KR20230072379A - Ic 테스트 장치 - Google Patents

Ic 테스트 장치 Download PDF

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Publication number
KR20230072379A
KR20230072379A KR1020220049676A KR20220049676A KR20230072379A KR 20230072379 A KR20230072379 A KR 20230072379A KR 1020220049676 A KR1020220049676 A KR 1020220049676A KR 20220049676 A KR20220049676 A KR 20220049676A KR 20230072379 A KR20230072379 A KR 20230072379A
Authority
KR
South Korea
Prior art keywords
test
vertical
horizontal
balance
screw
Prior art date
Application number
KR1020220049676A
Other languages
English (en)
Korean (ko)
Inventor
즈전 류
Original Assignee
항저우 창촨 테크놀로지 컴퍼니, 리미티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 항저우 창촨 테크놀로지 컴퍼니, 리미티드 filed Critical 항저우 창촨 테크놀로지 컴퍼니, 리미티드
Publication of KR20230072379A publication Critical patent/KR20230072379A/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020220049676A 2021-11-17 2022-04-21 Ic 테스트 장치 KR20230072379A (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
CN202111361197.8 2021-11-17
CN202111361197.8A CN114264929A (zh) 2021-11-17 2021-11-17 Ic测试装置
CN202210310233.6 2022-03-28
CN202210310233.6A CN114660439A (zh) 2021-11-17 2022-03-28 Ic测试装置

Publications (1)

Publication Number Publication Date
KR20230072379A true KR20230072379A (ko) 2023-05-24

Family

ID=80825097

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020220049676A KR20230072379A (ko) 2021-11-17 2022-04-21 Ic 테스트 장치

Country Status (3)

Country Link
KR (1) KR20230072379A (zh)
CN (2) CN114264929A (zh)
TW (1) TWI839734B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102678985B1 (ko) * 2024-03-26 2024-06-28 한화시스템(주) 적층형 전자모듈 분해장치

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024092402A1 (zh) * 2022-10-31 2024-05-10 中广核检测技术有限公司 一种视觉引导的紧固螺栓智能检测装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW504121U (en) * 2000-05-26 2002-09-21 Contrel Semiconductor Tech Co IC inserting device capable of precisely controlling downward pressing force
DE60220553T2 (de) * 2002-12-04 2008-01-31 Advantest Corp. Presselement und vorrichtung für ein elektronisches bauelement
JP2005265786A (ja) * 2004-03-22 2005-09-29 Seiko Epson Corp 押圧方法、押圧装置、ｉｃハンドラ及びｉｃ検査装置
JP2013061359A (ja) * 2013-01-10 2013-04-04 Seiko Epson Corp 電子部品の押圧装置及びｉｃハンドラ
TWI717803B (zh) * 2019-08-14 2021-02-01 日月光半導體製造股份有限公司 測試設備及測試方法
CN214391160U (zh) * 2021-01-07 2021-10-15 杭州长川科技股份有限公司 分选机

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102678985B1 (ko) * 2024-03-26 2024-06-28 한화시스템(주) 적층형 전자모듈 분해장치

Also Published As

Publication number Publication date
CN114660439A (zh) 2022-06-24
TW202321719A (zh) 2023-06-01
CN114264929A (zh) 2022-04-01
TWI839734B (zh) 2024-04-21

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