KR20210080025A - Optical film defect detection device, method and system having same - Google Patents

Abstract

Provided are an apparatus and a method for detecting a defect of an optical film, and a system having the same, comprising: a defect information receiving unit for receiving defect information about an optical film roll from at least one inspection apparatus; a defect position determining unit, on the basis of the defect information, for determining positions of the defects on a two-dimensional plane corresponding to the optical film roll; a periodic defect detection unit for detecting a periodic defect based on the determined defect position and an interval between the defects; and a general defect detection unit for detecting a defect, as a general defect, that satisfies a preset condition among the defects excluding defects detected as the periodic defect from the defects.

Description

Optical film defect detection device, method and system having the same

The present invention relates to an optical film defect detection apparatus and a system having the same.

Various image display devices, such as a liquid crystal display, an organic light emitting display, a field emission display (FED), and a plasma display panel (PDP), have been widely developed and used in recent years.

On the other hand, an image display device undergoes several inspection processes because various defects occur during the manufacturing process before being shipped to the market. Among them, one of the most used parts in an image display device is various optical films such as a polarizing film and a retardation film. Therefore, the defect of the optical film is one of the main causes of the defect of the image display device. Detecting a defect in an optical film first determines whether it is a defect and makes an accurate decision. After that, if it is determined as a defect, repair or disposal according to the defect, and furthermore, removal of the cause of the defect, etc. It can't be an important part.

The manufacture of optical films typically uses a line process for industrial mass production. Accordingly, the detection of the defect consists in determining the defect in the photographed portion by continuously photographing the optical film at a specific position of the line.

However, as the cost of parts increases with the recent trend of increasing the size of optical films, a more accurate defect determination method is required, and therefore, a method capable of accurately determining a defect is still required.

An object of the present invention is to provide a method for accurately discriminating defects of an optical film including periodic defects of the optical film.

An optical film defect detection apparatus according to the spirit of the present invention comprises: a defect information receiving unit for receiving defect information about the optical film roll from at least one inspection device; a defect positioning unit for determining positions of defects on a two-dimensional plane corresponding to the optical film roll, based on the defect information; a periodic defect detection unit configured to detect periodic defects based on the determined positions of the defects and an interval between the defects; and a general defect detection unit configured to detect, as a general defect, a defect that satisfies a preset condition among the defects except for the defects detected as the periodic defect from the defects.

The periodicity defect detection unit may detect defects having the same width direction with respect to the moving direction of the optical film roll and having the same spacing in the moving direction among the defects as the periodicity defect.

It may further include a; defect detection information generating unit for generating defect detection information for the detected periodic defect or the general defect.

The defect detection information of the periodic defect is determined to be defective among the plurality of transfer rolls based on the interval of the defects in the periodic defect and the circumferential length of the plurality of transfer rolls for transferring the pre-stored optical film roll Information on at least one transfer roll may be generated together.

The defect detection information generating unit may transmit the defect detection information to at least one of a manager terminal of the process management system, a worker terminal of the optical film processing line, and a warning device on the process line.

In the optical film defect detection system according to the spirit of the present invention, in the optical film defect detection system including the optical film defect detection device, when the periodic defect or the general defect is detected, the optical film roll It further includes a marking device for performing marking on the defect.

The marking device may perform a first marking on a defect corresponding to the periodic defect and a second marking on a defect corresponding to the general defect, and the first and second markings may have different shapes.

A method for detecting defects in an optical film according to an aspect of the present invention comprises the steps of: receiving defect information about an optical film roll from at least one inspection device; determining positions of defects on a two-dimensional plane corresponding to the optical film roll based on the defect information; detecting a periodicity defect based on the determined defect position and an interval between the defects; detecting, as a general defect, a defect satisfying a preset condition among the defects excluding the defects corresponding to the periodicity defect from the defects; and marking defects corresponding to the periodic defects and the general defects in the optical film roll.

According to an aspect of the present invention, it is possible to determine a periodic defect, thereby improving the manufacturing yield of the optical film.

According to one aspect of the present invention, the quality of the optical film can be managed on a consistent basis irrespective of the production amount of the optical film by automatically determining the occurrence of periodic defects included in the optical film, and the detection time of periodic defects By shortening it, productivity can be improved.

Furthermore, according to the embodiments of the present invention, by enabling to quickly identify and notify the occurrence of periodic defects in the optical film, rapid measures can be taken according to the occurrence of periodic defects, which results in production loss of the optical film ) can be reduced.

Furthermore, according to embodiments of the present invention, it is possible to first check the periodic defect in the optical film and determine the general defect, so that the system load for defect detection can be minimized.

1 is a block diagram of an optical film defect detection system according to an embodiment of the present invention.
2 is a block diagram of a defect detection unit of an optical film defect detection apparatus according to an embodiment of the present invention.
Figure 3 is a view related to the transport of the optical film.
Figure 4 is a view briefly showing an optical film marked by the marking device of the optical film defect detection device according to an embodiment of the present invention.
5 is a flowchart of an optical film defect detection apparatus according to an embodiment of the present invention.

The configuration shown in the embodiments and drawings described in this specification is only a preferred example of the disclosed invention, and there may be various modifications that can replace the embodiments and drawings of the present specification at the time of filing of the present application.

In addition, the same reference numbers or reference numerals in each drawing in the present specification indicate parts or components that perform substantially the same functions.

In addition, the terms used herein are used to describe the embodiments, and are not intended to limit and/or limit the disclosed invention. The singular expression includes the plural expression unless the context clearly dictates otherwise. In this specification, terms such as "comprises" or "have" are intended to designate that the features, numbers, steps, operations, components, parts, or combinations thereof described in the specification exist, but one or more other features It does not preclude the possibility of the presence or addition of figures, numbers, steps, operations, components, parts, or combinations thereof.

In addition, terms including ordinal numbers such as “first” and “second” used in this specification may be used to describe various components, but the components are not limited by the terms, and the terms are It is used only for the purpose of distinguishing one component from another. For example, without departing from the scope of the present invention, a first component may be referred to as a second component, and similarly, a second component may also be referred to as a first component. The term “and/or” includes any combination of a plurality of related listed items or any of a plurality of related listed items.

In addition, terms such as "~ part", "~ group", "~ block", "~ member", and "~ module" may mean a unit for processing at least one function or operation. For example, the terms may mean at least one process processed by at least one hardware such as a field-programmable gate array (FPGA)/application specific integrated circuit (ASIC), at least one software stored in a memory, or a processor. have.

Hereinafter, an embodiment according to the present invention will be described in detail with reference to the accompanying drawings.

1 is a block diagram of an optical film defect detection system according to an embodiment of the present invention, and FIG. 2 is a block diagram of a defect detection unit of an optical film defect detection apparatus according to an embodiment of the present invention.

The optical film defect detection system 1 may include an inspection device 10 , an optical film defect detection device 20 , and a marking device 40 . The inspection device 10 and the marking device 40 may be communicatively connected to the optical film defect detection device 20 through a communication unit. The communication unit may include the Internet, one or more local area networks, wide area networks, cellular networks, mobile networks, other types of networks, or a combination of these networks.

The inspection apparatus 10 may be disposed at different positions on the optical film processing line to detect defects generated in the process of processing the optical film and generate defect information on the detected defects.

For example, the optical film is manufactured while being transported through a continuous process, for example, a roll-to-roll process using a transport roll 50 . The inspection apparatus 10 may include a camera module disposed on the upper surface of the optical film in the optical film processing line, and may be configured to photograph the optical film using the camera module and detect defects from the photographed image. In addition, for this purpose, a light source may be provided on the opposite surface of the surface on which the camera module is located based on the optical film, and the camera module may be configured to photograph light emitted from the light source and transmitted through the optical film. In this case, when there is a defect in the optical film, the light transmittance of the corresponding portion is lowered, so that the defect can be easily detected.

The defect information generated by the inspection apparatus 10 may include the location, size, brightness, image of the defect, and inspection start and end times of the detected defect.

In the present invention, a defect means a portion that deviates from the average uniformity of the optical film. Defects may be judged as 'good' because they are within the normal range, or as 'defects' that exceed the normal range and cause product defects, depending on the determination result.

Information on the defect generated by the inspection apparatus 10 may be transmitted to the defect detection apparatus 20 .

The defect detecting apparatus 20 may include a defect information receiving unit 22 , a defect positioning unit 24 , and a defect detecting unit 30 .

The defect information receiving unit 22 receives defect information about the optical film roll from the at least one inspection device 10 . The received defect information may include the location, size, brightness, image of the defect, inspection start and end times, and the like of the detected defect.

The defect positioning unit 24 determines the position of the defect on the two-dimensional plane corresponding to the optical film roll, based on the defect information received from the inspection device 10 .

For example, the defect positioning unit 120 configures a two-dimensional plane corresponding to the length and width of the optical film roll, and integrates the defect information received from each inspection device 10 to position the defect in the two-dimensional plane. can be decided In this case, the position of the defect in the two-dimensional plane may be determined based on the position of the defect included in the defect information received from each inspection apparatus 10 . In addition, the length and width of the optical film roll may use preset values.

The defect detection unit 30 may detect a defect based on the position of the defect determined by the defect positioning unit 24 .

The defect detecting unit 30 may include a periodic defect detecting unit 32 , a general defect detecting unit 34 , and a defect detection information generating unit 36 .

The periodic defect detection unit 32 may detect a periodic defect D1 (refer to FIG. 4 ) based on the position of the defect determined by the defect positioning unit 24 . In detail, the periodic defect detection unit 32 may detect the periodic defect based on the positions of the defects determined by the defect positioning unit 24 and the interval between the defects. In this case, the periodicity defect means a defect that occurs periodically at regular intervals.

Specifically, the periodicity defect detection unit 32 may detect a plurality of defects occurring at the same interval with the same width direction relative to the moving direction F of the optical film roll as periodic defects D1 .

The general defect detection unit 34 may detect a general defect D2 (refer to FIG. 4 ) based on the position of the defect determined by the defect positioning unit 24 . The general defect detection unit 34 may detect, except for defects corresponding to the periodic defect D1 detected by the periodic defect detection unit 32 .

The general defect detection unit 34 may detect a defect that does not correspond to a periodic defect but exceeds a preset criterion as a general defect D2 based on information about the size and brightness of the generated defect. That is, the general defect detection unit 34 may not detect a defect within a normal range as a defect. The preset criterion may be set based on information about size, shape, and brightness.

When a defect is detected, the defect detection information generating unit 36 may generate defect detection information regarding the detected defect. When the periodic defect D1 is detected, defect detection information regarding the detected periodic defect D1 may be generated. Also, when the general defect D2 is detected, general defect information regarding the detected general defect D2 may be generated. The defect detection information generating unit 36 may generate defect information by classifying the periodic defect D1 and the general defect D2.

3 is a view related to the transport of the optical film, FIG. 4 is a view briefly showing the optical film marked by the marking device of the optical film defect detection device according to an embodiment of the present invention.

The defect detection information for the periodic defect may include information about the transfer roll 50 that has generated the periodic defect in the optical film processing line. In detail, the defect detection information generating unit 36 determines that the defect is defective among the plurality of transfer rolls based on the interval of the defects in the periodic defect D1 and the circumferential length of the plurality of transfer rolls for transferring the pre-stored optical film roll. It is possible to generate information about the at least one transfer roll to be used. Specifically, as shown in FIG. 3 , in the plurality of conveying rolls, at least two types of conveying rolls 51 and 52 having different diameters may be disposed. The plurality of conveying rolls may include a first conveying roll 51 having a circumference of A, and a second conveying roll 52 having a circumference of B. As shown in FIG. 4, when the interval between the detected periodic defects D1 is A, the defect detection information generating unit 36 includes a first transfer roll 51 having a circumference of A in the defect detection information for the periodic defects D1. may be determined to be a defective transfer roll, and information on the first transfer roll 51 may also be included. Through this, when a defect occurs in the optical film, it is possible to facilitate maintenance of the optical film transfer roll because it is only necessary to check the transfer rolls suspected of being defective without checking all the transfer rolls.

The defect detection information generating unit 36 transmits the generated defect detection information to, for example, a manager terminal of a process management system, a terminal of a process line operator, or a warning device on a process line, so that an immediate action is taken against occurrence of a periodic defect. can make it happen

The marking device 40 may mark the corresponding defect based on the information detected as the defect by the defect detection unit 30 . In detail, the marking apparatus 40 may mark a defect based on the defect detection information generated by the defect detection information generating unit 36 .

The marking apparatus 40 may mark the periodic defect D1 and the general defect D2 separately from the defect detection information generated by the defect detection information generating unit 36 . That is, the marking device 40 may be different from the first marking (M1, see FIG. 4) for the periodic defect (D1) and the second marking (M2, see FIG. 4) for the general defect (D2). The first and second markings M1 and M2 may have different shapes or sizes of markings. Through this, the user can easily distinguish the periodicity defect (D1) and the general defect (D2).

Hereinafter, the operation of the optical film defect detection system of the present invention will be described.

5 is a flowchart of an optical film defect detection apparatus according to an embodiment of the present invention. It is a flow chart. In the illustrated flowchart, the method is described by dividing the method into a plurality of steps, but at least some of the steps are performed in a reversed order, are performed together in combination with other steps, are omitted, are performed separately, or are not shown. One or more steps may be added and performed.

Referring to FIG. 5 , the optical film defect detection device 20 may receive defect information on the optical film roll from at least one inspection device 10 ( S110 ).

Thereafter, the optical film defect detection apparatus 20 determines the position of the defect on the two-dimensional plane corresponding to the optical film roll based on the received defect information (S120).

Thereafter, the optical film defect detection apparatus 20 detects whether the detected defect is a periodic defect D1 based on the determined position of the defect ( S130 ). When the detected defect corresponds to the periodicity defect D1, defect detection information for the periodicity defect D1 is generated, and a first marking M1 is performed for the periodicity defect D1 (S140).

If the detected defect does not correspond to the periodic defect D1, it is detected whether it is a general defect D2 (S150). When the detected defect satisfies a preset condition, defect detection information is generated for the general defect D2, and a second marking M2 is performed on the general defect D2 (S160). If the detected defect does not satisfy the preset condition, it is not detected as a general defect (D2) and marking is not performed (S170).

The optical film defect detection device 20 transmits the generated defect detection information to a manager terminal of a process management system, a terminal of a process line operator, or a warning device on a process line.

An embodiment of the present invention may include a computer-readable recording medium containing a program for performing the methods described herein on a computer. The computer-readable recording medium may include program instructions, local data files, local data structures, and the like alone or in combination. The medium may be specially designed and configured for the present invention, or may be commonly used in the field of computer software. Examples of the computer-readable recording medium include magnetic media such as hard disks, floppy disks and magnetic tapes, optical recording media such as CD-ROMs and DVDs, magneto-optical media such as floppy disks, and ROMs, RAMs, flash memories, and the like. Hardware devices specifically configured to store and execute program instructions are included. Examples of program instructions may include not only machine language codes such as those generated by a compiler, but also high-level language codes that can be executed by a computer using an interpreter or the like.

In the above, specific embodiments have been shown and described. However, it is not limited only to the above-described embodiments, and those of ordinary skill in the art to which the invention pertains can make various changes without departing from the spirit of the invention described in the claims below. .

1: optical film defect detection system 10: inspection device
20: defect detection device 22: defective information receiving unit
24: defective positioning unit 30: defect detection unit
32: periodic defect detection unit 34: general defect detection unit
36: defect detection information generating unit 40: marking device

Claims (8)

a defect information receiving unit for receiving defect information about the optical film roll from at least one inspection device;
a defect positioning unit for determining positions of defects on a two-dimensional plane corresponding to the optical film roll, based on the defect information;
a periodic defect detection unit configured to detect periodic defects based on the determined positions of the defects and an interval between the defects;
Defect detection apparatus of an optical film comprising a; a general defect detection unit for detecting a defect satisfying a predetermined condition among the defects excluding the defects detected as the periodic defect from the defects as a general defect. The method of claim 1,
The periodicity defect detection unit,
An optical film defect detecting apparatus for detecting defects having the same width direction relative to the moving direction of the optical film roll and having the same interval in the advancing direction among the defects as the periodic defect. The method of claim 1,
Defect detection apparatus of an optical film further comprising a; defect detection information generating unit for generating defect detection information for the detected periodic defect or the general defect. 4. The method of claim 3,
The defect detection information of the periodic defect is,
Based on the interval of the defects in the periodicity defect and the circumferential length of the plurality of transfer rolls for transferring the pre-stored optical film roll, information on at least one transfer roll determined to be defective among the plurality of transfer rolls together An optical film defect detection device. 4. The method of claim 3,
The defect detection information generation unit,
An optical film defect detection device for transmitting the defect detection information to at least one of a manager terminal of a process management system, an operator terminal of the optical film process line, and a warning device on the process line. In the optical film defect detection system comprising the optical film defect detection device of claim 1,
The optical film defect detection system further comprising a; when the periodic defect or the general defect is detected, a marking device for performing marking on the corresponding defect in the optical film roll. 7. The method of claim 6,
The marking device,
A first marking is made on a defect corresponding to the periodicity defect, and a second marking is made on a defect corresponding to the general defect,
The first and second marking is a defect detection system of an optical film having a different shape. Receiving defect information about the optical film roll from at least one inspection device;
determining positions of defects on a two-dimensional plane corresponding to the optical film roll based on the defect information;
detecting a periodicity defect based on the determined defect position and an interval between the defects;
detecting, as a general defect, a defect satisfying a preset condition among the defects excluding the defects corresponding to the periodicity defect from the defects;
In the optical film roll, the periodic defect and the step of marking the defect corresponding to the general defect; Defect detection method of an optical film comprising a.

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