KR20170028000A - Display device and driving method of the same - Google Patents

Abstract

The present invention compensates deterioration in proportion to the driving environment and the driving time of a gate driving part to extend the driving reliability and lifetime of a thin film transistor constituting the gate driving part, and to prevent defects due to deterioration of the thin film transistor. To this end, the present invention includes a deterioration compensation circuit part for sensing a gate signal outputted from the gate driving part and outputting a compensation signal for compensating a gate voltage based on the sensed gate signal.

Description

DISPLAY DEVICE AND DRIVING METHOD OF THE SAME [0002]

The present invention relates to a display device and a driving method thereof.

As the information technology is developed, the market of display devices, which is a connection medium between users and information, is getting larger. Accordingly, the use of display devices such as an organic light emitting display (OLED), a liquid crystal display (LCD), and a plasma display panel (PDP) is increasing.

Some of the above-described display devices, for example, a liquid crystal display device and an organic light emitting display device, include a display panel including a plurality of sub-pixels arranged in a matrix form and a driver for driving the display panel. The driver includes a gate driver for supplying a gate signal (or a scan signal) to the display panel, and a data driver for supplying a data signal to the display panel.

When a gate signal, a data signal, or the like is supplied to the subpixels arranged in a matrix form, the selected subpixel emits light so that an image can be displayed.

The gate driver is formed in the display panel by a gate in panel (GIP) method which is combined with a thin film transistor process. The gate driver includes a thin film transistor. Since the threshold voltage of the thin film transistor constituting the gate driver progresses in proportion to the environment of the display panel and the driving time, threshold voltage compensation is required to extend driving reliability and lifetime of the display device.

According to an aspect of the present invention, there is provided a method of driving a thin film transistor, the method comprising: .

According to the present invention, there is provided a display device including a display panel, a gate driver, a power supply, and a deterioration compensation circuit. The display panel displays the image. The gate driver is located in the non-display area of the display panel. The power supply unit supplies a gate voltage to the gate driver. The deterioration compensation circuit part senses the gate signal outputted from the gate driver and outputs a compensation signal for compensating the gate voltage based on the sensed gate signal.

The deterioration compensation circuit part can output a compensation signal for varying the gate voltage when it is determined that deterioration of the thin film transistor constituting the gate driver is a result of comparing the sensed gate signal and the internal reference voltage.

The power supply unit may vary the level of the selected one or both of the gate high voltage and the gate low voltage in response to the compensation signal.

The power supply part can increase the gate high voltage in response to deterioration of the thin film transistor constituting the gate driving part.

The deterioration compensating circuit part includes a sensing circuit part for comparing the sensed gate signal and an internal reference voltage, a compensating circuit for determining a degradation degree of the thin film transistor constituting the gate driving part based on the difference signal value outputted from the sensing circuit part, To the power supply unit.

The gate driving unit may further include a dummy gate driving unit, and the deterioration compensation circuit unit may sense the dummy gate signal through a feedback line connected to an output terminal of the dummy gate driving unit.

The power supply section may include a deterioration compensation circuit section, a left feedback line connected to the output terminal of the dummy gate driving section located on the left side of the display panel, and a right feedback line connected to the output terminal of the dummy gate driving section located on the right side of the display panel have.

In another aspect, the present invention provides a method of driving a display device. A method of driving a display device includes: supplying a data signal to a display panel; Supplying a gate signal to the display panel; And sensing the gate signal and compensating for the gate voltage based on the sensed gate signal.

The step of compensating the gate voltage may vary the gate voltage when it is determined that the deterioration of the thin film transistor constituting the gate driver results from comparing the sensed gate signal with the internal reference voltage.

The step of compensating the gate voltage may vary the level of the selected one or both of the gate high voltage and the gate low voltage.

The present invention has the effect of compensating deterioration in proportion to the driving environment and driving time of the gate driver. Further, the present invention has the effect of extending the driving reliability and lifetime of the thin film transistor constituting the gate driver, and improving the defect caused by deterioration of the thin film transistor. Further, since the gate voltage is increased according to the degree of deterioration of the thin film transistor, the present invention is advantageous in that additional reliability can be secured by avoiding a situation where the reliability margin is insufficient as compared with the conventional method using a fixed gate voltage. In addition, the present invention has the effect of extending the lifetime of the gate driver while minimizing the influence of the drop of the pixel charge voltage and the like.

1 is a schematic block diagram of a display device;
FIG. 2 is a diagram illustrating a configuration example of a subpixel shown in FIG. 1; FIG.
3 is an exemplary diagram showing a waveform of a gate signal output from the gate driver;
FIGS. 4 and 5 are views for explaining the threshold voltage transfer characteristic of the thin film transistor included in the gate driver; FIG.
6 is a block diagram of a main configuration of a display device according to an embodiment of the present invention;
7 is a schematic view of a gate driver and a dummy gate driver;
8 is a waveform diagram for explaining a compensation concept according to an embodiment of the present invention;
Fig. 9 is a schematic circuit configuration example of the deterioration compensating circuit; Fig.
10 is a schematic circuit configuration example of a power supply unit having a deterioration compensation circuit unit;
FIG. 11 is an exemplary view of a display device module constructed based on FIG. 10; FIG.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

The display device according to the present invention is implemented as a television, a set-top box, a navigation device, a video player, a Blu-ray player, a personal computer (PC), a home theater, a wearable device (such as a smart watch) and a smart phone (mobile phone). The display panel of the display device may be a liquid crystal display panel, an organic light emitting display panel, an electrophoretic display panel, or the like, but is not limited thereto.

FIG. 1 is a schematic block diagram of a display device, FIG. 2 is a configuration example of a subpixel shown in FIG. 1, and FIG. 3 is an exemplary waveform diagram of a gate signal outputted from a gate driver.

1 to 3, the display device includes a display panel 100, a timing controller 110, a data driver 120, a power supply 130, gate drivers 140L and 140R, 150).

The display panel 100 includes sub-pixels connected to the data lines DL and the gate lines GL which cross each other. The display panel 100 includes a display area AA where subpixels are formed and a non-display area (LNA, RNA) where various signal lines, pads, and the like are formed outside the display area AA.

One subpixel SP corresponds to the gate signal (or scan signal) supplied through the switching transistor SW and the switching transistor SW connected to the first gate line GL1 and the first data line DL1 And a pixel circuit (PC) that operates in response to the supplied data signal (DATA). The display panel 100 may be implemented as a liquid crystal display panel, an organic light emitting display panel, an electrophoretic display panel, or the like according to the configuration of the pixel circuit PC of the subpixel SP.

When the display panel 100 is composed of a liquid crystal display panel, it may be a twisted nematic (TN) mode, a VA (Vertical Alignment) mode, an IPS (In Plane Switching) mode, a FFS (Fringe Field Switching) mode, or an ECB (Electrically Controlled Birefringence) Mode. When the display panel 100 is formed of an organic light emitting display panel, it may be implemented as a top emission, a bottom emission, or a dual emission.

The timing controller 110 receives timing signals such as a vertical synchronizing signal, a horizontal synchronizing signal, a data enable signal, and a dot clock through an LVDS or TMDS interface receiving circuit connected to an image board. The timing controller 110 generates timing control signals for controlling the operation timings of the data driver 120 and the gate drivers 140L and 140R based on the input timing signal.

The data driver 120 includes a plurality of source drive ICs (Integrated Circuits). The source drive ICs are supplied with the data signal DATA and the source timing control signal DDC from the timing controller 110. The source driver ICs convert the data signal DATA from a digital signal into an analog signal in response to the source timing control signal DDC and supply it through the data lines DL of the display panel 100. [ The source drive ICs are connected to the data lines DL of the display panel 100 by a COG (Chip On Glass) process or a TAB (Tape Automated Bonding) process.

The power supply unit 130 is formed on an external substrate connected to the display panel 100 in the form of an IC. The power supply unit 130 may operate under the control of the timing control unit 110. The power supply unit 130 shifts the level of the gate high voltage VGH and the gate low voltage VGL and supplies the shifted level to the shift register unit. The power supply unit 130 includes only a portion for outputting the gate high voltage VGH and the gate low voltage VGL in a level shifter unit (not shown) according to the configuration or size of the display apparatus, .

The gate drivers 140L and 140R include shift register portions. The shift register unit constituting the gate drivers 140L and 140R is formed in a gate in panel (GIP) manner on the non-display areas LNA and RNA of the display panel 100. [

The shift register unit may be formed on the left and right sides of the non-display area (LNA, RNA) of the display panel 100 in the form of a thin film transistor. The shift register unit is configured in the form of a stage capable of changing the gate high voltage (VGH) and the gate low voltage (VGL) supplied from the power supply unit 130 into gate signals and sequentially outputting them.

The stage circuit units (not shown) constituting the shift register unit sequentially output the gate signals GL1 to GLn through the output terminals. The gate signals consist of a level corresponding to the gate high voltage VGH and a level corresponding to the gate low voltage VGL. The gate high voltage VGH is used as a signal to turn on the switching transistor of the subpixel SP of the display panel. On the other hand, the gate-low voltage VGL is used as a signal to turn off the switching transistor of the sub-pixel SP of the display panel.

In FIG. 3, the gate high voltage VGH does not overlap the first gate signal GL1 and the second gate signal GL2. However, the gate high voltage VGH may be superimposed according to the driving characteristics of the display panel 100. In addition, the gate signals GL1 to GLn may have a form other than that shown in FIG.

As described above, the gate drivers 140L and 140R include a plurality of thin film transistors. The threshold voltages of the thin film transistors constituting the gate drivers 140L and 140R are increased in proportion to the environment of the display panel 100 and the driving time. Therefore, it is necessary to compensate for deterioration in order to extend driving reliability and lifetime of the display device.

The deterioration compensation circuit unit 150 is a circuit for performing a sensing operation to extend the driving reliability and lifetime of the thin film transistors constituting the gate drivers 140L and 140R. The description of the degradation compensation circuit section 150 will be discussed in more detail below.

Hereinafter, deterioration of the gate drivers 140L and 140R with respect to the driving time and the environment (e.g., temperature) will be described.

4 and 5 are views for explaining the threshold voltage transfer characteristics of the thin film transistor included in the gate driver.

As shown in FIGS. 4 and 5, the threshold voltage Vth of the thin film transistor included in the gate driver is in an exponential relationship with respect to the driving time and the environment (for example, temperature). Therefore, the threshold voltage changes as the driving time is prolonged or the temperature is increased. That is, the main factors related to the reliability of the transistor are the driving time and the temperature change.

Since the thin film transistor included in the gate driving unit has such a characteristic, the threshold voltage Vth shifts (Positive / Negative Shift) in the positive (X2 direction) or negative (X1) direction as the driving time . Since the thin film transistor included in the gate driver has such a characteristic, the threshold voltage (Vth) changes as the temperature (see FIG. 5) increases. Because of this characteristic, when the threshold voltage is higher than the set voltage, the gate drive unit of the display device has a short life.

Various experiments were conducted to solve the above problems. For example, as a result of applying a high voltage to the gate driver in advance, a phenomenon that the pixel charge voltage drop amount? Vp becomes high has been observed. Since the pixel charge voltage drop amount (DELTA Vp) increases in proportion to the gate voltage, this amount is increased when the gate voltage is increased.

As a result, it is confirmed that asymmetrical DC voltage is accumulated in the liquid crystal, resulting in defects such as unevenness in the alignment and other defective reliability. In other words, it has been found through experiments that as the high voltage is applied to the thin film transistor of the gate driving part from the beginning, the deterioration speed is accelerated and the reliability is badly influenced.

As a result of continuing other experiments, it has been confirmed that the characteristics (threshold voltage, etc.) of the thin film transistor included in the gate driver can be sensed and compensated in real time (or close to real time) by applying the following embodiments.

In addition, the embodiment described below varies the level of the gate voltage output from the gate driver when the voltage fed back to the deterioration compensation circuitry exceeds the reference voltage (or threshold value) set therein. That is, the embodiment varies the level of the gate voltage to compensate the gate voltage if the waveform of the normal gate signal (or clock signal) is not output.

The embodiment has been shown to be capable of securing additional reliability by avoiding the shortage of the reliability margin (MARGIN) compared with the conventional method using the fixed gate voltage. In addition, the embodiment shows that the lifetime of the gate driver can be extended while minimizing the influence of the drop of the pixel charge voltage and the like.

Hereinafter, embodiments of the present invention will be described in more detail.

FIG. 6 is a block diagram of a main part of a display device according to an embodiment of the present invention, FIG. 7 is a schematic view of a gate driver and a dummy gate driver, and FIG. 8 is a diagram illustrating a concept of compensation according to an embodiment of the present invention Fig.

6, the deterioration compensation circuit unit 150 has a feedback line FB connected to an output terminal of the gate driver 140. [ The deterioration compensation circuit unit 150 receives the gate signal Vgout output through the output terminal of the gate driver 140 through the feedback line FB.

The deterioration compensation circuit unit 150 detects the degree of deterioration of the thin film transistor constituting the gate driver 140 based on the feedback gate signal Vgout and outputs a compensation signal PCS for compensating the degradation degree.

The power supply unit 130 compensates for one or both of the gate high voltage VGH and the gate low voltage VGL based on the compensation signal PCS output from the deterioration compensation circuit unit 150. The power supply 130 analyzes the compensation signal PCS and varies the level of the gate high voltage VGH or the gate low voltage VGL when it is determined that compensation is required.

The deterioration compensation circuit part 150 compensates the deterioration due to the deterioration of the thin film transistor constituting the gate driving part 140 by using the gate signal outputted through the output terminal of the gate driving part 140 Vgout).

Meanwhile, the gate signal Vgout output through the output terminal of the gate driver 140 may be maintained at a stable level in order to improve the driving stability and reliability of the display device. The reason is that when the deterioration compensation circuit unit 150 receives the gate signal Vgout output through the output terminal of the gate driver 140, the voltage down of the gate signal Vgout may be induced. In this case, since the display quality of the corresponding line may be lowered due to the voltage down (level down) of the gate signal Vgout, etc., the driving stability and reliability of the display device may be degraded.

Therefore, the circuit configuration between the deterioration compensation circuit unit 150 and the gate driver 140 will be changed as follows.

As shown in FIG. 7, in the embodiment of the present invention, a dummy gate driver 140D is formed in addition to the gate driver 140A for driving the display panel 100. FIG. Accordingly, the left and right gate drivers include a gate driver 140A for driving the display panel 100 and a dummy gate driver 140D. 7 that the gate driver 140A and the dummy gate driver 140D included in the left gate driver are shown.

The gate signal Vgout output from the gate driver 140A is supplied to the subpixels formed in the display area AA of the display panel 100. [ On the other hand, the dummy gate signal DVgout output from the dummy gate driver 140D is fed back to the deterioration compensating circuit.

Although not shown in FIG. 7, when the circuit is constructed with reference to FIG. 6, the deterioration compensation circuit portion has a feedback line connected to the output terminal of the dummy gate driver 140D. The deterioration compensation circuit part is fed back via the feedback line to the dummy gate signal DVgout output through the output terminal of the dummy gate driver 140D.

According to such a configuration, the deterioration compensation circuit part can grasp the deterioration degree of the thin film transistor constituting the gate driver 140A based on the dummy gate signal DVgout outputted from the dummy gate driver 140D. The deterioration compensation circuit part particularly recognizes the degree of deterioration with respect to the pull-up and pull-down thin film transistors Tpu and Tpd which govern the Q node Q and the QB node QB of the gate driver 140A. To this end, the timing controller operates the dummy gate driver 140D under the same conditions as the gate driver 140A.

On the other hand, the switching transistors included in the sub pixels of the display panel 100 are turned on by the gate high voltage. If a problem occurs in the level of the gate high voltage due to deterioration of the gate driver 140A, the switching transistor and the like are not turned on. Therefore, in the following description, compensation of the gate high voltage will be described as an example.

As shown in FIG. 8, the power supply unit 130 outputs the gate high voltage VGH1 of the first level in normal operation. When it is determined that compensation is necessary as a result of analyzing the compensation signal PCS, the gate high voltages VGH2 to VGHm at the second to Mth levels are outputted in accordance with the deterioration degree of the thin film transistor. For example, the power supply unit 130 may increase the gate high voltage VGH in stages according to the degree of deterioration of the thin film transistor.

The power supply unit 130 may have a look-up table (LUT) composed of a compensation table according to the degree of deterioration of the thin film transistors constituting the gate driver 140. In this case, whenever the compensation signal PCS is supplied to the power supply unit 130, the compensation value corresponding to the deterioration degree is automatically output through the lookup table (LUT). As a result, the level of the gate high voltage VGH is adaptively compensated (varied) corresponding to the driving time and the environment.

Hereinafter, an example of the configuration of the circuit according to the embodiment of the present invention will be described.

FIG. 9 is a schematic circuit configuration diagram of a deterioration compensation circuit portion, and FIG. 10 is a schematic circuit configuration diagram of a power supply portion having a deterioration compensation circuit portion.

<First Circuit Configuration Example> FIG.

As shown in FIG. 9, the deterioration compensation circuit unit 150 includes a sensing circuit unit 153 and a compensation signal generation unit 155. The sensing circuit unit 153 senses the dummy gate signal through the feedback line FB.

For example, the sensing circuit unit 153 may compare the level of the sensed dummy gate signal with the internal reference voltage Vref, and output the difference signal value according to the level change of the dummy gate signal. At this time, the reference voltage Vref may be set to a voltage value corresponding to the initial gate high voltage.

The compensation signal generation unit 155 detects the degree of deterioration of the thin film transistor constituting the gate driving unit based on the difference signal value transmitted from the sensing circuit unit 153 and outputs a compensation signal PCS which can compensate the degradation degree. As described above, the compensation signal PCS may be composed of a signal to compensate for at least one of the gate high voltage or the gate low voltage.

In the first circuit construction method described above, the deterioration compensation circuit section 150 is separately constructed. Therefore, the compensation signal PCS output from the deterioration compensation circuit unit 150 is transmitted to the power supply unit, and the power supply unit compensates the gate high voltage VGH corresponding to the compensation signal PCS and outputs the compensated signal PCS.

&Lt; Second Circuit Configuration Example >

As shown in FIG. 10, the power supply unit 130 has a gate voltage generation circuit unit 135 and a deterioration compensation circuit unit 150. The deterioration compensation circuit section 150 includes a sensing circuit section 153 and a compensation signal generation section 155. The sensing circuit unit 153 senses the dummy gate signal through the feedback line FB.

For example, the sensing circuit unit 153 may compare the level of the sensed dummy gate signal with the internal reference voltage Vref, and output the difference signal value according to the level change of the dummy gate signal. At this time, the reference voltage Vref may be set to a voltage value corresponding to the initial gate high voltage.

The compensation signal generation unit 155 detects the degree of deterioration of the thin film transistor constituting the gate driving unit based on the difference signal value transmitted from the sensing circuit unit 153 and outputs a compensation signal PCS which can compensate the degradation degree.

The gate voltage generating circuit unit 135 has a voltage changing unit 135a and a voltage generating unit 135b. The voltage changing unit 135a determines whether or not the gate high voltage is changed corresponding to the compensation signal PCS output from the deterioration compensation circuit unit 150. [

The voltage changing unit 135a analyzes the compensation signal PCS and does not output or output the voltage change signal corresponding to the result of the analysis. The voltage changing unit 135a analyzes the compensation signal PCS and outputs a voltage change signal VC to change the level of the gate high voltage VGH when it is determined that compensation for the gate high voltage VGH is required.

The voltage generation section 135b generates and outputs a gate high voltage. The voltage generating unit 135b varies the level of the gate high voltage VGH when the voltage changing signal VC is transmitted from the voltage changing unit 135a. The voltage generator 135b boosts the gate high voltage VGH to a specific level in response to the voltage change signal and outputs the voltage.

The second circuit construction method described above is configured such that the deterioration compensation circuit part 150 is included in the power supply part 130. [ Accordingly, the power supply unit 130 has the feedback line FB connected to the output terminal of the gate driving unit. The power supply unit 130 compensates the gate high voltage VGH in response to the compensation signal PCS.

According to the above description, the display device according to the present invention is driven by supplying a data signal to a display panel, supplying a gate signal to the display panel, sensing a gate signal, and compensating a gate voltage based on the sensed gate signal .

Hereinafter, an example in which the display device is manufactured in a module form based on the second circuit configuration method will be described. However, the display device described below is only one example, and the configuration of the device and the electrical connection relation may be changed depending on the type of the device to be implemented.

FIG. 11 is an exemplary view of a display device module based on FIG. 10; FIG.

11, the display device is electrically connected to the display panel 100, the first circuit board (FPCB), the second circuit board (S-PCB), and the third circuit board (C-PCB) It is made in module form.

The first circuit board (FPCB) may be selected as a flexible circuit board. The first circuit board (FPCB) is electrically connected to one side of the display panel (100). The data driver 120 is mounted on the first circuit board FPCB. The first circuit board (FPCB) on which the data driver 120 is mounted may be composed of a plurality of first circuit boards (FPCB). However, the number of the first circuit board (FPCB) and the data driver 120 may vary depending on the resolution and size of the display device.

The second circuit board (S-PCB) can be selected as a printed circuit board. The second circuit board (S-PCB) is electrically connected to one side of the first circuit board (FPCB). The second circuit board (S-PCB) electrically connects the first circuit board (FPCB) and the third circuit board (C-PCB).

The third circuit board (C-PCB) can be selected as a printed circuit board. The third circuit board (C-PCB) is electrically connected to one side of the second circuit board (S-PCB). The third circuit board (C-PCB) may be electrically connected to one side of the second circuit board (S-PCB) through a cable (CAB) or the like. A power supply 130 (PMIC) is mounted on the third circuit board (C-PCB).

The (internal) power supply 130 including the deterioration compensation circuit portion has a feedback line FB connected to the output terminal (GIP dummy output) of the dummy gate driver. The feedback line FB is wired on the display panel 100, the first circuit board FPCB, the second circuit board S-PCB, the cable CAB and the third circuit board C-PCB.

The feedback line FB is connected to the left feedback line 140L_FB connected to the output terminal (GIP Dummy output) of the dummy gate driving unit located on the left side of the display panel 100 and the dummy gate driving unit positioned on the right side of the display panel 100 And a right feedback line 140R_FB connected to an output terminal (GIP dummy output). That is, the feedback line FB can transmit the dummy gate signals output from the left and right sides of the display panel 100 to the power supply unit 130 including the deterioration compensation circuit unit.

The power supply 130 including the deterioration compensation circuit part can compensate the gate high voltage VGH based on the dummy gate signal transmitted through the feedback line FB. In the above description, the gate high voltage VGH is compensated by one example. However, as described above, the power supply 130 including the deterioration compensation circuit portion can compensate for at least one of the gate high voltage and the gate low voltage.

In addition, in the above description, the power supply unit 130 including the deterioration compensation circuit unit is mounted on the third circuit board (C-PCB). However, the power supply unit 130 including the deterioration compensation circuit unit may be mounted on the first circuit board (FPCB) or the second circuit board (S-PCB).

In the above description, the degradation compensation circuit part compensates for the deterioration of the thin film transistor constituting the gate driver based on the dummy gate signal output from the dummy gate driver. However, the deterioration compensation circuit part may compensate the deterioration of the thin film transistor constituting the gate driver based on the gate signal outputted through the output terminal of the gate driver, not the dummy type.

The present invention has the effect of compensating the deterioration in proportion to the driving environment and driving time of the gate driver. Further, the present invention has the effect of extending the driving reliability and lifetime of the thin film transistor constituting the gate driver, and improving the defect caused by deterioration of the thin film transistor. Further, since the gate voltage is increased according to the degree of deterioration of the thin film transistor, the present invention is advantageous in that additional reliability can be secured by avoiding a situation where the reliability margin is insufficient as compared with the conventional method using a fixed gate voltage. In addition, the present invention has the effect of extending the lifetime of the gate driver while minimizing the influence of the drop of the pixel charge voltage and the like.

While the present invention has been described in connection with what is presently considered to be practical exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, It will be understood that the invention may be practiced. It is therefore to be understood that the embodiments described above are to be considered in all respects only as illustrative and not restrictive. In addition, the scope of the present invention is indicated by the following claims rather than the detailed description. Also, all changes or modifications derived from the meaning and scope of the claims and their equivalents should be construed as being included within the scope of the present invention.

100: display panel 110: timing controller
120: Data driver 130: Power supply
140L, 140R: gate driver 150: deterioration compensation circuit part
153: sensing circuit unit 155: compensation signal generating unit
FB: feedback line PCS: compensation signal

Claims (10)

A display panel for displaying an image;
A gate driver positioned in a non-display area of the display panel;
A power supply for supplying a gate voltage to the gate driver; And
And a deterioration compensation circuit for sensing the gate signal output from the gate driver and outputting a compensation signal for compensating the gate voltage based on the sensed gate signal. The method according to claim 1,
The degradation compensation circuit section
And outputs a compensation signal for varying the gate voltage when it is determined that the thin film transistor constituting the gate driver is deteriorated as a result of comparing the sensed gate signal and an internal reference voltage. The method according to claim 1,
The power supply unit
And a gate high voltage and a gate low voltage corresponding to the compensation signal. The method according to claim 1,
The power supply unit
Wherein the gate high voltage is increased in response to deterioration of the thin film transistor constituting the gate driver. The method according to claim 1,
The degradation compensation circuit section
A sensing circuit for comparing the sensed gate signal with an internal reference voltage,
And a compensation signal generator for sensing a degree of deterioration of the thin film transistor constituting the gate driver based on the difference signal output from the sensing circuit and transmitting a compensation signal for compensating for deterioration to the power supply unit. The method according to claim 1,
Wherein the gate driver further includes a dummy gate driver,
Wherein the deterioration compensation circuit unit senses the dummy gate signal through a feedback line connected to an output terminal of the dummy gate driver. The method according to claim 1,
The power supply unit
A deterioration compensation circuit section,
A left feedback line connected to an output terminal of the dummy gate driver positioned on the left side of the display panel,
And a right feedback line connected to an output terminal of the dummy gate driver positioned on the right side of the display panel. Supplying a data signal to a display panel;
Supplying a gate signal to the display panel; And
Sensing the gate signal, and compensating a gate voltage based on the sensed gate signal. 9. The method of claim 8,
The step of compensating for the gate voltage
And comparing the sensed gate signal with an internal reference voltage to determine a deterioration of the thin film transistor constituting the gate driver, wherein the gate voltage is varied. 10. The method of claim 9,
The step of compensating for the gate voltage
Wherein a level of one or both of a gate high voltage and a gate low voltage is varied.

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