KR20230047328A - 시간 계측 장치, 형광 수명 계측 장치, 및 시간 계측 방법 - Google Patents

시간 계측 장치, 형광 수명 계측 장치, 및 시간 계측 방법 Download PDF

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Publication number
KR20230047328A
KR20230047328A KR1020227044160A KR20227044160A KR20230047328A KR 20230047328 A KR20230047328 A KR 20230047328A KR 1020227044160 A KR1020227044160 A KR 1020227044160A KR 20227044160 A KR20227044160 A KR 20227044160A KR 20230047328 A KR20230047328 A KR 20230047328A
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South Korea
Prior art keywords
time
signal
measurement
tac
detection signal
Prior art date
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Withdrawn
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KR1020227044160A
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English (en)
Korean (ko)
Inventor
후미노리 니이쿠라
아유무 요시미
겐 기타자와
다카유키 이노우에
Original Assignee
하마마츠 포토닉스 가부시키가이샤
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Priority claimed from PCT/JP2021/018263 external-priority patent/WO2022030062A1/ja
Publication of KR20230047328A publication Critical patent/KR20230047328A/ko
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/005—Time-to-digital converters [TDC]
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/10—Apparatus for measuring unknown time intervals by electric means by measuring electric or magnetic quantities changing in proportion to time
    • G04F10/105—Apparatus for measuring unknown time intervals by electric means by measuring electric or magnetic quantities changing in proportion to time with conversion of the time-intervals
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F13/00—Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00
    • G04F13/02—Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00 using optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G01N2021/6415—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence with two excitations, e.g. strong pump/probe flash
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/123—Conversion circuit

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
KR1020227044160A 2020-08-06 2021-05-13 시간 계측 장치, 형광 수명 계측 장치, 및 시간 계측 방법 Withdrawn KR20230047328A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2020-133839 2020-08-06
JP2020133839 2020-08-06
PCT/JP2021/018263 WO2022030062A1 (ja) 2020-08-06 2021-05-13 時間計測装置、蛍光寿命計測装置、及び時間計測方法

Publications (1)

Publication Number Publication Date
KR20230047328A true KR20230047328A (ko) 2023-04-07

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020227044160A Withdrawn KR20230047328A (ko) 2020-08-06 2021-05-13 시간 계측 장치, 형광 수명 계측 장치, 및 시간 계측 방법

Country Status (5)

Country Link
US (1) US20230288336A1 (enExample)
EP (1) EP4170436A4 (enExample)
JP (2) JP6946599B1 (enExample)
KR (1) KR20230047328A (enExample)
CN (1) CN115803689A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025004353A1 (ja) * 2023-06-30 2025-01-02 日本電信電話株式会社 測定装置、測定方法、及びプログラム

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003522946A (ja) 2000-02-10 2003-07-29 エボテック オーアーイー アクチェンゲゼルシャフト 蛍光強度及び寿命分布分析

Family Cites Families (14)

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Publication number Priority date Publication date Assignee Title
JPS5576919A (en) * 1978-12-06 1980-06-10 Japan Spectroscopic Co Measuring method for rapid time division spectroscopic analysis
JPS5972049A (ja) * 1982-10-19 1984-04-23 Horiba Ltd 試料の発光寿命測定装置
JPS59108261U (ja) * 1983-01-08 1984-07-21 株式会社堀場製作所 試料の発光寿命測定装置
DE102007026684B4 (de) * 2007-06-08 2009-03-19 Gesellschaft für Schwerionenforschung mbH Zeit-Amplituden-Konverter-Bauelement
EP2199830B1 (en) * 2008-12-19 2014-07-02 Leibniz-Institut für Neurobiologie A position resolved measurement apparatus and a method for acquiring space coordinates of a quantum beam incident thereon
JP2010266291A (ja) * 2009-05-13 2010-11-25 Mitsubishi Electric Corp 時間計測回路
CN102545669A (zh) * 2010-12-21 2012-07-04 台达电子工业股份有限公司 具有电容转换功能的太阳能光电系统
CN201926878U (zh) * 2010-12-23 2011-08-10 中国科学院西安光学精密机械研究所 一种光子序列到达时间的连续测量装置
WO2013034770A2 (en) * 2011-09-08 2013-03-14 Borowski, André Time-to-digital converter, 3d imager using same, method for time-to-digital conversion and method for 3d imaging
DE102011055330B4 (de) * 2011-11-14 2024-10-31 Leica Microsystems Cms Gmbh Verfahren zum Messen der Lebensdauer eines angeregten Zustandes in einer Probe
JP5978266B2 (ja) * 2014-09-03 2016-08-24 浜松ホトニクス株式会社 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法
EP3465156B1 (de) * 2016-05-25 2020-03-18 Leica Microsystems CMS GmbH Fluoreszenzlebensdauer-mikroskopieverfahren mit zeitkorrelierter einzelphotonenzählung welches höhere lichtintensitäten zulässt, und entsprechende vorrichtung
KR102035019B1 (ko) * 2017-09-20 2019-10-22 주식회사 유진로봇 거리 측정 장치, 시간 디지털 변환기, 및 이동체
CN110568749B (zh) * 2019-08-30 2021-04-09 华中师范大学 时间数字转换器电路、装置、设备及装置的控制方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003522946A (ja) 2000-02-10 2003-07-29 エボテック オーアーイー アクチェンゲゼルシャフト 蛍光強度及び寿命分布分析

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Publication number Publication date
JP7660049B2 (ja) 2025-04-10
EP4170436A4 (en) 2024-07-10
JP2022031264A (ja) 2022-02-18
JP6946599B1 (ja) 2021-10-06
EP4170436A1 (en) 2023-04-26
JPWO2022030062A1 (enExample) 2022-02-10
US20230288336A1 (en) 2023-09-14
CN115803689A (zh) 2023-03-14

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PA0105 International application

Patent event date: 20221215

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1202 Submission of document of withdrawal before decision of registration

Comment text: [Withdrawal of Procedure relating to Patent, etc.] Withdrawal (Abandonment)

Patent event code: PC12021R01D

Patent event date: 20240326

WITB Written withdrawal of application