KR20190039110A - 검사 장치, 검사 방법, 및 프로그램 - Google Patents

검사 장치, 검사 방법, 및 프로그램 Download PDF

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Publication number
KR20190039110A
KR20190039110A KR1020197003298A KR20197003298A KR20190039110A KR 20190039110 A KR20190039110 A KR 20190039110A KR 1020197003298 A KR1020197003298 A KR 1020197003298A KR 20197003298 A KR20197003298 A KR 20197003298A KR 20190039110 A KR20190039110 A KR 20190039110A
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KR
South Korea
Prior art keywords
image
wavelength
pixels
wavelength band
detection
Prior art date
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Abandoned
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KR1020197003298A
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English (en)
Korean (ko)
Inventor
히토시 미타니
마사후미 와카조노
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소니 주식회사
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Application filed by 소니 주식회사 filed Critical 소니 주식회사
Publication of KR20190039110A publication Critical patent/KR20190039110A/ko
Abandoned legal-status Critical Current

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    • H04N5/23238—
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformations in the plane of the image
    • G06T3/40—Scaling of whole images or parts thereof, e.g. expanding or contracting
    • G06T3/4038—Image mosaicing, e.g. composing plane images from plane sub-images
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • H04N23/11—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths for generating image signals from visible and infrared light wavelengths
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/698—Control of cameras or camera modules for achieving an enlarged field of view, e.g. panoramic image capture
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/41—Extracting pixel data from a plurality of image sensors simultaneously picking up an image, e.g. for increasing the field of view by combining the outputs of a plurality of sensors
    • H04N5/3415—
    • H04N9/045—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3148—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using three or more wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10032—Satellite or aerial image; Remote sensing
    • G06T2207/10036—Multispectral image; Hyperspectral image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30181—Earth observation
    • G06T2207/30188—Vegetation; Agriculture
    • H04N2005/2255—
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50—Constructional details
    • H04N23/555—Constructional details for picking-up images in sites, inaccessible due to their dimensions or hazardous conditions, e.g. endoscopes or borescopes

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Filters (AREA)
  • Polarising Elements (AREA)
  • Color Television Image Signal Generators (AREA)
  • Studio Devices (AREA)
  • Spectrometry And Color Measurement (AREA)
KR1020197003298A 2016-08-17 2017-08-03 검사 장치, 검사 방법, 및 프로그램 Abandoned KR20190039110A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2016159854A JP6697681B2 (ja) 2016-08-17 2016-08-17 検査装置、検査方法、およびプログラム
JPJP-P-2016-159854 2016-08-17
PCT/JP2017/028290 WO2018034167A1 (en) 2016-08-17 2017-08-03 Examination device, examination method, and program

Publications (1)

Publication Number Publication Date
KR20190039110A true KR20190039110A (ko) 2019-04-10

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KR1020197003298A Abandoned KR20190039110A (ko) 2016-08-17 2017-08-03 검사 장치, 검사 방법, 및 프로그램

Country Status (6)

Country Link
US (1) US10893221B2 (enExample)
EP (1) EP3501169A1 (enExample)
JP (1) JP6697681B2 (enExample)
KR (1) KR20190039110A (enExample)
CN (1) CN109565578B (enExample)
WO (1) WO2018034167A1 (enExample)

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BR112020017230B1 (pt) * 2018-03-02 2023-05-09 Jfe Steel Corporation Método de controle de forno
CN113315934A (zh) * 2019-04-23 2021-08-27 Oppo广东移动通信有限公司 一种单色偏振式cis及图像处理方法、存储介质
JP7525119B2 (ja) * 2019-08-28 2024-07-30 兵庫県公立大学法人 試料測定装置および試料測定方法
US11270110B2 (en) 2019-09-17 2022-03-08 Boston Polarimetrics, Inc. Systems and methods for surface modeling using polarization cues
CN114746717A (zh) * 2019-10-07 2022-07-12 波士顿偏振测定公司 利用偏振进行表面法线感测的系统和方法
CN112629655B (zh) * 2019-10-09 2024-06-04 北京小米移动软件有限公司 移动终端
JP7329143B2 (ja) 2019-11-30 2023-08-17 ボストン ポーラリメトリックス，インコーポレイティド 偏光キューを用いた透明な物体のセグメンテーションのためのシステム及び方法
CN111161283B (zh) * 2019-12-26 2023-08-04 可牛网络技术（北京）有限公司 一种处理图片资源的方法、装置及电子设备
CN113835135B (zh) * 2020-06-23 2022-11-22 同方威视技术股份有限公司 太赫兹安检机器人
AU2021297512A1 (en) * 2020-06-24 2023-02-23 Rubens IP Pty Ltd Detecting plant product properties
WO2022002610A1 (en) 2020-07-03 2022-01-06 Signify Holding B.V. Methods and systems for determining the growth stage of a plant
US12493146B2 (en) * 2020-07-17 2025-12-09 Sony Group Corporation Imaging processing system and 3D model generation method
JP2022098668A (ja) * 2020-12-22 2022-07-04 セイコーエプソン株式会社 分光測定方法、分光測定システム、及びコンピュータープログラム

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JPS4932978A (enExample) 1972-07-26 1974-03-26

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US7760256B2 (en) * 2007-05-31 2010-07-20 Panasonic Corporation Image processing apparatus that obtains color and polarization information
US8463078B2 (en) * 2007-08-23 2013-06-11 Lockheed Martin Corporation Multi-bank TDI approach for high-sensitivity scanners
JP5428509B2 (ja) * 2009-05-11 2014-02-26 ソニー株式会社 ２次元固体撮像装置、及び、２次元固体撮像装置における偏光光データ処理方法
US8823848B2 (en) * 2009-06-11 2014-09-02 The Arizona Board Of Regents On Behalf Of The University Of Arizona Microgrid imaging polarimeters with frequency domain reconstruction
WO2012017600A1 (ja) * 2010-08-04 2012-02-09 パナソニック株式会社 撮像素子および撮像装置
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JP5820794B2 (ja) * 2012-10-05 2015-11-24 オリンパス株式会社 撮像装置
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Also Published As

Publication number Publication date
US20190174077A1 (en) 2019-06-06
US10893221B2 (en) 2021-01-12
WO2018034167A1 (en) 2018-02-22
CN109565578B (zh) 2022-03-11
JP6697681B2 (ja) 2020-05-27
EP3501169A1 (en) 2019-06-26
JP2018029251A (ja) 2018-02-22
CN109565578A (zh) 2019-04-02

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