KR20240024614A - X선 감쇄 필터를 포함하는 원통형 배터리 비파괴 검사 장치 및 비파괴 검사 장치 방법 - Google Patents
X선 감쇄 필터를 포함하는 원통형 배터리 비파괴 검사 장치 및 비파괴 검사 장치 방법 Download PDFInfo
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- KR20240024614A KR20240024614A KR1020220102814A KR20220102814A KR20240024614A KR 20240024614 A KR20240024614 A KR 20240024614A KR 1020220102814 A KR1020220102814 A KR 1020220102814A KR 20220102814 A KR20220102814 A KR 20220102814A KR 20240024614 A KR20240024614 A KR 20240024614A
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- cylindrical battery
- attenuation filter
- flat panel
- panel detector
- ray
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- 238000009659 non-destructive testing Methods 0.000 claims description 16
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/304—Accessories, mechanical or electrical features electric circuits, signal processing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/313—Accessories, mechanical or electrical features filters, rotating filter disc
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/50—Detectors
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- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020220102814A KR20240024614A (ko) | 2022-08-17 | 2022-08-17 | X선 감쇄 필터를 포함하는 원통형 배터리 비파괴 검사 장치 및 비파괴 검사 장치 방법 |
| PCT/KR2022/015740 WO2024038954A1 (fr) | 2022-08-17 | 2022-10-17 | Dispositif de contrôle non destructif de batterie cylindrique comprenant un filtre d'atténuation de rayons x et un contrôle non destructif de batterie cylindrique, et procédé |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020220102814A KR20240024614A (ko) | 2022-08-17 | 2022-08-17 | X선 감쇄 필터를 포함하는 원통형 배터리 비파괴 검사 장치 및 비파괴 검사 장치 방법 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20240024614A true KR20240024614A (ko) | 2024-02-26 |
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ID=89941955
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020220102814A KR20240024614A (ko) | 2022-08-17 | 2022-08-17 | X선 감쇄 필터를 포함하는 원통형 배터리 비파괴 검사 장치 및 비파괴 검사 장치 방법 |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR20240024614A (fr) |
| WO (1) | WO2024038954A1 (fr) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102300230B1 (ko) | 2020-01-09 | 2021-09-09 | (주)자비스 | 회전 이송 구조의 엑스레이 검사 장치 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4041025B2 (ja) * | 2003-07-15 | 2008-01-30 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | Ｘ線分布調整フィルタ装置およびそれを用いたｘ線ｃｔ装置 |
| US6968042B2 (en) * | 2003-09-12 | 2005-11-22 | Ge Medical Systems Global Technology Company, Llc | Methods and apparatus for target angle heel effect compensation |
| KR20150041239A (ko) * | 2013-10-07 | 2015-04-16 | 삼성전자주식회사 | 엑스선 영상 장치 및 그 제어 방법 |
| JP6799917B2 (ja) * | 2015-12-21 | 2020-12-16 | 浜松ホトニクス株式会社 | 放射線検出装置、放射線検査システム、及び、放射線検出装置の調整方法 |
| CN114527149A (zh) * | 2021-12-27 | 2022-05-24 | 深圳市日联科技有限公司 | 动力卷绕电池的x射线穿透式补偿检测装置及方法 |
-
2022
- 2022-08-17 KR KR1020220102814A patent/KR20240024614A/ko not_active Application Discontinuation
- 2022-10-17 WO PCT/KR2022/015740 patent/WO2024038954A1/fr unknown
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102300230B1 (ko) | 2020-01-09 | 2021-09-09 | (주)자비스 | 회전 이송 구조의 엑스레이 검사 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024038954A1 (fr) | 2024-02-22 |
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