 - Google Patents

감광성 수지 조성물, 경화물, 및 반도체 소자 Download PDF

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Publication number
KR20250105374A
KR20250105374A KR1020257013342A KR20257013342A KR20250105374A KR 20250105374 A KR20250105374 A KR 20250105374A KR 1020257013342 A KR1020257013342 A KR 1020257013342A KR 20257013342 A KR20257013342 A KR 20257013342A KR 20250105374 A KR20250105374 A KR 20250105374A
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KR
South Korea
Prior art keywords
resin composition
photosensitive resin
diamine
group
meth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020257013342A
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English (en)
Korean (ko)
Inventor
후미히코 가와우치
다츠야 마키노
기예르모 페르난데즈
Original Assignee
가부시끼가이샤 레조낙
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 가부시끼가이샤 레조낙 filed Critical 가부시끼가이샤 레조낙
Publication of KR20250105374A publication Critical patent/KR20250105374A/ko
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
    • C08G73/14Polyamide-imides
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/032Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
    • G03F7/037Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polyamides or polyimides
    • H01L21/02118
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/68Organic materials, e.g. photoresists
    • H10P14/683Organic materials, e.g. photoresists carbon-based polymeric organic materials, e.g. polyimides, poly cyclobutene or PVC
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00Interconnections in chips, wafers or substrates
    • H10W20/40Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
    • H10W20/45Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes characterised by their insulating parts
    • H10W20/48Insulating materials thereof

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Materials For Photolithography (AREA)
KR1020257013342A 2022-11-08 2023-11-07 감광성 수지 조성물, 경화물, 및 반도체 소자 Pending KR20250105374A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPPCT/JP2022/041551 2022-11-08
PCT/JP2022/041551 WO2024100764A1 (ja) 2022-11-08 2022-11-08 感光性樹脂組成物、硬化物、及び半導体素子
PCT/JP2023/040068 WO2024101358A1 (ja) 2022-11-08 2023-11-07 感光性樹脂組成物、硬化物、及び半導体素子

Publications (1)

Publication Number Publication Date
KR20250105374A true KR20250105374A (ko) 2025-07-08

Family

ID=91032351

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020257013342A Pending KR20250105374A (ko) 2022-11-08 2023-11-07 감광성 수지 조성물, 경화물, 및 반도체 소자

Country Status (6)

Country Link
US (1) US20250271757A1 (https=)
JP (1) JPWO2024101358A1 (https=)
KR (1) KR20250105374A (https=)
CN (1) CN119096199A (https=)
TW (1) TW202421674A (https=)
WO (2) WO2024100764A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025100369A1 (ja) * 2023-11-06 2025-05-15 株式会社レゾナック マレイミド樹脂、樹脂組成物、硬化物、シート、積層体、及びプリント配線板
WO2025187616A1 (ja) * 2024-03-08 2025-09-12 三菱瓦斯化学株式会社 樹脂組成物、硬化物、プリプレグ、金属箔張積層板、樹脂複合シート、プリント配線板、および、半導体装置
WO2025187615A1 (ja) * 2024-03-08 2025-09-12 三菱瓦斯化学株式会社 樹脂組成物、硬化物、プリプレグ、金属箔張積層板、樹脂複合シート、プリント配線板、および、半導体装置
WO2025253919A1 (ja) * 2024-06-07 2025-12-11 住友化学株式会社 ポリイミド系樹脂、ポリアミック酸樹脂、ポリアミック酸樹脂組成物及びその硬化膜、並びに半導体パッケージ
JP2026020989A (ja) * 2024-07-29 2026-02-10 株式会社レゾナック 硬化性組成物の製造方法及び硬化性組成物用混合物
JP2026020986A (ja) * 2024-07-29 2026-02-10 株式会社レゾナック 硬化性組成物及び硬化物

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007057595A (ja) 2005-08-22 2007-03-08 Jsr Corp ポジ型感光性絶縁樹脂組成物およびその硬化物
JP2008309885A (ja) 2007-06-12 2008-12-25 Hitachi Chem Co Ltd ポジ型感光性樹脂組成物、レジストパターンの製造方法及び電子デバイス
WO2010073948A1 (ja) 2008-12-26 2010-07-01 日立化成工業株式会社 ポジ型感光性樹脂組成物、レジストパターンの製造方法、半導体装置及び電子デバイス

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102597875B1 (ko) * 2015-03-16 2023-11-03 다이요 홀딩스 가부시키가이샤 포지티브형 감광성 수지 조성물, 드라이 필름, 경화물 및 프린트 배선판
US20220179310A1 (en) * 2019-04-02 2022-06-09 Nippon Kayaku Kabushiki Kaisha Bismaleimide compound, photosensitive resin composition using same, cured product thereof, and semiconductor element
CN114207520B (zh) * 2019-08-01 2025-12-05 东丽株式会社 感光性树脂组合物、感光性片、固化膜、固化膜的制造方法、层间绝缘膜及电子部件
US20230095931A1 (en) * 2020-01-27 2023-03-30 Designer Molecules, Inc. Uv-curable resin compositions suitable for redistribution layers
KR102896548B1 (ko) * 2020-03-18 2025-12-08 도레이 카부시키가이샤 감광성 수지 조성물, 감광성 시트, 경화막, 경화막의 제조 방법, 전자 부품, 안테나 소자, 반도체 패키지 및 표시 장치
JP7306343B2 (ja) * 2020-07-17 2023-07-11 味の素株式会社 感光性樹脂組成物
WO2023106104A1 (ja) * 2021-12-09 2023-06-15 日産化学株式会社 感光性樹脂組成物

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007057595A (ja) 2005-08-22 2007-03-08 Jsr Corp ポジ型感光性絶縁樹脂組成物およびその硬化物
JP2008309885A (ja) 2007-06-12 2008-12-25 Hitachi Chem Co Ltd ポジ型感光性樹脂組成物、レジストパターンの製造方法及び電子デバイス
WO2010073948A1 (ja) 2008-12-26 2010-07-01 日立化成工業株式会社 ポジ型感光性樹脂組成物、レジストパターンの製造方法、半導体装置及び電子デバイス

Also Published As

Publication number Publication date
WO2024101358A1 (ja) 2024-05-16
WO2024100764A1 (ja) 2024-05-16
US20250271757A1 (en) 2025-08-28
TW202421674A (zh) 2024-06-01
CN119096199A (zh) 2024-12-06
JPWO2024101358A1 (https=) 2024-05-16

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