KR20240042886A - 도포 상태 분석 시스템 및 그 방법 - Google Patents
도포 상태 분석 시스템 및 그 방법 Download PDFInfo
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- KR20240042886A KR20240042886A KR1020220121706A KR20220121706A KR20240042886A KR 20240042886 A KR20240042886 A KR 20240042886A KR 1020220121706 A KR1020220121706 A KR 1020220121706A KR 20220121706 A KR20220121706 A KR 20220121706A KR 20240042886 A KR20240042886 A KR 20240042886A
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- 238000004458 analytical method Methods 0.000 title claims abstract description 100
- 238000000034 method Methods 0.000 title claims abstract description 51
- 239000011248 coating agent Substances 0.000 claims abstract description 100
- 238000000576 coating method Methods 0.000 claims abstract description 100
- 239000002904 solvent Substances 0.000 claims abstract description 61
- 238000007689 inspection Methods 0.000 claims description 121
- 230000002950 deficient Effects 0.000 claims description 61
- 238000001228 spectrum Methods 0.000 claims description 35
- 238000012545 processing Methods 0.000 claims description 33
- 230000000873 masking effect Effects 0.000 claims description 10
- 238000005286 illumination Methods 0.000 claims description 6
- 230000003595 spectral effect Effects 0.000 claims description 5
- 238000004020 luminiscence type Methods 0.000 claims description 4
- 238000005516 engineering process Methods 0.000 abstract description 3
- 230000008569 process Effects 0.000 description 8
- 230000004044 response Effects 0.000 description 7
- 230000008901 benefit Effects 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000004891 communication Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
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- 238000005507 spraying Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/90—Determination of colour characteristics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N2021/1765—Method using an image detector and processing of image signal
- G01N2021/177—Detector of the video camera type
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8809—Adjustment for highlighting flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8845—Multiple wavelengths of illumination or detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020220121706A KR102698877B1 (ko) | 2022-09-26 | 2022-09-26 | 도포 상태 분석 시스템 및 그 방법 |
| PCT/KR2023/010641 WO2024071617A1 (fr) | 2022-09-26 | 2023-07-24 | Système d'analyse d'état d'application et procédé associé |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020220121706A KR102698877B1 (ko) | 2022-09-26 | 2022-09-26 | 도포 상태 분석 시스템 및 그 방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20240042886A true KR20240042886A (ko) | 2024-04-02 |
| KR102698877B1 KR102698877B1 (ko) | 2024-08-26 |
Family
ID=90478268
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020220121706A KR102698877B1 (ko) | 2022-09-26 | 2022-09-26 | 도포 상태 분석 시스템 및 그 방법 |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR102698877B1 (fr) |
| WO (1) | WO2024071617A1 (fr) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007240431A (ja) * | 2006-03-10 | 2007-09-20 | Omron Corp | 欠陥検査装置および欠陥検査方法 |
| KR20150137474A (ko) * | 2014-05-29 | 2015-12-09 | 제이엘씨(주) | 컬러 이미지 분리를 이용한 비전검사 방법 |
| KR101640425B1 (ko) | 2016-04-11 | 2016-07-18 | (주)디엠소프트 | 실러 도포 상태 검사 시스템 및 방법 |
| JP2016206691A (ja) * | 2014-07-24 | 2016-12-08 | 株式会社プロスパークリエイティブ | 画像検査装置及び画像検査プログラム |
| JP2016206760A (ja) * | 2015-04-17 | 2016-12-08 | 有限会社修榮シール | 色判別方法及び色判別装置、並びに印刷機色調制御方法 |
| KR20170126847A (ko) * | 2016-04-08 | 2017-11-20 | 신닛테츠스미킨 카부시키카이샤 | 금속체의 표면 상태 감시 장치 및 금속체의 표면 상태 감시 방법 |
-
2022
- 2022-09-26 KR KR1020220121706A patent/KR102698877B1/ko active IP Right Grant
-
2023
- 2023-07-24 WO PCT/KR2023/010641 patent/WO2024071617A1/fr unknown
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007240431A (ja) * | 2006-03-10 | 2007-09-20 | Omron Corp | 欠陥検査装置および欠陥検査方法 |
| KR20150137474A (ko) * | 2014-05-29 | 2015-12-09 | 제이엘씨(주) | 컬러 이미지 분리를 이용한 비전검사 방법 |
| JP2016206691A (ja) * | 2014-07-24 | 2016-12-08 | 株式会社プロスパークリエイティブ | 画像検査装置及び画像検査プログラム |
| JP2016206760A (ja) * | 2015-04-17 | 2016-12-08 | 有限会社修榮シール | 色判別方法及び色判別装置、並びに印刷機色調制御方法 |
| KR20170126847A (ko) * | 2016-04-08 | 2017-11-20 | 신닛테츠스미킨 카부시키카이샤 | 금속체의 표면 상태 감시 장치 및 금속체의 표면 상태 감시 방법 |
| KR101640425B1 (ko) | 2016-04-11 | 2016-07-18 | (주)디엠소프트 | 실러 도포 상태 검사 시스템 및 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR102698877B1 (ko) | 2024-08-26 |
| WO2024071617A1 (fr) | 2024-04-04 |
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