KR20240012484A - 어레이형 초음파 영상 장치 및 그 제어 방법 - Google Patents

어레이형 초음파 영상 장치 및 그 제어 방법 Download PDF

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Publication number
KR20240012484A
KR20240012484A KR1020237044039A KR20237044039A KR20240012484A KR 20240012484 A KR20240012484 A KR 20240012484A KR 1020237044039 A KR1020237044039 A KR 1020237044039A KR 20237044039 A KR20237044039 A KR 20237044039A KR 20240012484 A KR20240012484 A KR 20240012484A
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KR
South Korea
Prior art keywords
ultrasonic
probe
array
scanning
reflected wave
Prior art date
Application number
KR1020237044039A
Other languages
English (en)
Korean (ko)
Inventor
다꾸야 기시모또
가오루 기따미
마꼬또 가미나가
Original Assignee
가부시키가이샤 히타치 파워 솔루션즈
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 히타치 파워 솔루션즈 filed Critical 가부시키가이샤 히타치 파워 솔루션즈
Publication of KR20240012484A publication Critical patent/KR20240012484A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/265—Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
    • G01N29/341—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with time characteristics
    • G01N29/343—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with time characteristics pulse waves, e.g. particular sequence of pulses, bursts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/0289—Internal structure, e.g. defects, grain size, texture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/10—Number of transducers
    • G01N2291/102—Number of transducers one emitter, one receiver

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
KR1020237044039A 2021-06-25 2022-06-14 어레이형 초음파 영상 장치 및 그 제어 방법 KR20240012484A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021105609A JP6990794B1 (ja) 2021-06-25 2021-06-25 アレイ型超音波映像装置及びその制御方法
JPJP-P-2021-105609 2021-06-25
PCT/JP2022/023826 WO2022270362A1 (ja) 2021-06-25 2022-06-14 アレイ型超音波映像装置及びその制御方法

Publications (1)

Publication Number Publication Date
KR20240012484A true KR20240012484A (ko) 2024-01-29

Family

ID=80185448

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020237044039A KR20240012484A (ko) 2021-06-25 2022-06-14 어레이형 초음파 영상 장치 및 그 제어 방법

Country Status (5)

Country Link
JP (1) JP6990794B1 (ja)
KR (1) KR20240012484A (ja)
CN (1) CN117546017A (ja)
TW (1) TWI828194B (ja)
WO (1) WO2022270362A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2022209235A1 (ja) 2021-03-31 2022-10-06
JP7368654B1 (ja) 2023-06-28 2023-10-24 株式会社日立パワーソリューションズ 超音波映像装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007263780A (ja) 2006-03-29 2007-10-11 Hitachi Engineering & Services Co Ltd 超音波検査方法及び超音波検査装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0614033B2 (ja) * 1987-01-19 1994-02-23 日立建機株式会社 超音波検査方法
JP2583939B2 (ja) * 1988-02-03 1997-02-19 日立建機株式会社 超音波探傷装置
JPH06138109A (ja) * 1992-10-29 1994-05-20 Hitachi Constr Mach Co Ltd 超音波検査方法および装置
JP4181007B2 (ja) * 2003-10-14 2008-11-12 アロカ株式会社 超音波診断装置
JP2010000198A (ja) * 2008-06-19 2010-01-07 Toshiba Corp 超音波診断装置及び超音波診断装置制御プログラム
JP5559993B2 (ja) * 2009-06-22 2014-07-23 株式会社日立メディコ 超音波診断装置及びその画像処理方法
JP2015154815A (ja) * 2014-02-20 2015-08-27 キヤノン株式会社 被検体情報取得装置およびその制御方法
JP6543109B2 (ja) * 2015-06-30 2019-07-10 株式会社日立パワーソリューションズ 超音波探触子および超音波検査装置
JP6989416B2 (ja) * 2017-08-25 2022-01-05 株式会社東芝 リニアスキャン超音波探傷装置およびリニアスキャン超音波探傷方法
JP6479243B1 (ja) * 2018-07-02 2019-03-06 株式会社日立パワーソリューションズ 超音波映像システム
KR20200110960A (ko) * 2019-03-18 2020-09-28 삼성메디슨 주식회사 초음파 진단 장치 및 그 제어 방법

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007263780A (ja) 2006-03-29 2007-10-11 Hitachi Engineering & Services Co Ltd 超音波検査方法及び超音波検査装置

Also Published As

Publication number Publication date
TWI828194B (zh) 2024-01-01
JP6990794B1 (ja) 2022-01-12
WO2022270362A1 (ja) 2022-12-29
CN117546017A (zh) 2024-02-09
JP2023004106A (ja) 2023-01-17
TW202300911A (zh) 2023-01-01

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