KR20170080916A

KR20170080916A - Display panel with pattern for measuring warpage and display device therewith and method for detecting defect ussing pattern for measuring warpage

Info

Publication number: KR20170080916A
Application number: KR1020150190740A
Authority: KR
Inventors: 박형빈; 이종호; 김홍석
Original assignee: 엘지디스플레이 주식회사
Priority date: 2015-12-31
Filing date: 2015-12-31
Publication date: 2017-07-11

Abstract

Disclosed is a display panel provided with a bending test pattern, a display device having the bend test pattern, and a bending defect detection method of the display panel using the bending test pattern. The disclosed invention includes: a flat plate-shaped panel portion provided to have a predetermined length and width; And a bending occurrence display portion provided on the panel portion to indicate whether or not the bending of the panel portion is generated, and the bending occurrence display portion includes a plurality of bending measurement patterns spaced apart from each other by a specified distance along the width direction or the longitudinal direction of the panel portion .
According to the present invention, it is possible to provide an effect of effectively suppressing the occurrence of a process error in the process of modularizing the display panel, a down operation of the equipment and a failure of the modularized display panel.

Description

TECHNICAL FIELD [0001] The present invention relates to a display panel having a bending test pattern, a display device having the bend test pattern, and a bending defect detection method of the display panel using the bending test pattern. [0002]

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a display panel having a bending measurement pattern, a display device having the bending measurement pattern, and a bending defect detection method using the bending measurement pattern. More particularly, A display device having the display panel, and a method of detecting warpage defects in a display panel using a warp measurement pattern.

In the field of information technology, the field of display that displays electrical information signals visually has been rapidly developed. As a result, a variety of flat display devices having excellent performance such as thinning, light weight, and low power consumption have been developed. Devices have been developed and are rapidly replacing existing cathode ray tubes (CRTs).

Specific examples of such a flat panel display include a flat panel display such as a liquid crystal display (LCD), a plasma display panel (PDP), and an organic light emitting diode (OLED) .

Among the above flat panel display devices, an organic light emitting element (hereinafter referred to as "OLED") is a self light emitting element and can be lightweight and thin because it does not require a backlight used in a liquid crystal display device as a non-light emitting element.

OLEDs are superior to liquid crystal display devices in viewing angle and contrast ratio, are advantageous in terms of power consumption, can be driven by DC low voltage, have a fast response speed, are resistant to external impacts due to their solid internal components, And has a merit in that the production cost can be saved more than the conventional liquid crystal display device because the manufacturing process is simple.

The display panel provided in such a flat panel display device using OLED can be manufactured from a size of 8 inches or more to a size of 50 inches or more.

Further, the display panel may be varied depending on the size of the display panel, but is usually formed into a thin film having a thickness of several millimeters to several centimeters.

Since such a display panel is formed into a thin film compared to its size, there is a possibility that the surface flatness of the display panel is unevenly formed.

That is, in the molding process of the display panel, a curvature may be formed in a part of the entire surface of the display panel, or distortion of the display panel may occur.

Particularly, in the molding process of the display panel, deflection of the panel mainly occurs at the corner portion of the display panel. Such panel deflection is mainly caused by the edge portion of the display panel being bent more than 1 mm toward the light emitting surface of the display panel.

The defective panel deflection generated in the display panel causes a process error in the process of modularizing the display panel and causes the operation of the equipment to be down, .

Therefore, it is necessary to detect whether the display panel is warped or not before the process of modularizing the display panel after the manufacturing process of the display panel is completed. However, The defective deflection of the display panel is not properly detected.

An object of the present invention is to provide a display panel provided with a bending measurement pattern capable of effectively detecting bending defects of a display panel, a display device having the bending measurement pattern, and a bending defect detection method using the bending measurement pattern.

According to an aspect of the present invention, there is provided a display panel provided with a bending measurement pattern, including: a flat plate-shaped panel portion having a predetermined length and width; And a bending indication portion provided on the panel portion to indicate whether or not the bending of the panel portion is generated, wherein the bending occurrence display portion includes a plurality of bending measurement portions spaced apart from each other by a predetermined distance along the width direction or the longitudinal direction of the panel portion Pattern.

It is preferable that the warp occurrence display portion is provided at an edge portion of the panel portion.

Preferably, the warp measurement pattern is formed by patterning an opaque metal material on the upper surface of the panel portion.

The warp occurrence display portion may further include: a corner display pattern portion including the warp measurement pattern provided at an edge portion of the panel portion; A width direction display pattern portion including a plurality of the bending measurement patterns spaced apart from the corner display pattern portion by a predetermined distance along a width direction of the panel portion; And a longitudinal display pattern portion including a plurality of the bending measurement patterns spaced apart from the corner display pattern portion by a predetermined distance along the longitudinal direction of the panel portion.

According to another aspect of the present invention, there is provided a display device comprising: a flat panel-shaped panel part having a predetermined length and width; and a display panel including a bending indication part provided on the panel part to indicate whether the panel part is bent ; And a case installed in the display panel, wherein the bending occurrence display part includes a plurality of bending measurement patterns spaced apart from each other by a predetermined distance along a width direction or a longitudinal direction of the panel part.

According to still another aspect of the present invention, there is provided a method of detecting warpage defects in a display panel using a warp measurement pattern, the method comprising: providing a flat panel unit having a predetermined length and width; A warp occurrence display part providing a warp occurrence display part for indicating whether or not a warp of the panel part occurs; And a bending occurrence determining step of determining whether bending of the panel unit has occurred by monitoring the bending occurrence display unit.

It is preferable that the warp occurrence display section is provided with the warp occurrence display section by patterning a plurality of warp measurement patterns on the upper surface of the panel section using a photoresist.

The step of arranging the bending indication portions may include arranging a plurality of bending measurement patterns at a predetermined distance along the width direction or the longitudinal direction of the panel portion; Preferably, the step of determining whether or not the flexure is generated may include monitoring a change in the spacing between the plurality of flexure measurement patterns to determine whether the flexure occurs in the panel unit.

In addition, it is preferable that the step of determining whether or not the warp occurs includes measuring a variation value of a gap between a plurality of the bending test patterns, and measuring a warpage of the panel unit based on the measured interval variation value.

According to the display panel provided with the bending measurement pattern of the present invention, the display device having the bending measurement pattern, and the deflection deflection detection method of the display panel using the bending measurement pattern, defective deflection of the display panel can be effectively detected Therefore, it is possible to provide an effect of effectively suppressing the occurrence of a process error in the process of modularizing the display panel, the downsizing of the equipment due to the process, and the failure of the modularized display panel.

1 is an exploded perspective view schematically showing a display device according to an embodiment of the present invention.
2 is a cross-sectional view schematically showing the display panel shown in Fig.
Fig. 3 is an enlarged view of the portion "III" in Fig.
4 is a cross-sectional view showing a cross section of the display panel shown in FIG.
FIG. 5 is a flowchart illustrating a method for detecting a defective deflection of a display panel using a bending measurement pattern according to an embodiment of the present invention. Referring to FIG.
6 is an enlarged view of a part of the display panel judged not to cause defective deflection.
FIG. 7 is an enlarged view of a portion of the display panel determined to have a defective deflection.
8 is a cross-sectional view of the display panel shown in FIG.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a display panel having a bending test pattern according to an exemplary embodiment of the present invention, a display device having the bending test pattern, and a bending defect detection method using the bending test pattern will be described with reference to the accompanying drawings. For convenience of explanation, the thicknesses of the lines and the sizes of the components shown in the drawings may be exaggerated for clarity and convenience of explanation. In addition, the terms described below are defined in consideration of the functions of the present invention, which may vary depending on the intention or custom of the user, the operator. Therefore, definitions of these terms should be made based on the contents throughout this specification.

FIG. 1 is an exploded perspective view schematically showing a display device according to an embodiment of the present invention, and FIG. 2 is a cross-sectional view schematically showing the display panel shown in FIG. FIG. 3 is an enlarged view of the portion "III" of FIG. 1, and FIG. 4 is a cross-sectional view of the display panel shown in FIG.

1 and 2, a display device 300 according to an embodiment of the present invention includes a display panel 100 in a flat plate shape and a case (not shown) provided in the display panel 100, 200).

The case 200 includes a cabinet 210 for guiding the edge of the display panel 100, a back cover 220 for accommodating the display panel 100, and a cover window 220 for protecting the display panel 100. [ A cover window 230 may be provided.

According to the case 200, the back cover 220 is positioned behind the display panel 100 with the cabinet 210 covering the edge of the display panel 100, and the back cover 220 is disposed in front of the display panel 100 When the cover window 230 is positioned, they can be coupled back and forth to be integrated.

The display panel 100 includes a panel unit 110 and a warp generation display unit 150.

Hereinafter, a case where the display device 300 includes the display panel 100 using the organic light emitting device OLED will be described as an example.

The panel unit 110 is provided in a form in which the substrate 101 on which the driving thin film transistor DTr and the light emitting diode E are formed is encapsulated by the in-

A semiconductor layer 104 is formed on the pixel region P on the substrate 101. The semiconductor layer 104 is made of silicon and has a central portion formed on both sides of the active region 104a and the active region 104a And source and drain regions 104b and 104c doped with a high concentration of impurities.

On the semiconductor layer 104, a gate insulating film 105 is formed. A gate wiring 107 is formed on the gate insulating film 105 in correspondence with the active region 104a of the semiconductor layer 104 and a gate wiring extending in one direction although not shown in the figure.

A first interlayer insulating film 106a and a gate insulating film 105 under the first interlayer insulating film 106a are formed on the active region 104a and the gate insulating film 106. In this case, And first and second semiconductor layer contact holes 109 respectively exposing source and drain regions 104b and 104c located on both sides.

Next, on the upper portion of the first interlayer insulating film 106a including the first and second semiconductor layer contact holes 109, source and drain regions (first and second semiconductor layer contact holes 109, Source and drain electrodes 108a and 108b are formed in contact with the gate electrodes 104a and 104b and 104c, respectively.

And a drain contact hole 112 exposing the drain electrode 108b over the first interlayer insulating film 106a exposed between the source and drain electrodes 108a and 108b and the two electrodes 108a and 108b, (106b) are formed.

At this time, the semiconductor layer 104 including the source and drain electrodes 108a and 108b and the source and drain regions 104b and 104c contacting the electrodes 108a and 108b and the gate insulating film 104 formed on the semiconductor layer 104 The gate electrode 105 and the gate electrode 107 constitute a driving thin film transistor DTr.

Although not shown, a data line (not shown) is formed which crosses the gate line (not shown) and defines the pixel region P. The switching thin film transistor (not shown) has the same structure as the driving thin film transistor DTr and is connected to the driving thin film transistor DTr.

In the drawings, the switching thin film transistor (not shown) and the driving thin film transistor DTr are shown as an example of a Co-planar type in which the semiconductor layer 104 is formed of a polysilicon semiconductor layer. And Bottom gate type of impurity amorphous silicon.

The panel portion 110 is connected to the drain electrode 108b of the driving thin film transistor DTr and has a relatively large work function value in a region for displaying an image substantially on the second interlayer insulating film 106b As a constituent element of the light emitting diode E as a material, a first electrode 111 constituting an anode is formed.

The first electrode 111 is formed for each pixel region P and a bank 119 is located between the first electrodes 111 formed for each pixel region P.

That is, the bank 119 is formed as a boundary portion for each pixel region P, and the first electrodes 111 are formed in a structure separated by the pixel regions P.

An organic light emitting layer 113 is formed on the first electrode 111.

Here, the organic light emitting layer 113 may be formed of a single layer made of a light emitting material. In order to improve light emitting efficiency, a hole injection layer, a hole transport layer, an emitting material layer, An electron transport layer, and an electron injection layer.

In general, the organic light emitting layer 113 displays red (R), green (G), and blue (B) colors. And organic materials 113a, 113b, and 113c that emit blue (B) light are patterned and used.

A second electrode 115, which forms a cathode, is formed on the entire surface of the organic light emitting layer 113.

At this time, the second electrode 115 includes a semitransparent metal film having a bilayer structure and thinly deposited metal material having a low work function. This second electrode 115 may be a two-layer structure in which a transparent conductive material is thickly deposited on a semitransparent metal film.

As an example, the organic light emitting layer 113 may be driven by a top emission type in which light emitted from the organic light emitting layer 113 is emitted toward the second electrode 115.

As another example, since the second electrode 115 is made of an opaque metal film, the organic light emitting layer 113 may be driven to emit light toward the first electrode 111 in a bottom emission type have.

According to the panel unit 110, when a predetermined voltage is applied to the first electrode 111 and the second electrode 115 according to a selected color signal, the holes injected from the first electrode 111 and the holes injected from the second electrode 115 115 are transported to the organic light emitting layer 113 to form an exciton. When the excitons transit from the excited state to the ground state, light is generated and emitted in the form of visible light.

At this time, the emitted light passes through the transparent second electrode 115 or the first electrode 111 and exits to the outside, so that the panel unit 110 realizes an arbitrary image.

An encaps substrate 102 is provided on the driving TFT DTr and the light emitting diode E and the substrate 101 and the encaps substrate 102 are separated from each other by an adhesive film 103 having adhesive properties .

Thus, the panel unit 110 is encapsulated.

The adhesive film 103 protects the driving thin film transistor DTr and the light emitting diode E formed on the substrate 101 by preventing external moisture from penetrating into the light emitting diode E. In this case, (E) and is formed on the substrate (101).

The adhesive film 103 is formed of a selected one of OCA (Optical Cleared Adhesive), a thermosetting resin, and a thermosetting encapsulant to seal the driving thin film transistor DTr and the light emitting diode E on the substrate 101.

Meanwhile, the substrate 101 and the in-cap substrate 102 may be formed of glass, plastic material, stainless steel, metal foil, or the like.

A printed circuit board 118 is connected to the panel unit 110 via a connecting member 116 such as a flexible circuit board or a tape carrier package (TCP).

The panel unit 110 connected to the printed circuit board 118 receives the driving signals from the driving circuit elements (not shown) mounted on the printed circuit board 118.

The display panel 100 is finally modularized through a combination of the panel unit 110, the cabinet 210, the back cover 220, and the cover window 230.

Since the panel 110 is formed as a thin film in comparison with the size of the panel 110, deflection of the panel may occur in the form of curvature or warpage of a part of the entire surface.

The defective panel warp caused by the panel unit 110 may cause a process error in the process of modularizing the display panel 100 and result in a down operation of the equipment, Causing a failure of the semiconductor device 100.

Referring to FIGS. 1 and 3, the flexure occurrence display unit 150 is provided on the panel unit 110 to indicate whether the panel unit 110 is bent.

The warpage occurrence indicator 150 is provided in a form including a plurality of warpage measurement patterns 151 that are spaced apart from each other by a specified distance along the width direction X or the length direction Y of the panel unit 110 .

Each of the bending measurement patterns 151 is provided on one side of the panel portion 110, more specifically, on the side of the display panel 100 facing the light emitting surface side.

Such a bending measurement pattern 151 may be provided in a visually recognizable form or may be provided in a recognizable form when light of a specific wavelength such as ultraviolet rays or infrared rays is received.

The bending measurement pattern 151 may be formed by patterning a pattern material on the upper surface of the panel unit 110, that is, the surface facing the light emitting surface side of the display panel 100, or may be formed by using various printing methods Or may be printed on the upper surface of the panel unit 110.

In the present embodiment, it is exemplified that the bending measurement pattern 151 is formed by patterning an opaque metal material on the upper surface of the panel portion 110. [

Since the bending measurement pattern 151 thus provided can be visually recognized without any equipment for irradiating light having a specific wavelength such as ultraviolet rays or infrared rays, it is possible to detect the change pattern of the bending measurement pattern 151 without additionally installing expensive equipment Can be effectively monitored.

The warp occurrence display part 150 including the above-described warp measurement pattern 151 is provided at the corner of the panel part 110. [

In this embodiment, it is exemplified that the warp occurrence display portion 150 is provided at each of the four corner portions of the panel portion 110. [

Each of the warping occurrence display portions 150 provided with the four corners of the panel portion 110 has the edge display pattern portion 250a, the width direction display pattern portion 250b, and the longitudinal direction display pattern portion 250c .

The corner display pattern portion 250a corresponds to a section including a bending measurement pattern 151 provided at the corner portion of the panel portion 110. [

The corner display pattern portion 250a is provided to be positioned between the width direction display pattern portion 250b and the longitudinal direction display pattern portion 250c.

Preferably, the width direction display pattern portion 250b and the longitudinal direction display pattern portion 250c are disposed at right angles to each other with the corner display pattern portion 250a as a center.

The width direction display pattern portion 250b includes a plurality of bending measurement patterns 151 spaced apart from the edge display pattern portion 250a along the width direction X of the panel portion 110 .

The longitudinal direction display pattern portion 250c includes a plurality of bending measurement patterns 151 spaced apart from the edge display pattern portion 250a along the longitudinal direction Y of the panel portion 110 Section.

The warpage display portion 150 provided as described above is configured to have a plurality of warpage measurement patterns 150 provided on the longitudinal direction display pattern portion 250c, The panel unit 110 can display whether a bending deformation has occurred or not.

The plurality of bending test patterns 151 provided on the width direction display pattern portion 250b and the longitudinal direction display pattern portion 250c are patterned on the upper surface of the panel portion 110, As shown in FIG.

Each of the bending measurement patterns 151 thus provided can be changed in position in accordance with the shape deformation of the panel portion 110.

When the shape of the panel part 110 is changed due to the bending deformation of the panel part 110, the position of the bending measurement pattern 151 provided in the area where the shape change has occurred varies depending on the shape change of the panel part 110 So that a change in the spacing between the bending test patterns 151 whose positions are changed occurs.

The variation of the gap between the bending test patterns 151 caused by the bending deformation of the panel unit 110 is not only an indication of whether the panel unit 110 is bent or deformed, It can be used as information for measuring how much bending deformation has occurred in the bending moment.

Preferably, the width direction display pattern portion 250b includes a plurality of bending measurement patterns 151 formed to have the same length and width.

The longitudinal direction display pattern portion 250c may further include a plurality of bending measurement patterns 151 formed to have the same length and width.

This is because when the interval between the respective bending test patterns 151 provided on the bending occurrence indicator 150 is measured, in addition to the factors caused by the occurrence of the bending deformation of the panel portion 110, So that the variables generated by the factors do not affect the measured value of the interval between the respective bending test patterns 151, and the ease of measurement and reliability are improved.

FIG. 5 is a flowchart illustrating a deflection defect detection method of a display panel using a bending measurement pattern according to an exemplary embodiment of the present invention, and FIG. 6 is an enlarged view of a portion of a display panel that is determined to have no deflection defects . 7 is an enlarged view of a portion of the display panel determined to have a defective deflection, and FIG. 8 is a cross-sectional view of the display panel shown in FIG.

Hereinafter, a defective deflection detection method for a display panel using a deflection measurement pattern according to an embodiment of the present invention will be described with reference to FIGS. 3 to 8. FIG.

3 to 5, in order to detect defective deflection of the display panel 100 using a bending measurement pattern according to an exemplary embodiment of the present invention, first, a flat panel member 110 having a predetermined length and width (S10).

Since the structure and manufacturing process of the panel unit 110 have been described above, a detailed description thereof will be omitted here.

Then, the panel unit 110 is provided with a warp generation display unit 150 for indicating whether the panel unit 110 is warped or not (S20).

The warpage occurrence display unit 150 is provided in a form including a plurality of warpage measurement patterns 151 that are spaced apart from each other by a predetermined interval along the width direction X or the length direction Y of the panel unit 110. [

The bending measurement pattern 151 may be formed by patterning a pattern material on the upper surface of the panel unit 110, that is, the surface facing the light emitting surface side of the display panel 100, Or may be printed on the upper surface of the panel unit 110.

Since the bending measurement pattern 151 thus prepared can be visually recognized without any equipment for irradiating light having a specific wavelength such as ultraviolet rays or infrared rays, it is possible to detect a change in the bending measurement pattern 151 without additionally installing expensive equipment To be monitored effectively.

When the panel portion 110 is bent, the shape of the flexural deformation of the panel portion 110 is most likely to appear at the edge portion of the panel portion 110.

That is, when the panel portion 110 is bent in the thickness direction of the panel portion 110, the shape of the flexure deformation appears at the corner portion of the panel portion 110 as compared with other portions of the panel portion 110 It is preferable to monitor the occurrence of the warping at the corners of the panel part 110 because the degree of the occurrence of the deformation of the panel part 110 is high and the degree of the deformation occurs most at the corners of the panel part 110. Therefore, It is the most efficient way to judge whether the

In view of this, in the present embodiment, the warp generation display unit 150 provided to indicate whether the panel unit 110 is warped is provided at each of the four corners of the panel unit 110, So that the warpage of the panel portion 110, which appears through at least one of the four corner portions, can be effectively monitored.

The edge display pattern portion 250a corresponds to a section including a bending measurement pattern 151 provided at a corner portion of the panel portion 110. [

At this time, a change in the shape of the panel part 110 at the time of the bending of the panel part 110 appears as a bending of the panel part 110 in the up and down direction Z, The interval between the patterns 151 becomes narrow.

After the process of providing the bending indication 150 to the panel unit 110 is completed, the bending indication unit 150 is monitored to determine whether the bending of the panel unit 110 has occurred (S30).

The process of providing the warpage occurrence indicator 150 to the panel unit 110 may be performed during the process of manufacturing the panel unit 110 or after the manufacture of the panel unit 110 is completed, It may be done before the process.

The process of determining whether or not the panel unit 110 is warped by monitoring the warping occurrence display unit 150 may include the steps of providing a warpage display unit 150 on the panel unit 110, .

A plurality of bending measurement patterns 151 provided in the bending occurrence display unit 150 are formed in a step of determining whether bending of the panel unit 110 has occurred by monitoring the bending occurrence display unit 150, ) Of the panel unit 110 is monitored to determine whether the panel unit 110 is bent.

According to the present embodiment, the state of the warp occurrence indicator 150 can be monitored by the monitoring device 10. [

The monitoring apparatus 10 is installed in a place where the display panel 110 is provided with a warpage display unit 150 provided thereon for mounting or transferring the display panel 100, And may be installed toward the lower side toward the display panel 100. [

As an example of the monitoring apparatus 10, an apparatus for capturing an image by capturing an object, such as a CCD camera, may be applied.

Such a monitoring apparatus 10 can acquire an image photographed in a direction from the upper side of the display panel 100 toward the display panel 100, that is, a direction perpendicular to the lower side.

By using the monitoring apparatus 10 as described above, it is possible to acquire images for acquiring information on how the intervals between the respective bending measurement patterns 151 provided on the bending occurrence display unit 150 have changed.

Information on how the interval between the respective bending measurement patterns 151 provided in the bending occurrence display unit 150 has changed can be acquired through the obtained image.

For example, when the width of each of the actual bending test patterns 151 provided on the bending occurrence display unit 150 is 10 μm, the width of each of the bending test patterns 151 appearing on the image acquired through the monitoring device 10 The actual spacing between the respective bending test patterns 151 is a method of comparing the widths of the respective bending test patterns 151 appearing on the image obtained through the monitoring apparatus 10 and the interval widths therebetween Can be grasped.

That is, when the interval between the bending measurement patterns 151 shown in the image acquired through the monitoring device 10 is 5 mm which is about half of the width of each of the bending measurement patterns 151, the bending measurement patterns 151 It can be understood that the actual interval between the electrodes is 5 占 퐉.

The actual bending measurement patterns 151 are spaced apart from each other at a predetermined interval (hereinafter, referred to as "measurement interval") when the bending measurement patterns 151 (Hereinafter, referred to as "interval variation value") between the plurality of bending measurement patterns 151 by comparing the measured interval variation value with a predetermined reference interval value It is possible to determine the amount of warpage of the panel part 110 and determine whether the panel part 110 is bent or not.

For example, when the ratio of the average value of the interval variation values between the plurality of bending measurement patterns 151 to the designated reference interval value is about 10%, a value proportional to the ratio (hereinafter referred to as " The deflection amount of the panel part 110 can be grasped and the thus obtained value of the deflection amount is compared with a numerical value designated as a reference (hereinafter, referred to as "reference value" It is possible to determine whether or not the flexure of the part 110 is generated.

Hereinafter, the actual values of the actual bending test patterns 151 provided on the bend generation display part 150 are 10 占 퐉, the specified reference intervals are 10 占 퐉, and the average value of the interval variation values between the plurality of bending test patterns 151 is Explanation is given by taking as an example the numerical value which is the same as the value of the amount of deflection when the ratio with respect to the specified reference interval value is 20% as the reference value.

As an example, when the numerical value of the interval width between the bending measurement patterns 151 measured using the image acquired through the monitoring apparatus 10 is equal to the numerical value of the specified interval interval width, It can be judged that it has not occurred.

As another example, when the numerical value of the interval width between the bending measurement patterns 151 measured using the image acquired through the monitoring apparatus 10 is 9 mu m on average, as shown in Fig. 6, The value of the deflection amount of the panel member 110 is within the reference numerical value range, so that it can be also judged that the panel member 110 is not warped.

Alternatively, when the numerical value of the interval width between the bending measurement patterns 151 measured using the image acquired through the monitoring apparatus 10 is 4 mu m on average as shown in Figs. 7 and 8, The deflection amount of the panel unit 110 is out of the reference value range and therefore it can be judged that the panel unit 110 is warped and the deflection of the display panel 100 can be detected do.

In the above example, the reference value is set to a numerical value equal to the value of the amount of deflection when the average value of the interval variation values between the plurality of bending test patterns 151 is 20% in comparison with the specified reference interval value. However, The reference numerals are determined differently from those exemplified above in consideration of the size and thickness of the display panel 100 and the shape and size of various components coupled to the display panel 100 in the modularization process of the display panel 100 It is possible.

According to the display panel provided with the above-described bending test pattern, the display device having the bending test pattern, and the bending defect detection method using the bend test pattern, the display panel 100 can be easily manufactured. It is possible to effectively detect a defective deflection, thereby effectively preventing the occurrence of a process error in the process of modularizing the display panel 100, a down operation of the equipment and a failure of the modular display panel 100 Can be provided.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims. I will understand. Accordingly, the true scope of protection of the present invention should be defined by the following claims.

10: Monitoring device
100: Display panel
110: pad portion
150: warp occurrence indicator
151: bending measurement pattern
200: Case
210: Cabinet
220: back cover
230: Cover window
A: Corner display pattern part
B: width direction display pattern portion
C: longitudinal direction display pattern portion
X: width direction
Y: Longitudinal direction

Claims

A flat plate-like panel portion provided to have a predetermined length and width; And
And a bending indication portion provided on the panel portion to indicate whether the bending of the panel portion has occurred,
Wherein the warp occurrence display portion includes a plurality of warpage measurement patterns arranged to be spaced apart from each other by a predetermined distance along a width direction or a longitudinal direction of the panel portion.

The method according to claim 1,
Wherein the warp occurrence display portion is provided with a warp measurement pattern provided at an edge portion of the panel portion.

The method according to claim 1,
Wherein the warp measurement pattern is provided with a warp measurement pattern provided by patterning an opaque metal material on an upper surface of the panel portion.

The apparatus according to any one of claims 1 to 3,
A corner display pattern portion including the bending measurement pattern provided at an edge portion of the panel portion;
A width direction display pattern portion including a plurality of the bending measurement patterns spaced apart from the corner display pattern portion by a predetermined distance along a width direction of the panel portion; And
And a longitudinal direction display pattern portion including a plurality of the bending measurement patterns spaced apart from the edge display pattern portion by a predetermined distance along a longitudinal direction of the panel portion.

A display panel including a flat panel-shaped panel portion having a predetermined length and width, and a warp occurrence display portion provided on the panel portion to indicate whether the panel portion is warped; And
And a case installed on the display panel,
Wherein the bending occurrence display portion includes a plurality of bending measurement patterns spaced apart from each other by a predetermined distance along a width direction or a longitudinal direction of the panel portion.

A panel part preparing step of providing a flat plate type panel part having a predetermined length and width;
A warp occurrence display part providing a warp occurrence display part for indicating whether or not a warp of the panel part occurs; And
And determining whether or not a bending of the panel unit is detected by monitoring the bending occurrence display unit.

The method according to claim 6,
Wherein the step of forming the warpage display section comprises patterning a plurality of warpage measurement patterns on the upper surface of the panel section using a photoresist to provide the warpage occurrence display section.

The method according to claim 6,
Wherein the step of arranging the bending indication portions comprises arranging a plurality of bending measurement patterns in a width direction of the panel portion or spaced apart from each other by a specified distance along the longitudinal direction;
Wherein the step of determining whether or not the warp occurs includes monitoring a change in a gap between the plurality of warp measuring patterns to determine whether the warp occurs in the panel unit.

9. The method of claim 8,
Wherein the step of determining whether or not the warp occurs includes measuring a variation value of a gap between the plurality of warp measurement patterns and determining a warp amount of the panel unit based on the measured gap variation value.