KR20180118189A - 깊이 감지 시스템들 및 방법들 - Google Patents

깊이 감지 시스템들 및 방법들 Download PDF

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Publication number
KR20180118189A
KR20180118189A KR1020187028216A KR20187028216A KR20180118189A KR 20180118189 A KR20180118189 A KR 20180118189A KR 1020187028216 A KR1020187028216 A KR 1020187028216A KR 20187028216 A KR20187028216 A KR 20187028216A KR 20180118189 A KR20180118189 A KR 20180118189A
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KR
South Korea
Prior art keywords
light
sensor
depth sensing
sensing system
visible light
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Ceased
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KR1020187028216A
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English (en)
Korean (ko)
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그레고리 마이클 링크
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매직 립, 인코포레이티드
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Publication of KR20180118189A publication Critical patent/KR20180118189A/ko
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/703—SSIS architectures incorporating pixels for producing signals other than image signals
    • H04N25/705—Pixels for depth measurement, e.g. RGBZ
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/1006—Beam splitting or combining systems for splitting or combining different wavelengths
    • G02B27/1013—Beam splitting or combining systems for splitting or combining different wavelengths for colour or multispectral image sensors, e.g. splitting an image into monochromatic image components on respective sensors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/208—Filters for use with infrared or ultraviolet radiation, e.g. for separating visible light from infrared and/or ultraviolet radiation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/13—Edge detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/55—Depth or shape recovery from multiple images
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • H04N23/11—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths for generating image signals from visible and infrared light wavelengths
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/45—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from two or more image sensors being of different type or operating in different modes, e.g. with a CMOS sensor for moving images in combination with a charge-coupled device [CCD] for still images
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/10—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming different wavelengths into image signals
    • H04N25/11—Arrangement of colour filter arrays [CFA]; Filter mosaics
    • H04N25/13—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements
    • H04N25/131—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements including elements passing infrared wavelengths
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/10—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming different wavelengths into image signals
    • H04N25/11—Arrangement of colour filter arrays [CFA]; Filter mosaics
    • H04N25/13—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements
    • H04N25/133—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements including elements passing panchromatic light, e.g. filters passing white light
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/702—SSIS architectures characterised by non-identical, non-equidistant or non-planar pixel layout
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/222—Studio circuitry; Studio devices; Studio equipment
    • H04N5/2224—Studio circuitry; Studio devices; Studio equipment related to virtual studio applications
    • H04N5/2226—Determination of depth image, e.g. for foreground/background separation
    • H04N5/2258—
    • H04N5/332—
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/802—Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
    • H10F39/8023—Disposition of the elements in pixels, e.g. smaller elements in the centre of the imager compared to larger elements at the periphery
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/805—Coatings
    • H10F39/8053—Colour filters
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10048—Infrared image

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Human Computer Interaction (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
KR1020187028216A 2016-03-01 2017-02-28 깊이 감지 시스템들 및 방법들 Ceased KR20180118189A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201662301847P 2016-03-01 2016-03-01
US62/301,847 2016-03-01
PCT/US2017/020030 WO2017151671A1 (en) 2016-03-01 2017-02-28 Depth sensing systems and methods

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Publication Number Publication Date
KR20180118189A true KR20180118189A (ko) 2018-10-30

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US (3) US10565717B2 (cg-RX-API-DMAC10.html)
EP (2) EP3902249B1 (cg-RX-API-DMAC10.html)
JP (3) JP6695440B2 (cg-RX-API-DMAC10.html)
KR (1) KR20180118189A (cg-RX-API-DMAC10.html)
CN (2) CN108779978B (cg-RX-API-DMAC10.html)
AU (2) AU2017227599A1 (cg-RX-API-DMAC10.html)
CA (1) CA3014766A1 (cg-RX-API-DMAC10.html)
IL (3) IL288771B2 (cg-RX-API-DMAC10.html)
NZ (2) NZ785500A (cg-RX-API-DMAC10.html)
WO (1) WO2017151671A1 (cg-RX-API-DMAC10.html)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108779978B (zh) 2016-03-01 2020-12-11 奇跃公司 深度感测系统和方法
WO2019054204A1 (ja) * 2017-09-14 2019-03-21 ソニー株式会社 画像処理装置および方法
CN111542827B (zh) 2017-12-29 2021-09-28 上海联影医疗科技股份有限公司 一种患者定位的系统和方法
CN116777901B (zh) * 2017-12-29 2026-03-03 上海联影医疗科技股份有限公司 一种用于医学成像中的生成对象的三维模型的系统
US11176694B2 (en) * 2018-10-19 2021-11-16 Samsung Electronics Co., Ltd Method and apparatus for active depth sensing and calibration method thereof
TWI720602B (zh) * 2019-08-27 2021-03-01 國立中央大學 重建物體表面的方法與光學系統
CN112532848A (zh) * 2020-12-16 2021-03-19 歌尔光学科技有限公司 一种摄像机

Family Cites Families (52)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5621529A (en) * 1995-04-05 1997-04-15 Intelligent Automation Systems, Inc. Apparatus and method for projecting laser pattern with reduced speckle noise
BR9709679A (pt) * 1996-06-13 2000-01-11 Leuven K U Res & Dev Sistema e processo para alcançar uma descrição de forma tridimencional.
JPH10253330A (ja) * 1997-03-06 1998-09-25 Toshiba Corp 表面形状測定装置
US6563105B2 (en) * 1999-06-08 2003-05-13 University Of Washington Image acquisition with depth enhancement
JP2001194114A (ja) * 2000-01-14 2001-07-19 Sony Corp 画像処理装置および画像処理方法、並びにプログラム提供媒体
US7061628B2 (en) * 2001-06-27 2006-06-13 Southwest Research Institute Non-contact apparatus and method for measuring surface profile
JP4035978B2 (ja) * 2001-10-05 2008-01-23 コニカミノルタホールディングス株式会社 ３次元形状モデルの評価方法および生成方法並びに装置
JP2004126416A (ja) * 2002-10-07 2004-04-22 Fuji Photo Film Co Ltd カメラ
ATE404952T1 (de) * 2003-07-24 2008-08-15 Cognitens Ltd Verfahren und system zur dreidimensionalen oberflächenrekonstruktion eines objekts
US8918162B2 (en) * 2007-04-17 2014-12-23 Francine J. Prokoski System and method for using three dimensional infrared imaging to provide psychological profiles of individuals
US8757812B2 (en) * 2008-05-19 2014-06-24 University of Washington UW TechTransfer—Invention Licensing Scanning laser projection display devices and methods for projecting one or more images onto a surface with a light-scanning optical fiber
EP4336447B1 (en) * 2008-05-20 2025-05-07 Adeia Imaging LLC Capturing and processing of images using monolithic camera array with heterogeneous imagers
JP5874116B2 (ja) * 2009-07-30 2016-03-02 国立研究開発法人産業技術総合研究所 画像撮影装置および画像撮影方法
US8723118B2 (en) * 2009-10-01 2014-05-13 Microsoft Corporation Imager for constructing color and depth images
KR20110040402A (ko) * 2009-10-14 2011-04-20 삼성전자주식회사 필터 어레이, 이를 포함하는 이미지 센서, 및 신호 보간 방법
KR101648201B1 (ko) * 2009-11-04 2016-08-12 삼성전자주식회사 영상 센서 및 이의 제조 방법.
GB0921461D0 (en) * 2009-12-08 2010-01-20 Qinetiq Ltd Range based sensing
US8456521B2 (en) * 2009-12-14 2013-06-04 Berliner Glas Kgaa Herbert Kubatz Gmbh & Co. Triangulation camera device and triangulation imaging method
JP2011199798A (ja) * 2010-03-24 2011-10-06 Sony Corp 物理情報取得装置、固体撮像装置、物理情報取得方法
AU2011237782A1 (en) 2010-04-09 2012-10-25 The Regents Of The University Of Michigan Biomarkers for MDM2 inhibitors for use in treating disease
WO2011135848A1 (ja) * 2010-04-28 2011-11-03 パナソニック株式会社 走査型画像表示装置
US20120146172A1 (en) * 2010-06-18 2012-06-14 Sionyx, Inc. High Speed Photosensitive Devices and Associated Methods
KR101680762B1 (ko) * 2010-10-29 2016-11-29 삼성전자주식회사 3ｄ 카메라용 빔스플리터 및 상기 빔스플리터를 채용한 3차원 영상 획득 장치
KR101739880B1 (ko) * 2010-12-01 2017-05-26 삼성전자주식회사 컬러 필터 어레이, 이를 포함하는 이미지 센서, 및 이를 포함하는 이미지 처리 장치
KR101861765B1 (ko) * 2011-03-03 2018-05-29 삼성전자주식회사 마이크로 렌즈를 포함하는 깊이 픽셀 및 상기 깊이 픽셀을 포함하는 깊이 센서
KR20120105169A (ko) * 2011-03-15 2012-09-25 삼성전자주식회사 복수의 거리 픽셀들을 포함하는 3차원 이미지 센서의 구동 방법
JP5761750B2 (ja) * 2011-07-19 2015-08-12 国立研究開発法人産業技術総合研究所 画像処理方法および装置
US9248457B2 (en) 2011-07-29 2016-02-02 Homax Products, Inc. Systems and methods for dispensing texture material using dual flow adjustment
CN102663725B (zh) 2012-03-05 2014-07-16 西北工业大学 基于线特征和控制点的可见光和sar图像配准方法
JP5958837B2 (ja) * 2012-05-28 2016-08-02 パナソニックＩｐマネジメント株式会社 奥行き推定撮像装置
WO2014020823A1 (ja) * 2012-07-30 2014-02-06 独立行政法人産業技術総合研究所 画像処理システムおよび画像処理方法
EP3869797B1 (en) * 2012-08-21 2023-07-19 Adeia Imaging LLC Method for depth detection in images captured using array cameras
WO2014041742A1 (ja) * 2012-09-14 2014-03-20 パナソニック株式会社 固体撮像装置及びカメラモジュール
JP5971050B2 (ja) * 2012-09-18 2016-08-17 富士通株式会社 形状計測装置及び形状計測方法
US9041914B2 (en) * 2013-03-15 2015-05-26 Faro Technologies, Inc. Three-dimensional coordinate scanner and method of operation
US9646384B2 (en) * 2013-09-11 2017-05-09 Google Technology Holdings LLC 3D feature descriptors with camera pose information
US8917327B1 (en) * 2013-10-04 2014-12-23 icClarity, Inc. Method to use array sensors to measure multiple types of data at full resolution of the sensor
CN113433700B (zh) 2013-11-27 2024-03-22 奇跃公司 虚拟和增强现实系统与方法
US10051211B2 (en) * 2013-12-05 2018-08-14 Omnivision Technologies, Inc. Image sensors for capturing both visible light images and infrared light images, and associated systems and methods
US9392262B2 (en) * 2014-03-07 2016-07-12 Aquifi, Inc. System and method for 3D reconstruction using multiple multi-channel cameras
US10051209B2 (en) * 2014-04-09 2018-08-14 Omnivision Technologies, Inc. Combined visible and non-visible projection system
US9325973B1 (en) * 2014-07-08 2016-04-26 Aquifi, Inc. Dynamically reconfigurable optical pattern generator module useable with a system to rapidly reconstruct three-dimensional data
CN107431779B (zh) * 2015-03-17 2020-09-18 索尼公司 信息处理设备和方法
US9694498B2 (en) * 2015-03-30 2017-07-04 X Development Llc Imager for detecting visual light and projected patterns
US10066933B2 (en) * 2015-05-04 2018-09-04 Facebook, Inc. Camera depth mapping using structured light patterns
CN105049829B (zh) * 2015-07-10 2018-12-25 上海图漾信息科技有限公司 滤光片、图像传感器、成像装置以及三维成像系统
US10503265B2 (en) * 2015-09-08 2019-12-10 Microvision, Inc. Mixed-mode depth detection
US10453185B2 (en) * 2015-11-12 2019-10-22 Aquifi, Inc. System and method for high dynamic range depth capture using multiple cameras
JP2017112169A (ja) * 2015-12-15 2017-06-22 ソニー株式会社 イメージセンサ、撮像システム及びイメージセンサの製造方法
CN108779978B (zh) 2016-03-01 2020-12-11 奇跃公司 深度感测系统和方法
US10616519B2 (en) * 2016-12-20 2020-04-07 Microsoft Technology Licensing, Llc Global shutter pixel structures with shared transfer gates
JP7418181B2 (ja) * 2018-11-06 2024-01-19 ミヨシ油脂株式会社 分散剤とそれを用いた分散液

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IL261149A (en) 2018-10-31
IL261149B (en) 2021-04-29
IL288771A (en) 2022-02-01
AU2021266266A1 (en) 2021-12-09
JP6695440B2 (ja) 2020-05-20
IL288771B2 (en) 2023-09-01
US11475583B2 (en) 2022-10-18
US20170256069A1 (en) 2017-09-07
JP2022009902A (ja) 2022-01-14
US10565717B2 (en) 2020-02-18
CA3014766A1 (en) 2017-09-08
NZ785500A (en) 2023-03-31
EP3902249A1 (en) 2021-10-27
US20200143553A1 (en) 2020-05-07
AU2017227599A1 (en) 2018-08-30
NZ745309A (en) 2023-03-31
EP3423784A1 (en) 2019-01-09
CN108779978B (zh) 2020-12-11
US20210183087A1 (en) 2021-06-17
EP3902249B1 (en) 2025-01-29
IL288771B1 (en) 2023-05-01
JP2019512678A (ja) 2019-05-16
IL281676B (en) 2022-01-01
US10964039B2 (en) 2021-03-30
JP7270702B2 (ja) 2023-05-10
EP3423784A4 (en) 2019-01-09
IL281676A (en) 2021-05-31
CN108779978A (zh) 2018-11-09
EP3423784B1 (en) 2021-07-28
CN112399028B (zh) 2025-04-29
JP2020144136A (ja) 2020-09-10
CN112399028A (zh) 2021-02-23
JP6972224B2 (ja) 2021-11-24
WO2017151671A1 (en) 2017-09-08

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