KR20220160007A - 촬상 장치 및 전자 기기 - Google Patents
촬상 장치 및 전자 기기 Download PDFInfo
- Publication number
- KR20220160007A KR20220160007A KR1020227034842A KR20227034842A KR20220160007A KR 20220160007 A KR20220160007 A KR 20220160007A KR 1020227034842 A KR1020227034842 A KR 1020227034842A KR 20227034842 A KR20227034842 A KR 20227034842A KR 20220160007 A KR20220160007 A KR 20220160007A
- Authority
- KR
- South Korea
- Prior art keywords
- transistor
- circuit
- electrically connected
- layer
- drain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
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- H04N5/378—
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- H01L27/14612—
-
- H01L27/14636—
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/703—SSIS architectures incorporating pixels for producing signals other than image signals
- H04N25/705—Pixels for depth measurement, e.g. RGBZ
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
- H10F39/8037—Pixels having integrated switching, control, storage or amplification elements the integrated elements comprising a transistor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/811—Interconnections
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Thin Film Transistor (AREA)
- Image Processing (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2020-057810 | 2020-03-27 | ||
| JP2020057810 | 2020-03-27 | ||
| PCT/IB2021/052110 WO2021191719A1 (ja) | 2020-03-27 | 2021-03-15 | 撮像装置および電子機器 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20220160007A true KR20220160007A (ko) | 2022-12-05 |
Family
ID=77890986
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020227034842A Pending KR20220160007A (ko) | 2020-03-27 | 2021-03-15 | 촬상 장치 및 전자 기기 |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US12041366B2 (https=) |
| JP (3) | JP7603059B2 (https=) |
| KR (1) | KR20220160007A (https=) |
| CN (1) | CN115336254A (https=) |
| WO (1) | WO2021191719A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12147888B2 (en) * | 2020-11-12 | 2024-11-19 | Samsung Electronics Co., Ltd. | Neural computer including image sensor capable of controlling photocurrent |
| JP2024011770A (ja) * | 2022-07-15 | 2024-01-25 | 日本放送協会 | 撮像素子、撮像装置および撮像素子の製造方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011119711A (ja) | 2009-11-06 | 2011-06-16 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
| JP2016123087A (ja) | 2014-12-10 | 2016-07-07 | 株式会社半導体エネルギー研究所 | 半導体装置および電子機器 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3642591B2 (ja) * | 1994-11-29 | 2005-04-27 | 株式会社日立メディコ | 画像処理装置 |
| US7151844B2 (en) * | 2001-12-06 | 2006-12-19 | General Motors Corporation | Image sensor method and apparatus having hardware implemented edge detection processing |
| US7215370B2 (en) * | 2003-07-23 | 2007-05-08 | Alphaplus Semiconductor Inc. | Pseudo-BJT based retinal focal-plane sensing system |
| JP2008199414A (ja) | 2007-02-14 | 2008-08-28 | Matsushita Electric Ind Co Ltd | 光電変換装置、イメージセンサ及びイメージングシステム |
| EP1971129A1 (en) | 2007-03-16 | 2008-09-17 | STMicroelectronics (Research & Development) Limited | Improvements in or relating to image sensors |
| JP2012175259A (ja) | 2011-02-18 | 2012-09-10 | Olympus Corp | 固体撮像装置 |
| US9762834B2 (en) * | 2014-09-30 | 2017-09-12 | Qualcomm Incorporated | Configurable hardware for computing computer vision features |
| WO2016179533A1 (en) * | 2015-05-06 | 2016-11-10 | Indiana University Research And Technology Corporation | Sensor signal processing using an analog neural network |
| JP2017063420A (ja) * | 2015-09-25 | 2017-03-30 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| KR102631381B1 (ko) * | 2016-11-07 | 2024-01-31 | 삼성전자주식회사 | 컨볼루션 신경망 처리 방법 및 장치 |
| US11039099B2 (en) | 2016-11-24 | 2021-06-15 | Sony Semiconductor Solutions Corporation | Solid-state imaging element, solid-state imaging apparatus, and method for controlling solid-state imaging element |
| CN114628425A (zh) | 2017-05-26 | 2022-06-14 | 株式会社半导体能源研究所 | 摄像装置及电子设备 |
| JP7144413B2 (ja) | 2017-07-14 | 2022-09-29 | 株式会社半導体エネルギー研究所 | 撮像装置 |
| JP6975606B2 (ja) | 2017-10-11 | 2021-12-01 | 浜松ホトニクス株式会社 | 固体撮像装置 |
-
2021
- 2021-03-15 JP JP2022509744A patent/JP7603059B2/ja active Active
- 2021-03-15 CN CN202180024385.3A patent/CN115336254A/zh active Pending
- 2021-03-15 KR KR1020227034842A patent/KR20220160007A/ko active Pending
- 2021-03-15 WO PCT/IB2021/052110 patent/WO2021191719A1/ja not_active Ceased
- 2021-03-15 US US17/911,193 patent/US12041366B2/en active Active
-
2024
- 2024-05-20 US US18/668,606 patent/US12238435B2/en active Active
- 2024-12-09 JP JP2024214402A patent/JP7781246B2/ja active Active
-
2025
- 2025-01-17 US US19/029,199 patent/US20250168527A1/en active Pending
- 2025-11-25 JP JP2025202950A patent/JP2026026156A/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011119711A (ja) | 2009-11-06 | 2011-06-16 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
| JP2016123087A (ja) | 2014-12-10 | 2016-07-07 | 株式会社半導体エネルギー研究所 | 半導体装置および電子機器 |
Also Published As
| Publication number | Publication date |
|---|---|
| US12238435B2 (en) | 2025-02-25 |
| JP2026026156A (ja) | 2026-02-16 |
| JPWO2021191719A1 (https=) | 2021-09-30 |
| JP7603059B2 (ja) | 2024-12-19 |
| JP2025026614A (ja) | 2025-02-21 |
| US20250168527A1 (en) | 2025-05-22 |
| US12041366B2 (en) | 2024-07-16 |
| JP7781246B2 (ja) | 2025-12-05 |
| US20230109524A1 (en) | 2023-04-06 |
| US20240305909A1 (en) | 2024-09-12 |
| CN115336254A (zh) | 2022-11-11 |
| WO2021191719A1 (ja) | 2021-09-30 |
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| JP7781246B2 (ja) | 撮像装置および電子機器 | |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| D21 | Rejection of application intended |
Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D21-EXM-PE0902 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |