KR102549884B1 - Display device and method for repair the same - Google Patents

Abstract

In this embodiment, a display panel including m (column)×n (row) subpixels, each subpixel including a first organic light emitting diode, a second organic light emitting diode, a driving transistor, a switching transistor, and a storage capacitor, , a first repair subpixel configured by electrically connecting the first organic light emitting diode of the defective subpixel and a second repair subpixel configured by electrically connecting the second organic light emitting diode of the defective subpixel.
According to the present embodiment, the first and second organic light emitting diodes disposed in the defective subpixel are divided and connected to adjacent normal subpixels, thereby improving visibility during display driving.

Description

Display device and its repair method {DISPLAY DEVICE AND METHOD FOR REPAIR THE SAME}

The present embodiment relates to a display device and a repair method thereof.

As the information society develops, the demand for display devices for displaying images is increasing in various forms, and recently, liquid crystal displays (LCDs), plasma displays, organic light emitting displays ( Various display devices such as OLED (Organic Light Emitting Diode Display) are being utilized.

Meanwhile, on the display panel of such a display device, elements such as transistors, capacitors, or organic light emitting diodes are disposed for each sub-pixel. (Short) or disconnection (open, disconnection) may cause a subpixel defect in which a corresponding subpixel becomes a bright spot or a dark spot.

Regarding such sub-pixel defects, a repair process has conventionally been performed in which defective sub-pixels that have become bright spots or dark spots are turned into abnormal sub-pixels that do not operate at all. That is, in the conventional repair processing method, a defective subpixel that has become a bright spot or a dark spot is turned into a non-operating abnormal subpixel.

Such a conventional repair processing method has a problem of impairing the visibility of a display image because it appears as a dark spot or a bright spot in a display panel.

An object of the present embodiment is to provide a display device and a repair method thereof in which visibility is prevented from deteriorating by making a defective subpixel into a dark spot or a bright spot by electrically connecting the defective subpixel to a normal subpixel.

In addition, the present embodiment provides a display device with improved visibility during display driving and a repair method thereof by dividing and connecting first and second organic light emitting diodes disposed in defective subpixels to adjacent normal subpixels, respectively. There is a purpose.

In the display device according to the present embodiments, m (m: natural number) data lines and n (n: natural number) gate lines are disposed to form a display panel including m (column)×n (row) subpixels. can include

Further, in the display device according to the present embodiments, each subpixel includes a first organic light emitting diode, a second organic light emitting diode connected in series with the first organic light emitting diode, and a driving transistor connected to the second organic light emitting diode at a first node. , a switching transistor connected to the driving transistor and the second node, and a storage capacitor connected between the first node and the second node.

Further, in the display device according to the present embodiments, when a defective subpixel among subpixels is referred to as a subpixel in a k-th row (k<n), a defective subpixel and a defective subpixel in the same column as the defective subpixel are adjacent to each other. A first repair subpixel configured by electrically connecting the first organic light emitting diode of the subpixel may be included.

Also, the display device according to the present embodiments may include a second repair subpixel configured by electrically connecting a k-1 th subpixel adjacent to the same column as the defective subpixel and a second organic light emitting diode of the defective subpixel. there is.

Also, the display device according to the present embodiments may further include a sensing transistor disposed between the first node and the reference voltage line in each subpixel.

Also, in the display device according to the present embodiments, the driving transistor, the switching transistor, and the sensing transistor of the defective subpixel may be in a dead state by cutting.

Also, in the display device according to the present embodiments, the first organic light emitting diode and the second organic light emitting diode in the defective subpixel may be electrically separated from each other by cutting.

Further, in the display device according to the present embodiments, the first repair subpixel has first and second organic light emitting diodes connected in series with first and second organic light emitting diodes connected in series in subpixels in a k+1th row. and a first organic light emitting diode of the defective sub-pixel connected in parallel with

Further, in the display device according to the present embodiments, the second repair subpixel includes first and second organic light emitting diodes connected in series with first and second organic light emitting diodes connected in series in subpixels in a k-1th row. and a second organic light emitting diode of the defective sub-pixel connected in parallel with

In addition, in the display device according to the present embodiments, a data voltage may be supplied to each subpixel when the display is driven, and a repair compensation data voltage different from the data voltage may be supplied to the first repair subpixel and the second repair subpixel. .

Also, the repair method of the display device according to the present embodiments may include identifying a defective subpixel of a k (k<n)th row among subpixels.

In addition, a repair method of a display device according to the present embodiments cuts a transistor disposed in a circuit region of a defective subpixel to make it dead, and connects the first organic light emitting diode of the defective subpixel to the defective subpixel. The method may include forming a first repair subpixel by connecting a subpixel of a k+1th row adjacent to each other in a column direction.

In addition, in the repair method of the display device according to the present embodiments, the second organic light emitting diode of the defective subpixel is connected to the subpixel in the k-1th row adjacent to the defective subpixel in a column direction to repair the second repair subpixel. Formation may be included.

Also, in the repair method of the display device according to the present embodiments, the step of putting the transistor of the defective subpixel into a dead state includes electrically separating the first organic light emitting diode and the second organic light emitting diode disposed in the defective subpixel. Further processes may be included.

Also, the repair method of the display device according to the present embodiments includes the steps of electrically connecting first organic light emitting diodes of subpixels in a k+1th row and defective subpixels in a kth row by using a first repair line. may further include.

In addition, the repair method of the display device according to the present embodiments includes the steps of electrically connecting second organic light emitting diodes of subpixels in a k−1 th row and defective subpixels in a k th row by using a second repair line. may further include.

In addition, in the repair method of the display device according to the present embodiments, when the display panel drives the display, a data voltage is supplied to each subpixel, and repair compensation data different from the data voltage is supplied to the first and second repair subpixels. It may include supplying a voltage.

The display device and its repair method according to the present embodiments can improve visibility during display driving by dividing and connecting first and second organic light emitting diodes disposed on defective subpixels to adjacent normal subpixels.

The display device and its repair method according to the present embodiment have an effect of preventing deterioration in visibility by making the defective subpixel into a dark spot or a bright spot by electrically connecting the defective subpixel to the normal subpixel.

In addition, the display device and its repair method according to the present embodiment have an effect of improving visibility when driving a display by dividing and connecting first and second organic light emitting diodes disposed on defective subpixels to adjacent normal subpixels, respectively. there is.

1 is a schematic system configuration diagram of an organic light emitting display device according to example embodiments.
2 is an equivalent circuit diagram of a subpixel in a display panel of an organic light emitting display device according to the present embodiments.
3 is another equivalent circuit diagram of a subpixel in a display panel of an organic light emitting display device according to the present embodiments.
4 is a diagram illustrating defective sub-pixels in a display panel of an organic light emitting display device according to the present embodiments.
5 is a diagram illustrating a repair method of an organic light emitting display device according to example embodiments.
6A is a view of applying a repair method to a defective sub-pixel of an organic light emitting display device according to the present embodiments.
FIG. 6B is a diagram illustrating a state in which visibility defects occur on a display panel of an organic light emitting display device when the repair method according to FIG. 6A is applied.
7 is a view of repairing a defective sub-pixel using another repair method of an organic light emitting display device according to the present embodiments.
8 is a diagram illustrating improved visibility when a repair method is applied to an organic light emitting display device according to the present embodiments.
FIG. 9 is a diagram illustrating a repair method applied to an organic light emitting display having the subpixel structure of FIG. 2 according to the present embodiments.
FIG. 10 is a diagram in which a repair method is applied to an organic light emitting display having the subpixel structure of FIG. 3 according to the present embodiments.
11 is a flowchart illustrating another repair method of an organic light emitting display device according to the present embodiments.

Advantages and features of the present invention, and methods of achieving them, will become clear with reference to the detailed description of the following embodiments taken in conjunction with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but will be implemented in a variety of different forms, and only the present embodiments make the disclosure of the present invention complete, and common knowledge in the art to which the present invention belongs. It is provided to fully inform the holder of the scope of the invention, and the present invention is only defined by the scope of the claims.

The shapes, sizes, ratios, angles, numbers, etc. disclosed in the drawings for explaining the embodiments of the present invention are illustrative, so the present invention is not limited to the details shown. Like reference numbers designate like elements throughout the specification. In addition, in describing the present invention, if it is determined that a detailed description of related known technologies may unnecessarily obscure the subject matter of the present invention, the detailed description will be omitted.

When 'includes', 'has', 'consists of', etc. mentioned in this specification is used, other parts may be added unless 'only' is used. In the case where a component is expressed in the singular, the case including the plural is included unless otherwise explicitly stated.

In interpreting the components, even if there is no separate explicit description, it is interpreted as including the error range.

In the case of a description of a positional relationship, for example, 'on top of', 'on top of', 'at the bottom of', 'next to', etc. Or, unless 'directly' is used, one or more other parts may be located between the two parts.

In the case of a description of a temporal relationship, for example, 'immediately' or 'directly' when a temporal precedence relationship is described in terms of 'after', 'following', 'next to', 'before', etc. It can also include non-continuous cases unless is used.

Although first, second, etc. are used to describe various components, these components are not limited by these terms. These terms are only used to distinguish one component from another. Therefore, the first component mentioned below may also be the second component within the technical spirit of the present invention.

Each feature of the various embodiments of the present invention can be partially or entirely combined or combined with each other, technically various interlocking and driving are possible, and each embodiment can be implemented independently of each other or can be implemented together in a related relationship. may be

Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. And in the drawings, the size and thickness of the device may be exaggerated for convenience. Like reference numbers indicate like elements throughout the specification.

1 is a schematic system configuration diagram of an organic light emitting display device according to the present embodiments, FIG. 2 is an equivalent circuit diagram of a subpixel in a display panel of the organic light emitting display device according to the present embodiments, and FIG. 3 is an equivalent circuit diagram of the present embodiment. Another equivalent circuit diagram of a subpixel in a display panel of an organic light emitting display device according to examples.

Referring to FIG. 1 , in the organic light emitting display device 100 according to the present embodiment, a plurality of data lines DL and a plurality of gate lines GL are disposed, and a plurality of sub pixels (SP) are provided. The arranged display panel 110, the source driver 120 driving the plurality of data lines DL, the scan driver 130 driving the plurality of gate lines GL, the source driver 120 and the scan A controller 140 controlling the driver 130 and the like are included.

The controller 140 controls the source driver 120 and the scan driver 130 by supplying various control signals to the source driver 120 and the scan driver 130 .

The controller 140 starts scanning according to the timing implemented in each frame, converts input image data input from the outside to suit the data signal format used by the source driver 120, and converts the converted driving data DATA. and controls the display driving data at an appropriate time according to the scan signal.

The source driver 120 drives the plurality of data lines DL by supplying the driving data voltage Vdata to the plurality of data lines DL. Here, the source driver 120 is also referred to as a 'data driver'.

The scan driver 130 sequentially drives the plurality of gate lines GL by sequentially supplying scan signals to the plurality of gate lines GL. Here, the scan driver 130 is also referred to as a 'gate driver'.

The scan driver 130 sequentially supplies scan signals of an on voltage or an off voltage to the plurality of gate lines GL under the control of the controller 140 .

When a specific gate line is opened by the scan driver 130, the source driver 120 converts the image data received from the controller 140 into analog data voltages and supplies them to a plurality of data lines DL.

Although the source driver 120 is located on only one side (eg, upper or lower side) of the display panel 110 in FIG. 1 , depending on a driving method or a panel design method, the source driver 120 is located on both sides (eg, upper and lower sides) of the display panel 110 . ) may be located in all of them.

The scan driver 130 is located on only one side (eg, the left or right side) of the display panel 110 in FIG. right) may be located on both sides.

The above-described controller 140 includes various types of input image data, including a vertical synchronization signal (Vsync), a horizontal synchronization signal (Hsync), an input data enable (DE) signal, a clock signal (CLK), and the like. Receive timing signals from outside (e.g. host system).

The controller 140 receives timing signals such as a vertical synchronization signal (Vsync), a horizontal synchronization signal (Hsync), an input DE signal, and a clock signal in order to control the source driver 120 and the scan driver 130, Various control signals are generated and output to the source driver 120 and the scan driver 130.

For example, in order to control the scan driver 130, the controller 140 includes a gate start pulse (GSP), a gate shift clock (GSC), and a gate output enable signal (GOE: It outputs various gate control signals (GCS: Gate Control Signal) including Gate Output Enable).

In addition, the controller 140, in order to control the source driver 120, a source start pulse (SSP: Source Start Pulse), a source sampling clock (SSC: Source Sampling Clock), a source output enable signal (SOE: Source Output It outputs various data control signals (DCS) including Enable) and the like.

The source driver 120 may include at least one source driver integrated circuit (SDIC) to drive a plurality of data lines.

Each source driver integrated circuit (SDIC) includes a shift register, a latch circuit, a digital to analog converter (DAC), an output buffer, and a gamma voltage generator. can do.

In some cases, each source driver integrated circuit (SDIC) may further include an analog to digital converter (ADC).

Each subpixel SP disposed on the display panel 110 may include a circuit element such as a transistor.

For example, in the display panel 110, each subpixel SP is composed of organic light emitting diodes (OLEDs) and circuit elements such as driving transistors (DTs) for driving them. .

The subpixel illustrated in FIG. 2 includes two transistors DT and SWT and one storage capacitor Cst to drive the first organic light emitting diode OLED1 and the second organic light emitting diode OLED2. It has a 2T (Transistor) 1C (Capacitor) structure.

In this 2T1C subpixel structure, a driving transistor (DT: Driving Transistor) is connected to a third node (N3) to which a driving voltage (EVDD) supplied from a driving voltage line (DVL) is applied and a second organic light emitting diode ( OLED2) to drive the first and second organic light emitting diodes OLED1 and OLED2 connected in series. A node where the second organic light emitting diode OLED2 and the driving transistor DT are connected is the first node N1.

The switching transistor (SWT: Switching Transistor) is controlled according to the scan signal (SCAN) supplied from the gate line (GL: Gate Line), and the data line (DL: Data Line) supplying the data voltage (Vdata) and the driving transistor It is connected between the second node (N2, gate node) of (DT).

A storage capacitor (Cst) is connected between the second node N2 and the first node N1 of the driving transistor DT, and serves to maintain a constant voltage during one frame.

In addition, the subpixel illustrated in FIG. 3 includes a driving transistor DT driving first and second organic light emitting diodes OLED1 and OLED2 connected in series, and a first node N1 of the driving transistor DT and a reference A first transistor (T1) electrically connected between a reference voltage line (RVL) supplying a voltage (Vref: Reference Voltage), a second node (N2) of the driving transistor (DT) and a data line ( DL) and a storage capacitor (Cst) electrically connected between the first node N1 and the second node N2 of the driving transistor DT. It consists of including. That is, the subpixel of FIG. 3 has a 3T (Transistor) 1C (Capacitor) structure.

The first and second organic light emitting diodes OLED1 and OLED2 may each include a first electrode (eg, an anode electrode or a cathode electrode), an organic light emitting layer, and a second electrode (eg, a cathode electrode or an anode electrode).

The third node N3 of the driving transistor DT may be electrically connected to the driving voltage line DVL that supplies the driving voltage EVDD, and may be a drain node or a source node. Here, the gate node, drain node, and source node mean a gate electrode, a drain electrode, and a source electrode.

The first transistor T1 is controlled by the first scan signal SCAN1 and may be referred to as a sensing transistor. Also, the second transistor T2 is controlled by the second scan signal SCAN2 and may be referred to as a switching transistor SWT having a 2T1C structure.

In addition, each subpixel of the organic light emitting display device 100 according to the present exemplary embodiment has a sensing function for sensing (measuring) a change in a characteristic value of a subpixel or a deviation in characteristic values between each subpixel, and a subpixel characteristic value using a sensing result. A compensation function may be provided.

Meanwhile, the reference voltage lines RVL electrically connected to the drain node or the source node of the first transistor T1 may be disposed one by one in one sub-pixel column, or two or more sub-pixel columns. Each may be placed one by one. The reference voltage line RVL may be referred to as a sensing line SL for sensing and then compensating for a degree of deterioration of the driving transistor DT or the organic light emitting diode OLED.

For example, when one pixel is composed of 4 sub-pixels (red sub-pixel, white sub-pixel, blue sub-pixel, green sub-pixel), the reference voltage line RVL is composed of 4 sub-pixel columns (red sub-pixel column). , a white subpixel column, a blue subpixel column, and a green subpixel column) may be disposed one by one.

4 is a diagram illustrating defective sub-pixels in the display panel of the organic light emitting display device according to the present exemplary embodiments, and FIG. 5 is a diagram illustrating a repair method of the organic light emitting display device according to the present exemplary embodiments.

Referring to FIG. 4 , a plurality of subpixels SP are disposed in a matrix structure on the display panel 110 of the organic light emitting display device 100 according to the present exemplary embodiment.

For example, if m (m is a natural number) data lines DL are disposed and n (n is a natural number) gate lines (GL) are disposed in the display panel 110, m (columns) * n (rows) number of subpixels SP are disposed.

In addition, each sub-pixel SP has a first light emitting area EA1 and a second light emitting area EA2 respectively corresponding to the first and second organic light emitting diodes OLED1 and OLED2, as described in FIGS. 2 and 3 . ) may be included. Here, an area where the transistors and storage capacitors are disposed may be referred to as a circuit area CA.

As shown in FIG. 4 , the defective subpixel SP_D identified in the display panel 110 composed of m*n subpixels SP is defined as an arbitrary subpixel in the k(k<n)th row. can do.

When a defective subpixel SP_D is generated in any one of the subpixels SP(k) disposed in the k-th row, as shown in the drawing, the defective subpixel SP_D is formed in the form of a bright spot (or a dark spot). appear. In this specification, being named a defective subpixel SP_D means that transistors in the subpixel have defects, and subpixels not named as defective subpixels refer to normal subpixels. For a normal subpixel, a separate expression 'normal' is omitted and described as a subpixel.

In addition, in FIG. 4 , the sub-pixel SP is divided into a first light emitting area EA1 and a second light emitting area EA2, and the circuit area CA is not specifically shown. In addition, a dotted line is displayed in a row corresponding to each sub-pixel SP to distinguish the first light emitting area EA1 and the second light emitting area EA2.

For example, green (G) is displayed in the subpixels SP(k) of the kth row where the defective subpixel SP_D is disposed, and the subpixels SP(k+1 of the k+1th row) )), red (R) is displayed, and subpixels (SP(k-1)) of the k−1 th row display blue (B). At this time, defective bright points are displayed in the defective sub-pixel SP_D of the k-th row.

That is, the method of repairing the defective sub-pixel SP_D as a bright spot or a dark spot has a problem of remarkably degrading the visibility of the display panel.

Therefore, it is better to perform the repair process by connecting the defective subpixel SP_D with a normal subpixel rather than simply repairing the bright or dark dots.

In the present exemplary embodiments, when a defective subpixel is generated in a subpixel disposed on the display panel 110, a repair process for the defective subpixel is performed according to the method shown in FIG. 5 .

Referring to FIG. 5 , checking a defective subpixel among a plurality of subpixels (SP) disposed on the display panel 110 (S501) and performing a repair process on the identified defective subpixel (S502). and compensating and driving the display panel by supplying repair compensation data to the subpixel on which the repair process has been performed (S503).

That is, a repair method of the organic light emitting display device may include physically performing a repair process and supplying repair compensation data to a repaired subpixel that is different from that of other normal subpixels to drive the display. This is because, since the light emitting area included in the repair subpixel is larger than that of other subpixels, the luminance of the light emitting areas included in each subpixel can be uniformly adjusted by supplying repair compensation data.

In particular, in the compensation driving step (S503), when a repair process to be described below is performed, since one normal subpixel is connected to the light emitting regions EA1 and EA2 of an adjacent defective subpixel, the data voltage supplied to the normal subpixel Visibility can be improved only when a repair compensation data voltage different from the voltage is supplied.

For example, address information of a subpixel (which may be referred to as a repair subpixel) that has undergone a repair process and repair compensation data for each luminance are set and stored in a memory disposed in a controller, and the organic light emitting display device drives the display. At this time, compensation driving may be performed by supplying compensation data stored in a memory to the repair subpixel.

FIG. 6A is a view of applying a repair method to defective sub-pixels of an organic light emitting display device according to the present embodiments, and FIG. 6B is a view showing poor visibility in a display panel of an organic light emitting display device when the repair method according to FIG. 6A is applied. This is a diagram showing what is happening.

Referring to FIG. 6A , if the location of a defective subpixel SP_D among subpixels disposed on the display panel 110 is a k-th row, the subpixel SP to be used in the repair process is k+1 in the same column direction. It is the subpixel SP(k+1) of the th row.

The subpixels in the k+1th row and the defective subpixels SP_D in the kth row have first and second light emitting regions EA1 and EA2 corresponding to the first and second organic light emitting diodes OLED1 and OLED2, respectively; It includes a circuit area CA in which a driving transistor or the like is disposed.

For example, the defective sub-pixel SP_D may be a case in which a defect occurs in a transistor disposed in the circuit area CA.

In this way, when the defective sub-pixel SP_D is identified, the cutting process CT is performed on the transistors disposed in the circuit area CA of the defective sub-pixel SP_D, so that the transistors are disposed in the defective sub-pixel SP_D. The first and second light emitting regions EA1 and EA2 are electrically separated.

In this case, the first and second organic light emitting diodes OLED1 and OLED2 of the driving transistor disposed in the circuit area CA of the subpixel of the k+1th row and the defective subpixel SP_D of the kth row 2 Proceed with the welding (W: Welding) process that electrically connects the light emitting areas (EA1, EA2)).

Accordingly, the circuit area CA of the defective sub-pixel SP_D in the k-th row becomes dead through the cutting process, and the driving transistor of the sub-pixel in the k+1-th row is first and second in the sub-pixel. The repair subpixel R_SP is formed by electrically connecting the light emitting regions EA1 and EA2 and the first and second light emitting regions EA1 and EA2 of the defective subpixel SP_D.

Here, the dead state means a state in which a transistor disposed in the circuit area CA is electrically separated from adjacent elements (such as an organic light emitting diode, a data line, and a driving voltage line) and cannot perform any operation.

Then, as described in FIG. 5, the display panel drives the display to display an image. A data voltage is supplied to each subpixel for driving the display, but data voltage is supplied to the repair subpixel R_SP connected to the defective subpixel. A repair compensation data voltage different from the voltage is supplied.

The subpixel (SP(k+1)) used to repair the defective subpixel is connected to more light emitting areas than other subpixels, so it can be driven at a constant luminance considering these loads. A repair data voltage may be set.

However, as shown in FIG. 6B, the k-th row including the defective sub-pixel SP_D displays green (G), and the repair sub-pixel R_SP located in the k+1-th row extends to the k-th row. Since it is formed as an extension, red (R) is displayed even in the k-th row.

That is, visibility is improved compared to when the defective sub-pixel SP_D is simply repaired with dark or bright spots, but red (R) is displayed as much as one sub-pixel area in the green (G) area, resulting in high resolution. The display device still has a problem of poor visibility.

As shown in FIG. 6B, red (R), green (G), and blue (B) should be displayed in order of the k+1th row, the kth row, and the k-1th row, but the k+1th row and It can be seen that the repair subpixels R_SP located in the k-th row all display red (R), and thus visibility is deteriorated.

In the organic light emitting display device according to the present embodiment, the first organic light emitting diode OLED1 of the defective subpixel in the kth row is connected to the subpixel in the k+1th row of the same column, and the second organic light emitting diode OLED2 is connected to the subpixel of the k-1th row of the same column, thereby improving the visibility of the display panel.

FIG. 7 is a view illustrating repair of defective sub-pixels using another repair method of the organic light emitting display device according to the present embodiments, and FIG. 8 shows visibility when the repair method is applied to the organic light emitting display device according to the present embodiments. This is a drawing showing this improved appearance.

Referring to FIG. 7 , the display panel 110 of the organic light emitting display device 100 according to the present exemplary embodiment may include m (column)×n (row) subpixels SP.

If any defective sub-pixel SP_D in the k-th row among the sub-pixels SP arranged in n rows is identified, the sub-pixel in the k+1-th row located in the same column as the defective sub-pixel SP_D in the k-th row A repair process is performed using the pixel SP and the sub-pixel SP of the k-1th row.

The first and second emission areas EA1 and EA2 included in the defective sub-pixel SP_D appear in the form of bright dots, but may appear in the form of dark dots in some cases.

The cutting process CT is performed on the transistors disposed in the circuit area CA of the defective sub-pixel SP_D, and thus the transistors and the first and second light emitting regions EA1 and EA2 disposed in the defective sub-pixel SP_D are formed. ) is electrically isolated.

In the repair method according to the present embodiments, an electrode (anode or cathode) commonly used in the first and second organic light emitting diodes OLED1 and OLED2 disposed in the defective subpixel SP_D in the k-th row is cut and removed. 1 organic light emitting diode (OLED1) and the second organic light emitting diode (OLED2) are electrically separated.

Then, the first repair subpixel R1_SP is formed by connecting the driving transistor of the subpixel in the k+1th row and the first organic light emitting diode OLED1 of the defective subpixel in the kth row through a welding process.

In the same manner, the second repair subpixel R2_SP is formed by connecting the driving transistor of the subpixel in the k−1th row and the second organic light emitting diode OLED2 of the defective subpixel in the kth row through a welding process.

Then, the display panel 110 drives the display to display an image. The data voltage is supplied to each subpixel for driving the display, but the data voltage and the data voltage are applied to the first and second repair subpixels R1_SP and R2_SP. Another repair compensation data voltage is supplied.

In FIG. 6A, there are four light emitting regions in the repair subpixel, but since there are three light emitting regions in the first and second repair subpixels R1_SP and R2_SP, respectively, the repair subpixel shown in FIG. 7 is the repair subpixel of FIG. 6A. The repair compensation data voltage may be reduced compared to that of the subpixel.

In addition, in the organic light emitting display device according to the present embodiment, the first repair subpixel R1_SP and the second repair subpixel R2_SP are connected to the first light emitting area EA1 in the k-th row where the defective subpixels are generated. Since the 2 light emitting areas EA2 are separately occupied, visibility during display driving can be improved.

That is, rather than displaying the same color over the entire area of the defective subpixel SP_D, visibility is improved because different colors of adjacent subpixels are displayed in the first light emitting region and the second light emitting region of the defective subpixel. .

Referring to FIG. 8 , the k-th row in which the defective sub-pixel SP_D occurs is divided into a first emission area EA1 and a second emission area EA2 of each sub-pixel SP. The first repair subpixel R1_SP in the k+1th row connected to the first light emitting area EA1 of the defective subpixel SP_D and k−1 connected to the second light emitting area EA2 of the defective subpixel SP_D The second repair subpixel R2_SP in the k-th row is separated from the boundary between the first emission area EA1 and the second emission area EA2 in the k-th row.

Therefore, when the subpixels in the k+1th row display red (R), the first repair subpixel R1_SP displays red (R) only up to the first light emitting area EA1 in the k+1th row and the kth row. ) is displayed.

In addition, when the subpixels in the k-1th row display blue (B), the second repair subpixel R2_SP displays blue (B) only up to the second light emitting area EA2 in the k-1th row and the kth row. ) is displayed.

As described above, in the repair method according to the present embodiment, the first light emitting area EA1 and the second light emitting area EA2 included in the defective subpixel SP_D are disposed in adjacent subpixels (k−1th row and EA2) of the same column, respectively. k+1th row), there is an effect of improving visibility during display driving.

FIG. 9 is a diagram illustrating a repair method applied to an organic light emitting display having the subpixel structure of FIG. 2 according to the present embodiments.

Referring to FIG. 9 together with FIG. 2 , the organic light emitting display device according to the present exemplary embodiment includes a plurality of subpixels SP. In the display panel composed of m (column) * n (row) subpixels, if a defect occurs in any subpixel in the kth row among the n rows, in this embodiment, the defective subpixel (SP_D: kth row) A repair process is performed using subpixels in the k+1th row and subpixels in the k−1th row of the same column as .

Accordingly, the subpixels in the k+1th row, the defective subpixels SP_D in the kth row, and the subpixels in the k−1th row have the same configuration.

As shown in FIG. 2 , each subpixel includes a first organic light emitting diode (OLED1), a second organic light emitting diode (OLED2), two transistors (DT and SWT), and one storage capacitor (Cst). It has a 2T (Transistor) 1C (Capacitor) structure.

Here, the first organic light emitting diode OLED1 corresponds to the first light emitting region EA1, the second organic light emitting diode OLED2 corresponds to the second light emitting region EA2, and two transistors DT and SWT And the storage capacitor Cst corresponds to the circuit area CA.

In the defective sub-pixel SP_D in the k-th row, the third node N3 of the driving transistor DT is located between the first cutting point CP1 and the first node N1 and the second organic light emitting diode OLED2. The cutting process is performed using the third cutting point CP3 between the two cutting points CP2 and the first and second organic light emitting diodes OLED1 and OLED2.

As described above, the transistors and capacitors disposed in the defective subpixel SP_D are in a dead state by the first to third cutting points CP1 , CP2 , and CP3 .

Then, the first node N1 of the subpixel in the k+1th row and the first organic light emitting diode OLED1 of the defective subpixel SP_D are welded using the first repair line RL1 to perform the first repair. A subpixel R1_SP is formed. Accordingly, the first node N1 of the subpixel in the k+1th row becomes the first welding point W1.

In addition, in the first repair subpixel R1_SP, the first and second organic light emitting diodes OLED1 and OLED2 in the k+1th subpixel are serially connected to each other, but are connected by the first repair line RL1. The first organic light emitting diode OLED1 of the subpixel is connected in parallel with them.

In addition, the second organic light emitting diode OLED2 of the defective subpixel SP_D and the first node N1 of the subpixel in the k-1th row are welded using the second repair line RL2, so that the second repair subpixel is welded. A pixel R2_SP is formed. Accordingly, the second cutting point CP2 of the defective subpixel SP_D becomes the second welding point W2 and is electrically connected to the first node of the subpixel in the k-1th row.

In addition, in the second repair subpixel R2_SP, the first and second organic light emitting diodes OLED1 and OLED2 in the k−1th subpixel are serially connected to each other, but are connected by the second repair line RL2. The second organic light emitting diode OLED2 of the subpixel is connected in parallel with them.

As described above, in the repair method according to the present embodiment, the first light emitting area EA1 and the second light emitting area EA2 included in the defective subpixel SP_D are disposed in adjacent subpixels (k−1th row and EA2) of the same column, respectively. k+1th row), there is an effect of improving visibility during display driving.

FIG. 10 is a diagram in which a repair method is applied to an organic light emitting display having the subpixel structure of FIG. 3 according to the present embodiments.

Referring to FIG. 10 together with FIG. 3 , the organic light emitting display device according to the present exemplary embodiment includes a plurality of subpixels SP. In the display panel composed of m (column) * n (row) subpixels, if a defect occurs in any subpixel in the kth row among the n rows, in this embodiment, the defective subpixel (SP_D: kth row) A repair process is performed using subpixels in the k+1th row and subpixels in the k−1th row of the same column as .

Accordingly, the subpixels in the k+1th row, the defective subpixels SP_D in the kth row, and the subpixels in the k−1th row have the same configuration.

As shown in FIG. 3 , each subpixel has a first connected between the first and second organic light emitting diodes OLED1 and OLED2, the driving transistor DT, the reference voltage line RVL, and the first node. A second transistor T2 connected between the transistor T1, the second node N2 of the driving transistor DT and the data line DL, and the first node N1 and the second transistor T2 of the driving transistor DT. A storage capacitor Cst connected between the nodes N2 is included. That is, each subpixel has a 3T (Transistor) 1C (Capacitor) structure.

Here, the first organic light emitting diode OLED1 corresponds to the first light emitting area EA1, the second organic light emitting diode OLED2 corresponds to the second light emitting area EA2, and the first transistor T1, The two transistors T2, the driving transistor DT, and the storage capacitor Cst correspond to the circuit area CA.

Also, the second transistor T2 may be referred to as a switching transistor SWT of FIG. 9 and the first transistor T1 may be referred to as a sensing transistor.

In the defective sub-pixel SP_D in the k-th row, the third node N3 of the driving transistor DT is located between the first cutting point CP1 and the first node N1 and the second organic light emitting diode OLED2. 2 cutting points CP2, a third cutting point CP3 between the first and second organic light emitting diodes OLED1 and OLED2, and a fourth cutting point between the first transistor T1 and the reference voltage line RVL ( CP4) to proceed with the cutting process.

Then, the first node N1 of the subpixel in the k+1th row and the first organic light emitting diode OLED1 of the defective subpixel SP_D are welded using the first repair line RL1, thereby performing the first repair process. A subpixel R1_SP is formed. Accordingly, the first node N1 of the subpixel in the k+1th row becomes the first welding point W1.

In addition, the second repair subpixel OLED2 of the defective subpixel SP_D and the first node N1 of the subpixel in the k-1th row are welded using the second repair line RL2. A pixel R2_SP is formed. Accordingly, the second cutting point CP2 of the defective subpixel SP_D becomes the second welding point W2 and is electrically connected to the first node of the subpixel in the k-1th row.

As described above, in the repair method according to the present embodiment, the first light emitting area EA1 and the second light emitting area EA2 included in the defective subpixel SP_D are adjacent to the normal subpixels (k−1th row) of the same column, respectively. and k+1th row), there is an effect of improving visibility during display driving.

11 is a flowchart illustrating another repair method of an organic light emitting display device according to the present embodiments.

Referring to FIG. 11 , a repair method of an organic light emitting display device according to the present embodiments is performed on a k-th row of m (column) * n (row) subpixels SP disposed on the display panel 110 . Checking a defective subpixel (S1101), performing a cutting process to make the transistors disposed in the circuit area CA of the defective subpixel in the k-th row dead (S1102), and Electrically isolating the first and second organic light emitting diodes of the defective sub-pixel SP_D in the k-th row (S1103), and the circuit of the k+1-th sub-pixel in the same column as the defective sub-pixel SP_D in the k-th row Forming a first repair subpixel R1_SP by electrically connecting the region and the first organic light emitting diode of the defective subpixel in the k-th row (S1104); Forming a second repair subpixel R2_SP by electrically connecting the circuit area of the k−1th subpixel and the second organic light emitting diode of the defective subpixel in the kth row (S1105); , performing compensation driving to supply repair compensation data to the first and second repair subpixels R1_SP and R2_SP (S1106).

The first repair subpixel R1_SP electrically connects a subpixel in a k+1th row and a first organic light emitting diode of a defective subpixel in a kth row by using a first repair line.

Also, the second repair subpixel R2_SP electrically connects a subpixel in a k−1 th row and a second organic light emitting diode of a defective subpixel in a kth row by using a second repair line.

Also, when the display panel drives the display, the data voltage supplied to each subpixel and the repair compensation data voltage supplied to the first and second repair subpixels have different values.

As described above, the display device and its repair method according to the present embodiment have an effect of preventing deterioration in visibility by making the defective subpixel into a dark spot or a bright spot by electrically connecting the defective subpixel to the normal subpixel.

In addition, the display device and its repair method according to the present embodiment have an effect of improving visibility when driving a display by dividing and connecting first and second organic light emitting diodes disposed on defective subpixels to adjacent normal subpixels, respectively. there is.

The above description and accompanying drawings are merely illustrative of the technical idea of the present invention, and those skilled in the art can combine the configuration within the scope not departing from the essential characteristics of the present invention. , various modifications and variations such as separation, substitution and alteration will be possible. Therefore, the embodiments disclosed in the present invention are not intended to limit the technical idea of the present invention, but to explain, and the scope of the technical idea of the present invention is not limited by these embodiments. The protection scope of the present invention should be construed according to the claims below, and all technical ideas within the equivalent range should be construed as being included in the scope of the present invention.

100: organic light emitting display device
110: display panel
120: source driver
130: scan driver
140: controller
CP1: first cutting point
CP2: 2nd cutting point
CP3: 3rd cutting point
CP4: 4th cutting point
R_SP: repair subpixel

Claims (12)

a display panel including m (columns)×n (rows) subpixels in which m (m: natural number) data lines and n (n: natural number) gate lines are disposed;
Each of the sub-pixels includes a first organic light emitting diode, a second organic light emitting diode connected in series with the first organic light emitting diode, a driving transistor connected to the second organic light emitting diode at a first node, and a driving transistor connected to a second node. A switching transistor connected thereto and a storage capacitor connected between the first node and the second node;
When a defective subpixel among the subpixels is referred to as a subpixel in a k-th row (k<n),
a first repair subpixel formed by electrically connecting a k+1 th subpixel adjacent to the same column as the defective subpixel and a first organic light emitting diode of the defective subpixel;
a second repair subpixel configured by electrically connecting a k-1 th subpixel adjacent to the same column as the defective subpixel and a second organic light emitting diode of the defective subpixel;
a first cutting point is disposed between the first node of the defective subpixel and the second organic light emitting diode of the defective subpixel;
a second cutting point is disposed between the second organic light emitting diode of the defective subpixel and the first organic light emitting diode of the defective subpixel;
The first organic light emitting diode of the defective subpixel is electrically connected to a first node of the k+1th subpixel, and the second organic light emitting diode of the defective subpixel is electrically connected to a first node of the k−1th subpixel. 1 Display device electrically connected to node. According to claim 1,
The display device further comprises a sensing transistor disposed between the first node and a reference voltage line. According to claim 2,
A display device in which the driving transistor, the switching transistor, and the sensing transistor of the defective sub-pixel are in a dead state by cutting. According to claim 1,
The first organic light emitting diode and the second organic light emitting diode in the defective subpixel are electrically separated from each other by cutting. According to claim 1,
The first repair subpixel includes first and second organic light emitting diodes connected in series and first and second organic light emitting diodes connected in series in the subpixels of the k+1th row, and the first and second organic light emitting diodes are connected in parallel to each other. 1 A display device including an organic light emitting diode. According to claim 1,
The second repair subpixel includes first and second organic light emitting diodes connected in series and first and second organic light emitting diodes connected in series in the subpixels of the k-1th row and defective subpixels connected in parallel with the first and second organic light emitting diodes. 2 A display device including an organic light emitting diode. According to claim 1,
A data voltage is supplied to each sub-pixel when the display is driven, and a repair compensation data voltage different from the data voltage is supplied to the first repair sub-pixel and the second repair sub-pixel. A display panel including m (column)×n (row) subpixels in which m (m: natural number) data lines and n (n: natural number) gate lines are disposed; An organic light emitting diode, a second organic light emitting diode connected in series with the first organic light emitting diode, a driving transistor connected to the second organic light emitting diode at a first node, a switching transistor connected to the driving transistor at a second node, and A method for repairing a display device including a storage capacitor connected between a first node and a second node, the method comprising:
identifying a defective subpixel in a k (k<n)th row of the subpixels;
A transistor disposed in a circuit area of the defective sub-pixel is cut into a dead state, and a first organic light emitting diode of the defective sub-pixel is connected to a sub-pixel in a k+1 row adjacent to the defective sub-pixel in a column direction. forming a first repair subpixel; and
forming a second repair subpixel by connecting a second organic light emitting diode of the defective subpixel with a subpixel in a k-1th row adjacent to the defective subpixel in a column direction;
a first cutting point is disposed between the first node of the defective subpixel and the second organic light emitting diode of the defective subpixel;
a second cutting point is disposed between the second organic light emitting diode of the defective subpixel and the first organic light emitting diode of the defective subpixel;
The first organic light emitting diode of the defective subpixel is electrically connected to a first node of the k+1th subpixel, and the second organic light emitting diode of the defective subpixel is electrically connected to a first node of the k−1th subpixel. 1 Repair method of display device electrically connected to node. According to claim 8,
Dead state of the transistor of the bad sub-pixel comprises:
The method of repairing a display device further comprising a step of electrically separating a first organic light emitting diode and a second organic light emitting diode disposed in the defective subpixel. According to claim 8,
The repair method of the display device further comprising the step of electrically connecting the subpixels in the k+1th row and the first organic light emitting diodes of the defective subpixels in the kth row by using a first repair line. According to claim 8,
The repair method of the display device further comprising electrically connecting the second organic light emitting diode of the subpixel in the k-1th row and the defective subpixel in the kth row by using a second repair line. According to claim 8,
When the display panel drives the display, a data voltage is supplied to each of the subpixels, and a repair compensation data voltage different from the data voltage is supplied to the first and second repair subpixels.

Images