KR20240105478A - 반도체 프로세싱 작업에서의 개선된 에지 균일성을 위한 에지 링 - Google Patents

반도체 프로세싱 작업에서의 개선된 에지 균일성을 위한 에지 링 Download PDF

Info

Publication number
KR20240105478A
KR20240105478A KR1020247020476A KR20247020476A KR20240105478A KR 20240105478 A KR20240105478 A KR 20240105478A KR 1020247020476 A KR1020247020476 A KR 1020247020476A KR 20247020476 A KR20247020476 A KR 20247020476A KR 20240105478 A KR20240105478 A KR 20240105478A
Authority
KR
South Korea
Prior art keywords
edge
edge ring
section
ring
recessed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020247020476A
Other languages
English (en)
Korean (ko)
Inventor
아난드 찬드라셰카르
레오나르드 와이 펑 코
손 보 남 트란
자레드 아마드 리
라울 비야스
강 리우
자스마인 린
Original Assignee
램 리써치 코포레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 램 리써치 코포레이션 filed Critical 램 리써치 코포레이션
Publication of KR20240105478A publication Critical patent/KR20240105478A/ko
Pending legal-status Critical Current

Links

Classifications

    • H01L21/68735
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7606Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32623Mechanical discharge control means
    • H01J37/32642Focus rings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7611Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge profile or support profile

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Drying Of Semiconductors (AREA)
  • Chemical Vapour Deposition (AREA)
KR1020247020476A 2021-11-22 2022-11-21 반도체 프로세싱 작업에서의 개선된 에지 균일성을 위한 에지 링 Pending KR20240105478A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202163264437P 2021-11-22 2021-11-22
US63/264,437 2021-11-22
PCT/US2022/080276 WO2023092135A1 (en) 2021-11-22 2022-11-21 Edge rings for improved edge uniformity in semiconductor processing operations

Publications (1)

Publication Number Publication Date
KR20240105478A true KR20240105478A (ko) 2024-07-05

Family

ID=86397905

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020247020476A Pending KR20240105478A (ko) 2021-11-22 2022-11-21 반도체 프로세싱 작업에서의 개선된 에지 균일성을 위한 에지 링

Country Status (6)

Country Link
US (1) US20250014938A1 (https=)
JP (1) JP2024541727A (https=)
KR (1) KR20240105478A (https=)
CN (1) CN118302849A (https=)
TW (1) TW202341341A (https=)
WO (1) WO2023092135A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG11202010375QA (en) 2018-04-20 2020-11-27 Lam Res Corp Edge exclusion control
KR20220012999A (ko) 2020-02-11 2022-02-04 램 리써치 코포레이션 웨이퍼 베벨/에지 상의 증착을 제어하기 위한 캐리어 링 설계들

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5676360A (en) * 1995-07-11 1997-10-14 Boucher; John N. Machine tool rotary table locking apparatus
US6547559B1 (en) * 2002-05-20 2003-04-15 Veeco Instruments, Inc. Clamping of a semiconductor substrate for gas-assisted heat transfer in a vacuum chamber
US20070065597A1 (en) * 2005-09-15 2007-03-22 Asm Japan K.K. Plasma CVD film formation apparatus provided with mask
US9997381B2 (en) * 2013-02-18 2018-06-12 Lam Research Corporation Hybrid edge ring for plasma wafer processing
US20160002778A1 (en) * 2014-07-03 2016-01-07 Applied Materials, Inc. Substrate support with more uniform edge purge
GB201419210D0 (en) * 2014-10-29 2014-12-10 Spts Technologies Ltd Clamp assembly
KR102037168B1 (ko) * 2017-11-06 2019-10-28 세메스 주식회사 기판 처리 장치 및 기판 지지 유닛
SG11202010375QA (en) * 2018-04-20 2020-11-27 Lam Res Corp Edge exclusion control
WO2021179000A1 (en) * 2020-03-06 2021-09-10 Lam Research Corporation Ring structure with compliant centering fingers
US20230126912A1 (en) * 2021-10-27 2023-04-27 Asm Ip Holding B.V. Plasma cvd apparatus with a bevel mask with a planar inner edge

Also Published As

Publication number Publication date
US20250014938A1 (en) 2025-01-09
JP2024541727A (ja) 2024-11-11
WO2023092135A1 (en) 2023-05-25
CN118302849A (zh) 2024-07-05
TW202341341A (zh) 2023-10-16

Similar Documents

Publication Publication Date Title
US11443975B2 (en) Planar substrate edge contact with open volume equalization pathways and side containment
US12480208B2 (en) Dynamic sheath control with edge ring lift
US9698042B1 (en) Wafer centering in pocket to improve azimuthal thickness uniformity at wafer edge
KR102771879B1 (ko) 반도체 프로세싱을 위한 웨이퍼 포지셔닝 페데스탈
US10262887B2 (en) Pin lifter assembly with small gap
KR102490237B1 (ko) 기울어진 한정 링들을 갖는 플라즈마 프로세싱 시스템들 및 구조체들
TWI900520B (zh) 具有用於排放晶圓邊緣氣體的流動路徑的排除環
KR20210063478A (ko) 이동가능한 에지 링 설계들
KR102910385B1 (ko) 베벨 에칭기 (bevel etcher) 를 위한 하부 플라즈마 배제 존 링
CN116288281A (zh) 用于控制晶片晶边/边缘上的沉积的承载环设计
KR20240105478A (ko) 반도체 프로세싱 작업에서의 개선된 에지 균일성을 위한 에지 링
JP7770441B2 (ja) 半導体基板処理におけるペデスタルへの蒸着の防止
WO2020257147A1 (en) Use of vacuum during transfer of substrates
WO2024076479A1 (en) Adjustable pedestal

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

P11 Amendment of application requested

Free format text: ST27 STATUS EVENT CODE: A-2-2-P10-P11-NAP-X000 (AS PROVIDED BY THE NATIONAL OFFICE)

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13 Application amended

Free format text: ST27 STATUS EVENT CODE: A-2-2-P10-P13-NAP-X000 (AS PROVIDED BY THE NATIONAL OFFICE)

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

P22-X000 Classification modified

St.27 status event code: A-2-2-P10-P22-nap-X000