KR20200133052A - 영상 계측 장치 - Google Patents

영상 계측 장치 Download PDF

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Publication number
KR20200133052A
KR20200133052A KR1020190057006A KR20190057006A KR20200133052A KR 20200133052 A KR20200133052 A KR 20200133052A KR 1020190057006 A KR1020190057006 A KR 1020190057006A KR 20190057006 A KR20190057006 A KR 20190057006A KR 20200133052 A KR20200133052 A KR 20200133052A
Authority
KR
South Korea
Prior art keywords
image
view
characteristic
viewing angle
target point
Prior art date
Application number
KR1020190057006A
Other languages
English (en)
Korean (ko)
Inventor
김성엽
김수영
김태호
이민탁
허준
Original Assignee
삼성디스플레이 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성디스플레이 주식회사 filed Critical 삼성디스플레이 주식회사
Priority to KR1020190057006A priority Critical patent/KR20200133052A/ko
Priority to CN202010120227.5A priority patent/CN111947891A/zh
Publication of KR20200133052A publication Critical patent/KR20200133052A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nonlinear Science (AREA)
  • Geometry (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
KR1020190057006A 2019-05-15 2019-05-15 영상 계측 장치 KR20200133052A (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020190057006A KR20200133052A (ko) 2019-05-15 2019-05-15 영상 계측 장치
CN202010120227.5A CN111947891A (zh) 2019-05-15 2020-02-26 影像测量装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020190057006A KR20200133052A (ko) 2019-05-15 2019-05-15 영상 계측 장치

Publications (1)

Publication Number Publication Date
KR20200133052A true KR20200133052A (ko) 2020-11-26

Family

ID=73336936

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020190057006A KR20200133052A (ko) 2019-05-15 2019-05-15 영상 계측 장치

Country Status (2)

Country Link
KR (1) KR20200133052A (zh)
CN (1) CN111947891A (zh)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0694515A (ja) * 1992-09-11 1994-04-05 Olympus Optical Co Ltd 光発散特性測定装置
JP3231268B2 (ja) * 1997-11-19 2001-11-19 大塚電子株式会社 光学的視野角測定装置
JP3421299B2 (ja) * 2000-03-28 2003-06-30 科学技術振興事業団 輝度の視野角依存性ならびに場所依存性測定装置及びその測定方法
TW200510692A (en) * 2003-09-05 2005-03-16 Hawkeye Vision Technology Co Ltd Tilted view angle optic inspection method for panel and device thereof
JP2007017400A (ja) * 2005-07-11 2007-01-25 Sony Corp 視野角特性測定方法及び視野角特性測定装置
JP2010008188A (ja) * 2008-06-26 2010-01-14 Fujitsu Ltd 表示パネルの検査装置、検査方法及びこれを用いた表示パネルの製造方法
CN106249450A (zh) * 2016-09-05 2016-12-21 凌云光技术集团有限责任公司 一种液晶显示屏检测系统

Also Published As

Publication number Publication date
CN111947891A (zh) 2020-11-17

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