KR20190061149A - Optical film marking system - Google Patents

Abstract

The present invention relates to a marking system for an optical film, capable of forming a marking type of various combinations. According to embodiments of the present invention, the marking system for an optical film comprises: a transfer unit transferring the optical film; an inspection unit inspecting for defects in the optical film; and a marking unit forming a marking on the optical film based on a defect inspection result by the inspection unit. The marking unit comprises a first marking device disposed at the lower side of the inspection unit and including multiple first marking units arranged in a direction crossing a transfer direction of the optical film to form a first marking on the optical film, and a second marking device disposed on a lower side than that of the first marking device and including multiple second marking units arranged in a direction parallel to the direction in which the first marking units are arranged to form a second marking on the optical film. The second marking unit is disposed between two adjacent first marking units with respect to the direction parallel to the direction in which the first marking unit is arranged.

Description

[0001] OPTICAL FILM MARKING SYSTEM [0002]

Embodiments of the present invention are directed to an optical film marking system that inspects optical films and performs marking.

In-line automated optical inspection system is used for optical film inspection in production process of optical film. The in-line automatic optical inspection system performs ink or barcode marking at the defect occurrence position, thereby discarding the marked area in the post-process or allowing additional inspection by the inspection members to be performed. For example, Korean Patent Laid-Open No. 10-2008-0043279 discloses a marking control method of a polarizing film inspection apparatus.

However, there are various quality standards according to the property of the optical film and the inspection method, and the corresponding marking form does not vary so that it is difficult to distinguish the quality of the optical film.

Embodiments of the present invention provide an optical film marking system that performs various types of marking based on optical film inspection results in an optical film production process.

An optical film marking system according to an embodiment of the present invention includes a transfer unit for transferring an optical film, an inspection unit for inspecting defects of the optical film, and a marking on the optical film based on the inspection result inspected by the inspection unit Wherein the marking unit includes a plurality of first marking units arranged along a direction intersecting the transport direction of the optical film to form a first mark on the optical film And a plurality of second marking portions arranged in a direction parallel to the direction in which the first marking portions are arranged to form a second marking on the optical film And the second marking portion is disposed between two adjacent first marking portions on the basis of a direction parallel to the direction in which the first marking portions are arranged. The.

In this embodiment, the inspection unit includes a first optical inspection apparatus for inspecting the transmitted light transmitted through one surface of the optical film on one surface of the optical film, and a second optical inspection apparatus And a second light inspection device for inspecting reflected light reflected by the one surface of the light irradiated to the first light inspection device.

In the present embodiment, the optical film includes a polarizing film, and the inspection unit detects the polarized light having an absorption axis in a different direction from the polarizing film and the light irradiated on one of the both surfaces of the optical film And a third light inspection device for inspecting the transmitted light transmitted through the filter.

In this embodiment, the first marking and the second marking may differ in at least one of hue, saturation, brightness, shape, and size.

In this embodiment, in the optical film marking system of the present invention, the marking form to be formed through the marking unit according to the inspection result inspected by the inspection unit is predetermined, and the marking form corresponding to the inspection result inspected by the inspection unit And at least one operation marking unit to be operated among the plurality of first marking units and the plurality of second marking units for controlling the operation of the plurality of first marking units and the plurality of second marking units.

In this embodiment, the control unit may control whether the operation marking unit is operated by a predetermined number of times during the optical film feeding to form a marking pattern corresponding to the inspection result inspected by the inspection unit.

In this embodiment, the control unit can select the defective area on the optical film based on the defective position inspected by the inspection unit, and select the operation marking unit so that the marking form to be formed through the marking unit is located inside the defective area .

In this embodiment, the operation marking unit selected by the control unit is arranged between at least two first marking units adjacent to each other with reference to a direction parallel to the direction in which the first marking units are arranged, and between the two first marking units At least two second marking portions adjacent to each other with reference to a direction parallel to the direction in which the first marking portions are arranged and at least one second marking portion disposed between the two second marking portions, 1 marking portion.

In this embodiment, the first spacing distance between the adjacent two first marking portions and the second spacing distance between the adjacent two second marking portions may be equal to each other.

In this embodiment, the order of the first marking portion and the second marking portion may be alternated with respect to a direction parallel to the direction in which the first marking portions are arranged.

In this embodiment, the second marking portion may be disposed at the center between two adjacent first marking portions with reference to a direction parallel to the direction in which the first marking portions are arranged.

Embodiments of the present invention can perform various types of marking based on the result of optical film inspection in an optical film production process. Thus, when defect inspection of an optical film needs to be performed by diversifying the quality standard, it is possible to configure various marking forms corresponding to the various quality standards.

1 is a conceptual diagram showing an optical film marking system according to an embodiment of the present invention.
FIG. 2 is a conceptual diagram showing the operation principle of the optical film marking system shown in FIG. 1. FIG.
3 is a view showing various examples of various marking patterns that can be set according to defect information determined based on the type of light inspection apparatus, the type and degree of defect, and the like.
4 is a conceptual diagram showing two examples of the marking type and a process for forming the marking type.
FIG. 5 is a view showing examples of various marking forms that can be formed through the optical film marking system shown in FIG.

BRIEF DESCRIPTION OF THE DRAWINGS The present invention will become more apparent from the following detailed description taken in conjunction with the accompanying drawings, in which: FIG. The present invention may, however, be embodied in many different forms and should not be construed as being limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. Is provided to fully convey the scope of the invention to those skilled in the art, and the invention is only defined by the scope of the claims. It is to be understood that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. In the present specification, the singular form includes plural forms unless otherwise specified in the specification. It is noted that the terms "comprises" and / or "comprising" used in the specification are intended to be inclusive in a manner similar to the components, steps, operations, and / Or additions. The terms first, second, etc. may be used to describe various elements, but the elements should not be limited by terms. Terms are used only for the purpose of distinguishing one component from another.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

FIG. 1 is a conceptual diagram showing an optical film marking system according to an embodiment of the present invention, FIG. 2 is a conceptual view showing an operation principle of the optical film marking system shown in FIG. 1, And various types of marking that can be set according to defect information determined based on the type and degree of the defect.

FIG. 4 is a conceptual view showing two examples of marking shapes and a process for forming the marking shapes, and FIG. 5 is a view showing examples of various marking shapes that can be formed through the optical film marking system shown in FIG.

Referring to FIGS. 1, 2 and 4, an optical film marking system 1000 according to an embodiment of the present invention inspects defects of an optical film in an optical film production process, and distinguishes Can be formed. The marking formed on the optical film can be used as a mark capable of identifying the position of the defect included in the optical film, the kind of the defect, the degree of defect, etc. by an apparatus or the like capable of identifying the inspection circle or marking. The optical film marking system 1000 includes a transfer unit 1100, an inspection unit 1200 and a marking unit 1300. The marking unit 1300 includes a first marking unit 1310 and a second marking unit 1320 ).

Optical films are collectively referred to as plastic films used for optical purposes. The optical film may include a polarizing film that adjusts the direction of light. Such a polarizing film generally includes a polarizer having an absorption axis in a specific direction formed by stretching the PVA film so that incident light can be polarized, and a protective film formed on one or both sides of the polarizer by an adhesive or a pressure- have. The optical film may further include at least one of a retardation film, a visual compensation film, a brightness enhancement film, and a surface protective film. The optical film may include a pressure-sensitive adhesive layer coated with a pressure-sensitive adhesive so as to be adhered to the panel. The optical film may include a release film for fixing the pressure-sensitive adhesive layer or for preventing the foreign matter from adhering to the pressure-sensitive adhesive layer by exposing the pressure-sensitive adhesive layer. The optical film may have a polarizing film laminate structure in which a protective film is laminated on a polarizer or an optical film laminate structure in which a functional film and / or a release film are laminated on a polarizing film laminate.

The transfer unit 1100 can transfer the optical film. The optical film conveyed by the conveying unit 1100 may be in the form of a long fabric extending along the longitudinal direction. The transfer unit 1100 for transferring the optical film in the form of a prototype can transfer the optical film material downstream from the upstream of the transfer path by a so-called Roll To Roll process.

On the other hand, an optical film laminate roll can be produced through a lamination process of laminating a plurality of films to form an optical film laminate and a winding process of winding an optical film laminate formed by the laminating process, The optical film stack 1000 can perform the inspection and marking process described below by supplying such an optical film laminate roll. In this case, the transfer unit 1100 may include a supply roll 1110 that can mount the optical film laminate roll and unroll and supply the optical film laminate from the optical film laminate roll. The supply roll 1110 may be formed in a generally cylindrical shape. The supply roll 1110 may be rotatable in one direction. For example, the supply roll 1110 may rotate clockwise to supply the optical film.

However, a lapping process for laminating a plurality of films to form an optical film laminate may also be performed in the optical film marking system 1000, in which case the transfer unit 1100 is mounted on the optical film laminate roll, But it may not include the supply roll 1110 that unwinds the laminate.

The transfer unit 1100 may include a plurality of transfer rolls 1130 capable of transferring the optical film in the form of a fabric long along the transfer direction. The transfer unit 1100 may include a winding roll 1120 for winding the optical film after the inspection and marking process described below is performed on the optical film transferred by the plurality of transfer rolls 1130. The winding roll 1120 may be formed in a substantially cylindrical shape. The winding roll 1120 may be located a predetermined distance apart from the feed roll 1110 and / or the transport roll 1130 along the transport direction of the optical film. The winding roll 1120 can be formed rotatable in one direction. For example, the winding roll 1120 can be rotated clockwise to wind the optical film.

That is, the optical film is transferred to the downstream side of the conveyance path at a predetermined speed along the longitudinal direction thereof by the rotation of the supply roll 1110 and / or the conveyance roll 1130, and various processes including an inspection and marking process After this is performed, it can be wound by the winding roll 1120.

The inspection unit 1200 can inspect defects of the optical film. The defect is a part which is not to be included in the product, and may include a part other than a specification such as a thickness of a bubble, a foreign object, a speckle, a white spot, a hole, a stain, a scratch or a thin film, an optical characteristic,

The defect inspection of the optical film can be performed using an optical technique, an electric technique, or the like. For example, extraneous materials such as yarn or deformations of the film can be inspected by photographing the film using a camera. The film thickness of the thin film can be calculated based on reflected light or the like. The resistance of the electrode can be measured by a method of bringing the resistance measuring roll into contact with the surface of the thin film, or by a non-contact resistance meter or the like.

The inspection unit 1200 may include an inspection apparatus for inspecting defects of the optical film. The inspection unit 1200 preferably inspects the entire width direction of the film to inspect the defect. The inspection unit 1200 may be disposed apart from the optical film downstream of the transfer unit 1100. Hereinafter, for convenience of explanation, the case where the inspection apparatus included in the inspection unit 1200 is a light inspection apparatus that detects defects using an optical technique will be mainly described. Such a light inspection apparatus may include a light source 1200a for irradiating light to the optical film and a light receiving portion 1200b for sensing light transmitted through the optical film or light reflected by the optical film, .

For example, the inspection unit 1200 may include a first light inspection apparatus 1210. The first optical inspection apparatus 1210 can inspect transmitted light transmitted through one surface of the optical film through the other surface. The first light inspection apparatus 1210 may include a first light source for irradiating light onto the optical film. A plurality of first light sources may be provided. The first light source may be disposed apart from one surface of the optical film. The first light inspection apparatus 1210 may include a first light receiving unit that senses light transmitted through the optical film. The first light receiving portion may include a sensor for measuring a light amount of light irradiated to the optical film. A plurality of first light receiving units may be provided to correspond to the number of light sources. The plurality of first light sources and the first light receiving portions may be arranged along the width direction of the optical film. The first light receiving portion may be disposed apart from the opposite surface of the optical film on which light is irradiated. For example, the first light source may be disposed apart from the upper surface of the optical film, and the first light receiving portion may be disposed apart from the lower surface of the optical film. In the case where the optical film has defects in this material, the light quantity of the transmitted light passing through the defective position of the material on the optical film may be different from the light quantity of the transmitted light passing through the optical film in the normal area without defects. The defect information deriving unit 1500 described later determines whether the type of the defect is the logistics, the position of the product defect, the degree of the product defect according to the degree of the light quantity of the transmitted light examined through the first light inspection apparatus 1210 Specific defect information can be derived.

For example, the inspection unit 1200 may include a second light inspection apparatus 1220. The second light inspection apparatus 1220 can inspect the reflected light in which the light irradiated on one of the both surfaces of the optical film is reflected by the one surface. The second light inspection apparatus 1220 may include a second light source for irradiating the optical film with light. A plurality of second light sources may be provided. The second light source may be disposed apart from one surface of the optical film. The second light inspection apparatus 1220 may include a second light receiving unit that senses light reflected on the optical film. And the second light receiving portion may include a sensor for measuring the light amount of the light irradiated to the optical film. A plurality of second light receiving units may be provided to correspond to the number of the second light sources. The plurality of second light sources and the second light receiving portions may be arranged along the width direction of the optical film. And the second light receiving portion may be disposed apart from the same surface of the optical film on which light is irradiated. For example, the second light source may be disposed apart from the upper surface of the optical film, and the second light receiving portion may be disposed apart from the upper surface of the optical film. In the case where the optical film has defects in the bubbles, the light quantity of the reflected light reflected at the defective position of the bubbles on the optical film may be different from the light quantity of the reflected light reflected on the optical film in the normal area without defects. The defect information deriving unit 1500 described later determines whether the kind of defect is bubble type, the position of the bubble type defect, and the degree of the bubble type defect according to the light amount of the reflected light inspected through the second light inspection apparatus 1210 The defect information can be derived.

As another example, the inspection unit 1200 may include a third light inspection apparatus 1230. The optical film may include a polarizing film. The third light inspection apparatus 1230 can examine the transmitted light that is transmitted through the polarizing filter having the light emitted on one of the both surfaces of the optical film and the absorption axis having a different direction from the polarizing film have. The third light inspection apparatus 1230 may include a third light source for irradiating light onto the optical film. A plurality of third light sources may be provided. The third light source may be disposed apart from one surface of the optical film. The third light inspection apparatus 1230 may include a third light receiving unit that inspects light transmitted through the optical film. The third light receiving portion may include a sensor for measuring the light amount of light irradiated to the optical film. A plurality of third light receiving units may be provided to correspond to the number of the third light sources. And the third light receiving portion may be disposed apart from the opposite surface of the optical film on which light is irradiated. For example, the third light source may be disposed apart from the upper surface of the optical film, and the third light receiving portion may be disposed apart from the lower surface of the optical film. On the other hand, the absorption axis of the polarizing filter may be formed so as to cross at an angle of 90 degrees with the absorption axis formed in the normal polarizing film. In the case where the optical film has a polarization deficiency, the light amount of the transmitted light transmitted through the optical film may be different from the light amount of the transmitted light transmitted through the optical film of the normal region without defects. The defect information deriving unit 1500 described later determines whether the type of defect is a polarization defect, the position of the polarization defect, and the degree of polarization defect according to the amount of transmitted light examined through the third light inspection apparatus 1210, Can be derived.

The optical film marking system 1000 may include a defect information deriving unit 1500 for deriving defect information based on a defect inspection result of the optical film. The defect inspection result through the inspection apparatus of the inspection unit 1200 can be transmitted to the defect information derivation unit 1500. The defect information may include the presence or absence of a defect, a position, a kind, and an accuracy. When a plurality of inspection apparatuses are used for defect inspection, the presence or absence of defects may be determined on the basis of the inspection results of the respective inspection apparatuses, and the presence or absence of defects may be determined by combining the inspection results of the plurality of inspection apparatuses.

The marking unit 1300 can form markings on the optical film based on the inspection results inspected by the inspection unit 1200. The marking unit 1300 can be disposed downstream of the inspection unit 1200 along the transport direction of the optical film. The marking unit 1300 may be disposed apart from one surface of the optical film. For example, the marking unit 1300 may be disposed apart from the upper surface of the optical film. Preferably, the marking unit 1300 is disposed so as to be markable with respect to the entire width direction of the film.

The marking unit 1300 may include a first marking device 1310. The first marking apparatus 1310 may be disposed downstream of the inspection unit 1200 along the transport direction of the optical film. The first marking device 1310 may include a plurality of first marking portions 1311 arranged along a direction intersecting the transport direction of the optical film. The first marking portion 1311 may form a first marking on the optical film. The first marking portion 1311 can form the first marking on the optical film using the ink. The first marking portion 1311 is provided to be movable up and down, and the first marking can be formed in such a manner that the first marking portion 1311 is moved down by spraying ink onto the optical film. Although ink has been described as an example of the marking medium used by the first marking unit 1311, the marking medium may be a laser, but not limited thereto, and any marking medium that can be marked on the optical film can be used.

The marking unit 1300 may include a second marking device 1320. The second marking device 1320 may be disposed downstream of the first marking device 1310 along the transport direction of the optical film. The second marking device 1320 may include a plurality of second marking portions 1321 arranged in a direction parallel to the direction in which the first marking portions 1311 are arranged. The second marking portion 1321 can form a second marking on the optical film. The second marking portion 1321 can form the second marking on the optical film using the ink. The second marking portion 1321 is provided so as to be movable up and down, and the second marking can be formed in such a manner that the second marking portion 1321 is moved down by spraying ink onto the optical film. Although ink is used as an example of the marking medium used by the second marking unit 1311, the marking medium may be a laser, but not limited thereto, and any marking medium that can be marked on the optical film can be used.

 The second marking portion 1321 may be disposed between two adjacent first marking portions 1311 with reference to a direction parallel to the direction in which the first marking portions 1311 are arranged. For example, the first marking portions 1311 are arranged at the same interval of the first separation distance? T1 from the left side to the right side of the optical film with respect to the width direction of the optical film, The second marking portion 1321 located at the leftmost position is arranged at the same interval of the second marking distance? T2 from the left to the right of the optical film with respect to the width direction of the film, 1311 by a distance smaller than the first separation distance delta t1 so that the second marking portions 1321 are arranged at positions adjacent to the adjacent two marks 1311 on the basis of the direction parallel to the direction in which the first marking portions 1311 are arranged. And may be disposed between the first marking portions 1311 of the number of dogs.

)의 색상을 붉은색인 것으로 가정하고, 빗금으로 표현된 마킹(

)의 색상을 푸른색인 것으로 가정하여 설명한다.The first marking formed by the first marking portion 1311 and the second marking formed by the second marking portion 1321 may differ in at least one of hue, saturation, lightness, shape, and size. That is, the first marking and the second marking may have characteristics that can be distinguished from each other by an inspection source or an automatic marking identifying device. As an example, the first marking and the second marking may be markings formed by distinguishing red and blue colors, respectively. Hereinafter, for the sake of convenience of explanation, the marking represented by black in FIGS. 2 to 5

) Is assumed to be red, and the marking expressed by the hatched

) Is a blue color.

The first separation distance? T1 between the adjacent two first marking portions 1311 and the second separation distance? T2 between the adjacent two second marking portions 1321 may be the same. The first separation distance delta t1 is the interval between the adjacent two first marking portions 1311 and the second separation distance is the interval between the adjacent two second marking portions 1321. [ The first spacing distance and the second spacing distance may equally be 20 mm.

The order of the first marking portion 1311 and the second marking portion 1321 may be alternated with respect to a direction parallel to the direction in which the first marking portions 1311 are arranged. That is, the second marking portions 1321 may be disposed between two adjacent first marking portions 1311 with reference to a direction parallel to the direction in which the first marking portions 1311 are arranged.

The second marking portion 1321 may be disposed at the center between two adjacent first marking portions 1311 with reference to a direction parallel to the direction in which the first marking portions 1311 are arranged. That is, the distances? T3 on the basis of the optical film width direction between the adjacent two first marking portions 1311 and the second marking portions 1321 disposed therebetween may be equal to each other. For example, the distance? T3 on the basis of the optical film width direction between the two adjacent first marking portions 1311 and the second marking portions 1321 disposed therebetween may be equal to each other by 10 mm.

The marking pattern formed through the marking unit 1300 according to the defect inspection result inspected by the inspection unit 1200 may be predetermined. For example, a user using the optical film marking system 1000 can specify the marking type according to a criterion (hereinafter, referred to as a quality criterion) for discriminating the quality of the optical film. In this case, as shown in FIG. 2, a marking pattern distinguishable from the defects d1, d2, and d3 having different types of defects, degree of defects, etc. may be formed according to the inspection result.

For example, the user can determine whether or not the defect information (e.g., foreign matter A, foreign matter B, foreign matter C, ..., foreign matter H), which is a defect that can be detected by the transmitted light inspection apparatus, (For example, bubble A, bubble B, bubble C, bubble A, bubble A, bubble B, bubble B, (See FIG. 3 (b)) corresponding to each of the bubbles H (see FIG. 3), defective information (for example, (See FIG. 3 (c)) corresponding to each of the defect A, the polarized light defect B, the polarized light defect C, ..., and the polarized light defect H, respectively. Further, various types of marking (see FIG. 3 (d)) which do not overlap can be designed in advance, by adding not only the three light inspection apparatuses described above but also other inspection apparatuses or inspection apparatuses using an electric method . The optical film marking system 1000 may include a marking type storage unit 1600 for storing a pre-designed marking type as computerized marking type information.

The marking type information may include a first marking factor, a second marking factor, and a no-marking factor that constitute a matrix within a predetermined area. Here, the first marking factor, the second marking factor, and the marking factor may be given to each element of the matrix. The control unit 1400, which will be described later, allows the first marking to be formed at a point on the optical film corresponding to the position of the element to which the first marking factor is given through the control of the marking unit 1300, So that a second marking can be formed at a point on the optical film that corresponds to the position of the element to which the marking factor is imparted, and any marking among the first marking and the second marking at a point on the optical film corresponding to the position of the element to which the marking factor is applied Can be prevented from being formed.

The marking type information may be information related to the m X n matrix type. m is the number of rows formed by the marking factors arranged along the width direction of the optical film and n is the number of columns formed by the marking factors arranged along the transport direction of the optical film. 5 (a), the marking type information is information related to the 3x3 matrix form, and the first marking factor given to the elements a11, a13, a31, and a33 Is used as information for forming a first mark at a point on the optical film corresponding to the position of the element to which the first marking factor is applied and the second marking factor given to the elements of a12, The marking factor applied to the elements of a21 and a23 is used as information for forming the second marking on the point on the optical film corresponding to the position of the element to which the marking factor is applied, The first marking and the second marking may not be formed at a point on the optical film corresponding to the first marking and the second marking.

4, the optical film marking system 1000 includes a plurality of first marking portions 1311 and a plurality of second marking portions 1311 to form a marking pattern corresponding to a defect inspection result inspected by the inspection unit 1200. [ And a control unit 1400 for selecting at least one operation marking unit AM to be operated among the plurality of operation units 1321 and controlling whether the operation marking unit AM is operated or not.

The operation marking unit AM selected by the control unit 1400 includes at least two first marking units 1311 adjacent to each other with reference to a direction parallel to the direction in which the first marking units 1311 are arranged, At least one second marking portion 1321 disposed between the first marking portions 1311 or at least two second marking portions 1321 adjacent to each other with reference to a direction parallel to the direction in which the first marking portions 1311 are arranged, 2 marking section 1321 and at least one first marking section 1311 disposed between the two second marking sections 1311. [

The control unit 1400 may control the operation of the operation marking unit AM by a predetermined number of times during the optical film feeding to form a marking pattern corresponding to the defect inspection result inspected by the inspection unit 1200 have.

The process of controlling the operation unit 1400 to select and operate the operation marking unit AM may be performed in the following manner.

Assuming that the marking type corresponding to the result of the specific defect (defect 1) inspection is a 3 x 3 matrix form as shown in FIG. 4 (a), corresponding marking type information is a11, a21, a31, a31 , a32 and a33 may be given a first marking factor, a12 and a32 may be given a second marking factor, and an element of a22 may be given an unknown marking factor. The control unit 1400 includes two first marking units 1311 adjacent to each other as shown in FIG. 4 (c) to form a marking pattern as shown in FIG. 4 (a) It is possible to select one second marking portion 1321 disposed between the first and second portions 1311 and 1311 as the operation marking portion AM1. Then, the control unit 1400 controls the first marking unit 1311 selected by the operation marking unit AM1 to operate all of the first, second, and third times at predetermined time intervals while the optical film is being transported And one second marking section 1321 selected by the operation marking section AM1 is operated at a predetermined time interval while the optical film is being conveyed, , The marking pattern as shown in FIG. 4A can be formed at a position corresponding to the specific defect (defect 1) in FIG. 4C.

The control unit 1400 selects the defective area DA on the optical film based on the defect position inspected by the inspection unit 1200 and determines whether the marking form to be formed through the marking unit 1300 is defective area DA, It is possible to select the operation marking portion AM so as to be positioned inside the operation marking portion AM. The defective area DA may be formed in a polygonal or circular shape including a defect position. The defective area DA can be selected based on the defect information and the marking type corresponding to the defect information. For example, a square defective area DA including a defect position on the optical film can be selected.

Referring to FIG. 4 (c), the defective area DA1 can be selected such that the defect 1 is located at the center of the defective area DA1. Here, it is assumed that the defect (defect 1) is formed at a specific position of the optical film, and the marking pattern corresponding to the defect (defecet 1) is in the form of a 3 × 3 matrix as shown in FIG. 4 (a). The control unit 1400 includes a defective area DA1 having a square shape with a length of about 20 mm, which includes a position on the optical film to be defective (defect 1) on the transported optical film and can form a first mark on the first column of the marking type, Can be selected. The control unit 1400 includes two first marking units 1311 and one second marking unit 1321 capable of forming a marking pattern corresponding to a defect (defecet1) in the defective area DA1, ).

The defective area DA may be selected differently depending on which markings are formed during the first marking or the second marking in the first column of the matrix marking type. For example, as in the right region of FIG. 4C, the defective area DA2 may be selected such that the defect 2 is not located at the center of the defective area DA2. Here, it is assumed that the defect (defect 2) is formed at a specific position of the optical film, and the marking is in the form of a 3 × 3 matrix as shown in FIG. 4 (b). The control unit 1400 includes a defective area DA2 of a square shape having a length of about 20 mm on one side, which includes a position where a defect 2 exists on the optical film to be transferred and a second mark can be formed on the first line of the marking type, Can be selected. The control unit 1400 includes two second marking units 1321 and one first marking unit 1311 capable of forming markings corresponding to the defect 2 in the defect area DA2 and the operation marking unit AM2, .

An example of the operation of the above-described optical film marking system 1000 of the present invention is as follows.

The optical film may be transported by rotation of the supply roll 1110 and / or the transport roll 1130. After the inspection process and the marking process described below are performed, the optical film can be wound by the rotation of the winding roll 1120.

The inspection unit 1200 can perform an inspection process for inspecting defects of the optical film transferred by the transfer unit 1100. [ For example, the inspection unit 1200 irradiates light onto the optical film through the light source 1200a of the light inspection apparatus, and outputs the light amount of the transmitted light, which is transmitted through the optical film through the light receiving unit 1200b, And the defect of the optical film can be inspected. The inspection unit 1200 may include a plurality of inspection apparatuses. The inspection apparatus can inspect the optical film and transmit the inspection result to the defect information deriving unit 1500. [ The defect information deriving unit 1500 can generate defect information including information such as presence / absence, type, degree and position of defects based on the inspection result. The generated defect information may be transmitted to the controller 1400. When the defect information is transmitted to the control unit 1400, the control unit 1400 can select the marking type information related to the marking type corresponding to the defect information among the various marking type information stored in the marking type storage unit 1600 in advance. The controller 1400 can select the defect area DA based on at least one of defect information including defect position information and marking type or marking type information corresponding to the defect information. The control unit 1400 includes a plurality of first marking units 1311 and at least one operation marking unit 1321 to be operated in the plurality of second marking units 1321 based on the marking type and / (AM) can be selected. The control unit 1400 determines the number of operations of the operation marking unit AM based on the marking type and / or the marking type information, and the operation marking unit AM determines whether the optical film is to be transported according to the predetermined number of times and the time interval And the marking can be formed on the optical film by operating.

The user can store marking type and / or marking type information corresponding to bubbles, foreign objects, scratches, and the like in the marking type storage unit 1600 as a type of defect. The defect may be formed in the form of foreign matter at a specific position of the optical film based on the width direction of the optical film. The inspection unit 1200 may be provided with a transmitted light inspection apparatus which irradiates light onto the optical film through the light source 1200a and measures the transmitted light with the light receiving unit 1200b to perform defect inspection, , Degree, and so on. The inspection result may be transmitted to the defect information derivation unit 1500. The defect information derivation unit 1500 may determine that the foreign object is defective and generate defect information and transmit the defect information to the control unit 1400. [ For example, if it is assumed that marking type and / or marking type information corresponding to a defect inspection result including a specific foreign matter is the marking type and / or marking type information shown in FIG. 5A, the controller 1400 ) May select marking type and / or marking type information corresponding to the foreign matter defect. The controller 1400 selects a square defect area DA having a length of about 20 mm on the side including the defect based on the selected marking form, the position of the foreign object, and the marking form. The control unit 1400 can select two first marking units 1311 and one second marking unit 1321 that can be marked in the defective area DA as the operation marking unit AM. The controller 1400 controls the first and second markers 1311 and 1311 selected by the operation marking unit AM in accordance with the marking type and / The second marking section 1321 selected by the operation marking section AM can be operated in all of the first, second and third steps while the optical film is being conveyed The marking pattern shown in Fig. 5 (a) can be formed on the optical film.

The effect of the optical film marking system 1000 according to an embodiment of the present invention is as follows.

The optical film marking system 1000 can be disposed between the two first marking portions 1311 adjacent to the second marking portion 1321 with reference to a direction parallel to the direction in which the first marking portions 1311 are arranged , And marking can be formed at closely spaced intervals along the width direction of the optical film using a plurality of marking devices (the first marking device 1310 and the second marking device 1320). Since the first marking portion 1311 and the second marking portion 1321 are not arranged in parallel on the imaginary same reference line parallel to the transport direction of the optical film, A marking pattern can be formed. Thus, when defect inspection of an optical film needs to be performed by diversifying the quality standard, it is possible to configure various marking forms corresponding to the various quality standards.

For example, if the marking system in which the first marking portion 1311 and the second marking portion 1321 are arranged on the same virtual reference line parallel to the transport direction of the optical film, The optical marking system 1000 according to the present invention is not limited to the first marking portion 1311 (1) and (b-2) (B-1) and (b-2) of FIG. 5 as well as in FIG. 5 (b-1) are not arranged in parallel on the imaginary same reference line parallel to the transport direction of the optical film there is an advantage that a marking form including both the first marking and the second marking can be set as shown in (c-1), (c-2), and (d-1). In addition, a marking form such as a numerical form can be set as shown in FIG. 5 (e). Also, as shown in (b-3), (c-3), and (d-2) in FIG. 5, a marking pattern for forming a plurality of rows in the traveling direction of the optical film may be set.

5 (b-1) and 5 (b-2) shown in Fig. 5 (b-1) The marking system in which the first marking portion 1311 and the second marking portion 1321 are arranged on the same virtual reference line parallel to the transport direction of the optical film is used There may be a problem that the first marking and the second marking are overlapped with each other.

On the other hand, in the optical film marking system 1000 according to an embodiment of the present invention, when the second marking portion 1321 is adjacent to the first marking portion 1321 adjacent to the first marking portion 1311 in the direction parallel to the direction in which the first marking portions 1311 are arranged, (1311), it is possible to prevent the first marking and the second marking from overlapping with each other.

Since at least one of the hue, saturation, lightness, shape and size of the first marking and the second marking in the optical film marking system 1000 may be different from each other, a combination of the first marking and the second marking Various marking patterns can be formed according to the inspection result of the optical film.

In the optical film marking system 1000, the control unit 1400 selects at least one operation marking unit AM to be operated among the plurality of first marking units 1311 and the second marking unit 1321, It is possible to selectively control the operation of the operation marking unit AM by a predetermined number of times while the optical film is being conveyed or by selectively combining the first marking and the second marking with each other, .

In the optical film molding system 1000, the control unit 1400 selects the defective area DA on the optical film based on the defect inspection result and the marking type inspected by the inspection unit 1200, and the marking unit 1300 The marking can be formed on the defective area DA including the defective position by selecting the operation marking part AM so that the marking form to be formed through the defective area DA is located inside the defective area DA, The type of defects on the defective position and / or the degree of defects can be easily confirmed.

Although the present invention has been described in connection with the above-mentioned preferred embodiments, it is possible to make various modifications and variations without departing from the spirit and scope of the invention. Accordingly, it is intended that the appended claims cover all such modifications and variations as fall within the true spirit of the invention.

1000: Optical film marking system
1100:
1110: Feed roll
1120: Winding roll
1130: Feed roll
1200: Inspection unit
1210: First optical inspection apparatus
1220: second optical inspection apparatus
1230: Third optical inspection apparatus
1200a: light source
1200b:
1300: Marking unit
1310: first marking device
1311: first marking portion
1320: second marking device
1321: second marking portion
1400:
1500: Defect information deriving unit
1600: Marking type storage unit
AM: Operation marking part
DA: defective area
δt1: First separation distance
δt2: Second separation distance

Claims (11)

A transfer unit for transferring the optical film;
An inspection unit for inspecting defects of the optical film;
And a marking unit for forming a mark on the optical film based on a defect inspection result inspected by the inspection unit,
The marking unit includes:
A first marking device disposed downstream of the inspection unit and including a plurality of first marking portions arranged along a direction intersecting the transport direction of the optical film to form a first mark on the optical film;
And a second marking unit disposed downstream of the first marking unit and arranged in a direction parallel to the direction in which the first marking units are arranged to form a second marking on the optical film, Device,
Wherein the second marking portion is disposed between two adjacent first marking portions based on a direction parallel to a direction in which the first marking portions are arranged. The method according to claim 1,
The inspection unit includes:
A first light inspection device for inspecting light transmitted through one surface of the optical film through the other surface;
And a second light inspecting device for inspecting reflected light in which light irradiated to either one of both surfaces of the optical film is reflected by the one surface of the optical film. The method according to claim 1,
Wherein the optical film comprises a polarizing film,
The inspection unit includes:
And a third light inspecting device for inspecting the transmitted light that is transmitted through the polarizing filter having the light emitted on one of the two surfaces of the optical film and having an absorption axis in a different direction from the polarizing film, Optical film marking system. The method according to claim 1,
Wherein the first marking and the second marking differ in at least one of color, saturation, lightness, shape and size. The method according to claim 1,
The marking form to be formed through the marking unit according to the inspection result inspected by the inspection unit is predetermined,
A control unit for selecting at least one operation marking unit to be operated among the plurality of first marking units and the plurality of second marking units so as to form a marking pattern corresponding to the inspection result inspected by the inspection unit, And an optical film marking system. 6. The method of claim 5,
Wherein the operation marking unit, selected by the control unit,
At least two first marking portions adjacent to each other with reference to a direction parallel to the direction in which the first marking portions are arranged and at least one second marking portion disposed between the two first marking portions,
At least two second marking portions adjacent to each other with reference to a direction parallel to the direction in which the first marking portions are arranged and at least one first marking portion disposed between the two second marking portions, Marking system. 6. The method of claim 5,
Wherein the control unit controls whether or not the operation marking unit is operated a predetermined number of times during the transporting of the optical film to form a marking pattern corresponding to the inspection result inspected by the inspection unit. 6. The method of claim 5,
Wherein the control unit selects a defective area on the optical film based on a defect position inspected by the inspection unit and selects the operation marking unit such that a marking form to be formed through the marking unit is located inside the defective area, Optical film marking system. The method according to claim 1,
The first gap distance between two adjacent first marking portions and the second gap distance between two adjacent second marking portions are equal to each other. The method according to claim 1,
Wherein the order of the first marking portion and the second marking portion alternates with respect to a direction parallel to a direction in which the first marking portion is arranged. 11. The method of claim 10,
And the second marking portion is disposed at the center between two adjacent first marking portions based on a direction parallel to the direction in which the first marking portions are arranged.

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