CN115803689A - 时间测量装置、荧光寿命测量装置及时间测量方法 - Google Patents

时间测量装置、荧光寿命测量装置及时间测量方法 Download PDF

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Publication number
CN115803689A
CN115803689A CN202180046560.9A CN202180046560A CN115803689A CN 115803689 A CN115803689 A CN 115803689A CN 202180046560 A CN202180046560 A CN 202180046560A CN 115803689 A CN115803689 A CN 115803689A
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CN
China
Prior art keywords
time
signal
measurement
tac
detection signal
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Pending
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CN202180046560.9A
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English (en)
Chinese (zh)
Inventor
新仓史智
吉见步
北泽健
井上贵之
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Hamamatsu Photonics KK
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Hamamatsu Photonics KK
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Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority claimed from PCT/JP2021/018263 external-priority patent/WO2022030062A1/ja
Publication of CN115803689A publication Critical patent/CN115803689A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/005—Time-to-digital converters [TDC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F10/00—Apparatus for measuring unknown time intervals by electric means
    • G04F10/10—Apparatus for measuring unknown time intervals by electric means by measuring electric or magnetic quantities changing in proportion to time
    • G04F10/105—Apparatus for measuring unknown time intervals by electric means by measuring electric or magnetic quantities changing in proportion to time with conversion of the time-intervals
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F13/00—Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00
    • G04F13/02—Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00 using optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G01N2021/6415—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence with two excitations, e.g. strong pump/probe flash
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/123—Conversion circuit

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
CN202180046560.9A 2020-08-06 2021-05-13 时间测量装置、荧光寿命测量装置及时间测量方法 Pending CN115803689A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020-133839 2020-08-06
JP2020133839 2020-08-06
PCT/JP2021/018263 WO2022030062A1 (ja) 2020-08-06 2021-05-13 時間計測装置、蛍光寿命計測装置、及び時間計測方法

Publications (1)

Publication Number Publication Date
CN115803689A true CN115803689A (zh) 2023-03-14

Family

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Family Applications (1)

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CN202180046560.9A Pending CN115803689A (zh) 2020-08-06 2021-05-13 时间测量装置、荧光寿命测量装置及时间测量方法

Country Status (5)

Country Link
US (1) US20230288336A1 (enExample)
EP (1) EP4170436A4 (enExample)
JP (2) JP6946599B1 (enExample)
KR (1) KR20230047328A (enExample)
CN (1) CN115803689A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025004353A1 (ja) * 2023-06-30 2025-01-02 日本電信電話株式会社 測定装置、測定方法、及びプログラム

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59108261U (ja) * 1983-01-08 1984-07-21 株式会社堀場製作所 試料の発光寿命測定装置
US20100171530A1 (en) * 2007-06-08 2010-07-08 Gsi Helmholtzzentrum Fuer Schwerionenforschung Gmbh Time-to-amplitude converter component
JP2010266291A (ja) * 2009-05-13 2010-11-25 Mitsubishi Electric Corp 時間計測回路
CN102545669A (zh) * 2010-12-21 2012-07-04 台达电子工业股份有限公司 具有电容转换功能的太阳能光电系统
CN103105383A (zh) * 2011-11-14 2013-05-15 徕卡显微系统复合显微镜有限公司 测量样本中激发态寿命的方法
CN106716266A (zh) * 2014-09-03 2017-05-24 浜松光子学株式会社 时间测量装置、时间测量方法、发光寿命测量装置及发光寿命测量方法
KR20190032938A (ko) * 2017-09-20 2019-03-28 주식회사 유진로봇 거리 측정 장치, 시간 디지털 변환기, 및 이동체
CN110568749A (zh) * 2019-08-30 2019-12-13 华中师范大学 时间数字转换器电路、装置、设备及装置的控制方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5576919A (en) * 1978-12-06 1980-06-10 Japan Spectroscopic Co Measuring method for rapid time division spectroscopic analysis
JPS5972049A (ja) * 1982-10-19 1984-04-23 Horiba Ltd 試料の発光寿命測定装置
US6690463B2 (en) 2000-02-10 2004-02-10 Evotec Biosystems Ag Fluorescence intensity and lifetime distribution analysis
EP2199830B1 (en) 2008-12-19 2014-07-02 Leibniz-Institut für Neurobiologie A position resolved measurement apparatus and a method for acquiring space coordinates of a quantum beam incident thereon
CN201926878U (zh) * 2010-12-23 2011-08-10 中国科学院西安光学精密机械研究所 一种光子序列到达时间的连续测量装置
EP2753988B1 (en) * 2011-09-08 2019-10-30 Fastree 3D Bv Time-to-digital converter and method therefor
CN109477796B (zh) 2016-05-25 2022-05-31 徕卡显微系统复合显微镜有限公司 允许更高光强度的利用时间相关单光子计数的荧光寿命成像显微学方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59108261U (ja) * 1983-01-08 1984-07-21 株式会社堀場製作所 試料の発光寿命測定装置
US20100171530A1 (en) * 2007-06-08 2010-07-08 Gsi Helmholtzzentrum Fuer Schwerionenforschung Gmbh Time-to-amplitude converter component
JP2010266291A (ja) * 2009-05-13 2010-11-25 Mitsubishi Electric Corp 時間計測回路
CN102545669A (zh) * 2010-12-21 2012-07-04 台达电子工业股份有限公司 具有电容转换功能的太阳能光电系统
CN103105383A (zh) * 2011-11-14 2013-05-15 徕卡显微系统复合显微镜有限公司 测量样本中激发态寿命的方法
CN106716266A (zh) * 2014-09-03 2017-05-24 浜松光子学株式会社 时间测量装置、时间测量方法、发光寿命测量装置及发光寿命测量方法
KR20190032938A (ko) * 2017-09-20 2019-03-28 주식회사 유진로봇 거리 측정 장치, 시간 디지털 변환기, 및 이동체
CN110568749A (zh) * 2019-08-30 2019-12-13 华中师范大学 时间数字转换器电路、装置、设备及装置的控制方法

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Publication number Publication date
EP4170436A1 (en) 2023-04-26
US20230288336A1 (en) 2023-09-14
JP6946599B1 (ja) 2021-10-06
JP7660049B2 (ja) 2025-04-10
JPWO2022030062A1 (enExample) 2022-02-10
EP4170436A4 (en) 2024-07-10
KR20230047328A (ko) 2023-04-07
JP2022031264A (ja) 2022-02-18

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