KR20190039110A - 검사 장치, 검사 방법, 및 프로그램 - Google Patents

검사 장치, 검사 방법, 및 프로그램 Download PDF

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Publication number
KR20190039110A
KR20190039110A KR1020197003298A KR20197003298A KR20190039110A KR 20190039110 A KR20190039110 A KR 20190039110A KR 1020197003298 A KR1020197003298 A KR 1020197003298A KR 20197003298 A KR20197003298 A KR 20197003298A KR 20190039110 A KR20190039110 A KR 20190039110A
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South Korea
Prior art keywords
image
wavelength
pixels
wavelength band
detection
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Abandoned
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KR1020197003298A
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English (en)
Korean (ko)
Inventor
히토시 미타니
마사후미 와카조노
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소니 주식회사
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Publication of KR20190039110A publication Critical patent/KR20190039110A/ko
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    • H04N5/23238
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00Geometric image transformations in the plane of the image
    • G06T3/40Scaling of whole images or parts thereof, e.g. expanding or contracting
    • G06T3/4038Image mosaicing, e.g. composing plane images from plane sub-images
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • H04N23/11Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths for generating image signals from visible and infrared light wavelengths
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60Control of cameras or camera modules
    • H04N23/698Control of cameras or camera modules for achieving an enlarged field of view, e.g. panoramic image capture
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/41Extracting pixel data from a plurality of image sensors simultaneously picking up an image, e.g. for increasing the field of view by combining the outputs of a plurality of sensors
    • H04N5/3415
    • H04N9/045
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3148Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using three or more wavelengths
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255Details, e.g. use of specially adapted sources, lighting or optical systems
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3025Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10032Satellite or aerial image; Remote sensing
    • G06T2207/10036Multispectral image; Hyperspectral image
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30181Earth observation
    • G06T2207/30188Vegetation; Agriculture
    • H04N2005/2255
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50Constructional details
    • H04N23/555Constructional details for picking-up images in sites, inaccessible due to their dimensions or hazardous conditions, e.g. endoscopes or borescopes

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Optical Filters (AREA)
  • Polarising Elements (AREA)
  • Color Television Image Signal Generators (AREA)
  • Studio Devices (AREA)
KR1020197003298A 2016-08-17 2017-08-03 검사 장치, 검사 방법, 및 프로그램 Abandoned KR20190039110A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2016159854A JP6697681B2 (ja) 2016-08-17 2016-08-17 検査装置、検査方法、およびプログラム
JPJP-P-2016-159854 2016-08-17
PCT/JP2017/028290 WO2018034167A1 (en) 2016-08-17 2017-08-03 Examination device, examination method, and program

Publications (1)

Publication Number Publication Date
KR20190039110A true KR20190039110A (ko) 2019-04-10

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KR1020197003298A Abandoned KR20190039110A (ko) 2016-08-17 2017-08-03 검사 장치, 검사 방법, 및 프로그램

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Country Link
US (1) US10893221B2 (https=)
EP (1) EP3501169A1 (https=)
JP (1) JP6697681B2 (https=)
KR (1) KR20190039110A (https=)
CN (1) CN109565578B (https=)
WO (1) WO2018034167A1 (https=)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7070423B2 (ja) * 2016-10-17 2022-05-18 ソニーグループ株式会社 画像処理装置と画像処理方法および撮像装置
KR102500640B1 (ko) * 2018-03-02 2023-02-15 제이에프이 스틸 가부시키가이샤 로의 제어 방법
CN113315934A (zh) * 2019-04-23 2021-08-27 Oppo广东移动通信有限公司 一种单色偏振式cis及图像处理方法、存储介质
JP7525119B2 (ja) * 2019-08-28 2024-07-30 兵庫県公立大学法人 試料測定装置および試料測定方法
WO2021055585A1 (en) 2019-09-17 2021-03-25 Boston Polarimetrics, Inc. Systems and methods for surface modeling using polarization cues
WO2021071995A1 (en) 2019-10-07 2021-04-15 Boston Polarimetrics, Inc. Systems and methods for surface normals sensing with polarization
CN112629655B (zh) * 2019-10-09 2024-06-04 北京小米移动软件有限公司 移动终端
EP4066001B1 (en) 2019-11-30 2026-03-04 Intrinsic Innovation LLC Systems and methods for transparent object segmentation using polarization cues
CN111161283B (zh) * 2019-12-26 2023-08-04 可牛网络技术(北京)有限公司 一种处理图片资源的方法、装置及电子设备
CN113835135B (zh) * 2020-06-23 2022-11-22 同方威视技术股份有限公司 太赫兹安检机器人
US12352689B2 (en) 2020-06-24 2025-07-08 Rubens IP Pty Ltd Detecting plant product properties
CN115811935A (zh) 2020-07-03 2023-03-17 昕诺飞控股有限公司 用于确定植物的生长阶段的方法和系统
JP7757964B2 (ja) * 2020-07-17 2025-10-22 ソニーグループ株式会社 撮像処理システムおよび3dモデル生成方法
JP2022098668A (ja) * 2020-12-22 2022-07-04 セイコーエプソン株式会社 分光測定方法、分光測定システム、及びコンピュータープログラム
JP2023179319A (ja) * 2022-06-07 2023-12-19 株式会社ジーエスワークス 植物情報収集装置、植物育成状態判定装置、及び植物育成状態判定プログラム
US20260017807A1 (en) * 2024-05-10 2026-01-15 The United States Of America As Represented By The Secretary Of The Navy Optical surveillance system for detecting airborne objects and method for detecting airborne objects

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4932978A (https=) 1972-07-26 1974-03-26

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4932978B1 (https=) 1969-06-10 1974-09-04
WO2008149489A1 (ja) * 2007-05-31 2008-12-11 Panasonic Corporation 画像処理装置
US8463078B2 (en) * 2007-08-23 2013-06-11 Lockheed Martin Corporation Multi-bank TDI approach for high-sensitivity scanners
JP5428509B2 (ja) * 2009-05-11 2014-02-26 ソニー株式会社 2次元固体撮像装置、及び、2次元固体撮像装置における偏光光データ処理方法
US8823848B2 (en) * 2009-06-11 2014-09-02 The Arizona Board Of Regents On Behalf Of The University Of Arizona Microgrid imaging polarimeters with frequency domain reconstruction
JP4932978B2 (ja) 2010-08-04 2012-05-16 パナソニック株式会社 撮像素子および撮像装置
JP2013031054A (ja) * 2011-07-29 2013-02-07 Ricoh Co Ltd 撮像装置及びこれを備えた物体検出装置、並びに、光学フィルタ及びその製造方法
WO2013031100A1 (ja) * 2011-09-02 2013-03-07 パナソニック株式会社 偏光撮像素子および内視鏡
US20130070140A1 (en) * 2011-09-21 2013-03-21 Robert Gove Image sensors with multiple lenses of varying polarizations
JP5820794B2 (ja) * 2012-10-05 2015-11-24 オリンパス株式会社 撮像装置
JP5807192B2 (ja) * 2013-01-21 2015-11-10 パナソニックIpマネジメント株式会社 測定装置および測定方法
WO2015015722A1 (ja) * 2013-07-29 2015-02-05 パナソニックIpマネジメント株式会社 光学フィルタおよびそれを用いた偏光撮像装置
WO2015015717A1 (ja) * 2013-07-30 2015-02-05 パナソニックIpマネジメント株式会社 撮像装置、並びにそれを用いた撮像システム、電子ミラーシステムおよび測距装置
US10051209B2 (en) * 2014-04-09 2018-08-14 Omnivision Technologies, Inc. Combined visible and non-visible projection system
US9686487B1 (en) * 2014-04-30 2017-06-20 Lockheed Martin Corporation Variable scan rate image generation
US20160006954A1 (en) * 2014-07-03 2016-01-07 Snap Vision Technologies LLC Multispectral Detection and Processing From a Moving Platform
US9876972B1 (en) * 2014-08-28 2018-01-23 Lockheed Martin Corporation Multiple mode and multiple waveband detector systems and methods
JP2016049102A (ja) * 2014-08-29 2016-04-11 株式会社リコー 圃場管理システム、圃場管理方法、プログラム
EP3264754B1 (en) * 2015-02-27 2022-02-16 Sony Group Corporation Image processing device, image processing method and image capturing element
WO2016208415A1 (ja) * 2015-06-26 2016-12-29 ソニー株式会社 検査装置、センシング装置、感度制御装置、検査方法、並びにプログラム
US10559616B2 (en) * 2015-07-30 2020-02-11 Sony Semiconductor Solutions Corporation Solid-state imaging apparatus and electronic device
EP3376759B1 (en) * 2015-11-10 2021-04-14 Sony Corporation Image processing device and image processing method
JP6650839B2 (ja) * 2016-06-24 2020-02-19 日立造船株式会社 偏光カメラ及び画像処理方法
JP6697680B2 (ja) * 2016-08-17 2020-05-27 ソニー株式会社 信号処理装置、信号処理方法、およびプログラム

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4932978A (https=) 1972-07-26 1974-03-26

Also Published As

Publication number Publication date
US10893221B2 (en) 2021-01-12
EP3501169A1 (en) 2019-06-26
CN109565578A (zh) 2019-04-02
JP2018029251A (ja) 2018-02-22
US20190174077A1 (en) 2019-06-06
JP6697681B2 (ja) 2020-05-27
CN109565578B (zh) 2022-03-11
WO2018034167A1 (en) 2018-02-22

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