KR20160065645A - Tray Module for X-Ray Instigation and Apparatus for Investigating Object with X-ray by Lateral Direction Emission - Google Patents
Tray Module for X-Ray Instigation and Apparatus for Investigating Object with X-ray by Lateral Direction Emission Download PDFInfo
- Publication number
- KR20160065645A KR20160065645A KR1020140169902A KR20140169902A KR20160065645A KR 20160065645 A KR20160065645 A KR 20160065645A KR 1020140169902 A KR1020140169902 A KR 1020140169902A KR 20140169902 A KR20140169902 A KR 20140169902A KR 20160065645 A KR20160065645 A KR 20160065645A
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- alignment
- inspected
- ray
- block
- inspection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/025—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material using neutrons
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S131/00—Tobacco
- Y10S131/905—Radiation source for sensing condition or characteristic
Abstract
Description
The present invention relates to an X-ray inspection tray module and an X-ray inspection apparatus capable of inspecting an oblique direction by the X-ray inspection tray module. More specifically, the present invention relates to an X-ray inspection apparatus for aligning an object to be inspected at a predetermined position, An X-ray inspection tray module, and an X-ray inspection apparatus that enables an oblique direction inspection by the X-ray inspection tray module.
X-ray inspection is applied to various industrial fields including medical field, and various types of inspection devices according to product types are known in each application field. For example, an x-ray inspection apparatus may be applied to defect inspection of a printed circuit board, defect inspection of a mobile device, defect inspection of a food container, or foreign matter detection of a food to inspect the defect of the product. Generally, in an X-ray inspection apparatus, objects to be inspected can be supplied continuously by a conveying means such as a conveyor or individually loaded on a tray. Then, an image can be obtained by irradiating the object to be inspected with the X-ray in the vertical direction with respect to the conveyor or the tray. However, depending on the structure of the object to be inspected, it may be difficult to obtain a necessary inspection image when the X-rays are vertically irradiated.
Prior art relating to x-ray inspection is Patent No. 0978054, a battery x-ray inspection device. The prior art aims to provide an X-ray inspection apparatus capable of rotating an object to be inspected, including an XYZ-axis, at various angles. For this purpose, the prior art includes a fixed table having a sliding door formed on a front surface of the case, a sensor provided on a side surface of the sliding door, a guide between the x-ray tube and the detector to be rotatable by a motor, A Y-axis moving table having a guide rotatable by a motor is disposed at an upper portion thereof, a guide is provided at an upper portion of the Y-axis moving table so as to be rotatable by a motor, An X-axis moving table for moving the X-axis moving table in the Y-axis direction, a coupling opening for moving the Y-axis horizontally along the X-axis moving table, a seating unit formed on both sides of the upper portion, Ray inspection apparatus having a table on which a tray having a plurality of trays is disposed.
Another prior art related to x-ray inspection apparatus is patent registration number 1133048 battery inspection apparatus. The prior art includes a partition wall for shielding a second stage for inspecting a battery from a first stage for loading and unloading the battery so that the x-ray is interrupted during the inspection of the battery, and an outer wall for shielding the second stage from the outside A chamber; A loading unit for transferring the battery to the first stage, an unloading unit for transferring the battery to the outside of the chamber in the first stage, and an unloading unit for transferring the battery received from the loading unit, And a transfer unit for transferring the battery to the first stage and the transfer unit for transferring the battery to the first stage and the second stage for transferring the battery to the unloading unit when the inspection of the battery is completed, A transfer path portion for forming a path for inspecting the battery between the first and second stages via the first and second stages and the battery may be set respectively, A first stage arranged in a direction from the first stage toward the second stage, And a second conveying jig.
The prior art does not disclose an x-ray inspection apparatus that allows a plurality of inspected objects to be aligned and inspected at the inspection position while being continuously transferred, and to be discharged in a series of orders. For example, products such as electronic components, printed circuit boards or batteries can be assembled in large quantities and can be continuously conveyed through conveying means such as conveyors. It is advantageous to continuously carry out the inspection of the transferring process or the predetermined process of such a product. However, in the case of the prior art, it is difficult to apply to a subject to be inspected composed of a laminated structure. And does not disclose an alignment structure for allowing a subject to be inspected to be fixed in a predetermined position in a tray. It is advantageous in the X-ray inspection apparatus that the subject to be inspected is accurately aligned at a predetermined position according to the structure of the subject to be inspected, and at the same time, the X-ray is irradiated in an arbitrary direction to obtain an inspection image in various directions. Prior art or publicly known techniques do not disclose such inspection structures.
The present invention has been made to solve the problems of the prior art and has the following purpose.
An object of the present invention is to provide an X-ray inspection tray module capable of aligning an object to be inspected at a predetermined position and acquiring a lateral image of an object to be inspected, and an X-ray inspection apparatus capable of inspecting the X-
According to a preferred embodiment of the present invention, the x-ray inspection tray module comprises: a base block; A first alignment block serving as an alignment reference in a first direction with respect to an object to be inspected; A second alignment block for aligning the subject to be inspected in a second direction; And an alignment arm for moving the object to be inspected into a first alignment block, wherein an object to be inspected is aligned at a position defined by the first alignment block and the second alignment block by operation of the alignment arm, Adjusts the predetermined position according to the size of the subject to be inspected.
According to another preferred embodiment of the present invention, the alignment arm is comprised of a rotatable linker and a push block coupled to one end of the linker to control the operation of the first alignment block and the second alignment block.
According to another preferred embodiment of the present invention, the rotation reference point is set in the alignment arm, and the push block is moved by rotating a part of the alignment arm based on the rotation reference point.
According to another preferred embodiment of the present invention, the x-ray inspection apparatus further comprises: a conveyance guide for conveying the inspection tray module loaded with the inspection target object; A tray alignment unit disposed on a side surface of the conveyance guide; And at least one x-ray tube and a detector disposed on a side surface of the conveyance guide, wherein each of the inspection tray modules includes a first alignment block and a second alignment block for aligning an object to be inspected to a predetermined position of the inspection tray And the at least one X-ray tube irradiates X-rays to the side of the object to be inspected.
According to another preferred embodiment of the present invention, the at least one X-ray tube irradiates X-rays based on different portions of the object to be inspected.
According to another preferred embodiment of the present invention, the x-ray irradiation direction of one of the at least one x-ray tube and the other x-ray tube crosses each other through the different positions of the subject to be inspected.
According to another preferred embodiment of the present invention, the object to be inspected is aligned in advance before reaching the irradiation position of the at least one X-ray tube in the transfer guide, and the transfer guide is moved in the pitch unit .
According to another preferred embodiment of the present invention, the x-ray tube is arranged to be movable independently or in at least one direction with a detector at a corresponding position.
The inspection tray module according to the present invention allows the object to be inspected to be accurately aligned at a predetermined position. Further, the inspection apparatus according to the present invention makes it possible to acquire inspection images of objects to be inspected in various directions.
Figures 1A and 1B illustrate an embodiment of the inspection tray module according to the present invention.
2 shows an embodiment of an alignment structure of an inspection tray module that can be applied to an inspection apparatus according to the present invention.
FIGS. 3A and 3B show an embodiment of an X-ray examination apparatus according to the present invention.
FIG. 4 shows an embodiment of a structure in which an object to be inspected is inspected by the X-ray inspection apparatus according to the present invention.
5A and 5B show embodiments of an X-ray tube and a detector applied to an inspection apparatus according to the present invention.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the embodiments shown in the accompanying drawings, but the present invention is not limited thereto. In the following description, components having the same reference numerals in different drawings have similar functions, so that they will not be described repeatedly unless necessary for an understanding of the invention, and the known components will be briefly described or omitted. However, It should not be understood as being excluded from the embodiment of Fig.
Figures 1A and 1B illustrate an embodiment of an
1A and 1B, an X-ray
The
The
The
The
The
When the first moving
The
The object to be inspected B can be moved in the first direction and aligned with respect to the
The
A fixing
The fixing and the alignment of the object B to be inspected can be performed by various methods, and the present invention is not limited to the embodiments shown.
The first and second alignment reference lines BX and BY of the object B to be inspected can be determined in advance as shown in the right side of FIG. When the subject B to be inspected is aligned with the
2 shows an embodiment of an alignment structure of an inspection tray module that can be applied to an inspection apparatus according to the present invention.
Referring to FIG. 2, the
When the
FIGS. 3A and 3B show an embodiment of an X-ray examination apparatus according to the present invention.
Referring to FIG. The
Referring to FIG. 3B, the object B to be inspected has a laminated structure and it is difficult to obtain an accurate internal image when X-rays are transmitted perpendicularly to the object B to be inspected from the upper side or the lower side. Therefore, the X-rays X11, X12 and X2 can be emitted to the side of the object B to be inspected and at least two X-rays X11 and X12 can be emitted to different points P11 and P12 of the object B to be inspected And can cross each other. The X-ray X2 may be irradiated in a direction perpendicular to the side by another X-ray tube as necessary. The other points P11 and P12 for irradiating the X-rays X11 and X12 in the inclined direction can be predetermined and can be the alignment reference of the object B to be inspected.
As shown in FIG. 3A, the
The object B to be inspected can be loaded on each
FIG. 4 shows an embodiment of a structure in which an object to be inspected B is inspected by an X-ray inspection apparatus according to the present invention.
Referring to FIG. 4, a conveying
The object to be inspected which has been inspected at the inspection position can be judged to be defective and the object to be inspected (B) showing whether it is normal or not can be discharged through different discharge paths. The acquiring process of the x-ray image, the display method of the normal / defective, or the discharging method of each inspected object B can be performed according to a method known in the art. And each process can be controlled by an appropriate control unit. Also, the control unit can control the transfer of the
As described above, it is advantageous that the
5A and 5B show an embodiment of an
5A, the
Referring to FIG. 5B, the
The
The inspection tray module according to the present invention allows the object to be inspected to be accurately aligned at a predetermined position. Further, the inspection apparatus according to the present invention makes it possible to acquire inspection images of objects to be inspected in various directions.
While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention . The invention is not limited by these variations and modifications, but is limited only by the claims appended hereto.
10, 10a, 10b: Inspection tray module 11: Base block
12:
14: alignment arm 20: alignment unit to be inspected
24:
32a, 32b: a detector
141: Linker 142: Push block
Claims (7)
A first alignment block 12 serving as an alignment reference in the first direction with respect to the object B to be inspected;
A second alignment block (13a, 13b) for aligning the subject (B) to be inspected in a second direction; And
And an alignment arm (14) for moving said subject (B) to said first alignment block (12)
The object to be inspected B is aligned at a position defined by the first alignment block 12 and the second alignment block 13a and 13b by the operation of the alignment arm 14, Wherein the predetermined position is adjusted according to the size of the subject (B) to be inspected.
An inspection object alignment unit 20 disposed on a side surface of the conveyance guide 24; And
And at least one X-ray tube (31a, 31b) and a detector (32a, 32b) arranged on a side surface of the conveyance guide (24)
Each of the inspection tray modules 10a and 10b includes a first alignment block 12 and a second alignment block 13a and 13b for aligning the object B to be inspected to predetermined positions of the inspection trays 10a and 10b, And the at least one X-ray tube (31a, 31b, 31c) irradiates X-rays to the side of the subject (B) to be inspected.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020140169902A KR101654818B1 (en) | 2014-12-01 | 2014-12-01 | Tray Module for X-Ray Instigation and Apparatus for Investigating Object with X-ray by Lateral Direction Emission |
PCT/KR2015/009711 WO2016088990A1 (en) | 2014-12-01 | 2015-09-16 | X-ray inspection tray module, and x-ray inspection apparatus capable of inclined direction inspection by using same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020140169902A KR101654818B1 (en) | 2014-12-01 | 2014-12-01 | Tray Module for X-Ray Instigation and Apparatus for Investigating Object with X-ray by Lateral Direction Emission |
Publications (2)
Publication Number | Publication Date |
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KR20160065645A true KR20160065645A (en) | 2016-06-09 |
KR101654818B1 KR101654818B1 (en) | 2016-09-22 |
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KR1020140169902A KR101654818B1 (en) | 2014-12-01 | 2014-12-01 | Tray Module for X-Ray Instigation and Apparatus for Investigating Object with X-ray by Lateral Direction Emission |
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WO (1) | WO2016088990A1 (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20190013014A (en) * | 2017-07-31 | 2019-02-11 | (주)자비스 | An X-ray Inspecting Apparatus Capable of Investigating a Inner Defect and a Welding Part |
KR20200068180A (en) * | 2018-12-05 | 2020-06-15 | (주)자비스 | An X-Ray Investigating Apparatus for Avoiding an Interference |
KR20210009271A (en) * | 2019-07-16 | 2021-01-26 | 주식회사 쎄크 | X-ray inspecting apparatus |
KR20220149019A (en) * | 2021-04-30 | 2022-11-08 | (주)자비스 | A System for Investigating a Total Electrode Condition of a Battery |
KR20230019670A (en) * | 2021-08-02 | 2023-02-09 | (주)자비스 | An X-ray Inspecting Apparatus Capable of Detecting Multi Directions |
Families Citing this family (2)
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KR101962712B1 (en) * | 2017-07-18 | 2019-03-27 | (주)자비스 | A Inspecting Device for a X-ray Investigating Apparatus Having a Structure of Arranging a Plural of Inspection Objects |
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20090123633A (en) * | 2008-05-28 | 2009-12-02 | 주식회사 쎄크 | X-ray inspecting apparatus for use in secondary battery |
KR20090130898A (en) * | 2008-06-17 | 2009-12-28 | 미래산업 주식회사 | Apparatus of aligning a tray and test handler using the same |
KR100973689B1 (en) * | 2010-05-26 | 2010-08-03 | (주)자비스 | X-ray ct inspection facility for chip |
KR100978054B1 (en) | 2009-11-13 | 2010-08-25 | (주)자비스 | X-ray inspection apparatus for battery |
KR20110140112A (en) * | 2010-06-24 | 2011-12-30 | 아사히 가라스 가부시키가이샤 | Device and method for defect inspection of plate transparent body |
KR101133048B1 (en) | 2011-04-08 | 2012-04-04 | 주식회사 이노메트리 | Battery inspection apparatus |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005043322A (en) * | 2003-07-25 | 2005-02-17 | Hitachi Medical Corp | Device for inspecting x-ray content |
-
2014
- 2014-12-01 KR KR1020140169902A patent/KR101654818B1/en active IP Right Grant
-
2015
- 2015-09-16 WO PCT/KR2015/009711 patent/WO2016088990A1/en active Application Filing
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20090123633A (en) * | 2008-05-28 | 2009-12-02 | 주식회사 쎄크 | X-ray inspecting apparatus for use in secondary battery |
KR20090130898A (en) * | 2008-06-17 | 2009-12-28 | 미래산업 주식회사 | Apparatus of aligning a tray and test handler using the same |
KR100978054B1 (en) | 2009-11-13 | 2010-08-25 | (주)자비스 | X-ray inspection apparatus for battery |
KR100973689B1 (en) * | 2010-05-26 | 2010-08-03 | (주)자비스 | X-ray ct inspection facility for chip |
KR20110140112A (en) * | 2010-06-24 | 2011-12-30 | 아사히 가라스 가부시키가이샤 | Device and method for defect inspection of plate transparent body |
KR101133048B1 (en) | 2011-04-08 | 2012-04-04 | 주식회사 이노메트리 | Battery inspection apparatus |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20190013014A (en) * | 2017-07-31 | 2019-02-11 | (주)자비스 | An X-ray Inspecting Apparatus Capable of Investigating a Inner Defect and a Welding Part |
KR20200068180A (en) * | 2018-12-05 | 2020-06-15 | (주)자비스 | An X-Ray Investigating Apparatus for Avoiding an Interference |
KR20210009271A (en) * | 2019-07-16 | 2021-01-26 | 주식회사 쎄크 | X-ray inspecting apparatus |
KR20220149019A (en) * | 2021-04-30 | 2022-11-08 | (주)자비스 | A System for Investigating a Total Electrode Condition of a Battery |
KR20230019670A (en) * | 2021-08-02 | 2023-02-09 | (주)자비스 | An X-ray Inspecting Apparatus Capable of Detecting Multi Directions |
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Publication number | Publication date |
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WO2016088990A1 (en) | 2016-06-09 |
KR101654818B1 (en) | 2016-09-22 |
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