KR20180026028A - Display device and method for repair the same - Google Patents

Abstract

The present embodiment may include a display panel including m (rows) x n (rows) subpixels, wherein each subpixel includes a first organic light emitting diode, a second organic light emitting diode, a driving transistor, a switching transistor, and a storage capacitor, a first repair subpixel electrically connecting the first organic light emitting diode of a defective subpixel, and a second repair subpixel electrically connecting the second organic light emitting diode of the defective subpixel. The present embodiment has the effect of improving visibility in a display driving process by connecting the first and second organic light emitting diodes arranged in the defective subpixel to adjacent normal subpixels, respectively.

Description

DISPLAY APPARATUS AND METHOD FOR REPAIRING THE SAME

The present embodiment relates to a display device and a repair method thereof.

2. Description of the Related Art As an information society has developed, demands for a display device for displaying an image have been increasing in various forms. In recent years, a liquid crystal display (LCD), a plasma display (Plasma Display) OLED (Organic Light Emitting Diode Display) and the like.

On the other hand, in the display panel of such a display device, elements such as transistors, capacitors or organic light emitting diodes are arranged for each subpixel. In the manufacturing process of the display panel, (Short) or disconnection (open, disconnection), and a subpixel defect in which the subpixel becomes a luminescent spot or a dark spot may occur.

Conventionally, in the case of such subpixel failure, a repair process has been carried out in which a defective subpixel which has become a bright spot or a dark spot is made an abnormal subpixel which does not operate at all. That is, in the conventional repair processing method, a bad subpixel which has become a bright spot or a dark spot is made an abnormal subpixel which does not operate.

Such a conventional repair processing method has a problem that visibility of a display image is deteriorated because it appears as a dark spot or a bright spot in the display panel.

The present embodiment is intended to provide a display device and a repairing method thereof that electrically connect a defective subpixel to a normal subpixel to prevent bad visibility from being degraded by rendering a defective subpixel into a dark spot or a bright spot.

In addition, the present embodiment provides a display device in which the visibility in the display drive is improved by connecting the first and second organic light emitting diodes disposed in the defective subpixel by dividing the first and second organic light emitting diodes into adjacent normal subpixels, respectively, and a repair method thereof There is a purpose.

The display device according to the present embodiment has a display panel in which m (m: natural number) data lines and n (n: natural number) gate lines are arranged and m (column) x (row) .

In addition, in the display device according to the present embodiment, each sub-pixel includes a first organic light emitting diode, a second organic light emitting diode connected in series with the first organic light emitting diode, a second organic light emitting diode connected to the second organic light emitting diode, A switching transistor connected to the driving transistor and the second node, and a storage capacitor connected between the first node and the second node.

Further, when the defective subpixel among the subpixels is referred to as a subpixel in the k-th row (k < n), the display device according to the present embodiments is characterized in that the defective subpixel and the adjacent k + And a first repair subpixel configured by electrically connecting the first organic light emitting diode of the subpixel.

The display device according to the present embodiment may include a second repair subpixel configured by electrically connecting the adjacent k-1th subpixel in the same column as the defective subpixel and the second organic light emitting diode of the defective subpixel have.

Further, the display device according to the present embodiments may further include a sensing transistor disposed between the first node and the reference voltage line in each sub-pixel.

Further, in the display device according to the present embodiments, the driving transistor, the switching transistor, and the sensing transistor of the defective sub-pixel may be in a dead state by cutting.

Also, in the display device according to the present embodiments, the first organic light emitting diode and the second organic light emitting diode may be electrically disconnected from each other by cutting in the defective subpixel.

In addition, in the display device according to the present embodiments, the first repair subpixel includes first and second organic light emitting diodes connected in series with the first and second organic light emitting diodes connected in series in the (k + 1) And a first organic light emitting diode of a defective subpixel connected in parallel with the first organic light emitting diode.

In the display device according to the present embodiment, the second repair subpixel may include first and second organic light emitting diodes connected in series with the first and second organic light emitting diodes connected in series in the subpixel of the (k-1) And a second organic light emitting diode of a defective subpixel connected in parallel with the first organic light emitting diode.

In the display device according to the present embodiment, the data voltages are supplied to the respective subpixels during display driving, and the repair voltage data voltages different from the data voltages may be supplied to the first repair subpixel and the second repair subpixel .

Further, the repair method of the display device according to the present embodiments may include identifying a bad subpixel of k (k < n) th row in the subpixels.

In addition, the repair method of the display device according to the present embodiments is characterized in that the transistor disposed in the circuit region of the defective subpixel is cut into a dead state, and the first organic light emitting diode of the defective subpixel and the defective subpixel And forming the first repair subpixel by connecting the first repair subpixel with the (k + 1) -th row subpixel adjacent in the column direction.

Further, the repairing method of the display device according to the present embodiments is characterized in that the second organic light emitting diode of the defective subpixel and the defective subpixel are connected to the subpixel of the (k-1) To form a second layer.

Further, the repair method of the display device according to the present embodiments is characterized in that the step of making the transistors of the defective subpixel into a dead state includes a step of electrically isolating the first organic light emitting diode and the second organic light emitting diode, Process. &Lt; / RTI &gt;

Also, the repair method of the display device according to the present embodiments is characterized in that the first organic light emitting diode of the subpixel in the (k + 1) th row and the defective subpixel in the kth row is electrically connected using the first repair line As shown in FIG.

The repair method of the display device according to the present embodiment is characterized in that the second organic light emitting diode of the subpixel in the (k-1) th row and the defective subpixel in the kth row is electrically connected using the second repair line As shown in FIG.

Further, in the repair method of the display device according to the present embodiments, when the display panel drives the display, the data voltages are supplied to the respective subpixels, and the repair voltages of the first and second repair subpixels Lt; RTI ID = 0.0 &gt; voltage. &Lt; / RTI &gt;

The display device and the repair method according to the present embodiments can improve the visibility in the display driving by connecting the first and second organic light emitting diodes disposed in the defective subpixel to the adjacent normal subpixels, respectively.

The display device and its repairing method according to the present embodiment have an effect of preventing the visibility of the defective sub-pixel from being lowered by making the defective sub-pixel electrically connect to the normal sub-pixel by making the defective sub-pixel into a dark spot or bright spot.

In addition, the display device and the repair method according to the present embodiment are effective in improving the visibility in the display drive by connecting the first and second organic light emitting diodes disposed in the defective subpixel to the adjacent normal subpixels, respectively have.

1 is a schematic system configuration diagram of an organic light emitting display according to the present embodiments.
2 is an equivalent circuit diagram of subpixels in a display panel of an OLED display according to the present embodiments.
3 is another equivalent circuit diagram of subpixels in the display panel of the OLED display according to the present embodiments.
FIG. 4 is a view showing a defective sub-pixel in a display panel of an OLED display according to the present embodiments.
5 is a view illustrating a repair method of the OLED display according to the present embodiments.
6A is a diagram illustrating a repair method applied to a defective sub-pixel of an OLED display according to an exemplary embodiment of the present invention.
FIG. 6B is a view showing a display failure of the display panel of the organic light emitting display device when the repair method is applied according to FIG. 6A.
7 is a view for repairing a defective sub-pixel using another repair method of the OLED display according to the present embodiments.
8 is a view showing an improved visibility when the repair method is applied to the organic light emitting display according to the present embodiments.
FIG. 9 is a diagram illustrating a repair method applied to the organic light emitting display having the sub-pixel structure of FIG. 2 according to the present embodiments.
10 is a diagram illustrating a repair method applied to the OLED display device having the sub-pixel structure of FIG. 3 according to the present embodiments.
11 is a flowchart showing another repair method of the organic light emitting diode display according to the present embodiments.

BRIEF DESCRIPTION OF THE DRAWINGS The advantages and features of the present invention, and the manner of achieving them, will be apparent from and elucidated with reference to the embodiments described hereinafter in conjunction with the accompanying drawings. The present invention may, however, be embodied in many different forms and should not be construed as being limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. Is provided to fully convey the scope of the invention to those skilled in the art, and the invention is only defined by the scope of the claims.

The shapes, sizes, ratios, angles, numbers, and the like disclosed in the drawings for describing the embodiments of the present invention are illustrative, and thus the present invention is not limited thereto. Like reference numerals refer to like elements throughout the specification. In the following description, well-known functions or constructions are not described in detail since they would obscure the invention in unnecessary detail.

In the case where the word 'includes', 'having', 'done', etc. are used in this specification, other parts can be added unless '~ only' is used. Unless the context clearly dictates otherwise, including the plural unless the context clearly dictates otherwise.

In interpreting the constituent elements, it is construed to include the error range even if there is no separate description.

In the case of a description of the positional relationship, for example, if the positional relationship between two parts is described as 'on', 'on top', 'under', and 'next to' Or &quot; direct &quot; is not used, one or more other portions may be located between the two portions.

In the case of a description of a temporal relationship, for example, if the temporal relationship is described by 'after', 'after', 'after', 'before', etc., May not be continuous unless they are not used.

The first, second, etc. are used to describe various components, but these components are not limited by these terms. These terms are used only to distinguish one component from another. Therefore, the first component mentioned below may be the second component within the technical spirit of the present invention.

It is to be understood that each of the features of the various embodiments of the present invention may be combined or combined with each other, partially or wholly, technically various interlocking and driving, and that the embodiments may be practiced independently of each other, It is possible.

Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In the drawings, the size and thickness of the device may be exaggerated for convenience. Like reference numerals designate like elements throughout the specification.

2 is an equivalent circuit diagram of subpixels in a display panel of an OLED display according to an embodiment of the present invention. FIG. 3 is a circuit diagram of an organic light emitting diode Fig. 5 is another equivalent circuit diagram of subpixels in the display panel of the organic light emitting display according to the examples. Fig.

1, an OLED display 100 according to the present embodiment includes a plurality of data lines DL and a plurality of gate lines GL, and a plurality of sub pixels (SP) A source driver 120 for driving a plurality of data lines DL, a scan driver 130 for driving a plurality of gate lines GL, a source driver 120, A controller 140 for controlling the driver 130, and the like.

The controller 140 supplies various control signals to the source driver 120 and the scan driver 130 to control the source driver 120 and the scan driver 130.

The controller 140 starts scanning in accordance with the timing implemented in each frame, switches the input image data input from the outside according to the data signal format used by the source driver 120, And controls the display driving data at a proper time in accordance with the scan signal.

The source driver 120 drives the plurality of data lines DL by supplying the driving data voltage Vdata to the plurality of data lines DL. Here, the source driver 120 is also referred to as a &quot; data driver &quot;.

The scan driver 130 sequentially drives the plurality of gate lines GL by sequentially supplying scan signals to the plurality of gate lines GL. Here, the scan driver 130 is also referred to as a 'gate driver'.

The scan driver 130 sequentially supplies a scan signal of an On voltage or an Off voltage to the plurality of gate lines GL under the control of the controller 140.

When the specific gate line is opened by the scan driver 130, the source driver 120 converts the image data received from the controller 140 into an analog data voltage and supplies the data voltage to the plurality of data lines DL.

1, the source driver 120 is located only on one side (e.g., on the upper side or the lower side) of the display panel 110 but may be disposed on both sides of the display panel 110 ). &Lt; / RTI &gt;

1, the scan driver 130 is disposed on only one side (e.g., the left side or the right side) of the display panel 110, The right side).

The controller 140 described above is capable of outputting various kinds of signals including the vertical synchronization signal Vsync, the horizontal synchronization signal Hsync, the input data enable signal (DE), and the clock signal (CLK) Timing signals from the outside (e.g., the host system).

The controller 140 receives a timing signal such as a vertical synchronization signal Vsync, a horizontal synchronization signal Hsync, an input DE signal, and a clock signal to control the source driver 120 and the scan driver 130, And generates various control signals and outputs them to the source driver 120 and the scan driver 130.

For example, to control the scan driver 130, the controller 140 may include a gate start pulse (GSP), a gate shift clock (GSC), a gate output enable signal GOE Gate Output Enable), and the like.

In order to control the source driver 120, the controller 140 may further include a source start pulse SSP, a source sampling clock SSC, a source output enable signal SOE, And outputs various data control signals (DCS: Data Control Signals).

The source driver 120 may drive a plurality of data lines including at least one source driver integrated circuit (SDIC).

Each source driver integrated circuit (SDIC) includes a shift register, a latch circuit, a digital to analog converter (DAC), an output buffer, a gamma voltage generator, and the like can do.

Each source driver integrated circuit (SDIC) may further include an analog to digital converter (ADC), as the case may be.

Each subpixel SP disposed on the display panel 110 may include a circuit element such as a transistor.

For example, in the display panel 110, each sub-pixel SP is composed of an organic light emitting diode (OLED) and a circuit element such as a driving transistor (DT) for driving the organic light emitting diode .

The subpixel illustrated in FIG. 2 includes two transistors DT and SWT and one storage capacitor Cst for driving the first organic light emitting diode OLED1 and the second organic light emitting diode OLED2 2T (Transistor) 1C (Capacitor) structure.

In this 2T1C subpixel structure, a driving transistor DT is connected between a third node N3 to which a driving voltage EVDD supplied from a driving voltage line DVL is applied and a second node N3 to which a second organic light emitting diode OLED2 to drive the first and second organic light emitting diodes OLED1 and OLED2 connected in series. The node to which the second organic light emitting diode OLED2 and the driving transistor DT are connected is the first node N1.

A switching transistor SWT is controlled in accordance with a scan signal SCAN supplied from a gate line GL and is connected to a data line DL for supplying a data voltage Vdata, (N2, gate node) of the data driver DT.

The storage capacitor Cst is connected between the second node N2 of the driving transistor DT and the first node N1 and serves to maintain a constant voltage for one frame.

The subpixel illustrated in FIG. 3 includes a driving transistor DT for driving first and second organic light emitting diodes OLED1 and OLED2 connected in series, a first node N1 of the driving transistor DT, A first transistor T1 electrically connected between a reference voltage line RVL for supplying a reference voltage Vref and a second transistor N2 connected between the second node N2 of the driving transistor DT and the data line A storage capacitor Cst which is electrically connected between the first node N1 and the second node N2 of the driving transistor DT; . That is, the sub-pixel of FIG. 3 has a 3T (Transistor) 1C (Capacitor) structure.

The first and second organic light emitting diodes OLED1 and OLED2 may include a first electrode (e.g., an anode electrode or a cathode electrode), an organic light emitting layer, and a second electrode (e.g., a cathode electrode or an anode electrode).

The third node N3 of the driving transistor DT may be electrically connected to the driving voltage line DVL for supplying the driving voltage EVDD and may be a drain node or a source node. Here, the gate node, the drain node, and the source node mean a gate electrode, a drain electrode, and a source electrode.

The first transistor T1 is controlled by the first scan signal SCAN1 and may be referred to as a sensing transistor. Also, the second transistor T2 is controlled by the second scan signal SCAN2 and can be named as a switching transistor SWT having a 2T1C structure.

Each subpixel of the OLED display 100 according to the present embodiment includes a sensing function for sensing a characteristic value variation or a characteristic value deviation between subpixels and a subpixel characteristic value using a sensing result It is possible to provide a compensation function that compensates the user.

The reference voltage line RVL electrically connected to the drain node or the source node of the first transistor T1 may be arranged one for each sub pixel column or two or more sub pixel columns And may be arranged one by one. The reference voltage line RVL may be referred to as a sensing line SL for sensing and compensating the degree of deterioration of the driving transistor DT or the organic light emitting diode OLED.

For example, when one pixel is composed of four subpixels (red subpixel, white subpixel, blue subpixel, green subpixel), the reference voltage line RVL is divided into four subpixel columns , A white subpixel column, a blue subpixel column, and a green subpixel column).

FIG. 4 is a view showing a defective sub-pixel in a display panel of the OLED display according to the present invention, and FIG. 5 is a diagram illustrating a repair method of the OLED display according to the present embodiments.

Referring to FIG. 4, a plurality of sub-pixels SP are arranged in a matrix structure on the display panel 11 of the OLED display 100 according to the present embodiment.

For example, when m (m is a natural number) data lines DL are arranged in the display panel 110 and n (n is a natural number) gate lines GL are arranged, m (columns) * n (Rows) of subpixels SP are arranged.

Each of the subpixels SP includes a first light emitting region EA1 and a second light emitting region EA2 corresponding to the first and second organic light emitting diodes OLED1 and OLED2, ). Here, the region where the transistors and the storage capacitors are disposed can be referred to as a circuit region (CA).

4, the defective sub-pixel SP_D identified in the display panel 110 composed of m * n sub-pixels SP is defined as any sub-pixel of k (k <n) can do.

When a defective subpixel SP_D is generated in any one of the subpixels SP (k) arranged in the kth row, the defective subpixel SP_D is formed as a luminescent spot (or a dark spot) as shown in the figure appear. In this specification, what is called a defective subpixel (SP_D) means that a transistor in a subpixel has failed, and a subpixel not called a defective subpixel means a normal subpixel. For normal subpixels, the expression 'normal' is omitted and is described as a subpixel.

In FIG. 4, the subpixel SP is shown as being divided into the first emission region EA1 and the second emission region EA2, and the circuit region CA is not shown in detail. A row corresponding to each subpixel SP is indicated by a dotted line to distinguish the first emission region EA1 from the second emission region EA2.

For example, green (G) is displayed in the subpixels SP (k) of the k-th row in which the defective subpixel SP_D is disposed and subpixels SP (k + 1 ) Displays red (R), and blue (B) is displayed in sub-pixels SP (k-1) of the (k-1) th row. At this time, defective spot defects are displayed in the defective subpixel SP_D of the k-th row.

That is, the method of repairing the defective sub-pixel SP_D with a luminescent spot or a dark spot has a problem of significantly lowering the visibility of the display panel.

Therefore, it is more preferable to perform repair processing in such a manner that the defective sub-pixel SP_D is connected to the normal sub-pixel rather than merely repairing the defective sub-pixel SP_D to the bright spot or dark spot.

In this embodiment, when a defective sub-pixel is generated in a sub-pixel disposed on the display panel 110, the repair process of the defective sub-pixel proceeds according to the method shown in FIG.

Referring to FIG. 5, a step S501 of identifying a defective sub-pixel among the plurality of sub-pixels SP arranged in the display panel 110, a step S502 of performing a repair process on the identified defective sub- And compensating driving the display panel by supplying repair compensation data to the subpixel that has undergone the repair process (S503).

That is, the repair method of the organic light emitting display device may include a method of physically repairing and supplying display data to the repair subpixel and other repair subpixels and repair repair data. This is because, since the light emitting area included in the repair subpixel is larger than that of the other subpixels, the brightness of the light emitting areas included in each subpixel can be uniformly adjusted by supplying repair repair data to be supplied.

Particularly, in the compensation driving step S503, when the repair process described below is performed, since one normal subpixel is connected to the light emitting regions EA1 and EA2 of the adjacent defective subpixel, the data voltage And the repair repair data voltage to improve the visibility.

For example, address information of sub pixels (which may be referred to as repair sub pixels) that have undergone a repair process in the memory disposed in the controller and repair correction data for each luminance are set and stored, The compensation driving can be performed by supplying compensation data stored in the memory to the repair subpixel.

FIG. 6A is a diagram illustrating a repair method for defective sub-pixels of the organic light emitting display according to the present embodiment. FIG. 6B is a view illustrating a case where a repair method is applied according to FIG. 6A, Fig.

6A, if the position of the defective subpixel SP_D among the subpixels arranged in the display panel 110 is a k-th row, the subpixel SP to be used in the repair process is k + 1 in the same column direction (SP (k + 1)) in the second row.

the subpixels in the (k + 1) th row and the defective subpixel SP_D in the kth row correspond to the first and second emission regions EA1 and EA2 corresponding to the first and second organic light emitting diodes OLED1 and OLED2, And a circuit region CA in which driving transistors and the like are arranged.

For example, the defective subpixel SP_D may be a case where a transistor disposed in the circuit region CA has a failure.

Thus, when the defective subpixel SP_D is identified, the cutting process CT is performed on the transistor disposed in the circuit area CA of the defective subpixel SP_D, and the transistors are arranged in the defective subpixel SP_D Thereby electrically isolating the first and second light emitting regions EA1 and EA2.

At this time, the first and second organic light emitting diodes OLED1 and OLED2 (first and second organic light emitting diodes) of the driving transistor disposed in the circuit area CA of the (k + 1) 2 light emitting regions EA1 and EA2) are electrically connected to each other through a W (Welding) process.

Therefore, the circuit area CA of the defective subpixel SP_D of the k-th row becomes a dead state in the cutting process, and the driving transistor of the (k + 1) -th row subpixel becomes the first and second The repair subpixel R_SP is formed by electrically connecting the first and second emission regions EA1 and EA2 of the emission regions EA1 and EA2 and the defective subpixel SP_D.

Here, a dead state means a state in which a transistor disposed in the circuit region CA is electrically disconnected from an adjacent element (an organic light emitting diode, a data line, a drive voltage line, and the like) and can not perform any operation.

5, the display panel drives the display so as to display an image. In each sub-pixel, a data voltage is supplied for driving the display. In the repair sub-pixel R_SP connected to the defective sub-pixel, data Voltage and other repair-compensated data voltages are supplied.

The subpixel SP (k + 1) used for repairing the defective subpixel is connected to more light emitting areas than the other subpixels, and can be driven with a constant luminance in consideration of such loads The repair data voltage can be set.

However, as shown in FIG. 6B, the k-th row including the defective sub-pixel SP_D indicates green (G), and the repair sub-pixel R_SP located in the (k + And the red (R) is displayed in the k-th row as well.

That is, visibility is improved as compared with repairing the defective sub-pixel SP_D with a simple point of dark spot or bright spot, but red (R) is displayed by one sub-pixel area in an area displaying green (G) There is still a problem that visibility is poor in the display device.

(R), green (G), and blue (B) in the order of k + 1th row, kth row and kth row, as shown in FIG. 6B, the repair subpixels R_SP located in the k-th row all display red (R), and visibility is reduced.

In the organic light emitting display according to the present embodiment, the first organic light emitting diode OLED1 of the defective subpixel generated in the kth row is connected to the (k + 1) th row subpixel of the same row, and the second organic light emitting diode OLED2, Is connected to sub-pixels in the (k-1) th row of the same column, thereby improving the visibility of the display panel.

FIG. 7 is a view for repairing a defective subpixel using another repair method of the organic light emitting diode display according to the present embodiment. FIG. 8 is a diagram for explaining the repairing method of the organic light emitting display according to the present invention, And Fig.

Referring to FIG. 7, the display panel 110 of the OLED display 100 according to the present embodiment may include m (rows) * n (rows) of subpixels SP.

When any bad subpixel SP_D of the k-th row among the subpixels SP arranged in n rows is identified, the sub-pixel SP_D of the k + 1-th row located in the same column as the defective subpixel SP_D of the k- The repair process is performed using the pixel SP and the sub-pixel SP of the (k-1) th row.

The first and second light emitting regions EA1 and EA2 included in the defective subpixel SP_D are shown as bright spots, but they may appear as dark spots in some cases.

The transistors disposed in the circuit area CA of the defective subpixel SP_D are subjected to a cutting process CT to form first and second light emitting areas EA1 and EA2 disposed in the transistor and the defective subpixel SP_D ).

In the repairing method according to the present embodiment, the electrode (anode or cathode) commonly used for the first and second organic light emitting diodes OLED1 and OLED2 disposed in the defective subpixel SP_D of the kth row is cut 1 electrically isolates the organic light emitting diode OLED1 from the second organic light emitting diode OLED2.

Then, the first repair subpixel R1_SP is formed by connecting the driving transistor of the (k + 1) th row and the first organic light emitting diode OLED1 of the defective subpixel of the kth row through a welding process.

In the same manner, the driving transistor of the (k-1) -th row sub-pixel and the second organic light emitting diode OLED2 of the defective sub-pixel of the k-th row are connected in a welding process to form the second repair sub-pixel R2_SP.

Then, the display panel performs display driving for displaying an image, in which each subpixel is supplied with a data voltage for driving the display, but the first and second repair subpixels are supplied with a repair voltage data voltage different from the data voltage .

6A, four light emitting regions exist in the repair subpixels. However, since there are three light emitting regions in the first and second repair subpixels R1_SP and R2_SP, the repair subpixel as shown in FIG. The repair compensation data voltage can be reduced more than the subpixel.

In the OLED display according to the present embodiment, the first repair sub-pixel R1_SP and the second repair sub-pixel R2_SP are arranged in the first emission region EA1 and the second emission region E2 in the k- Since the two light emitting regions EA2 are separated and occupied, visibility in driving the display can be improved.

That is, visibility is improved because the colors of adjacent subpixels, which are different from each other, are displayed in the first light emitting region and the second light emitting region of the defective subpixel, as compared with displaying the same color in the entire area of the defective subpixel SP_D .

Referring to FIG. 8, the k-th row in which the defective sub-pixel SP_D is generated is divided into a first emission region EA1 and a second emission region EA2 of each subpixel SP. The first repair subpixel R1_SP of the (k + 1) th row connected to the first light emitting region EA1 of the defective subpixel SP_D and the k-1 The second repair subpixel R2_SP of the second row is separated at the boundary between the first light emitting region EA1 and the second light emitting region EA2 of the kth row.

Accordingly, when the subpixels in the (k + 1) th row display red (R), the first repair subpixel R1_SP is red (R ).

When the subpixels in the (k-1) th row display blue (B), the second repair subpixel R2_SP only emits blue (B) light until the second light emitting area EA2 of the k- ).

As described above, in the repairing method according to the present embodiment, the first light emitting region EA1 and the second light emitting region EA2 included in the defective subpixel SP_D are adjacent to the adjacent subpixels (k-1 th row and k + 1 &lt; th &gt; row), thereby improving visibility at the time of display driving.

FIG. 9 is a diagram illustrating a repair method applied to the organic light emitting display having the sub-pixel structure of FIG. 2 according to the present embodiments.

Referring to FIG. 9 together with FIG. 2, the organic light emitting display according to the present embodiment includes a plurality of sub-pixels SP. In the present embodiment, a defective subpixel (SP_D: k-th row) is generated when a defective pixel occurs in any subpixel of the k-th row among n rows in a display panel composed of m (columns) * n (rows) The subpixel in the (k + 1) -th row and the (k-1) -th row in the same row as the subpixel in the column.

Therefore, the subpixels in the (k + 1) th row, the defective subpixel SP_D in the kth row and the (k-1) th row have the same configuration.

Each sub-pixel includes a first organic light emitting diode OLED1, a second organic light emitting diode OLED2, two transistors DT and SWT, and one storage capacitor Cst, as shown in FIG. 2 2T (Transistor) 1C (Capacitor) structure.

Here, the first organic light emitting diode OLED1 corresponds to the first light emitting region EA1, the second organic light emitting diode OLED2 corresponds to the second light emitting region EA2, the two transistors DT and SWT, And the storage capacitor Cst correspond to the circuit area CA.

The defective subpixel SP_D of the kth row is connected to the third node N3 of the driving transistor DT through the first cut point CP1 and between the first node N1 and the second organic light emitting diode OLED2. The cutting process is performed using the second cutting point CP2 and the third cutting point CP3 between the first and second organic light emitting diodes OLED1 and OLED2.

As described above, the transistors and the capacitors disposed in the defective sub-pixel SP_D by the first to third cutting points CP1, CP2, and CP3 are in the dead state.

Then, the first organic light emitting diode OLED1 of the (k + 1) -th row sub-pixel first node N1 and the defective sub-pixel SP_D is welded by using the first repair line RL1, Thereby forming the subpixel R1_SP. Accordingly, the first node N1 of the (k + 1) -th row sub-pixel becomes the first welding point WP1.

The first repair sub-pixel R1_SP is connected to the first and second organic light emitting diodes OLED1 and OLED2 in the (k + 1) -th sub-pixel in series. However, the first repair sub- The first organic light emitting diode OLED1 of the subpixel is connected in parallel with the first organic light emitting diode OLED1.

Further, the second organic light emitting diode OLED2 of the defective subpixel SP_D and the subpixel first node N1 of the (k-1) -th row are welded by using the second repair line RL2, Thereby forming a pixel R2_SP. Accordingly, the second cut point CP2 of the defective subpixel SP_D becomes the second welding point WP2 and is electrically connected to the first subpixel of the (k-1) -th row.

Also, the second repair sub-pixel R2_SP may be configured such that the first and second organic light emitting diodes OLED1 and OLED2 in the (k-1) th sub-pixel are connected in series to each other, And the second organic light emitting diode OLED1 of the subpixel is connected in parallel with them.

As described above, in the repairing method according to the present embodiment, the first light emitting region EA1 and the second light emitting region EA2 included in the defective subpixel SP_D are adjacent to the adjacent subpixels (k-1 th row and k + 1 &lt; th &gt; row), thereby improving visibility at the time of display driving.

10 is a diagram illustrating a repair method applied to the OLED display device having the sub-pixel structure of FIG. 3 according to the present embodiments.

Referring to FIG. 10 together with FIG. 3, the organic light emitting display according to the present embodiment includes a plurality of sub-pixels SP. In the present embodiment, a defective subpixel (SP_D: k-th row) is generated when a defective pixel occurs in any subpixel of the k-th row among n rows in a display panel composed of m (columns) * n (rows) The subpixel in the (k + 1) -th row and the (k-1) -th row in the same row as the subpixel in the column.

Therefore, the subpixels in the (k + 1) th row, the defective subpixel SP_D in the kth row and the (k-1) th row have the same configuration.

Each subpixel includes first and second organic light emitting diodes (OLED1 and OLED2), a driving transistor (DT), and a first node connected between a reference voltage line (RVL) and a first node, A second transistor T2 connected between the second node N2 of the driving transistor DT and the data line DL and a second transistor T2 connected between the first node N1 and the second node N1 of the driving transistor DT, And a storage capacitor Cst connected between the node N2. That is, each sub-pixel has a 3T (Transistor) 1C (Capacitor) structure.

Here, the first organic light emitting diode OLED1 corresponds to the first light emitting region EA1, the second organic light emitting diode OLED2 corresponds to the second light emitting region EA2, the first transistor T1, The two transistors T2, the driving transistor DT and the storage capacitor Cst correspond to the circuit region CA.

Also, the second transistor T2 may be referred to as a switching transistor SWT in FIG. 9, and the first transistor T1 may be referred to as a sensing transistor.

The defective subpixel SP_D of the kth row is connected to the third node N3 of the driving transistor DT through the first cut point CP1 and between the first node N1 and the second organic light emitting diode OLED2. A third cutting point CP3 between the first and second organic light emitting diodes OLED1 and OLED2 and a fourth cutting point CP2 between the first transistor T1 and the reference voltage line RVL. CP4), and the cutting process is performed.

Then, by welding the first organic light emitting diode OLED1 of the (k + 1) -th row subpixel first node N1 and the defective subpixel SP_D using the first repair line RL1, Thereby forming the subpixel R1_SP. Therefore, the sub-pixel first node N1 in the (k + 1) th row becomes the first welding point WP1.

Further, by welding the second organic light emitting diode OLED2 of the defective subpixel SP_D and the subpixel first node N1 of the (k-1) -th row using the second repair line RL2, Thereby forming a pixel R2_SP. Accordingly, the second cut point CP2 of the defective subpixel SP_D becomes the second welding point WP2 and is electrically connected to the first subpixel of the (k-1) -th row.

As described above, in the repairing method according to the present embodiment, the first light emitting area EA1 and the second light emitting area EA2 included in the defective subpixel SP_D are adjacent to the normal normal subpixels (k-1) th row And the (k + 1) -th row), the visibility in the display driving is improved.

11 is a flowchart showing another repair method of the organic light emitting diode display according to the present embodiments.

11, the repairing method of the organic light emitting display according to the present exemplary embodiment is characterized in that the repairing method of the organic light emitting display according to the present invention includes the steps of: (S1101) confirming a defective sub-pixel, performing a cutting process (S1102) to make transistors disposed in a circuit area (CA) of a defective sub-pixel in a k-th row into a dead state, (S1103) of electrically isolating the first and second organic light emitting diodes of the defective subpixel SP_D of the kth row and the first and second organic light emitting diodes of the k &lt; th &gt; (S1104) forming a first repair subpixel R1_SP by electrically connecting the first organic light emitting diode of the defective subpixel of the kth row and the first organic light emitting diode of the kth row to the first organic light emitting diode of the row of the same row as the defective subpixel SP_D of the kth row the circuit area of the (k-1) th sub-pixel and the second organic light emitting diode of the defective sub- (S1105) forming a second repair subpixel R2_SP by electrically connecting the first repair subpixel R2_SP and the first repair subpixel R2_SP to the first and second repair subpixels R1_SP and R2_SP when the display panel drives the display, (Step S1106).

The first repair subpixel R1_SP electrically connects the first organic light emitting diode of the (k + 1) -th row defective subpixel with the kth row using the first repair line.

The second repair subpixel R2_SP electrically connects the subpixels of the (k-1) th row and the second organic light emitting diodes of the defective subpixel of the kth row using the second repair line.

In addition, when the display panel drives the display, the data voltage supplied to each sub-pixel and the repair-compensated data voltage supplied to the first and second repair sub-pixels have different values.

As described above, the display device and the repairing method according to this embodiment have an effect of preventing the visibility of the defective sub-pixel from being lowered by connecting the defective sub-pixel to the normal sub-pixel electrically.

In addition, the display device and the repair method according to the present embodiment are effective in improving the visibility in the display drive by connecting the first and second organic light emitting diodes disposed in the defective subpixel to the adjacent normal subpixels, respectively have.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the inventions. , Separation, substitution, and alteration of the invention will be apparent to those skilled in the art. Therefore, the embodiments disclosed in the present invention are intended to illustrate rather than limit the scope of the present invention, and the scope of the technical idea of the present invention is not limited by these embodiments. The scope of protection of the present invention should be construed according to the following claims, and all technical ideas within the scope of equivalents should be construed as falling within the scope of the present invention.

100: organic light emitting display
110: Display panel
120: Source driver
130: scan driver
140: controller
CP1: 1st cutting point
CP2: 2nd cutting point
CP3: Third Cutting Point
CP4: Fourth Cutting Point
R_SP: Repair subpixel

Claims (12)

a display panel including m (column) × n (row) subpixels in which m (m: natural number) data lines and n (n: natural number) gate lines are arranged;
Each subpixel includes a first organic light emitting diode, a second organic light emitting diode connected in series with the first organic light emitting diode, a driving transistor connected to the second organic light emitting diode at a first node, And a storage capacitor coupled between the first node and the second node,
Assuming that the defective subpixel among the subpixels is a subpixel of the kth row (k < n)
A first repair subpixel configured by electrically connecting adjacent k + 1th subpixels in the same row as the defective subpixel and the first organic light emitting diode of the defective subpixel,
And a second repair subpixel configured by electrically connecting an adjacent k-1th subpixel in the same row as the defective subpixel to a second organic light emitting diode of the defective subpixel. The method according to claim 1,
And a sensing transistor disposed between the first node and the reference voltage line. 3. The method of claim 2,
Wherein the driving transistor, the switching transistor, and the sensing transistor of the defective sub-pixel are in a dead state by cutting. The method according to claim 1,
Wherein the first organic light emitting diode and the second organic light emitting diode in the defective subpixel are electrically separated from each other by cutting. The method according to claim 1,
The first repair subpixel may include first and second organic light emitting diodes connected in series in the (k + 1) th row of subpixels and first and second organic light emitting diodes coupled in series with the first and second organic light emitting diodes, A display comprising an organic light emitting diode. The method according to claim 1,
The second repair subpixel may include first and second organic light emitting diodes connected in series in sub-pixels of the (k-1) -th row and first and second organic light emitting diodes connected in series, 2 organic light emitting diode. The method according to claim 1,
Wherein each of the subpixels is supplied with a data voltage at the time of display driving and the repair voltage data is supplied to the first repair subpixel and the second repair subpixel different from the data voltage. and a display panel including m (column) × n (row) subpixels in which m (m: natural number) data lines and n (n: natural number) gate lines are arranged, A first organic light emitting diode, a second organic light emitting diode connected in series with the first organic light emitting diode, a driving transistor connected to the second organic light emitting diode at a first node, a switching transistor connected at the second node to the driving transistor, 1. A repair method of a display device including a storage capacitor connected between a first node and a second node,
Identifying a bad subpixel in k (k < n) th rows in the subpixels;
The transistor disposed in the circuit region of the defective subpixel is cut into a dead state and the first organic light emitting diode of the defective subpixel is connected to the subpixel of the (k + 1) th row adjacent to the defective subpixel in the column direction Forming a first repair sub-pixel; And
Forming a second repair subpixel by connecting the second organic light emitting diode of the defective subpixel and the subpixel of the (k-1) th row adjacent to the defective subpixel in the column direction. 9. The method of claim 8,
The step of bringing the transistor of the defective subpixel into the dead state comprises:
Further comprising the step of electrically isolating the first organic light emitting diode and the second organic light emitting diode disposed in the defective subpixel. 9. The method of claim 8,
Wherein the first organic light emitting diode of the (k + 1) th row and the defective subpixel of the kth row are electrically connected to each other by using the first repair line. 9. The method of claim 8,
And the second organic light emitting diodes of the (k-1) -th row and the (k-1) -th row defective subpixel are electrically connected using a second repair line. 9. The method of claim 8,
Wherein a data voltage is supplied to each of the sub pixels when the display panel drives the display, and a repair repair data voltage different from the data voltage is supplied to the first and second repair sub pixels.

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