KR102191350B1 - Optical film marking system - Google Patents

Abstract

Embodiments of the present invention include a transfer unit for transferring an optical film; An inspection unit for inspecting defects in the optical film; and a marking unit for forming a mark on the optical film based on a defect inspection result inspected by the inspection unit, wherein the marking unit is downstream of the inspection unit A first marking device disposed along a direction crossing the transport direction of the optical film and including a plurality of first marking portions forming first markings on the optical film; and the first marking device A marking device located further downstream, comprising a second marking device including a plurality of second marking parts arranged along a direction parallel to the direction in which the first marking parts are arranged to form a second marking on the optical film, The second marking unit discloses an optical film marking system, which is disposed between two adjacent first marking units based on a direction parallel to a direction in which the first marking unit is arranged.

Description

Optical film marking system {OPTICAL FILM MARKING SYSTEM}

Embodiments of the present invention relate to an optical film marking system for inspecting and marking an optical film.

In the production process of optical films, an in-line automated optical inspection system is used for inspection of optical films. The in-line automatic optical inspection system performs ink or barcode marking at the defect location, thereby discarding the marked area in a post process or allowing additional inspection by inspectors to be performed. For example, Korean Patent Application Publication No. 10-2008-0043279 discloses a method for controlling marking of a polarizing film inspection device.

However, there are various quality standards depending on the nature of the optical film and the method of inspection, and there is a difficulty in distinguishing the quality of the optical film because the form of marking corresponding thereto is not diverse.

Embodiments of the present invention provide an optical film marking system that performs various types of marking based on an optical film inspection result in an optical film production process.

An optical film marking system according to an embodiment of the present invention forms a marking on an optical film based on a transfer unit for transferring the optical film, an inspection unit for inspecting defects in the optical film, and an inspection result inspected by the inspection unit. And a marking unit, wherein the marking unit is a marking device located downstream of the inspection unit, and includes a plurality of first marking units arranged along a direction crossing the transport direction of the optical film to form a first marking on the optical film. The first marking device to be marked, and a marking device located downstream of the first marking device, comprising a plurality of second marking parts arranged along a direction parallel to the direction in which the first marking parts are arranged to form a second marking on the optical film And a second marking device, wherein the second marking unit is disposed between two adjacent first marking units based on a direction parallel to a direction in which the first marking unit is arranged.

In this embodiment, the inspection unit includes a first optical inspection device for inspecting the transmitted light transmitted through the other surface of the light irradiated to one of both surfaces of the optical film and any one of both surfaces of the optical film. It may include at least one of the second light inspection apparatus for inspecting the reflected light reflected by the one surface of the irradiated light.

In this embodiment, the optical film includes a polarizing film, and the inspection unit is a polarized light having an absorption axis in a direction different from that of the polarizing film and the other surface of the light irradiated to any one surface of the optical film. It may include a third light inspection device for inspecting the transmitted light transmitted through the filter.

In this embodiment, the first marking and the second marking may be different from at least one of hue, saturation, brightness, shape, and size.

In this embodiment, in the optical film marking system of the present invention, the marking type to be formed through the marking unit is predetermined according to the inspection result inspected by the inspection unit, and the marking type corresponding to the inspection result inspected by the inspection unit In order to form, a control unit for controlling whether or not to operate by selecting at least one operation marking unit to be operated from among the plurality of first marking units and the plurality of second marking units may be included.

In the present embodiment, the control unit may control whether or not the motion marking unit is operated a predetermined number of times while the optical film is being transferred in order to form a marking shape corresponding to the inspection result inspected by the inspection unit.

In this embodiment, the control unit may select a defect area on the optical film based on the defect location inspected by the inspection unit, and select the operation marking unit so that the marking type to be formed through the marking unit is located inside the defect area. .

In this embodiment, the motion marking unit selected by the control unit is disposed between at least two first marking units adjacent to each other based on a direction parallel to the direction in which the first marking unit is arranged and the two first marking units. At least one second marking portion including at least one second marking portion, or at least two second marking portions adjacent to each other based on a direction parallel to the direction in which the first marking portion is arranged, and at least one second marking portion disposed between the two second marking portions. It may include one marking part.

In this embodiment, a first separation distance between two adjacent first marking portions and a second separation distance between two adjacent second marking portions may be the same.

In the present embodiment, the order of the first marking part and the second marking part may alternate with each other based on a direction parallel to the direction in which the first marking part is arranged.

In this embodiment, the second marking unit may be disposed at the center between two adjacent first marking units based on a direction parallel to the direction in which the first marking unit is arranged.

Embodiments of the present invention may perform various types of marking based on the optical film inspection result in the optical film production process. Accordingly, when it is necessary to perform defect inspection of an optical film by diversifying quality standards, there is an advantage of configuring various combinations of marking types corresponding to each of the diversified quality standards.

1 is a conceptual diagram showing an optical film marking system according to an embodiment of the present invention.
2 is a conceptual diagram showing the operating principle of the optical film marking system shown in FIG.
3 is a view showing several examples of various marking types that can be set according to defect information determined based on the type of optical inspection apparatus and the type and degree of defects.
4 is a conceptual diagram showing two examples of marking types and a process for forming the marking types.
5 is a diagram showing examples of various marking types that can be formed through the optical film marking system shown in FIG. 1.

BRIEF DESCRIPTION OF THE DRAWINGS The present invention will become apparent with reference to the embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but will be implemented in various forms different from each other, and only these embodiments make the disclosure of the present invention complete, and common knowledge in the technical field to which the present invention pertains. It is provided to completely inform the scope of the invention to those who have it, and the invention is only defined by the scope of the claims. Meanwhile, terms used in the present specification are for explaining embodiments and are not intended to limit the present invention. In this specification, the singular form also includes the plural form unless specifically stated in the phrase. As used in the specification, "comprises" and/or "comprising" refers to the presence of one or more other components, steps, actions and/or elements, and/or elements, steps, actions and/or elements mentioned. Or does not exclude additions. Terms such as first and second may be used to describe various components, but the components should not be limited by terms. The terms are only used for the purpose of distinguishing one component from another component.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1 is a conceptual diagram showing an optical film marking system according to an embodiment of the present invention, FIG. 2 is a conceptual diagram showing the operating principle of the optical film marking system shown in FIG. 1, and FIG. 3 is a type and defect of the optical inspection device. It is a diagram showing several examples of various marking types that can be set according to defect information determined based on the type and degree of.

4 is a conceptual diagram showing two examples of marking types and a process for forming the marking types, and FIG. 5 is a view showing examples of various marking types that can be formed through the optical film marking system shown in FIG. 1.

1, 2 and 4, the optical film marking system 1000 according to an embodiment of the present invention inspects defects in the optical film in the optical film production process, and distinguishes the optical films from each other based on the inspection result. Can form a marking that is The marking formed on the optical film can be used as a mark by which the location of the defect included in the optical film, the type of the defect, and the degree of the defect can be identified by an inspection source or a device capable of identifying the marking. The optical film marking system 1000 includes a transfer unit 1100, an inspection unit 1200, and a marking unit 1300, and the marking unit 1300 includes a first marking device 1310 and a second marking device 1320. ) Can be included.

Optical film is a generic term for plastic films used for optics. The optical film may include a polarizing film that adjusts the direction of light. In general, such a polarizing film may include a polarizer in which an absorption axis in a specific direction is formed by stretching a PVA film so that incident light can be polarized, and a protective film formed on one or both sides of the polarizer by an adhesive or an adhesive. have. The optical film may further include at least one functional film of a retardation film, a visual compensation film, a brightness enhancement film, and a surface protection film. The optical film may include a pressure-sensitive adhesive layer coated with a pressure-sensitive adhesive so as to be attached to the panel. The optical film may include a release film for preventing adhesion of foreign substances to the adhesive layer due to adhesion of the adhesive layer or exposure of the adhesive layer. The optical film may have a polarizing film laminate structure in which a protective film is laminated on a polarizer or an optical film laminate structure in which a functional film and/or a release film is laminated on a polarizing film laminate.

The transfer unit 1100 may transfer the optical film. The optical film transferred by the transfer unit 1100 may be in the form of a fabric that extends long along the length direction. The transfer unit 1100 for transferring the optical film in the form of such a fabric may transfer the fabric of the optical film from the upstream to the downstream of the transfer path by a so-called roll-to-roll process.

On the other hand, an optical film laminate roll can be manufactured through a laminating process of laminating a plurality of films to form an optical film laminate and a winding process of winding the optical film laminate formed by the laminating process, and the optical film marking system (1000) may perform the inspection and marking process described later by supplying such an optical film laminate roll. In this case, the transfer unit 1100 may include a supply roll 1110 capable of supplying the optical film stack by removing the optical film stack from the optical film stack roll by mounting the optical film stack roll. The supply roll 1110 may be formed in a generally cylindrical shape. The supply roll 1110 may be formed to be rotatable in one direction. For example, the supply roll 1110 may rotate clockwise to supply the optical film.

However, the lamination process of laminating a plurality of films to form an optical film stack may be performed within the optical film marking system 1000, and in this case, the transfer unit 1100 is equipped with an optical film stack roll to provide an optical film. It may not include a supply roll 1110 for unwinding the stack.

The transfer unit 1100 may include a plurality of transfer rolls 1130 capable of transferring an optical film in the form of a fabric long along a transfer direction. The transfer unit 1100 may include a take-up roll 1120 for winding the optical film after inspection and marking processes described below are performed on the optical film transferred by the plurality of transfer rolls 1130. The winding roll 1120 may be formed in a generally cylindrical shape. The winding roll 1120 may be spaced apart from the supply roll 1110 and/or the conveying roll 1130 by a predetermined distance along the conveying direction of the optical film. The winding roll 1120 may be formed to be rotatable in one direction. For example, the winding roll 1120 may be rotated clockwise to wind the optical film.

That is, the optical film is transferred to the downstream side of the transfer path at a predetermined speed along the longitudinal direction by rotation of the supply roll 1110 and/or the transfer roll 1130, and various processes including inspection and marking processes to be described later After this is performed, it may be wound up by the winding roll 1120.

The inspection unit 1200 may inspect defects in the optical film. Defects are parts that are not to be included in the product, and may include air bubbles, foreign matters, threads, white spots, holes, stains, scratches, or parts whose film thickness, optical characteristics, electrical characteristics, etc. are out of specification.

The defect inspection of the optical film may be performed using an optical method or an electrical method. For example, foreign objects, such as a thread, or deformation of a film can be inspected by photographing a film using a camera. The film thickness of the thin film can be calculated based on reflected light or the like. The resistance of the electrode can be measured by a method of contacting the resistance measuring roll on the surface of the thin film or by a non-contact resistance measuring device.

The inspection unit 1200 may include an inspection device for inspecting defects in the optical film. It is preferable that the inspection unit 1200 inspects the entire width direction of the film to perform defect inspection. The inspection unit 1200 may be disposed downstream of the transfer unit 1100 and spaced apart from the optical film. Hereinafter, for convenience of explanation, a description will be made focusing on a case where the inspection device included in the inspection unit 1200 is an optical inspection device that detects defects using an optical technique. Such an optical inspection device may include a light source 1200a for irradiating light onto the optical film, and a light receiving unit 1200b for sensing light transmitted through the optical film or reflected by the optical film. .

For example, the inspection unit 1200 may include a first optical inspection device 1210. The first optical inspection device 1210 may inspect the transmitted light transmitted through the other surface of the light irradiated to one of both surfaces of the optical film. The first optical inspection device 1210 may include a first light source for irradiating light onto the optical film. A plurality of first light sources may be provided. The first light source may be disposed to be spaced apart from one surface of the optical film. The first optical inspection device 1210 may include a first light receiving unit that detects light transmitted through the optical film. The first light receiving unit may include a sensor that measures the amount of light irradiated onto the optical film. A plurality of first light receiving units may be provided to correspond to the number of light sources. The plurality of first light sources and the first light receiving units may be arranged along the width direction of the optical film. The first light receiving unit may be disposed to be spaced apart from a surface opposite to one surface irradiated with light on the optical film. For example, the first light source may be disposed to be spaced apart from the upper surface of the optical film, and the first light receiving part may be disposed to be spaced apart from the lower surface of the optical film. When there is a defect of a foreign material in the optical film, the amount of transmitted light transmitted through the defective position of the foreign material on the optical film may be different from the amount of transmitted light that has passed through the optical film in a normal region without defects. The defect information extraction unit 1500 to be described later determines whether the type of the defect is a foreign material, the location of the foreign material defect, and the degree of the foreign material defect according to the degree of the amount of transmitted light inspected through the first optical inspection device 1210. Specific defect information can be derived.

For another example, the inspection unit 1200 may include a second optical inspection device 1220. The second optical inspection device 1220 may be installed spaced apart from the first optical inspection device 1210 along the longitudinal direction downstream of the transfer unit 1100, and the light irradiated on either side of the optical film is You can inspect the reflected light reflected by one surface. The second optical inspection device 1220 may include a second light source for irradiating light onto the optical film. A plurality of second light sources may be provided. The second light source may be disposed to be spaced apart from one surface of the optical film. The second optical inspection device 1220 may include a second light receiving unit that detects light reflected from the optical film. The second light receiving unit may include a sensor that measures the amount of light irradiated onto the optical film. A plurality of second light receiving units may be provided to correspond to the number of second light sources. The plurality of second light sources and the second light receiving units may be arranged along the width direction of the optical film. The second light-receiving unit may be disposed to be spaced apart from the same surface as the one surface irradiated with light on the optical film. For example, the second light source may be disposed to be spaced apart from the upper surface of the optical film, and the second light-receiving portion may be disposed to be spaced apart from the upper surface of the optical film. When the optical film has defects of bubbles, the amount of reflected light reflected at the location of the defects of bubbles on the optical film may be different from the amount of reflected light reflected by the optical film in a normal region without defects. The defect information extraction unit 1500 to be described later specifies whether the type of the defect is a bubble, the location of the bubble defect, and the degree of the bubble flow defect according to the level of the amount of reflected light inspected through the second optical inspection device 1210. Defect information can be derived.

For another example, the inspection unit 1200 may include a third optical inspection device 1230. The optical film may include a polarizing film. The third optical inspection device 1230 may inspect the transmitted light transmitted through a polarizing filter having an absorption axis in a direction different from that of the polarizing film and the other surface of the light irradiated to any one of both surfaces of the optical film. have. The third optical inspection device 1230 may include a third light source for irradiating light onto the optical film. A plurality of third light sources may be provided. The third light source may be disposed to be spaced apart from one surface of the optical film. The third optical inspection device 1230 may include a third light receiving unit that inspects light transmitted through the optical film. The third light receiving unit may include a sensor that measures an amount of light irradiated onto the optical film. A plurality of third light receiving units may be provided to correspond to the number of third light sources. The third light-receiving unit may be disposed to be spaced apart from a surface opposite to one surface irradiated with light on the optical film. For example, the third light source may be disposed to be spaced apart from the upper surface of the optical film, and the third light receiving part may be disposed to be spaced apart from the lower surface of the optical film. Meanwhile, the absorption axis of the polarizing filter may be formed to cross the absorption axis formed in the normal polarizing film at an angle of 90°. When there is a polarization defect in the optical film, the amount of transmitted light transmitted to the position of the polarization defect on the optical film may be different from the amount of transmitted light transmitted through the optical film in a normal region without defects. The defect information extraction unit 1500, which will be described later, determines whether the type of the defect is a polarization defect, the location of the polarization defect, and the degree of the polarization defect according to the amount of transmitted light inspected through the third optical inspection device 1210. Can be derived.

The optical film marking system 1000 may include a defect information extraction unit 1500 for deriving defect information based on a defect inspection result of the optical film. The defect inspection result through the inspection device of the inspection unit 1200 may be transmitted to the defect information extraction unit 1500. The defect information may include the presence or absence, location, type and degree of defects. When a plurality of inspection devices are used for the defect inspection, the presence or absence of a defect may be determined based on the inspection results of each inspection device, or the presence or absence of a defect may be determined by synthesizing the inspection results of the plurality of inspection devices.

The marking unit 1300 may form a marking on the optical film based on the inspection result inspected by the inspection unit 1200. The marking unit 1300 may be disposed downstream of the inspection unit 1200 along the transport direction of the optical film. The marking unit 1300 may be disposed to be spaced apart from one surface of the optical film. For example, the marking unit 1300 may be disposed to be spaced apart from the upper surface of the optical film. The marking unit 1300 is preferably disposed to be able to mark the entire width direction of the film.

The marking unit 1300 may include a first marking device 1310. The first marking device 1310 may be disposed downstream of the inspection unit 1200 along the transport direction of the optical film. The first marking device 1310 may include a plurality of first marking portions 1311 arranged along a direction crossing the transfer direction of the optical film. The first marking part 1311 may form a first marking on the optical film. The first marking part 1311 may form the first marking on the optical film using ink. The first marking part 1311 is installed so as to be able to move up and down, and may form a first marking in such a manner that it is lowered to spray ink onto the optical film and rise. Although ink was described as an example as the marking medium used by the first marking unit 1311, the marking medium may be a laser, but is not limited thereto, and any marking medium capable of marking on the optical film may be used.

The marking unit 1300 may include a second marking device 1320. The second marking device 1320 may be disposed downstream from the first marking device 1310 along the transport direction of the optical film. The second marking device 1320 may include a plurality of second marking portions 1321 arranged along a direction parallel to the direction in which the first marking portions 1311 are arranged. The second marking part 1321 may form a second marking on the optical film. The second marking part 1321 may form a second marking on the optical film using ink. The second marking part 1321 may be installed so as to move up and down, and may be lowered to spray ink onto the optical film and form a second marking in an upward manner. Ink as an example has been described as the marking medium used by the second marking unit 1311, but the marking medium may be a laser, but is not limited thereto, and any marking medium capable of marking on the optical film may be used.

The second marking portion 1321 may be disposed between two adjacent first marking portions 1311 based on a direction parallel to the direction in which the first marking portion 1311 is arranged. For example, the first marking part 1311 is arranged at the same interval of the first separation distance δt1 from the left to the right of the optical film based on the width direction of the optical film, and the second marking part 1321 is also Based on the width direction of the film, they are arranged at the same intervals of the second separation distance (δt2) from the left to the right of the optical film, but the second marking part 1321 located on the leftmost side is the first marking part ( 1311) by a distance smaller than the first separation distance (δt1), each second marking portion 1321 is 2 adjacent to the first marking portion 1311 in a direction parallel to the direction It may be disposed between the first marking portions 1311.

)의 색상을 붉은색인 것으로 가정하고, 빗금으로 표현된 마킹(

)의 색상을 푸른색인 것으로 가정하여 설명한다.The first marking formed by the first marking part 1311 and the second marking formed by the second marking part 1321 may differ in at least one of hue, saturation, brightness, shape, and size. That is, the first marking and the second marking may have characteristics that can be distinguished from each other by an inspection agent or an automated marking identification device. As an example, the first marking and the second marking may be markings formed by distinguishing colors of red and blue, respectively. In the following, for convenience of description, markings represented in black in FIGS. 2 to 5 (

It is assumed that the color of) is red, and the marking (

The explanation assumes that the color of) is blue.

A first separation distance δt1 between two adjacent first marking portions 1311 and a second separation distance δt2 between two adjacent second marking portions 1321 may be the same. The first separation distance δt1 is an interval between two adjacent first marking portions 1311, and the second separation distance is an interval between two adjacent second marking portions 1321. The first separation distance and the second separation distance may equally be 20 mm.

The order of the first marking part 1311 and the second marking part 1321 may alternate with each other based on a direction parallel to the direction in which the first marking part 1311 is arranged. That is, the second marking part 1321 may be disposed between the two adjacent first marking parts 1311 based on a direction parallel to the direction in which the first marking part 1311 is arranged.

The second marking part 1321 may be disposed in the center between the two adjacent first marking parts 1311 based on a direction parallel to the direction in which the first marking part 1311 is arranged. That is, the distance δt3 based on the width direction of the optical film between the adjacent two first marking portions 1311 and the second marking portions 1321 disposed therebetween may be the same. For example, a distance δt3 based on the width direction of the optical film between two adjacent first marking portions 1311 and the second marking portions 1321 disposed therebetween may be equal to 10 mm.

According to the defect inspection result inspected by the inspection unit 1200, the marking shape formed through the marking unit 1300 may be predetermined. For example, a user using the optical film marking system 1000 may designate a marking type according to a criterion for discriminating the quality of an optical film (hereinafter, a quality criterion). In this case, as shown in FIG. 2, the types of defects, the degree of defects, and the like can be differentiated from each other on the defects d1, d2 and d3 according to the inspection result.

As an example, the user may select a foreign object that is a defect that can be detected by the transmitted light inspection device, and defect information that is distinguished according to the degree of the defect (e.g., foreign substance A, foreign substance B, foreign substance C, ..., foreign substance H). Corresponding marking type (refer to Fig. 3(a)), bubbles, which are defects that can be found by the reflected light inspection device, and defect information that is distinguished according to the degree of the defect (for example, bubble A, bubble B, bubble C, ..., bubble H) marking type corresponding to each (refer to Fig. 3(b)), polarization defects that can be found by a polarization inspection device and defect information that is distinguished according to the degree of the defect (for example, polarization Marking types corresponding to each of the defects A, polarization defects B, polarization defects C, ..., polarization defects H) can be designed in advance, respectively. In addition, it is possible to design in advance not only the three optical inspection devices described above, but also various marking types that do not overlap even when additional optical inspection devices or inspection devices using electrical methods are added (see Fig. 3(d)). . The optical film marking system 1000 may include a marking type storage unit 1600 that stores a predesigned marking type as computerized marking type information.

The marking type information may include a first marking factor, a second marking factor, and a no-marking factor constituting a matrix within a predetermined area. Here, any one of a first marking factor, a second marking factor, and a no-marking factor may be assigned to each element of the matrix. The control unit 1400, which will be described later, enables the first marking to be formed at a point on the optical film corresponding to the position of the element to which the first marking factor is assigned through the control of the marking unit 1300, and the second marking factor is given. The second marking can be formed at the point on the optical film corresponding to the position of the element, and any of the first and second markings on the point on the optical film corresponding to the position of the element to which the no-marking factor is assigned. It can be prevented from forming.

The marking type information may be information related to an m X n matrix type. m is the number of rows formed by marking factors arranged along the width direction of the optical film, and n may be defined as the number of columns formed by marking factors arranged along the transport direction of the optical film. Taking the marking type information shown in FIG. 5A as an example, the marking type information here is information related to a 3×3 matrix type, and the first marking factor assigned to the elements of a11, a13, a31 and a33 Is used as information for forming a first marking at a point on the optical film corresponding to the position of the element to which the corresponding first marking factor is assigned, and the second marking factor assigned to the elements a12, a22 and a32 is the corresponding second marking factor. It is used as information to form the second marking at the point on the optical film corresponding to the position of the element to which the marking factor is assigned, and the no-marking factor assigned to the elements of a21 and a23 is the position of the element to which the corresponding no-marking factor is assigned. It can be used as information to prevent any markings from being formed on the optical film corresponding to the first marking and the second marking.

Referring to FIG. 4, the optical film marking system 1000 includes a plurality of first marking portions 1311 and a plurality of second markings to form a marking shape corresponding to the defect inspection result inspected by the inspection unit 1200. It may include a control unit 1400 that selects at least one motion marking unit AM to be operated from among the units 1321 to control whether or not to operate.

The operation marking unit AM selected by the control unit 1400 includes at least two first marking units 1311 adjacent to each other based on a direction parallel to the direction in which the first marking unit 1311 is arranged, and two Including at least one second marking portion 1321 disposed between the first marking portions 1311, or at least two second marking portions 1321 adjacent to each other based on a direction parallel to the direction in which the first marking portion 1311 is arranged. A second marking portion 1321 and at least one first marking portion 1311 disposed between the two second marking portions 1311 may be included.

The control unit 1400 may control whether or not the operation marking unit AM is operated a predetermined number of times while the optical film is being transferred in order to form a marking shape corresponding to the defect inspection result inspected by the inspection unit 1200. have.

A process in which the control unit 1400 selects the operation marking unit AM and controls whether to operate it may be performed in one form as follows.

Assuming that the marking type corresponding to the test result of a specific defect 1 is a 3 X 3 matrix type as shown in Fig. 4(a), the corresponding marking type information is a11, a21, a31, a31 in the matrix. , elements of a32 and a33 may be given a first marking factor, elements of a12 and a32 may have a second marking factor, and elements of a22 may have a no-marking factor. The control unit 1400 includes two first marking units 1311 adjacent to each other as in Fig. 4 (c) and two adjacent first markings in order to form a marking shape as shown in Fig. 4 (a). One second marking part 1321 disposed between the parts 1311 may be selected as the motion marking part AM1. In addition, the control unit 1400 controls the two first marking units 1311 selected as the motion marking unit AM1 to operate once, second, and third times, respectively, at predetermined time intervals while the optical film is being transferred. It is controlled so that one second marking unit 1321 selected as the operation marking unit AM1 can operate at predetermined time intervals while the optical film is being transferred, in the first time, no operation in the second time, and in the third time. By doing so, it is possible to form the marking shape as shown in FIG. 4A at a position corresponding to a specific defect 1 in FIG. 4C.

The control unit 1400 selects the defect area DA on the optical film based on the defect location inspected by the inspection unit 1200, and the marking shape to be formed through the marking unit 1300 is the defect area DA. The motion marking unit AM may be selected to be positioned inside. The defect area DA may be formed in a polygonal or circular shape including a defect location. The defect area DA may be selected based on the defect information and a marking type corresponding to the defect information. For example, a square defect area DA including a defect location on the optical film may be selected.

Referring to FIG. 4C, the defect area DA1 may be selected so that the defect 1 is located at the center of the defect area DA1. Here, it is assumed that the defect (defect1) is formed at a specific position of the optical film, and the marking type corresponding to the defect (defecet1) is a 3X3 matrix type as shown in FIG. 4A. The control unit 1400 includes the location of the defect (defect1) on the transferred optical film and forms a first marking in the first column of the corresponding marking type, a square-shaped defect area DA1 having a side length of about 20 mm. You can choose. The control unit 1400 operates two first marking units 1311 and one second marking unit 1321 capable of forming a marking shape corresponding to a defect (defecet1) in the defect area DA1. ) Can be selected.

The defect area DA may be selected differently depending on which of the first markings or the second markings is formed in the first column of the matrix type marking type. For example, as in the right area of FIG. 4C, the defect area DA2 may be selected so that the defect 2 is not located in the center of the defect area DA2. Here, it is assumed that the defect2 is formed at a specific position of the optical film, and the marking type is a 3X3 matrix type as shown in FIG. 4B. The control unit 1400 is a square-shaped defect area DA2 having a side length of about 20 mm, which includes a location of the defect 2 on the transferred optical film and can form a second marking in the first column of the corresponding marking type. You can choose. The control unit 1400 operates two second marking units 1321 and one first marking unit 1311 capable of forming markings corresponding to the defect 2 in the defective area DA2. You can choose

An example of the operation of the optical film marking system 1000 of the present invention described above is as follows.

The optical film may be transferred by rotation of the supply roll 1110 and/or the transfer roll 1130. After the inspection process and the marking process described below are performed, the optical film may be wound up by rotation of the winding roll 1120.

The inspection unit 1200 may perform an inspection process for inspecting defects in the optical film transferred by the transfer unit 1100. For example, the inspection unit 1200 irradiates light to the optical film through the light source 1200a of the optical inspection device, and measures the amount of transmitted light transmitted through the optical film through the light receiving unit 1200b or reflected light reflected by the optical film. By measuring, defects of the optical film can be inspected. The inspection unit 1200 may include a plurality of inspection devices. The inspection device may inspect the optical film and transmit the inspection result to the defect information extraction unit 1500. The defect information extraction unit 1500 may generate defect information including information such as presence, type, degree, and location of defects based on the inspection result. The generated defect information may be transmitted to the control unit 1400. When the defect information is transmitted to the control unit 1400, the control unit 1400 may select marking type information related to the marking type corresponding to the defect information from among a number of marking type information previously stored in the marking type storage unit 1600. The controller 1400 may select the defect area DA based on at least one of defect information including defect location information and marking type or marking type information corresponding to the defect information. The control unit 1400 includes at least one motion marking unit to be operated from among the plurality of first marking units 1311 and the plurality of second marking units 1321 based on the marking type and/or the marking type information and the defect area DA. (AM) can be selected. The control unit 1400 determines the number of operations of the motion marking unit AM based on the marking type and/or marking type information, and the motion marking unit AM determines the number of times and time intervals during which the optical film is being transferred. It can operate to form a marking on the optical film.

The user may pre-store the marking type and/or marking type information corresponding to bubbles, foreign substances, and scratches in the marking type storage unit 1600 as the type of defect. The defect may be formed in the form of a foreign material at a specific position of the optical film based on the width direction of the optical film. The inspection unit 1200 may be provided with a transmitted light inspection device, and the transmitted light inspection device irradiates light to the optical film through the light source 1200a and measures the transmitted light with the light receiving unit 1200b to perform defect inspection to locate a foreign object. , It is possible to generate test results including degree, etc. The inspection result may be transmitted to the defect information extraction unit 1500, and the defect information extraction unit 1500 may determine the foreign object as a defect, generate defect information, and transmit it to the control unit 1400. For example, if it is assumed that the marking type and/or the marking type information corresponding to the defect inspection result containing a specific foreign material is the marking type and/or the marking type information shown in FIG. 5A, the controller 1400 ) May select a marking type and/or marking type information corresponding to the foreign material defect. The control unit 1400 selects a square-shaped defect area DA having a length of about 20 mm on one side including the defect based on the selected marking type, the position of the foreign object, and the marking type. The control unit 1400 may select two first marking units 1311 and one second marking unit 1321 capable of marking the inside of the defect area DA as the operation marking units AM. The control unit 1400 operates the first two marking units 1311 selected as the motion marking unit AM according to the marking type and/or the marking type information at predetermined time intervals while the optical film is being transferred. The second marking unit 1321 selected as the operation marking unit AM can be operated during the first, second and third cycles while the optical film is being transferred. By controlling so that it is possible to form the marking shape shown in Figure 5 (a) on the optical film.

The effects of the optical film marking system 1000 according to an embodiment of the present invention described above are as follows.

The optical film marking system 1000 may be disposed between the two first marking parts 1311 adjacent to the second marking part 1321 based on a direction parallel to the direction in which the first marking part 1311 is arranged. , There is an advantage of being able to form markings at close intervals along the width direction of the optical film by using a plurality of marking devices (the first marking device 1310 and the second marking device 1320). In addition, since the first marking part 1311 and the second marking part 1321 are not arranged side by side on the same virtual reference line parallel to the transport direction of the optical film, there may be more various combinations than those arranged on the same reference line. Marking shape can be formed. Accordingly, when it is necessary to perform defect inspection of an optical film by diversifying quality standards, there is an advantage of configuring various combinations of marking types corresponding to each of the diversified quality standards.

For example, in the case of a marking system in which the first marking part 1311 and the second marking part 1321 are arranged in parallel on the same virtual reference line parallel to the transport direction of the optical film, FIG. 5(b- As shown in 1) and (b-2), a marking type composed of only the first marking or a marking type composed of only the second marking cannot be set, but the optical film marking system 1000 of the present invention includes the first marking unit 1311 ) And the second marking part 1321 are not arranged side by side on the same virtual reference line parallel to the transport direction of the optical film, and thus (b-1) and (b-2) of FIG. 5 as well as ( As in c-1), (c-2), and (d-1), there is an advantage of being able to set a marking type including both the first and second markings. In addition, as shown in (e) of FIG. 5, a marking type such as a number type may be set. In addition, as can be seen in (b-3), (c-3) and (d-2) of FIG. 5, it is possible to set a marking type forming a plurality of rows in the traveling direction of the optical film.

In some cases, different types of defects are included in regions adjacent to each other on the optical film, and one of the marking types shown in Fig. 5(b-1) and the marking type shown in Fig. 5(b-2), respectively. If any one of them is to be formed, a marking system in which the first marking part 1311 and the second marking part 1321 are arranged in parallel on the same virtual reference line parallel to the transport direction of the optical film is used. In this case, there may be a problem that the first marking and the second marking overlap each other.

On the other hand, in the optical film marking system 1000 according to an embodiment of the present invention, two first markings adjacent to the second marking part 1321 are based on a direction parallel to the direction in which the first marking part 1311 is arranged. Since it may be disposed between the portions 1311, it is possible to prevent a problem in which the first and second markings overlap each other.

In the optical film marking system 1000, since at least one of the color, saturation, brightness, shape, and size of the first and second markings may be differently configured, the combination of the first and second markings distinguished from each other is As a result, various marking types can be formed according to the inspection result of the optical film.

In the optical film marking system 1000, the control unit 1400 selects at least one operation marking unit AM to be operated from among a plurality of first marking units 1311 and 1321 to determine whether to operate. It is possible to control or selectively control whether or not the operation marking unit (AM) is operated for a predetermined number of times while the optical film is being transferred, making it easier to make various types of markings by combining the first and second markings. Can be formed.

In the optical film marketing system 1000, the control unit 1400 selects the defect area DA on the optical film based on the defect inspection result and the marking type inspected by the inspection unit 1200, and the marking unit 1300 ), since the operation marking part AM is selected so that the marking shape to be formed is located inside the defect area DA, a marking can be formed on the defect area DA including the defect location, It is easy to check the type of defect and/or the degree of defect on the corresponding defect location.

Although the present invention has been described in connection with the above-mentioned preferred embodiments, it is possible to make various modifications or variations without departing from the spirit and scope of the invention. Accordingly, the scope of the appended claims will include such modifications or variations as long as they fall within the gist of the present invention.

1000: optical film marking system
1100: transfer unit
1110: supply roll
1120: winding roll
1130: feed roll
1200: inspection unit
1210: first optical inspection device
1220: second optical inspection device
1230: 3rd optical inspection device
1200a: light source
1200b: light receiving unit
1300: marking unit
1310: first marking device
1311: first marking part
1320: second marking device
1321: second marking portion
1400: control unit
1500: defect information extraction unit
1600: marking type storage unit
AM: Motion marking part
DA: defective area
δt1: first separation distance
δt2: second separation distance

Claims (11)

A transfer unit for transferring the optical film;
A first optical inspection device and a second optical inspection device are spaced apart from each other along the longitudinal direction in which the optical film is transported, and an inspection unit for inspecting defects in the optical film;
A marking unit for forming a mark on the optical film based on the defect inspection result inspected by the inspection unit; And
The defect information including whether the type of the defect is a foreign material is derived according to the level of the amount of light of the transmitted amount inspected through the first optical inspection device. Includes; a defect information extraction unit that derives defect information including whether or not the type is air bubbles,
The marking unit,
A marking device positioned downstream of the inspection unit, the first marking device including a plurality of first marking portions arranged along a direction crossing the transport direction of the optical film to form a first marking on the optical film; And
A second marking device located downstream of the first marking device, comprising a plurality of second marking parts arranged along a direction parallel to a direction in which the first marking parts are arranged to form a second marking on the optical film Device,
The second marking unit is disposed between two adjacent first marking units based on a direction parallel to a direction in which the first marking unit is arranged. The method of claim 1,
The first optical inspection device,
Inspecting the transmitted light transmitted through the other side of the light irradiated to one of the both sides of the optical film,
The second optical inspection device,
The optical film marking system to inspect the reflected light reflected by the one surface of the light irradiated to any one of the two surfaces of the optical film. The method of claim 1,
The optical film includes a polarizing film,
The inspection unit,
Including a third optical inspection device for inspecting the transmitted light transmitted through a polarizing filter having an absorption axis in a direction different from the other side and the polarizing film and the other side, Optical film marking system. The method of claim 1,
The first marking and the second marking are different in at least one of hue, saturation, brightness, shape and size. The method of claim 1,
According to the inspection result inspected by the inspection unit, the marking type to be formed through the marking unit is predetermined,
A control unit that controls whether or not to operate by selecting at least one operation marking unit to be operated from among the plurality of first marking units and the plurality of second marking units in order to form a marking shape corresponding to the test result inspected by the inspection unit Containing, optical film marking system. The method of claim 5,
The operation marking unit selected by the control unit,
At least two first marking portions adjacent to each other based on a direction parallel to the direction in which the first marking portions are arranged, and at least one second marking portion disposed between the two first marking portions, or
An optical film comprising at least two second marking portions adjacent to each other based on a direction parallel to the direction in which the first marking portions are arranged, and at least one first marking portion disposed between the two second marking portions Marking system. The method of claim 5,
The control unit controls whether or not the motion marking unit is operated by a predetermined number of times while the optical film is being transferred to form a marking shape corresponding to the inspection result inspected by the inspection unit. The method of claim 5,
The control unit selects a defect area on the optical film based on the defect location inspected by the inspection unit, and selects the operation marking unit so that the marking type to be formed through the marking unit is located inside the defect area, Optical film marking system. The method of claim 1,
The optical film marking system, wherein a first separation distance between two adjacent first marking portions and a second separation distance between two adjacent second marking portions are the same. The method of claim 1,
The order of the first marking part and the second marking part alternately with each other based on a direction parallel to the direction in which the first marking part is arranged. The method of claim 10,
The second marking unit is disposed at a center between two adjacent first marking units based on a direction parallel to a direction in which the first marking unit is arranged.

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