KR20170134726A - Radio frequency (RF) -sputter deposition sources, deposition apparatus, and method of operation thereof - Google Patents
Radio frequency (RF) -sputter deposition sources, deposition apparatus, and method of operation thereof Download PDFInfo
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- KR20170134726A KR20170134726A KR1020177032412A KR20177032412A KR20170134726A KR 20170134726 A KR20170134726 A KR 20170134726A KR 1020177032412 A KR1020177032412 A KR 1020177032412A KR 20177032412 A KR20177032412 A KR 20177032412A KR 20170134726 A KR20170134726 A KR 20170134726A
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- power
- electrical
- power connector
- electrical connection
- deposition source
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/342—Hollow targets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3444—Associated circuits
Abstract
A deposition source 10 for sputter deposition is provided. The deposition source includes at least one rotatable cathode (30), an RF power arrangement (20), and a power transfer assembly (40) connecting the rotatable cathode and the RF power arrangement, the power transfer assembly comprising a rotatable cathode Includes a first power connector (42) and a second power connector (44) for simultaneously providing RF energy from the RF power arrangement at two spaced positions (32, 34).
Description
[0001] Embodiments of the present invention are directed to a deposition source for sputter deposition, a sputtering apparatus, and methods of operation thereof. Embodiments include, in particular, a sputter deposition source for radio frequency (RF) sputtering, utilizing a rotatable cathode, an RF sputtering device for sputter deposition in a vacuum chamber, and RF power from the RF power device to the rotatable cathode .
[0002] PVD processes, and in particular sputtering processes, are getting more and more attention in some technical fields, e.g., display manufacturing. With a variety of sputtering techniques, a good deposition rate can be obtained with sufficient layer properties. Sputtering, particularly magnetron sputtering, is a technique for coating substrates, such as glass or plastic substrates, with metallic or non-metallic layers. Thus, a stream of coating material is produced by sputtering the target through the use of a plasma. As a result of collisions with the high-energy particles from the plasma, material is released from the target surface and plasma parameters such as pressure, power, gas, magnetic field, etc. are controlled. The material ejected from the target is moved from the target toward one or more substrates to be coated and attached to such substrates. A wide variety of materials, including metals, semiconductors, and dielectric materials, can be sputtered to desired specifications. Magnetron sputtering has been recognized in a variety of applications including semiconductor processing, optical coatings, food packaging, magnetic recording, and protective wear coatings.
[0003] Known sputtering devices include a power arrangement with a power supply for generating and supplying electrical energy, a power transfer assembly for depositing the energy to gas to ignite and sustain the plasma, And at least one cathode comprising a target for providing a coating material through sputtering by plasma. Sputtering is achieved by a wide variety of devices having different electrical, magnetic, and mechanical configurations. Known arrangements include power arrangements that provide direct current (DC) or alternating current (AC) to produce a plasma and AC electromagnetic fields applied regularly to the gas provide higher plasma rates than DC electromagnetic fields do. In a radio frequency (RF) sputtering apparatus, the plasma is striked and maintained by applying an RF electric field. Thus, non-conductive materials can also be sputtered. Comparing DC sputtering with intermediate frequency (MF) sputtering and DC sputtering, DC sputtering provides the highest deposition rate while RF sputtering provides the lowest deposition rate.
[0004] Sputtering devices having both static targets such as flat plate targets and rotary targets such as rotating cylindrical targets may be used. Often, sputtering devices with rotating targets are made to operate only with an alternating current of direct current or low-to medium frequency, but do not operate using RF emissions. As a result, such devices are only suitable for deposition of conductive layers. Recently, efforts have been made to combine the advantages of RF sputtering with rotatable targets.
[0005] In view of the above, in accordance with the independent claims, there is provided a deposition source for sputter deposition, a device for sputter deposition in a vacuum chamber, and a method of operating a deposition source. Further aspects, advantages, and features of the present invention are apparent from the dependent claims, the detailed description, and the accompanying drawings.
[0006] According to embodiments described herein, a sputter deposition source for sputter deposition is provided. The source includes: an RF power arrangement for supplying RF power; At least one rotatable cathode comprising a target for emitting a coating material during sputtering; And a power delivery assembly that couples the rotatable cathode to the RF power arrangement and thus feeds RF energy from the RF power arrangement to the rotatable cathode. The power delivery assembly includes a first power connector for providing RF energy from the RF power arrangement to the rotatable cathode and a second power connector for simultaneously providing RF energy from the RF power arrangement to the rotatable cathode, The first power connector is arranged spaced apart from the second power connector. As a result, RF energy can be applied to the rotatable cathode at the same time in at least one of the first position and the second position, particularly in both the first position and the second position.
[0007] According to embodiments, there is provided a sputter apparatus for sputter deposition in a vacuum chamber. The apparatus includes a sputter deposition source for sputter deposition in a vacuum chamber. The sputter deposition source comprises a rotatable cathode-cathode arranged within the vacuum chamber, the target providing a material to be deposited; An RF power arrangement for supplying RF power, arranged outside the vacuum chamber; And a first power connector and a second power connector for providing RF energy from the RF power arrangement to the rotatable cathode at two spaced positions, wherein at least one of the first power connector and the second power connector comprises a RF And a vacuum feed-through for transferring RF energy from the power arrangement into the vacuum chamber.
[0008] According to a further embodiment, a method of operating a deposition source for sputter deposition is provided. The method includes feeding RF energy to the rotatable cathode at a first position and at a second position spaced from the first position. The method may be performed by a sputtering apparatus according to the embodiments described herein, or by a deposition source for sputter deposition. In one embodiment, at least one electrical characteristic of the electrical connection supplying RF energy to at least one of the first position and the second position is adjusted during sputtering or prior to sputtering.
[0010] In order that the above-recited features of the present invention may be understood in detail, a more particular description of the invention as summarized above may be made by reference to the embodiments. The accompanying drawings relate to embodiments of the present invention and are described below:
[0011] Figure 1 shows a schematic view of a deposition source for sputter deposition according to embodiments described herein;
[0012] FIG. 2 shows a schematic view of a deposition source for sputter deposition according to embodiments described herein;
[0013] FIG. 3 illustrates a schematic side view of a deposition source for sputter deposition according to embodiments described herein;
[0014] FIG. 4 shows a schematic perspective view of the embodiment of FIG. 3;
[0015] FIG. 5 shows a schematic view of a deposition source for sputter deposition according to embodiments described herein;
[0016] FIG. 6 shows a schematic diagram of a sputtering apparatus according to embodiments described herein;
[0017] FIG. 7 illustrates a flow diagram of a method of operating a deposition source for sputter deposition in accordance with embodiments described herein;
[0018] FIG. 8 shows a flow diagram of a method of operating a deposition source for sputter deposition in accordance with embodiments described herein.
[0019] Reference will now be made in detail to the various embodiments of the invention, examples of which are illustrated in the drawings. In the following description of the drawings, like reference numerals refer to like components. In general, only differences for the individual embodiments are described. Each example is provided as an illustration of the invention and is not intended as a limitation of the invention. Further, the features illustrated or described as part of one embodiment may be used with other embodiments, or may be used for other embodiments, to create further embodiments. The detailed description is intended to cover such modifications and variations.
[0020]
Fig. 1 is a cross-sectional view of a fuel cell including a
In embodiments described herein, the cathode includes a first axial end and a second axial end opposite the first axial end, the first power connector is mounted at the first axial end, and the second power connector Is installed at the second shaft end. In accordance with embodiments, one or more of the electrical characteristics of the electrical connection between at least one of the first and second power connectors and the match box may include a matchbox, while the RF power arrangement may include a matchbox, It can be made possible.
[0021]
The
[0022]
According to some embodiments, the
[0023]
According to some embodiments, the
[0024]
In some embodiments, the
[0025] According to some embodiments, the sputter deposition source may also include a magnetron. The magnetron is a magnet assembly typically provided by permanent magnets to confine the plasma during sputter deposition. Typically, such magnets are arranged in a rotatable cathode.
[0026] In some embodiments, the target of the
[0027]
In some embodiments, which may be combined with other embodiments described herein, the target of the
[0028]
In some embodiments, the target, particularly the target tube, comprises or is made from at least one of Ag, Cu, titanium and Au. In particular, the
[0029]
The
[0030] Sputtering devices do not utilize the target material reliably and uniformly, even if the target is provided on the rotatable cathode, when RF energy is only fed to the rotatable cathode at only a single feeding position. This is because the RF electric field emanating from the cathode regions near the single feeding position can be stronger than the RF electric field that is emitted from the cathode regions far from the feeding position so that stronger sputtering can occur near the feeding position It is because. In particular, the rotatable cathodes, which are provided with electrical power through one cathode support arranged at the proximal end of the cathode, experience weaker sputtering in the target regions at the distal end of the cathode remote from the cathode support. This effect leads to asymmetrical target utilization in sputter deposition sources with a single power connector, a lack of layer uniformity, and a potential increase in material costs.
[0031]
In contrast, according to embodiments disclosed herein, RF energy is applied to the
[0032]
According to some embodiments that may be combined with other embodiments described herein, the
[0033]
In the case of embodiments in which the
[0034]
In some embodiments, the rotatable cathode has a cylindrical shape with a first axial end and a second axial end opposite the first axial end. Advantageously, RF energy can be fed to such cylindrical
[0035]
In some embodiments, at least one of the
[0036] According to some embodiments, at least one of the first power connector and the second power connector provides RF energy transfer to the rotatable cathode by capacitive coupling or inductive coupling.
[0037]
Figure 2 shows a schematic view of a
[0038]
2, the
[0039]
In some embodiments, the
[0040]
Similar to the embodiment shown in FIG. 1, the
[0041]
In some embodiments, the
[0042]
The
[0043]
According to some embodiments that may be combined with other embodiments described herein, the first electrical characteristic and the second electrical characteristic may be determined by a first impedance of the first
[0044]
The corresponding electrical properties of the first
[0045]
Figure 3 shows a schematic side view of a
[0046]
3 and 4, the
[0047]
In some embodiments, the first electrical characteristic refers to the first electrical resistance of the first
[0048]
According to embodiments, the adjustment device may be configured to set the first impedance to be equal to the second impedance before initiating the sputtering operation, in order to pre-set the same utilization of the target at both axial ends of the
[0049]
According to embodiments that may be combined with other embodiments disclosed herein, the
[0050]
3 and 4, the
[0051]
4, in accordance with some embodiments that may be combined with other embodiments described herein, in order to hold and support the
[0052]
Figure 5 shows a schematic view of a
[0053]
5, a
[0054]
In the following description, only the
[0055]
According to some implementations, the
[0056]
The
[0057]
The distance between the
[0058] In embodiments, at least one of the first power connector and the second power connector is made for RF energy transfer to the rotatable cathode by capacitive coupling or through a contact device such as a brush.
[0059]
FIG. 6 shows a schematic view of a
[0061]
An
[0062]
As shown in FIG. 6,
[0063] According to typical embodiments, the process gases may include inert gases such as argon, and / or reactive gases such as oxygen, nitrogen, hydrogen and ammonia, ozone, activated gases, and the like.
[0064]
In the
[0065]
Figure 6 shows a
[0066]
The details of the
[0067] Figure 7 shows a flow diagram of a method of operating a deposition source for sputter deposition in accordance with embodiments described herein. Any of the embodiments described above may be taken as the deposition source to be operated in accordance with the operating method described herein.
[0068]
7, the method includes simultaneously applying RF energy to the rotatable cathode at a first position and at a second position spaced from the first position, as exemplified by the
[0069] Figure 8 shows a flow diagram of a method of operating a deposition source for sputter deposition according to another embodiment described herein.
[0070]
As shown in Figure 8, the method adjusts the first electrical characteristic of the first electrical connection to supply RF energy from the third position to the first position, as exemplified by the
[0071] According to some embodiments, the first electrical characteristic and / or the second electrical characteristic is adjusted by varying the spatial length of the first electrical connection and / or the second electrical connection. In particular, the ratio of the length of the first electrical connection to the length of the second electrical connection may be varied. In some embodiments, the ratio may be adjusted to be essentially or exactly one. As used herein, "essentially" includes ratio values of 0.98 to 1.02. 1 results in a symmetrical feeding of the rotary cathode in a balanced manner, thus leading to a uniform target utilization. In other embodiments, to compensate for the asymmetrical use of a previously used target, and / or to compensate for unequal electrical characteristics of the first power connector and / or the second power connector, ≪ / RTI >
[0072]
8, the RF energy is applied to the rotatable cathode, as exemplified by the
[0073] While the foregoing is directed to embodiments of the present invention, other and further embodiments of the invention may be devised without departing from the basic scope thereof, and the scope thereof is determined by the claims that follow.
Claims (15)
At least one rotatable cathode (30);
An RF power arrangement (20); And
And a power delivery assembly (40, 140) connecting the rotatable cathode and the RF power arrangement,
The power transfer assembly includes a first power connector (42, 142, 342, 442) for simultaneously providing RF energy from the RF power arrangement to the rotatable cathode at two spaced positions (32, 34) And a second power connector (44, 144, 344, 444).
Deposition source for sputter deposition.
Wherein the first power connector (42, 142, 342) and the second power connector (44, 144, 344) are arranged essentially symmetrically with respect to a cross-sectional plane intersecting the center of the rotatable cathode (30)
Deposition source for sputter deposition.
The rotatable cathode (30) has a cylindrical shape with a first axial end (132, 332) and a second axial end opposite the first axial end (134, 334) (142, 342) is installed at the first axial end and the second power connector (144, 344) is installed at the second axial end,
Deposition source for sputter deposition.
Wherein at least one of the first power connector (342) and the second power connector (344) provides RF energy transfer to the rotatable cathode (30) by capacitive coupling or inductive coupling,
Deposition source for sputter deposition.
The RF power arrangement includes a match box 21,
The power delivery assembly includes:
First electrical connections (146, 246) connecting the match box and the first power connector;
And a second electrical connection (148, 248) connecting the match box and the second power connector.
Deposition source for sputter deposition.
Wherein the first impedance of the first electrical connection and the second impedance of the second electrical connection are different by less than 10% and in particular the first impedance and the second impedance are essentially the same and / The first electrical resistance of the first electrical connection and the second electrical resistance of the second electrical connection are different by less than 10%, and in particular, the first electrical resistance and the second electrical resistance are essentially the same,
Deposition source for sputter deposition.
In particular, by adjusting the length of the first electrical connection and / or the second electrical connection to adjust the first electrical characteristic of the first electrical connection and / or the second electrical characteristic of the second electrical connection, Device 226,
Deposition source for sputter deposition.
The match box (21) includes an output terminal (25) provided movably along at least one of the first electrical connection (246) and the second electrical connection (248)
Deposition source for sputter deposition.
Wherein the first electrical connector and the second electrical connector are provided by a conductive rod 249 connected between the first power connector 142 and the second power connector 144, ≪ RTI ID = 0.0 > a < / RTI > conductive rod,
Deposition source for sputter deposition.
Wherein at least one of the first power connector and the second power connector has a cathode support portion movable with respect to the rotatable cathode (30) from an operating position for sputtering operation to an installation position for disassembly of the rotatable cathode 236)
Deposition source for sputter deposition.
The cathode support 236 is axially movable away from the rotatable cathode 30,
Deposition source for sputter deposition.
A vacuum chamber 410; And
A deposition source (420) according to any one of the preceding claims,
The rotatable cathode 30 is positioned inside the vacuum chamber 410,
Wherein at least one of the first power connector and the second power connector comprises a feed-through (152), particularly a vacuum rotary feed-through, for delivering RF energy from the RF power arrangement into the vacuum chamber.
Sputtering device.
The method includes concurrently feeding RF energy to the rotatable cathode (30) at a first position (32) and a second position (34) spaced from the first position.
A method of operating a deposition source for sputter deposition.
A second electric power supply for supplying RF energy to the second position from the third position and / or for adjusting a first electrical characteristic of the first electrical connection 246 that supplies RF energy from the third position to the first position, And adjusting a second electrical characteristic of the connection portion (248).
A method of operating a deposition source for sputter deposition.
Wherein the first electrical characteristic and the second electrical characteristic are adjusted by varying a ratio between a length of the first electrical connection portion and a length of the second electrical connection portion,
A method of operating a deposition source for sputter deposition.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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PCT/EP2015/060228 WO2016180443A1 (en) | 2015-05-08 | 2015-05-08 | Radio frequency (rf) - sputter deposition source, deposition apparatus and method of operating thereof |
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KR20170134726A true KR20170134726A (en) | 2017-12-06 |
KR101956722B1 KR101956722B1 (en) | 2019-03-11 |
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KR1020177032412A KR101956722B1 (en) | 2015-05-08 | 2015-05-08 | Radio frequency (RF) -sputter deposition sources, deposition apparatus, and method of operation thereof |
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KR (1) | KR101956722B1 (en) |
CN (1) | CN208741937U (en) |
WO (1) | WO2016180443A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102067820B1 (en) | 2018-07-24 | 2020-01-17 | (주)선익시스템 | Deposition Equipment Including Means Having Variable Formation for Restraining Arc |
KR20200011295A (en) | 2018-07-24 | 2020-02-03 | 주식회사 선익시스템 | Deposition Equipment Including Means of Restraining Arc |
KR20200018081A (en) | 2018-08-10 | 2020-02-19 | 주식회사 선익시스템 | Deposition Equipment Including Means Having Covering Formation for Restraining Arc |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN112323036B (en) * | 2020-11-03 | 2022-10-21 | 北京北方华创微电子装备有限公司 | Power feed-in mechanism, rotating base device and semiconductor processing equipment |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2750162A2 (en) * | 2012-12-28 | 2014-07-02 | Silevo, Inc. | Radio-frequency sputtering system with rotary target for fabricating solar cells |
US20140332375A1 (en) * | 2011-11-10 | 2014-11-13 | Fhr Anlagenbau Gmbh | Assembly for feeding in hf current for tubular cathodes |
-
2015
- 2015-05-08 KR KR1020177032412A patent/KR101956722B1/en active IP Right Grant
- 2015-05-08 WO PCT/EP2015/060228 patent/WO2016180443A1/en active Application Filing
- 2015-05-08 CN CN201590001451.5U patent/CN208741937U/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20140332375A1 (en) * | 2011-11-10 | 2014-11-13 | Fhr Anlagenbau Gmbh | Assembly for feeding in hf current for tubular cathodes |
EP2750162A2 (en) * | 2012-12-28 | 2014-07-02 | Silevo, Inc. | Radio-frequency sputtering system with rotary target for fabricating solar cells |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102067820B1 (en) | 2018-07-24 | 2020-01-17 | (주)선익시스템 | Deposition Equipment Including Means Having Variable Formation for Restraining Arc |
KR20200011295A (en) | 2018-07-24 | 2020-02-03 | 주식회사 선익시스템 | Deposition Equipment Including Means of Restraining Arc |
KR20200018081A (en) | 2018-08-10 | 2020-02-19 | 주식회사 선익시스템 | Deposition Equipment Including Means Having Covering Formation for Restraining Arc |
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Publication number | Publication date |
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CN208741937U (en) | 2019-04-16 |
KR101956722B1 (en) | 2019-03-11 |
WO2016180443A1 (en) | 2016-11-17 |
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