KR20090054892A - Color filter defect correction device and color filter defect correction method - Google Patents

Abstract

A color filter defect correcting device and a color filter defect correcting method are provided to perform one of the irradiation of a laser beam and an ink coating in a region selected by a color filter by forming a correction process unit. A host computer(1) controls the whole operation of a color filter defect correcting device(101). A control computer(2) controls each unit mounted on the color filter defect correcting device. An image processor(3) detects the defect point of the color filter based on the photographed image of the color filter. A positioning apparatus(51) changes the position of the color filter. A Z-axis stage(4) changes the height of a correction processor(50) for an XY table(5). A laser irradiation unit(7) irradiates the laser beam to one pixel or more in the color filter through a slot of a variable slit unit(8). An ink coating unit(9) coats the ink for correcting the defect on one pixel or more. A monitor(10) displays the image of the color filter of the image processor.

Description

COLOR FILTER DEFECT CORRECTION DEVICE AND COLOR FILTER DEFECT CORRECTION METHOD}

The present invention relates to a color filter defect correction apparatus and a color filter defect correction method, and more particularly, to a color filter defect correction apparatus and a color filter defect correction method for correcting defects in a black matrix region and a coloring region of a color filter.

In the color filter which is a component of the liquid crystal display, a lattice pattern (material such as chromium, chromium oxide, resin) and colored region (hereinafter also referred to as color filter region) are formed called a black matrix. Defects in the step of forming the black matrix include black defects in which the black matrix protrudes to the color filter region (no color in this step), and white defects in which a part of the black matrix is separated. Moreover, even after coloring, there exist black defects in which the colors of each other are mixed, and white defects in which the colors are missing. Conventionally, the method of correct | amending black defects with a laser beam or filling up white defects with ink is employ | adopted while an operator looks at a camera image.

For example, Japanese Unexamined Patent Application Publication No. 9-61296 (Patent Document 1) discloses the following color filter defect correction apparatus. That is, the defective portion of the color filter is recognized by the image processing portion, the ink is applied to the recognized portion of the defective color filter by the ink coating needle of the ink coating portion, and the ink applied by the ink curing portion is cured. Remove unnecessary portions of the applied ink by irradiating the laser from the laser irradiation unit.

In addition, Japanese Patent Laid-Open No. 2005-107327 (Patent Document 2) discloses a configuration in which a plurality of defects of a color filter are temporarily removed by irradiation of laser light.

However, in Patent Literature 1 and Patent Literature 2, the same slit is used at the same size as the dust, and since the laser is irradiated to the entire dust including the defect, the removed portion other than the defect is also used. It is necessary to apply ink. For this reason, more time is required than when applying ink only by a defect.

An object of the present invention is to provide a color filter defect correction apparatus and a color filter defect correction method capable of appropriately correcting a defect of a color filter.

A color filter defect correction apparatus according to an aspect of the present invention is a color filter defect correction apparatus for correcting a defect of a color filter having a light transmission region and a light shielding region adjacent to the light transmission region, and detecting a defect of the color filter. An image processing unit that determines a region to be corrected in the color filter based on the detected defect, the positional relationship between the light transmitting region and the light shielding region, and at least one of irradiating laser light and applying ink to the determined region in the color filter; A correction processing unit that performs either correction processing is provided.

Preferably, the correction processing portion includes a slit portion for forming a slit and a laser irradiation portion for irradiating a laser light to the color filter through the slit, and the image processing portion includes the entire region of the detected defect is a light transmission region. In the case of, the position of the slit is determined so that the area of the color filter to which the laser light is irradiated contains at least a part of the detected defect and does not overlap with the light shielding area, and the laser irradiator is provided through the slit at the determined position. The laser beam is irradiated to the color filter.

Preferably, the correction processing portion includes a slit portion for forming a slit and a laser irradiation portion for irradiating a laser light to the color filter through the slit, and the image processing portion includes a detected defect over the light shielding region and the light transmitting region. In this case, the position of the slit is determined so that the area of the color filter to which the laser light is irradiated includes at least a part of the detected defect, and the area of the color filter to which the laser light is irradiated and the overlapping area of the light shielding area is minimized. The laser irradiation unit irradiates the laser light to the color filter through the slit at the determined position.

Preferably, the image processing unit further compares the size of the defect in the light blocking area among the detected defects with the size of the defect in the light transmitting area when the detected defect exists over the light shielding area and the light transmitting area. The correction processing unit includes an ink coating unit which selects ink of a color corresponding to a region having a larger defect among the light shielding region and the light transmitting region, and applies ink of the selected color to the determined region in the color filter. .

Preferably, the color filter has a first light transmission region and a second light transmission region which are disposed to face each other through the light shielding region, and the correction processing unit is disposed between the first light transmission region and the second light transmission region. A slit portion for forming a slit having a width greater than the distance of the laser beam; and a laser irradiation portion for irradiating a laser light to the color filter through the slit, wherein the image processing portion includes: The position of the slit is determined so that the area of the color filter to which the laser light is irradiated includes at least a part of the detected defect, and overlaps the light shielding area and one light transmission area, and the laser irradiation unit determines the slit at the determined position. The laser beam is irradiated to the color filter through.

Preferably, the color filter has a first light transmission region and a second light transmission region that are disposed to face each other through the light shielding region, and the correction processing unit includes a first light transmission region and a second light transmission region in the color filter. An ink coating portion for applying ink to a region having a width greater than the distance between the light transmissive regions of the image processing portion, wherein the image processing portion includes a color filter to which ink is applied when the entire area of the detected defect exists in the light shielding region. An area of the ink coating portion is positioned so as to include at least a part of the detected defect, and overlaps the light shielding region and one light transmitting region, and the ink coating portion applies ink to the color filter at the determined position.

Preferably, the correction processing portion includes a slit portion for forming a slit and a laser irradiation portion for irradiating a laser light to the color filter through the slit, and the image processing portion includes the first portion of the slit based on the detected position of the defect. If the position is determined and the entire area of the detected defect is present in the light transmission area, it is based on the overlapping area of the light filter area and the area of the color filter to which the laser light is to be irradiated through the slit at the first position. The 2nd position of a slit is determined by correcting the position of 1, and a laser irradiation part irradiates a laser beam to a color filter through the slit at a 2nd position.

Preferably, the correction processing portion includes a slit portion for forming a slit and a laser irradiation portion for irradiating a laser light to the color filter through the slit, and the image processing portion includes the first portion of the slit based on the detected position of the defect. If the position is determined and the entire area of the detected defect is present in the light shielding area, it is based on the overlapping area of the area of the color filter and the light transmitting area to which the laser light is to be irradiated through the slit at the first position. The 2nd position of a slit is determined by correcting the position of 1, and a laser irradiation part irradiates a laser beam to a color filter through the slit at a 2nd position.

The color filter defect correction method according to any aspect of the present invention is a color filter defect correction method for correcting a defect of a color filter having a light transmission region and a light shielding region adjacent to the light transmission region, the method comprising: detecting a defect of a color filter And determining a region to be corrected in the color filter based on the detected defects, the positional relationship between the light transmitting region and the light shielding region, and irradiating laser light to the determined region in the color filter and applying ink. A step of performing at least one correction process is included.

Preferably, the color filter defect correction method further includes a step of forming a slit, and in the step of determining a region to be corrected, when the entire region of the detected defect is present in the light transmission region, In the step of determining the position of the slit so that the area of the color filter to which the laser light is irradiated contains at least a part of the detected defect and does not overlap with the light shielding area, and performing the correction process, the color filter through the slit at the determined position The laser beam is irradiated to it.

Preferably, the color filter defect correction method further includes a step of forming a slit, and in the step of determining the region to be corrected, when the detected defect is present over the light shielding region and the light transmitting region. The position of the slit is determined so that the area of the color filter to which the laser light is irradiated contains at least a part of the detected defect, and the area of the color filter to which the laser light is irradiated and the overlapping area of the light shielding area are minimized and corrected. In the step of performing a process, a laser beam is irradiated to a color filter through the slit at the determined position.

Preferably, in the step of determining the region to be corrected, if the detected defect exists over the light shielding region and the light transmission region, the size and light of the defect in the light shielding region among the detected defects are also present. In the step of performing the correction process by comparing the size of the defect in the transmission region, an ink of a color corresponding to the region having the larger defect is selected from the light shielding region and the light transmission region, and selected in the determined region of the color filter. Apply colored ink.

Preferably, the color filter has a first light transmission region and a second light transmission region which are disposed to face each other through the light shielding region, and the color filter defect correction method further includes the first light transmission region and the second light transmission region. Forming a slit having a width larger than the distance between the light transmissive regions of the laser beam; and in the step of determining the region to be corrected, if the entire region of the detected defect is present in the light shielding region, In the step of determining the position of the slit so that the area of the color filter to which light is irradiated contains at least a part of the detected defect and overlaps the light shielding area and one light transmitting area, and performs a correction process, the slit at the determined position The laser beam is irradiated to the color filter through.

Preferably, the color filter has a first light transmission region and a second light transmission region which are disposed to face each other through the light shielding region, and in the step of performing the correction process, the first light transmission region and the second light In the step of applying ink to an area of a color filter having a width larger than the distance between the transmission areas and determining the area to be corrected, when the entire area of the detected defect is present in the light shielding area, the ink In the step of determining the position at which the ink is applied so that the region of the color filter to be applied contains at least a part of the detected defect and overlaps the light shielding region and one light transmitting region, and in the correcting process, the color is determined at the determined position. Apply ink to the area of the filter.

Preferably, the color filter defect correction method further includes a step of forming a slit, and the step of determining a region to be corrected comprises setting the first position of the slit on the basis of the detected position of the defect. In the case where the determining step and the entire area of the detected defect exist in the light transmission area, the step is based on the overlapping area of the light filter area and the area of the color filter to which the laser light is to be irradiated through the slit at the first position. Comprising a step of determining the second position of the slit by correcting the position of 1, and in the step of performing the correction process, the laser light is irradiated to the color filter through the slit at the second position.

Preferably, the color filter defect correction method further includes a step of forming a slit, and the step of determining a region to be corrected comprises setting the first position of the slit based on the position of the detected defect. In the case where the determining step and the entire area of the detected defect exist in the light shielding area, the step is based on the overlapping area of the color filter area and the light transmitting area to which the laser light is to be irradiated through the slit at the first position. Comprising a step of determining the second position of the slit by correcting the position of 1, and in the step of performing the correction process, the laser light is irradiated to the color filter through the slit at the second position.

According to the present invention, defect correction of a color filter can be appropriately performed.

EMBODIMENT OF THE INVENTION Hereinafter, embodiment of this invention is described using drawing. In addition, the same code | symbol is attached | subjected to the same or equivalent part in drawing, and the description is not repeated.

Configuration and default behavior

BRIEF DESCRIPTION OF THE DRAWINGS It is an external view which shows the structure of the color filter defect correction apparatus which concerns on embodiment of this invention.

Referring to Fig. 1, the color filter defect correction apparatus 101 includes a host computer 1, a control computer (control unit) 2, an image processing unit 3, a Z-axis stage 4, and XY. The table 5, the chuck stand 6, the laser irradiation part 7, the variable slit part 8, the ink application part 9, the monitor 10, and the objective lens 21 are provided. . The laser irradiation section 7, the variable slit section 8, and the ink coating section 9 constitute a correction processing section 50. The Z-axis stage 4 and the XY table 5 constitute the positioning mechanism 51. The variable slit part 8 includes the XY slit mechanism 61 and the (theta) slit mechanism 62 mentioned later.

The host computer 1 controls the color filter defect correction apparatus 101 as a whole.

The control computer 2 controls each unit mounted in the color filter defect correction apparatus 101.

The image processing unit 3 photographs the color filter with a CCD (Charge Coupled Devices) camera (not shown), and detects a defect point of the color filter based on the captured image.

The image processing unit 3 also generates a binarized defect extraction image based on the defect detection result, and based on the logical product of the binarized normal mask image and the defect extraction image. The defects in the black matrix area and the defects in the color filter area are determined.

The positioning mechanism 51 changes the position of the color filter. That is, the Z-axis stage 4 changes the height of the correction process part 50 with respect to the XY table 5. The XY table 5 changes the position of the color filter in the horizontal direction.

The chuck stand 6 is a stand on which a color filter or the like to be corrected is placed and fixed.

The laser irradiation part 7 irradiates a laser beam to one or more pixels of the color filter through the slit formed by the variable slit part 8.

Here, the control computer 2 includes a storage unit (not shown) which stores one or more irradiation ranges per laser beam. The storage unit stores, for example, the irradiation range per laser beam for each type of color filter.

Further, the control computer 2 controls the XY table 5 and the Z-axis stage 4 on the basis of the defect detection result of the image processing unit 3 to irradiate the position where the laser light is irradiated to the color filter and the ink application position. Determine at least one place each.

The variable slit unit 8 selects one irradiation range from one or more irradiation ranges stored in the storage unit on the basis of the defect detection result of the image processing unit 3, and selects the slit based on the selected laser beam irradiation range. By adjusting a shape and a magnitude | size, the irradiation range in the color filter of the laser beam from the laser irradiation part 7 is adjusted. Here, the slit size of the variable slit portion 8, that is, the irradiation range per stroke of the laser beam stored in the storage portion, can be made smaller than that of the color filter. The XY slit mechanism 61 adjusts the longitudinal and horizontal size of the slit. The slit mechanism 62 adjusts the angle of the slit.

The ink coating unit 9 applies ink for correcting defects to one or more pixels in the color filter. Here, the ink application range per one time of the ink application part 9 can be set smaller than the cleaning of a color filter.

The monitor 10 displays the image of the color filter picked up by the image processing unit 3.

2 is a diagram illustrating a configuration of an XY slit mechanism.

2, the XY slit mechanism 61 includes the X direction size adjustment motor 31 and the Y direction size adjustment motor 32. As shown in FIG.

3 is an external plan view showing the configuration of an adjustment mechanism in the X direction included in the XY slit mechanism.

Referring to FIG. 3, when the X direction-sizing motor 31 is driven to rotate the shaft 38, the opening and closing portions 33 to 34 move in the directions of the arrows, respectively, according to the rotational direction. For example, when the X-direction size adjusting motor 31 rotates in one direction, the opening and closing portions 33 to 34 are separated from each other, and when the X direction size adjusting motor 31 is rotated in the other direction, the opening and closing portions 33 to 34 are close to each other.

4 is an external plan view showing the configuration of the slit mechanism.

Referring to FIG. 4, the slit mechanism 62 includes a rotation angle adjusting motor 35, a belt 36, and a rotation table 37. The rotation angle adjustment motor 35 drives the belt 36 to rotate the turntable 37. The XY slit mechanism 61 is disposed on the turntable 37 so that the rotational center C2 of the slit mechanism 62 and the center C1 of the XY slit mechanism 61 shown in FIG. 2 coincide with each other. Are assembled.

5 is an external view showing a configuration of an ink coating unit of the color filter defect correction device according to the embodiment of the present invention.

Referring to FIG. 5, the ink application unit 9 includes an ink application positioning cylinder 11, an ink tank table 12, an ink tank 13, and an ink application needle 14. .

The ink application positioning cylinder 11 performs positioning in the vertical direction of the ink application needle 14.

The ink tank table 12 performs positioning in the circumferential direction of the ink tank 13.

The ink application needle 14 is attached to the lower end of the ink application positioning cylinder 11. During the ink application operation, the ink application positioning cylinder 11 is lowered so that the ink application needle 14 contacts the application surface, and the ink attached to the tip of the ink application needle 14 is applied to a defect point of the color filter. Is applied. After application, the ink application needle 14 is immersed in the ink tank 13 provided in the ink tank table 12 in order to adhere the ink to the tip portion of the ink application needle 14.

In addition, the ink coating part 9 is not limited to the structure containing the cylinder 11, the ink tank table 12, etc. as mentioned above, For example, it can be set as the following structures. That is, the ink coating portion includes a coating needle for attaching the correction liquid attached to the tip to the defect. Moreover, it is provided in the predetermined position out of the visual field of the observation optical system which observes a defect, and includes the application | coating palette which preserves correction liquid. In addition, the application needle is moved in the XY plane parallel to the color filter and in the Z direction perpendicular to the color filter, and either the application standby position in or near the field of view of the observation optical system and the preparation position near the application palette. An actuator for positioning the applicator in one position is included.

FIG. 6 is a diagram showing a relationship between a black matrix region, a color filter region, and a pixel in the color filter.

Referring to FIG. 6, the color filter to be corrected includes a black matrix area (light shielding area) formed in a lattice shape, and a color filter area (light transmission area) adjacent to the black matrix area and enclosed.

In addition, a color filter consists of several color filter area | regions, and each is called an element. In the defect detection processing of the image processing unit 3, the sweep is defined as follows. At the intersection of the longitudinally formed black matrix regions, there is the beginning of the restoration DS and the end of the restoration DE. In addition, the beginning DS of a picture is called the position of a color filter. The image processing unit 3 specifies the position of this color filter. In addition, in FIG. 6, the range from the start DS of a circle | round | yen surrounded by square to the edge DE of a circle | round | yen is set to one place P. In FIG. In addition, when the image is binarized by 1 pixel that is brighter than the threshold value T and dark pixels that are 0, the set of pixels having a value of 1 in the pixel P is the color filter region of the pixel P, The set of pixels of 0 (hatched portion in FIG. 6) is the black matrix area of the pixel P. FIG. Each pixel P has one color among RGB (Red, Green, Blue), and each pixel included in the color filter region of one pixel P has the same color.

[action]

Next, an operation when the image processing unit 3 in the color filter defect correction apparatus according to the embodiment of the present invention detects a defect location of the color filter will be described.

FIG. 7 is a flowchart in which the color filter defect correction apparatus according to the embodiment of the present invention determines an operation procedure when correcting one defect of a color filter.

Here, it is assumed that the color filter is placed on the chuck 6, and the position correction such as the inclination of the color filter is completed. In addition, the color filter defect correction apparatus 101 stores inspection data, that is, coordinate values of defects in the color filter, area values of the color filters, size types of the color filters (large, medium, small, etc.) and defect types. Suppose you are collecting from a host computer.

The control computer 2 controls the positioning mechanism 51 to move the color filter to a position where the correction processor 50 can correct the defect of the color filter. Further, the control computer 2 adjusts the brightness of the lighting unit (not shown) so as to detect the defect of the color filter, and switches the objective lens 21 to a predetermined magnification (S1).

The image processing unit 3 performs focus adjustment of the objective lens 21 to focus on the color filter (S2).

The image processing unit 3 photographs the color filter as the inspection target, receives the photographed input image, and detects a defect point of the color filter based on the brightness of the pixel in the input image (S3 and S4).

The image processing unit 3 calculates the center position of the defect based on the defect detection result. The control computer 2 performs the centering on the basis of the center position of the defect calculated by the image processing unit 3, that is, the positioning mechanism 51 is controlled so that the center position of the defect is located at the center of the input image. (S5).

The control computer 2 sets the number of repetitions (Try) = 1 (S6).

When the number of repetitions Try is less than or equal to the maximum number of repetitions Max (YES in S7), the image processing unit 3 switches the objective lens 21 to a high magnification in order to obtain a precise defect position (S8).

The image processing unit 3 adjusts the focus of the objective lens 21 in order to focus on the color filter (S9).

The image processing unit 3 photographs the color filter as the inspection target and accepts the photographed input image (S10).

If the number of repetitions (Try) is 1 (YES in S11), the image processing unit 3 saves the received input image as an input image before correction (S12).

When the number of repetitions (Try) is 2 or more (N0 in S11), the image processing unit 3 saves the received input image as an input image after correction (S13).

The image processing part 3 detects the defect location of a color filter based on the brightness of the pixel in the received input image (S14).

When the image processing unit 3 detects a defect in the received input image (YES in S15), the color of the ink to be applied by determining the color corresponding to the defect location is obtained, and the application position of the ink is determined. Calculate. The image processing unit 3 also calculates the irradiation position of the laser light (S16).

The control computer 2 switches the objective lens 21 to a predetermined magnification. In addition, the image processing unit 3 performs focus adjustment of the objective lens 21 in order to focus on the color filter (S17).

The correction processing unit 50 performs at least one of correction processing of irradiating laser light and applying ink to the color filter based on the correction position calculated by the image processing unit 3 (S18).

The control computer 2 adds 1 to the number of iterations Try (S19).

When the number of repetitions (Try) is less than or equal to the maximum number of repetitions (Max) (YES in S7), the image processing unit 3 performs defect detection processing again on the corrected input image (S8 to S14).

And when the image processing part 3 detects a defect in the corrected input image (YES in S15), it performs a defect correction process again (S16-S18).

On the other hand, when the defect is not detected in the corrected input image (N0 in S15), the image processing unit 3 succeeds in correcting the current defect when the number of repetitions (Try) is two or more (N0 in S21). It is judged that it has been done, for example, it returns to step S1 again and correct | amends another defect (S23).

Further, the image processing unit 3 has a defect in the color filter when no defect is detected in the corrected input image (N0 in S15), and when the number of repetitions (Try) is 1 (YES in S21). It is judged whether or not it is clear, for example, it returns to step S1 again and correct | amends another defect (S20).

Further, the control computer 2 determines that the defect cannot be corrected when the number of repetitions Try is greater than the maximum number of repetitions Max (N0 in S7). For example, the control computer 2 returns to step S1 again to determine other defects. Correction is made (S20).

Hereinafter, the operation of the color filter defect correction device according to the embodiment of the present invention will be described in detail.

[Generation of Binary Input Image]

First, the operation when the color filter defect correction device according to the embodiment of the present invention generates a binary input image will be described.

8A and 8B are diagrams showing an input image and a binarized input image.

The image processing unit 3 photographs the color filter, generates a binary input image based on the photographed input image, and separates the input image into a black matrix area BM and a color filter area CF. If the brightness of the pixel at the position (x, y) of the input image is f (x, y), the binarized input image is b (x, y), and the threshold is T, f (x, y) To b (x, y) is expressed by the following equation.

Of the plurality of pixels represented by b (x, y), the pixel with brightness 1 is the color filter area CF and the pixel with brightness 0 is the black matrix area BM.

Here, if the average value of the brightness of the black matrix area BM is IBM, and the average value of the brightness of the darkest pixel among the pixels RGB of the color filter area CF is ICF, the threshold value T is expressed by the following equation. Is displayed.

[Creation of Mask Image in Color Filter Area]

Next, the operation of generating the mask image of the color filter area on the basis of the generated binary input image by the image processing unit 3 will be described.

9A is a diagram illustrating a registered image. (b) is a figure which shows a binarized input image. (c) is a figure which shows the mask image of a color filter area | region.

The image processing unit 3 detects the position of each RGB picture on the image by pattern matching.

The image processing unit 3 photographs in advance an ideal color filter without a defect and stores it as a registered image m (x, y).

The image processing unit 3 uses the threshold value T from the registered image m (x, y) in the same manner as the binary input image b (x, y), and the color filter area is 1 (white). And a binary registration image other than 0 (black) are generated.

The image processing unit 3 registers in advance the coordinates of the search target S and the color filter area CF in the binarized registration image. More specifically, the image processing unit 3 registers the coordinates of the upper left and the vertical and horizontal sizes with respect to the search object S, and also registers the coordinates of the disadvantages with respect to the color filter area CF. have.

In addition, the image processing unit 3 obtains in advance the positional relationship between the search target S and the color filter area. When the upper left coordinate of the search target S is (xs, ys) and the coordinates of the respective disadvantages of the color filter region CF are (xi, yi), the search target S and the color filter region CF The positional relationship is (xi-xs, yi-ys).

Then, the image processing unit 3 searches a portion similar to the search object S from the binarized input image b (x, y) by pattern matching, and adjusts the upper left coordinates of the portion similar to the search object S. Obtain Further, the image processing unit 3 determines the position of the color filter area CF corresponding to the portion similar to the search object S from the positional relationship between the search object S and the color filter area CF obtained at the time of registration. Detect.

As shown by the dotted line in FIG. 9B, when a defect occurs in the color filter and a portion similar to the search target S cannot be detected, the image processing unit 3 is located near the defect. The upper left coordinate of the site similar to the search target S is estimated using the detection result.

By the above processing, the image processing unit 3 clarifies the coordinates of the disadvantages of the color filter area CP, makes the color filter area white, and makes the background part black. A mask image is created. With such a configuration, the deviation of the mask image due to positioning error or the like can be minimized as compared with the configuration in which the mask image is merely generated from the registered image.

In addition, since the brightness of each pixel of RGB is different, when searching a part similar to the search target S by the shade pattern matching, the possibility of misperception increases normally unless a registered image for reference is prepared for each color. However, in the color filter defect correction apparatus according to the embodiment of the present invention, the image processing unit 3 generates a binarized input image based on the captured input image, and based on the binarized input image, With the configuration for generating a mask image, only one type of registered image for reference may be prepared, and the configuration and processing of the color filter defect correction apparatus 101 can be simplified.

[Defect Detection]

Next, the operation when the image processing unit 3 inspects the input image and detects a defect point will be described.

10A and 10B are diagrams showing an operation when the image processing unit detects a defect in the horizontal direction of the input image.

The image processing unit 3 detects a defect point based on the brightness of the element of the color filter. More specifically, the image processing unit 3, with respect to the brightness f (x, y) of the position (x, y) in the input image, if P is a periodic interval, i.e., the interval of elements arranged at equal intervals. The comparison test is carried out as follows.

As described above, the image processing unit 3 compares the brightness f (x, y) with the brightness f (x-P, y) before one cycle and the brightness f (x + P, y) after one cycle.

Where sp (x, y) is the result of comparing f (x, y) and f (xP, y), and s + p (x, y) is f (x, y) and f (x + P, y). ) Shows a comparison result.

The image processing unit 3 compares sH (x, y) with the slice level Td when the signs of s-p (x, y) and s + p (x, y) coincide. In addition, the image processing unit 3, at the position (xP, y) or the position (x + P, y) when the signs of sp (x, y) and s + p (x, y) do not match. The position (x, y) is excluded from the inspection object because the pixel is likely to be defective and the inspection reliability is low. Such a structure can prevent the error of defect detection by the noise of an input image.

And if sH (x, y) is Td or more, the image processing part 3 judges that the pixel in position (x, y) is a defect, and stores the result in dH (x, y). In dH (x, y), a pixel of value 1 indicates a defect and a pixel of value 0 is normal.

In the color filter defect correction apparatus according to the embodiment of the present invention, the image processing unit 3 includes the brightness f (x, y), the brightness f (xP, y) before one cycle, and the brightness f (1) after one cycle. Although it is called the structure which compares x + P and y), it is not limited to this. The image processing unit 3 compares, for example, the brightness f (x, y) with the brightness f (x-2 × P, y) before two cycles and the brightness f (x + 3 × P, y) after three cycles. For example, the configuration may be such that the brightness of the pixel at the position (x, y) is compared with the brightness of the pixel belonging to a different location than the pixel to which the pixel at the position (x, y) belongs.

In addition, it is also possible to make the structure which compares the brightness of the pixel of position (x, y) and the brightness of pixels other than the pixel of position (x, y), ie, compares the brightness of the pixels which belong to the same place. However, in the configuration in which the brightness of the pixel at the position (x, y) is compared with the brightness of the pixel belonging to a different location than the pixel to which the pixel at the position (x, y) belongs, the pixel to be compared with the pixel of the defect detection target is Since the possibility of normality is high, the defect of a pixel can be detected more correctly, and it can be said that it is a preferable structure.

11A and 11B are diagrams showing an operation when the image processing unit detects a defect in the vertical direction of the input image.

The image processing unit 3 compares the brightness f (x, y) of the position (x, y) in the input image as follows when the interval of the elements arranged at regular intervals, that is, at equal intervals, is as follows. Is done.

As described above, the image processing unit 3 compares the brightness f (x, y) with the brightness f (x-P, y) before one cycle and the brightness f (x + P, y) after one cycle.

Where sp (x, y) is the result of comparing f (x, y) and f (xP, y), and s + p (x, y) is f (x, y) and f (x + P, y). ) Shows a comparison result.

The image processing unit 3 compares sV (x, y) with the slice level Td when the signs of s-p (x, y) and s + p (x, y) coincide.

And if sV (x, y) is Td or more, the image processing part 3 judges the pixel in position (x, y) as a defect, and stores the result in dV (x, y). In dV (x, y), a pixel of value 1 indicates a defect and a pixel of value 0 is normal.

Next, an operation when the image processing unit detects defects in both the horizontal direction and the vertical direction of the input image will be described.

The image processing unit 3 utilizes the result of comparing the brightness f (x, y) in the horizontal and vertical directions with the brightness f (xP, y) before one cycle and the brightness f (x + P, y) after one cycle. Defect detection is performed as follows.

If sH (x, y) or sV (x, y) is Td or more, the image processing unit 3 judges the pixel at position (x, y) as a defect and stores the result in dHV (x, y). do. In dHV (x, y), a pixel of value 1 indicates a defect and a pixel of value 0 is normal.

As a use example of each of the defect detection methods described above, when a plurality of elements are arranged in the horizontal direction in the input image and only one time is arranged in the vertical direction, a method of detecting defects in the horizontal direction of the input image is provided. Adopt. In addition, when a plurality of elements are arranged in the vertical direction in the input image and only one time is arranged in the horizontal direction, a method of detecting defects in the vertical direction of the input image is adopted. In the case where two or more elements are arranged in the vertical direction and the horizontal direction, respectively, in the input image, a method of detecting defects in both the horizontal direction and the vertical direction of the input image is adopted. These three defect detection methods are selected according to the magnification of the objective lens 21 used for defect detection inspection, and the size of sweep.

Next, an operation when the image processing unit 3 determines the slice level Td of black defects will be described.

12 (a) and 12 (b) are diagrams showing the relationship of the slice level (Td) 7 of the black matrix area, the RGB pixels, and the black defects.

The brightness of the black matrix area is set to IBM, and the brightness of each RGB pixel is set to IR, IG, and IB. Based on IBM, each contrast value of IR, IG, and IB is represented by the following equation.

The image processing unit 3 selects a value smaller than min (CR, CG, CB) as the slice level Td because the black matrix area is the darkest.

Here, in the color filter, the brightness of the color filter area is not equal in adjacent places. In general, CCD (Charge Coupled Device) cameras have the highest sensitivity to the green wavelength. For this reason, green recall appears the brightest in the input image, followed by red, blue.

In the method of performing defect detection in the horizontal direction, the vertical direction, and the horizontal direction and the vertical direction of the above-mentioned input image, respectively, since the brightness of the color filter area | region of the adjacent pixel is compared, it is to compare different brightness. However, since the color filter defect correction apparatus according to the embodiment of the present invention has a configuration in which the slice level Td is smaller than min (CR, CG, CB), even when comparing different brightnesses, Detection can be performed correctly.

In addition, when the field of view is wide, i.e., when the image capturing area 3 has a large one shot area, the configuration may be used to compare the brightness of the color filter areas in three different colors corresponding to the same color.

Next, an operation when the image processing unit 3 determines the slice level Td of white defects will be described.

13A and 13B are diagrams showing the relationship between the black matrix area, each RGB pixel, and the slice level Td of the white defect.

The brightness of the white defect part is set to IWH, and the brightness of each pixel of RGB is set to IR, IG, and IB. Based on IWH, the contrast values of IR, IG, and IB are expressed by the following equations.

The image processing unit 3 selects as the slice level Td a value smaller than min (CR, CG, CB) because the white defect is brightest.

FIG. 14A is a diagram showing an input image of a color filter in which a defect exists. FIG. 14B is a diagram showing a black defect extracted image generated by the image processing unit.

Referring to Fig. 14A, black defects and white defects are mixed in the color filter. The image processing unit 3 detects black defects using the slice level Td of black defects, and generates a binarized black defect extracted image as shown in Fig. 14B.

FIG. 15A is a diagram showing an input image of a color filter in which a defect exists. FIG. 15B is a diagram showing a white defect extracted image generated by the image processing unit.

Referring to Fig. 15A, black defects and white defects are mixed in the color filter. The image processing unit 3 detects white defects using the slice level Td of the white defects, and generates a binarized white defect extracted image as shown in Fig. 15B.

As described above, in the color filter defect correction apparatus according to the embodiment of the present invention, even when black defects and white defects are mixed in the color filter, black defects and white defects can be distinguished and detected.

By the way, there exist two types of white defects: the white defect in a black matrix area | region, and the white defect in a color filter area | region. For example, the whiteness in the black matrix area is corrected by filling the missing portions by applying ink, but the application range of the ink cannot be adjusted to the width of the black matrix area. This is because the size of the ink coating needle cannot be changed to match the size of the white defect. In addition, although it is possible to make the structure which the color filter defect correction apparatus 101 has several needles which have a different diameter, it cannot cover all white defects.

For this reason, when ink is applied when correcting the white defect in the black matrix area, it will come out. In other words, when ink is applied to the black matrix area, the ink is protruded to the color filter area, and the portion of the ink protruding becomes black defect of the color filter area. Then, it is necessary to detect black defects in the color filter area, to irradiate laser light to remove black defects, and to apply ink to a portion where the black defects are removed.

After correcting the white defects in the color filter area after correcting the white defects in the color filter area, the ink bulging into the color filter area as described above, that is, the black defects are removed, and the ink is reapplied to the portion where the black defects are removed. Needs to be applied, and the defect correction time increases. Therefore, as the correction order, the order of correcting white defects in the black matrix area and then correcting the white defects in the color filter area is preferable.

In addition, ink may bleed into the black matrix area when correcting white defects in the color filter area. However, ink that bleeds into the black matrix area does not block light that must pass through the color filter. Does not.

Then, the image processing unit 3 determines the white defect in the black matrix area and the white defect in the color filter area, corrects the white defect in the black matrix area, and then corrects the white defect in the color filter area.

16 is a diagram illustrating an operation of the image processing unit generating a white defect extracted image in the color filter area. 17 is a diagram illustrating an operation of the image processing unit generating a white defect extracted image in the black matrix area.

The mask image of the color filter region is a binarized image in which the color filter region is 1 and the portion other than the color filter region including the black matrix region is zero. The white defect extracted image is a binarized image in which a defective portion is 1 and a portion other than the defective portion is zero. Therefore, the image processing unit 3 generates the white defect extracted image in the color filter region by calculating the logical product of the mask image of the color filter region and the white defect extracted image. Further, the image processing unit 3 generates a white defect extracted image in the black matrix region by calculating a logical product of the image obtained by inverting the logic level of the mask image of the color filter region and the white defect extracted image. do.

[Centering]

Next, the operation when the control computer 2 performs the centering in the color filter defect correction apparatus according to the embodiment of the present invention will be described.

18 is a diagram illustrating an operation of the image processing unit generating a defect mask image.

Referring to FIG. 18, the image processing unit 3 generates a black defect extracted image and a white defect extracted image as described above, and generates a defect mask image by calculating a logical sum of both.

And the image processing part 3 calculates the center position of the part whose value is 1 (the part without hatching in FIG. 18) in a defect mask image.

That is, in the defect mask image, if the total number of pixels having a value of 1 is N and the coordinates of the pixel i having a value of 1 are (xi, yi), the center coordinates (XG) of the defective portion are determined. , YG) is calculated based on the following equation.

Then, the control computer 2 controls the positioning mechanism 51 so that the center coordinates XG and YG of the defective portion coincide with the center of the screen based on the calculation result of the image processing unit 3.

[Color judgment]

Next, an operation when the color filter defect correction apparatus according to the embodiment of the present invention performs color determination of the pixel containing the defect will be described.

19 is a diagram illustrating an example of a defect extraction image.

Since the position of the color filter region in each pixel is made clear from the mask image of the generated color filter region, the image processing unit 3 compares the position of the color filter region of each pixel with the defect extraction image, The recall PERR containing (ERR) is specified. More specifically, the image processing unit 3 obtains the vertex coordinates of the rectangle R that circumscribes the defect as position information of the defect, and is referred to as a recall (hereinafter referred to as a defect recall) including the rectangle R. FIG. ).

Next, the image processing unit 3 compares the color information registered in advance with the color information of the defect recovery PERR, and specifies the color of the defect recovery.

More specifically, the color representative value of each RGB picture is registered in advance in the image processing unit 3. If the color representative values of RGB are HR, HG and HB, HR, HG and HB are expressed by the following equation.

In formula (D1), Hm (x, y) represents a color value and is obtained by a conversion formula described later from the RGB values in the registered image m (x, y). In addition, (x1, y1) is the upper left coordinate of the measurement area, and (x2, y2) represents the lower right coordinate of the measurement area. In other words, HR, HG and HB are color average values in the measurement area.

20 is a diagram showing color histograms of RGB pixels.

Referring to FIG. 20, since the color values of each RGB element are actually distributed around HR, HG and HB, respectively, the image processing unit 3 displays the color representative values of each RGB element (HR ± rR), ( HG ± rG) and (HB ± rB). rR, rG, rB is 3xσ, for example, when σ is the standard deviation of each distribution centering on HR, HG, and HB.

21 is a diagram illustrating an operation of the image processing unit generating a color information calculation mask image.

Referring to FIG. 21, the image processing unit 3 generates a color information calculation mask image by calculating an exclusive logical sum of the defect extraction image and the color filter area mask image.

The image processing unit 3 calculates a color value only for pixels having a value 1 (the part without hatching in Fig. 21) in the color information calculation mask image. The image processing unit 3 is excluded from the calculation target because the color value of the defective portion having the same value 0 as that of the black matrix area is not obvious.

Since the position of each color filter region is made clear from the mask image of the generated color filter region, the image processing unit 3 accumulates the color values of the pixel whose value of the color information calculation mask is 1 in each color filter region. (Iii), the average value of the color values is obtained for each color filter area. Then, the image processing unit 3 compares the obtained average value with the color representative values of the RGB pixels, and determines the color corresponding to the color representative value closest to the obtained average value as the color of the color filter region.

Here, when all the color information calculation masks in a color filter are zero, it becomes color indefiniteness. In this case, as described later, the color of the color filter area is specified based on color registration information registered in advance.

Next, a method of calculating the color value from the RGB value in the registered image m (x, y) will be described.

In an image taken with a color CCD camera, the three primary colors of the color are displayed using three values of RGB. The sensory quantities such as hue and sharpness are difficult to understand by the RGB values, A close color system has been devised. One of the color systems is the HSV color system. Here, H represents hue, S represents saturation, and V represents lightness. The HSV colorimetric system can be easily calculated from RGB values and is used in the field of computer image processing.

If the minimum value is fmin and the maximum value is fmax among the RGB values, the brightness V is expressed as V = fmax.

In addition, the hue H and the saturation S are calculated as follows.

[Reliability of Color Judgment]

Next, the calculation method and the usage method of the reliability of color determination in the color filter defect correction apparatus which concerns on embodiment of this invention are demonstrated.

22A and 22B are diagrams showing aspects of color determination performed when the reliability of color determination in the drawing is low in the color filter defect correcting apparatus according to the embodiment of the present invention.

In each color filter area, if the total number of pixels on the picked-up image corresponding to the color filter area for performing color determination is N, and the number of pixels on the picked-up image corresponding to the value 1 of the color information mask used for color determination is Nm, , The reliability R for the color judgment of the circuit is expressed as R = Nm / N.

The image processing unit 3 trusts the color judgment result by comparing the average value of the color values in the color filter area and the color representative value with respect to the recovery of the reliability R having a predetermined value or more. On the other hand, the image processing unit 3 contrasts the color ordering information registered in advance for the recall below the predetermined value, and corrects the color determination result when there is a contradiction in the color ordering information. .

Here, the color ordering information is a logical product. For example, when the horizontal direction of the input image of the color filter is an arrangement of RGB, the order of (RGB) is stored. Color order information is input to the recipe set to the color filter defect correction apparatus 101, for example. In addition, a recipe is stored in the memory | storage part in the control computer 2, for example.

First, as shown in Fig. 22A, the case where the RGB elements are arranged in a stripe pattern in the order of (RGB) in the horizontal direction of the input image will be described. The image processing unit 3 scans the sweep from the upper left to the lower right of the input image, and when the sweep having a low reliability R (D1 in FIG. 22A) appears, the ash having a low reliability R The color of the next pixel after the cattle immediately before the cattle (D2 in Fig. 22A) is retrieved from the color sequence information. Then, when the color retrieved from the color sequence information and the color of the above-described element (D3 in FIG. 22A) of the low-referential association are the same, the color retrieved from the color sequence information has the reliability R. Decide on a low recall color. In addition, when the color of the recall above the low reliability R is negative, the search is performed from the color and the color ordering information of the recall below the low reliability R (D4 in FIG. 22A). Contrast one color. When the color of the recall below the recall with low reliability R is negative, the color of the recall immediately before the next recall (D5 in FIG. 22A) of the recall with low reliability R is color-ordered. Retrieved from the information and following the recall (D6 in FIG. 22 (a)) above the recall (D5 in FIG. 22A) or the recall with low reliability R The color searched from the color of the information below (the D7 of FIG. 22 (a)) and the color order information is performed.

Next, as shown in Fig. 22B, the case where the RGB elements are arranged in a stripe pattern in the order of (RGB) in the longitudinal direction of the input image will be described. The image processing unit 3 scans the sweep from the upper left of the input image to the lower right, and when the recall with low reliability R (D1 in FIG. 22B) appears, the reliability with low reliability R appears. The color of the next picture after the picture just before the cow (D2 in Fig. 22B) is retrieved from the color sequence information. And when the color searched from the color ordering information and the color of the left search (D3 of FIG. 22 (b)) of the left of the low low recall are the same, the color searched from the color ordering information has the reliability R Decide on a low recall color. In addition, when the color of the left side of the recall with low reliability R is negative, the color and color sequence information of the upper recall (D4 in FIG. 22B) of the low reliability R are retrieved. Contrast the colors. In the case where the color of the upper picture of the low reliability R is negative, the color of the color immediately before the next picture (D5 in FIG. 22 (b)) of the low low reliability R is color coded. Searched for from the next (after D6 in FIG. 22 (b)) or the next after the low reliability (R). The color searched from the color of the upper chamber of the chamber (D7 in FIG. 22B) and the color sequence information is compared.

Next, an operation when the color filter defect correction device according to the embodiment of the present invention determines the laser irradiation area and the ink application area in the color filter will be described. The laser irradiation area and the ink coating area may be determined by the control computer 2 instead of the image processing unit 3.

In the following description, for example, the shape of the slit SL is rectangular and the shape of the ink applied by the color filter is assumed to be a circle. For example, the width of the black matrix area | region BM is W, the diameter of the ink application source IA is D, and the color filter area | region in the paper horizontal direction of the figure shown below. When the width of CF is set to C and the width of the slit SL is set to S, it is assumed that C≥S> W and C≥D> W.

In addition, regarding the diameter of the ink application source IA, when ink is apply | coated to a board | substrate normally, the ink adhering to the board | substrate surface spreads circularly. Then, the diameter of the circle is measured, and the measured diameter is used as the diameter D of the ink application source IA and used in the color filter defect correction apparatus 101. In addition, ink application | coating and the measurement of the diameter of the ink application source IA are repeated, and the average value of the diameter measured in multiple times is used for the color filter defect correction apparatus 101 as the diameter D of the ink application source IA. In some cases.

The control computer 2 controls the laser irradiation unit 7, the ink application unit 9, and the positioning mechanism 51 based on the calculation results of the laser irradiation area and the ink application area by the image processing unit 3, A laser beam is irradiated to the defect location of a color filter, and ink is apply | coated further.

The control computer 2 moves the slit SL formed by the variable slit part 8 to an initial position. More specifically, the image processing unit 3 determines the initial position of the slit SL based on the position of the detected defect ERR. For example, the image processing unit 3 determines the initial position of the slit SL so that the center of the rectangle R circumscribed to the defect ERR and the center of the slit SL coincide with each other. And the control computer 2 moves the slit SL to an initial position by controlling the positioning mechanism 51. FIG.

Next, the image processing unit 3 includes the area of the color filter (temporary laser irradiation area), the black matrix area BM and the color filter area CF to which the laser light is irradiated through the slit SL at the initial position. The final position of the slit SL, that is, the position of the slit SL at the time of actually irradiating the laser light is determined by correcting the initial position of the slit SL based on the overlap region of.

And the laser irradiation part 7 irradiates a laser beam to a color filter through the slit SL in a final position.

FIG. 23A is a diagram illustrating an example of the initial position of the slit, the color filter region, the black matrix region, and the defect position. (B) is sectional drawing which shows the XXIIIB-XXIIIB cross section in FIG.23 (a). FIG. 24A is a diagram showing an example of the final position of the slit, the color filter region, the black matrix region and the defect position. (B) is sectional drawing which shows the XXIVB-XXIVB cross section in FIG.24 (a).

The image processing unit 3 has the entire area of the defect ERR present in the color filter area CF, such as the case where the detected defect ERR exists in the color filter area CF near the black matrix area BM. In this case, the area of the color filter irradiated with laser light through the slit SL (hereinafter also referred to as laser irradiation area RA) includes at least a part of the defect ERR, and also the black matrix area BM. ), The final position of the slit SL is determined by correcting the initial position of the slit SL so as not to overlap.

Referring to FIG. 23, when the image bordering area of the laser irradiation area RA overlaps the black matrix area BM, the image processing unit 3 uses the black matrix from the image border of the laser irradiation area RA. The distance L to the boundary between the area BM and the color filter area CF is obtained.

Referring to FIG. 24, the control computer 2 moves the center of the slit SL to the lower edge side by the distance L by controlling the positioning mechanism 51. Thereby, the laser irradiation area RA and the black matrix area BM can be prevented from overlapping.

FIG. 25A is a diagram illustrating an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. FIG. 25B is a cross-sectional view illustrating a XXVB-XXVB cross section in FIG. 25A. FIG. 26A is a diagram illustrating an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. (B) is sectional drawing which shows the XXVIB-XXVIB cross section in FIG.26 (a).

Referring to FIG. 25, in the case where the left border side of the laser irradiation area RA overlaps with the black matrix area BM, the image processing unit 3 uses the black matrix from the left edge of the laser irradiation area RA. The distance L to the boundary between the area BM and the color filter area CF is obtained.

Referring to FIG. 26, the control computer 2 moves the center of the slit SL to the right edge side by the distance L by controlling the positioning mechanism 51. Thereby, the laser irradiation area RA and the black matrix area BM can be prevented from overlapping.

FIG. 27A is a diagram illustrating an example of the initial position of the slit, the color filter region, the black matrix region, and the defect position. (B) is sectional drawing which shows the XX'B-XX'B cross section in (a) of FIG. FIG. 28A is a diagram showing an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. (B) is sectional drawing which shows the XX'B-XX'B cross section in FIG.

Referring to FIG. 27, in the case where the area on the edge of the laser irradiation area RA and the black matrix area BM overlap, the image processing unit 3 is arranged from the black matrix from the border of the laser irradiation area RA. The distance L to the boundary between the area BM and the color filter area CF is obtained.

Referring to FIG. 28, the control computer 2 moves the center of the slit SL to the upper edge side by the distance L by controlling the positioning mechanism 51. Thereby, the laser irradiation area RA and the black matrix area BM can be prevented from overlapping.

FIG. 29A is a diagram illustrating an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. (B) is sectional drawing which shows the XX'B-XX'B cross section in FIG. FIG. 30A is a diagram illustrating an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. (B) is sectional drawing which shows the XXXB-XXXB cross section in FIG.

Referring to FIGS. 29A and 29B, when the area on the rim side of the laser irradiation area RA and the black matrix area BM overlap with each other, the image processing unit 3 includes the laser irradiation area ( The distance L from the border of the RA) to the boundary between the black matrix area BM and the color filter area CF is obtained.

Referring to FIGS. 30A and 30B, the control computer 2 moves the center of the slit SL to the left edge side by the distance L by controlling the positioning mechanism 51. Thereby, the laser irradiation area RA and the black matrix area BM can be prevented from overlapping.

FIG. 31A is a diagram illustrating an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. FIG. 31B is a cross-sectional view showing a XXXIB-XXXIB cross section in FIG. 31A. (C) of FIG. 31 is sectional drawing which shows the XXXIC-XXXIC cross section in FIG. FIG. 32A is a diagram illustrating an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. FIG. 32B is a cross-sectional view showing a XXXIIB-XXXIIB cross section in FIG. 32A. FIG. 32C is a cross-sectional view illustrating a XXXIIC-XXXIIC cross section in FIG. 32A.

Referring to (a) to (c) of FIG. 31, the image processing unit 3 is a case where the black border region BM and the region on the upper border side and the left border side of the laser irradiation area RA overlap. The distance L1 from the top border of the laser irradiation area RA to the boundary between the black matrix area BM and the color filter area CF, and the black matrix area BM from the left edge of the laser irradiation area RA. ) And the distance L2 to the boundary of the color filter area CF.

Referring to FIGS. 32A to 32C, the control computer 2 moves the center of the slit SL to the lower edge side by a distance L1 by controlling the positioning mechanism 51. In addition, the center of the slit SL is moved to the right edge side by the distance L2. As a result, the final position of the slit SL and the black matrix area BM can be prevented from overlapping.

FIG. 33A is a diagram illustrating an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. FIG. 33B is a cross-sectional view showing a XXXIIIB-XXXIIIB cross section in FIG. 33A. FIG. 33C is a cross-sectional view illustrating a XXXIIIC-XXXIIIC cross section in FIG. 33A. 34A is a diagram illustrating an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. FIG. 34B is a cross-sectional view illustrating a XXXIVB-XXXIVB cross section in FIG. 34A. FIG. 34C is a cross-sectional view illustrating a XXXIVC-XXXIVC cross section in FIG. 34A.

Referring to FIGS. 33A to 33C, the image processing unit 3 includes a case where the black border region BM and the region on the lower border side and the border of the laser irradiation region RA overlap. The distance L1 from the edge of the laser irradiation area RA to the boundary of the black matrix area BM and the color filter area CF, and the black matrix area BM from the rim of the laser irradiation area RA. ) And the distance L2 to the boundary of the color filter area CF.

Referring to FIGS. 34A to 34C, the control computer 2 moves the center of the slit SL to the upper edge side by a distance L1 by controlling the positioning mechanism 51. In addition, the center of the slit SL is moved to the left edge side by the distance L2. As a result, the final position of the slit SL and the black matrix area BM can be prevented from overlapping.

FIG. 35A shows an example of the initial position of the slit, the color filter region, the black matrix region, and the defect position. FIG. 35B is a cross-sectional view showing a XXXVB-XXXVB cross section in FIG. 35A. FIG. 35C is a cross-sectional view showing a XXXVC-XXXVC cross section in FIG. 35A. 36A is a diagram showing an example of the final position of the slit, the color filter area, the black matrix area, and the defect location. FIG. 36B is a cross-sectional view illustrating a XXXVIB-XXXVIB cross section in FIG. 36A. FIG. 36C is a cross-sectional view illustrating a XXXVIC-XXXVIC cross section in FIG. 36A.

Referring to FIGS. 35A to 35C, when the image processing unit 3 overlaps the area on the upper border side and the area around the rim border of the laser irradiation area RA, the black matrix area BM overlaps. The distance L1 from the edge of the laser irradiation area RA to the boundary between the black matrix area BM and the color filter area CF, and the black matrix area BM from the rim of the laser irradiation area RA are shown in FIG. ) And the distance L2 to the boundary of the color filter area CF.

Referring to FIGS. 36A to 36C, the control computer 2 moves the center of the slit SL to the lower edge side by the distance L1 by controlling the positioning mechanism 51. In addition, the center of the slit SL is moved to the left edge side by the distance L2. As a result, the final position of the slit SL and the black matrix area BM can be prevented from overlapping.

FIG. 37A is a diagram illustrating an example of the initial position of the slit, the color filter region, the black matrix region, and the defect position. FIG. 37B is a cross-sectional view showing a cross-sectional view of XXX 'B-XXX' B in FIG. FIG. 37C is a cross-sectional view showing a cross-sectional view of XXXC-XXXXXXC in FIG. FIG. 38A is a diagram illustrating an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. FIG. 38 (b) is a cross-sectional view showing a XXX_B XXX_B cross section in FIG. 38 (a). FIG. 38C is a cross-sectional view showing a cross-sectional view of XXXXC-XXXXC in FIG. 38A.

Referring to FIGS. 37A to 37C, when the image processing unit 3 overlaps the lower border side region and the left border side region of the laser irradiation region RA with the black matrix region BM. The distance L1 from the lower edge of the laser irradiation area RA to the boundary between the black matrix area BM and the color filter area CF, and the black matrix area BM from the left edge of the laser irradiation area RA. ) And the distance L2 to the boundary of the color filter area CF.

Referring to FIGS. 38A to 38C, the control computer 2 moves the center of the slit SL to the upper edge side by a distance L1 by controlling the positioning mechanism 51. In addition, the center of the slit SL is moved to the right edge side by the distance L2. As a result, the final position of the slit SL and the black matrix area BM can be prevented from overlapping.

FIG. 39A is a diagram illustrating an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. FIG. 39B is a cross-sectional view showing a cross-sectional view of XXX 'B-XXX' B in FIG. 39 (a). 40A is a diagram illustrating an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. (B) is sectional drawing which shows XLB-XLB cross section in FIG. 40 (a).

When the detected defect ERR exists over the black matrix area BM and the color filter area CF, the image processing unit 3 includes the laser irradiation area RA at least a part of the defect ERR. Further, the final position of the slit SL is determined by correcting the initial position of the slit SL such that the overlap region of the laser irradiation region RA and the black matrix region BM is minimized.

Referring to FIGS. 39A and 39B, the image processing unit 3 vertices A through D of the rectangle R circumscribed to the defect ERR by the above-described defect detection process. Find the coordinates of. The image processing unit 3 determines the final position of the slit SL by correcting the initial position of the slit SL based on the overlap region of the rectangle R and the black matrix area BM.

That is, in the image processing unit 3, the defect ERR exists over the black matrix area BM and the color filter area CF, and the upper part of the defect ERR exists in the black matrix area BM. The distance L from the upper edge of the laser irradiation area RA to the rectangle R is obtained.

Referring to FIGS. 40A and 40B, the control computer 2 moves the center of the slit SL to the lower edge side by the distance L by controlling the positioning mechanism 51. Thereby, the overlapping area of the laser irradiation area RA and the black matrix area BM can be minimized.

FIG. 41A is a diagram showing an example of the initial position of the slit, the color filter region, the black matrix region, and the defect position. (B) is sectional drawing which shows the XLIB-XLIB cross section in FIG. 41 (a). FIG. 42A is a diagram illustrating an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. FIG. 42B is a cross-sectional view illustrating a cross section of XLIIB-XLIIB in FIG. 42A.

Referring to FIGS. 41A and 41B, in the image processing unit 3, the defect ERR is present over the black matrix area BM and the color filter area CF, and the defect ERR is not displayed. When the left part exists in the black matrix area BM, the distance L from the left edge of the laser irradiation area RA to the rectangle R is obtained.

Referring to FIGS. 42A and 42B, the control computer 2 moves the center of the slit SL to the rim side by the distance L by controlling the positioning mechanism 51. Thereby, the overlapping area of the laser irradiation area RA and the black matrix area BM can be minimized.

FIG. 43A is a diagram showing an example of the initial position of the slit, the color filter region, the black matrix region, and the defect position. (B) is sectional drawing which shows the xLIIIB-XLIIIB cross section in (a) of FIG. FIG. 44A shows an example of the final position of the slit, the color filter region, the black matrix region and the defect position. FIG. 44B is a cross-sectional view showing a XLIV-XLIVB cross section in FIG. 44A.

Referring to FIGS. 43A and 43B, in the image processing unit 3, the defect ERR is present over the black matrix area BM and the color filter area CF, and the defect ERR is not displayed. When the lower part exists in the black matrix area | region BM, the distance L from the edge of the laser irradiation area | region RA to the rectangle R is calculated | required.

Referring to FIGS. 44A and 44B, the control computer 2 moves the center of the slit SL to the upper edge side by the distance L by controlling the positioning mechanism 51. Thereby, the overlapping area of the laser irradiation area RA and the black matrix area BM can be minimized.

45A is a diagram illustrating an example of the initial position of the slit, the color filter region, the black matrix region, and the defect position. FIG. 45B is a cross-sectional view illustrating a cross section of XLVB-XLVB in FIG. 45A. 46A is a diagram showing an example of the final position of the slit, the color filter area, the black matrix area, and the defect location. FIG. 46B is a cross-sectional view showing a cross section of XLVIB-XLVIB in FIG. 46A.

Referring to FIGS. 45A and 45B, in the image processing unit 3, the defect ERR is present over the black matrix area BM and the color filter area CF, and the defect ERR is not displayed. When the right part exists in the black matrix area | region BM, the distance L from the edge of the laser irradiation area RA to the rectangle R is calculated | required.

Referring to FIGS. 46A and 46B, the control computer 2 moves the center of the slit SL to the left edge side by the distance L by controlling the positioning mechanism 51. Thereby, the overlapping area of the laser irradiation area RA and the black matrix area BM can be minimized.

FIG. 47A shows an example of the initial position of the slit, the color filter region, the black matrix region, and the defect position. FIG. 47B is a cross-sectional view illustrating a cross-sectional view of XL_B-XL_B in FIG. 47A. FIG. 47C is a cross-sectional view showing a cross-sectional view of XLC-XL_C in FIG. 47A. FIG. 48A is a diagram illustrating an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. (B) is sectional drawing which shows the xL_B-xL_B cross section in FIG. 48 (a). FIG. 48C is a cross-sectional view showing a cross-section of XLC-XL_C in FIG. 48A.

Referring to FIGS. 47A to 47C, in the image processing unit 3, the defect ERR is present over the black matrix area BM and the color filter area CF, and the defect ERR is not displayed. When the upper part and the left part exist in the black matrix area BM, the distance L1 from the top edge of the laser irradiation area RA to the rectangle R and the left edge of the laser irradiation area RA from the left border Find the distance L2 to R).

Referring to FIGS. 48A to 48C, the control computer 2 moves the center of the slit SL to the lower edge side by a distance L1 by controlling the positioning mechanism 51. In addition, the center of the slit SL is moved to the right edge side by the distance L2. Thereby, the overlapping area of the laser irradiation area RA and the black matrix area BM can be minimized.

FIG. 49A is a diagram illustrating an example of the initial position of the slit, the color filter region, the black matrix region, and the defect position. (B) is sectional drawing which shows the xL1XB-XL_B cross section in FIG. 49 (a). FIG. 49C is a cross-sectional view showing a cross-sectional view of XLC-XL_C in FIG. 49A. 50A is a diagram illustrating an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. (B) is sectional drawing which shows the LB-LB cross section in (a) of FIG. (C) is sectional drawing which shows the LC-LC cross section in (a) of FIG.

Referring to FIGS. 49A to 49C, in the image processing unit 3, the defect ERR is present over the black matrix area BM and the color filter area CF, and the defect ERR is also present. In the case where the lower part and the lower part of the are present in the black matrix area BM, the distance L1 from the edge of the laser irradiation area RA to the rectangle R and the rectangle from the rim of the laser irradiation area RA are rectangular. The distance L2 to (R) is obtained.

Referring to FIGS. 50A to 50C, the control computer 2 moves the center of the slit SL to the upper edge side by a distance L1 by controlling the positioning mechanism 51. In addition, the center of the slit SL is moved to the left edge side by the distance L2. Thereby, the overlapping area of the laser irradiation area RA and the black matrix area BM can be minimized.

FIG. 51A shows an example of the initial position of the slit, the color filter region, the black matrix region, and the defect position. FIG. 51B is a cross-sectional view illustrating the LIB-LIB cross section in FIG. 51A. FIG. 51C is a cross-sectional view illustrating a LIC-LIC cross section in FIG. 51A. FIG. 52A is a diagram showing an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. (B) is sectional drawing which shows the LIIB-LIIB cross section in (a) of FIG. (C) of FIG. 52 is sectional drawing which shows LIIC-LIIC cross section in FIG.

Referring to FIGS. 51A to 51C, in the image processing unit 3, the defect ERR is present over the black matrix area BM and the color filter area CF, and the defect ERR is not displayed. When the upper part and the right part are present in the black matrix area BM, the distance L1 from the top border of the laser irradiation area RA to the rectangle R, and the rectangle (from the rim of the laser irradiation area RA), Find the distance L2 to R).

Referring to FIGS. 52A to 52C, the control computer 2 moves the center of the slit SL to the lower edge side by the distance L1 by controlling the positioning mechanism 51. In addition, the center of the slit SL is moved to the left edge side by the distance L2. Thereby, the overlapping area of the laser irradiation area RA and the black matrix area BM can be minimized.

FIG. 53A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. FIG. 53B is a cross-sectional view showing a LIIIB-LIIIB cross section in FIG. 53A. FIG. 53C is a cross-sectional view illustrating a LIIIC-LIIIC cross section in FIG. 53A. FIG. 54A is a diagram showing an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. FIG. 54B is a cross-sectional view illustrating a LIVB-LIVB cross section in FIG. 54A. FIG. 54C is a cross-sectional view illustrating a LIVC-LIVC cross section in FIG. 54A.

Referring to FIGS. 53A to 53C, in the image processing unit 3, the defect ERR is present over the black matrix area BM and the color filter area CF, and the defect ERR is not displayed. When the lower part and the left part exist in the black matrix area BM, the distance L1 from the lower edge of the laser irradiation area RA to the rectangle R, and the rectangle (from the left edge of the laser irradiation area RA) Find the distance L2 to R).

Referring to FIGS. 54A to 54C, the control computer 2 moves the center of the slit SL to the upper edge side by the distance L1 by controlling the positioning mechanism 51. In addition, the center of the slit SL is moved to the right edge side by the distance L2. Thereby, the overlapping area of the laser irradiation area RA and the black matrix area BM can be minimized.

Fig. 55 is a diagram showing a state in which defects exist over the black matrix area and the color filter area.

The image processing unit 3, when the detected defect ERR exists across the black matrix area BM and the color filter area CF, that is, the detected defect ERR is present in the black matrix area BM and the color filter. When present in both of the areas CF, the size of the defective area in the black matrix area BM and the size of the defective area in the color filter area CF are compared.

Then, the ink coating unit 9, based on the comparison result of the image processing unit 3, the ink of the color corresponding to the region where the defect region is larger among the black matrix region BM and the color filter region CF. Then, the ink of the selected color is applied to the area of the color filter irradiated with the laser light.

Specifically, the area of the defect area in the black matrix area BM, that is, the portion to be colored in the same color as the black matrix area BM, should be colored in the same color as the pixel in the SA, color filter area CF. Let the area of a part be SB. The ink coating unit 9 selects ink of the same color as the black matrix area BM when SA> SB, and selects ink of the same color as the pixel when SA≤SB.

Here, in the above method, a portion to which ink of a color different from that of the ink to be originally applied is applied is formed. However, when the area of the portion satisfies the product standard, the above method can be employed. By such a method, the correction operation can be completed in a short time as compared with the case where defect correction is performed by using both the ink of the color corresponding to the black matrix area BM and the ink of the color corresponding to the color filter area CF. Can be.

Referring to FIG. 55, the area AR1 of the defect ERR in the black matrix area BM is smaller than the area AR2 of the defect ERR in the color filter area CF. In this case, the ink applying unit 9 selects ink of any one of RGB colors corresponding to the color filter area CF based on the comparison result of the image processing unit 3.

Fig. 56 is a diagram showing a state in which defects exist over the black matrix area and the color filter area.

Referring to FIG. 56, the area AR1 of the defect ERR in the black matrix area BM is larger than the area AR2 of the defect ERR in the color filter area CF. In this case, the ink applying unit 9 selects ink of a color corresponding to the black matrix area BM based on the comparison result of the image processing unit 3.

In addition, when the entire area of the defect ERR exists in the color filter area CF, the ink applying unit 9 selects ink of a color corresponding to the color filter area CF, and the laser light is irradiated. Ink of the selected color is applied to the area of the color filter. In addition, when the entire area of the defect ERR exists in the black matrix area BM, the ink coating unit 9 selects ink of a color corresponding to the black matrix area BM, and the laser light is irradiated. Ink of the selected color is applied to the area of the color filter.

57A to 57C are diagrams showing the slit position SL when the entire region of the defect exists in the black matrix region. Here, it will be described that the paper transverse direction in Fig. 57 is the x-axis direction, and the paper longitudinal direction is the y-axis direction.

Referring to Fig. 57A, the entire area of the detected defect ERR is present in all of the width direction of the black matrix area BM and part of the extending direction.

The control computer 2 moves the slit SL formed by the variable slit part 8 to an initial position. More specifically, the control computer 2 controls the positioning mechanism 51 to control the center of the defect ERR of the color filter, that is, the center line ML and the slit SL of the black matrix area BM. The slit SL is moved to coincide with the center.

Referring to FIG. 57B, next, the image processing unit 3 includes a black matrix area BM and one color filter in which the laser irradiation area RA includes at least a part of the defect ERR. The final position of the slit SL is determined by correcting the initial position of the slit SL so as to overlap the region CF.

More specifically, the image processing unit 3 shifts the initial position of the slit SL in the width direction of the black matrix region BM by (SW) / 2 from the center line ML of the black matrix region BM. The position is determined as the final position of the slit SL in the width direction of the black matrix area BM.

Referring to FIG. 57C, the image processing unit 3 then shifts the slit SL in the extending direction of the black matrix region BM. For example, in the case where the slit SL is shifted from the upper portion of the sheet to the lower portion of the sheet in FIG. 57C, the image processing unit 3 is arranged such that the upper edge of the slit SL coincides with the upper edge of the defect ERR. First, the initial position of the slit SL in the extending direction of the area | region which irradiates a laser beam, ie, the black matrix area | region BM, is determined. The y-coordinate of the center of the slit SL at this time is set to pB.

In addition, the image processing unit 3 includes the slit SL in the extending direction of the area irradiated with laser light, that is, the black matrix area BM, so that the lower side of the slit SL and the lower side of the defect ERR coincide. Determine the final position of). The y-coordinate of the center of the slit SL at this time is set to pT.

If the maximum shift amount of the slit SL is P and the total number of cuts by laser irradiation is n, the y coordinate of the center of the slit SL and the shift amount p of the slit SL are as follows. Is displayed.

58A to 58E show when the color filter defect correction apparatus according to the embodiment of the present invention corrects a defect when all regions of the defect exist in the black matrix region extending in the paper longitudinal direction. It is a figure which shows the operation | movement of. 59A to 59E show the color filter defect correcting apparatus according to the embodiment of the present invention, in the case where the entire region of the defect exists in the black matrix region extending in the paper transverse direction. It is a figure which shows the operation | movement at the time of correction.

First, the control computer 2 moves the ink application source IA to the initial position. More specifically, the image processing unit 3 controls the positioning mechanism 51 when the entire area of the detected defect ERR exists in the black matrix area BM, whereby the defect of the color filter ( The ink coating portion 9 is moved so that the center of the ERR, that is, the center line ML of the black matrix region BM and the ink application source IA coincide.

Referring to Figs. 58A and 59A, next, in the image processing unit 3, the ink application source IA includes at least a part of the defect ERR, and the black matrix area ( The final position of the ink application source IA is determined by correcting the zero application position of the ink application source IA so as to overlap the BM and one color filter area CF.

More specifically, the image processing unit 3 shifts the ink application source IA in the width direction of the black matrix region BM by (DW) / 2 from the center line ML of the black matrix region BM. Is determined as the final position of the ink application source IA in the width direction of the black matrix region BM. In addition, the image processing part 3 is a center coordinate of the ink application source IA in the extending direction of the black matrix area | region BM, for example, of the slit SL in the extending direction of the black matrix area | region BM. Set to the same position as the center coordinate.

Referring to Figs. 58 (b) and 59 (b), the control computer 2 is based on the laser irradiation section 7 and the cut position determined by the image processing section 3, that is, the final position of the slit SL. By controlling the positioning mechanism 51, a laser beam is irradiated to the defect location of a color filter.

Referring to FIGS. 58 (c) and 59 (c), the control computer 2 is based on the ink application area determined by the image processing unit 3, that is, the final position of the ink application source IA. By controlling (9) and the positioning mechanism 51, ink of the same color as the black matrix area BM is applied to the defect location of the color filter. At this time, ink of the same color as the black matrix area BM is projected to the color filter area CF2, but not to the color filter area CF1.

Referring to FIGS. 58D and 59D, the image processing unit 3 determines the slit position SL for cutting the ink protruding from the color filter area CF2. In this case, the image processing section 3 has the cut position in the same manner as in the case shown in Figs. 23 to 38 described above, for example, when the entire area of the defect ERR exists in the color filter area CF. That is, the final position of the slit position SL is determined.

And the control computer 2 controls the laser irradiation part 7 and the positioning mechanism 51 based on the cut position determined by the image processing part 3, ie, the final position of the slit SL, and a laser to a color filter. Irradiate light.

Referring to FIGS. 58E and 59E, the image processing unit 3 sets, for example, the center of the ink application source IA to the same position as the center of the slit SL.

And the control computer 2 controls the ink application part 9 and the positioning mechanism 51 based on the ink application area | region determined by the image processing part 3, ie, the final position of the ink application source IA, Ink of the same color as the color filter region CF2 is applied to the irradiation region of the laser light shown in FIGS. 58D and 59D.

As described above, in the color filter defect correction apparatus according to the embodiment of the present invention, in the case where the entire region of the defect exists in the black matrix region, two color filter regions disposed to face each other through the black matrix region BM. The defect of the color filter is corrected so that ink does not bleed out of both CFs. That is, when the ink of the same color as the black matrix area BM is applied, the ink application area is determined so that the ink bulges out on only one color filter area CF.

Here, when the ink coating part 9 includes the ink coating needle 14 which can obtain the diameter D of the ink application source IA smaller than the width W of the black matrix area | region BM, it is set as the structure which the ink coating part 9 contains. When the entire area of the defect exists in the black matrix area BM, ink of the same color as the black matrix area BM can be prevented from protruding into the color filter area CF. However, it is difficult to manufacture such a small ink coating needle, and manufacturing cost becomes high.

However, in the color filter defect correction apparatus according to the embodiment of the present invention, even when the ink coating needle 14 having a large diameter is used, ink is prevented from escaping to both of the two color filter regions CF. Thus, the correction work after ink application can be completed in a short time. In addition, it is possible to minimize the normal area in the color filter area CF, which is simultaneously removed when irradiating the laser light to the portion where the ink of the same color as the black matrix area BM is projected.

By the way, in the structure of patent document 1 and patent document 2, it relates to the correction | amendment of the defect of a color filter, and the area larger than a defect may be cut with a laser, and in this case, compared with the operation content of this invention, There is a problem that requires time.

In addition to the calculation method of the slit position performed by the color filter defect correction apparatus according to the embodiment of the present invention, a method of matching the size of the slit SL to the size of the defect is also considered. However, the size of the slit SL needs to be determined in consideration of the spread of the applied ink. That is, when the size of the slit SL, i.e., the cut size, is reduced, the amount of ink protruding from the color filter to the normal region increases. Then, since the film thickness of the area | region where ink bulged out becomes large beyond a permissible value, a defect may be newly created. For this reason, when the size of a defect is smaller than an ink application area | region, it is difficult to change the size of the slit SL small according to the size of a defect.

In addition, in order to prevent the non-applied portion from occurring in the region of the color filter irradiated with the laser light, and to suppress the outflow of the ink to the normal region, the ink application source IA is the slit SL. In some cases, the size of the slit SL is set to be inscribed to the edge of the edge. Therefore, when the size of the defect ERR is smaller than the ink application source IA, it is difficult to change the size of the slit SL in accordance with the size of the defect ERR.

However, in the color filter defect correction apparatus according to the embodiment of the present invention, the image processing unit 3 detects a defect of the color filter, detects the detected defect, the color filter region CF, and the black matrix region BM. Based on the positional relationship of, the area to be corrected in the color filter is determined. In this way, the structure for calculating the corrected color filter area appropriately according to the position where the defect is generated makes it unnecessary to correct the normal area of the color filter without changing the size of the slit SL according to the size of the defect. The processing can be minimized. Therefore, in the color filter defect correction apparatus which concerns on embodiment of this invention, defect correction of a color filter can be performed suitably.

The present invention is not limited to the above description, and the present invention can be variously modified, modified and combined within the scope of the appended claims as required by those skilled in the art.

BRIEF DESCRIPTION OF THE DRAWINGS The external view which shows the structure of the color filter defect correction apparatus which concerns on embodiment of this invention.

2 is a diagram illustrating a configuration of an XY slit mechanism.

3 is an external plan view showing a configuration of an adjustment mechanism in the X direction included in the XY slit mechanism.

4 is an external plan view showing the configuration of the slit mechanism;

Fig. 5 is an external view showing the configuration of an ink coating unit of the color filter defect correction device according to the embodiment of the present invention.

Fig. 6 is a diagram showing a relationship between a black matrix area, a color filter area, and a pixel in the color filter.

Fig. 7 is a flowchart in which the color filter defect correction device according to the embodiment of the present invention determines an operation sequence when correcting one defect of a color filter.

8A and 8B are diagrams showing an input image and a binarized input image.

Fig. 9A is a diagram showing a registered image. Fig. 9B is a diagram showing a binarized input image. Fig. 9C is a diagram showing a mask image of the color filter area.

10A and 10B show an operation when the image processing unit detects a defect in the horizontal direction of the input image.

11A and 11B show an operation when the image processing unit detects defects in the vertical direction of the input image.

12A and 12B are diagrams showing the relationship between the black matrix area, each RGB pixel, and the slice level Td of black defects.

13A and 13B are diagrams showing the relationship between the black matrix area, each RGB pixel, and the slice level Td of the white defect.

Fig. 14A is a diagram showing an input image of a color filter in which a defect exists. Fig. 14B is a diagram showing a black defect extracted image generated by the image processing unit.

Fig. 15A is a diagram showing an input image of a color filter in which a defect exists. Fig. 15B is a diagram showing a white defect extracted image generated by the image processing unit.

16 is a diagram showing an operation of an image processing unit generating a white defect extracted image in a color filter area;

FIG. 17 is a diagram showing an operation of an image processing unit generating a white defect extracted image in a black matrix area; FIG.

18 is a diagram illustrating an operation of an image processing unit generating a defect mask image.

19 is a diagram illustrating an example of a defect extraction image.

Fig. 20 is a diagram showing the color histogram of each RGB RGB.

21 is a diagram illustrating an operation of an image processing unit generating color information calculation mask images;

22A and 22B are diagrams showing aspects of color determination performed when the reliability of color determination in the resolution is low in the color filter defect correction apparatus according to the embodiment of the present invention.

Fig. 23A is a diagram showing an example of the initial position of the slit, the color filter region, the black matrix region and the defect position. (B) is sectional drawing which shows XXIIIB-XXIIIB cross section in FIG.23 (a).

Fig. 24A is a diagram showing an example of the final position of the slit, the color filter area, the black matrix area and the defect location. (B) is sectional drawing which shows XXIVB-XXIVB cross section in FIG.24 (a).

25A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. FIG. 25B is a cross-sectional view illustrating a XXVB-XXVB cross section in FIG. 25A.

Fig. 26A is a diagram showing an example of the final position of the slit, the color filter area, the black matrix area and the defect location. (B) is sectional drawing which shows XXVIB-XXVIB cross section in FIG.26 (a).

27A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. (B) is sectional drawing which shows the XX'B-XX'B cross section in FIG.

FIG. 28A shows an example of a final position of a slit, a color filter area, a black matrix area, and a defect location; (B) is sectional drawing which shows the XX'B-XX'B cross section in (a) of FIG.

29A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. (B) is sectional drawing which shows the XX'B-XX'B cross section in (a) of FIG.

30A is a diagram showing an example of a final position of a slit, a color filter area, a black matrix area, and a defect location. (B) is sectional drawing which shows the XXXB-XXXB cross section in (a) of FIG.

31A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. (B) is sectional drawing which shows the XXXIB-XXXIB cross section in FIG. (C) is sectional drawing which shows the XXXIC-XXXIC cross section in FIG.

FIG. 32A is a diagram showing an example of a final position of a slit, a color filter region, a black matrix region, and a defect position; FIG. FIG. 32B is a cross-sectional view showing a XXXIIB-XXXIIB cross section in FIG. 32A. FIG. 32C is a cross-sectional view showing a XXXIIC-XXXIIC cross section in FIG. 32A.

33A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. FIG. 33B is a cross-sectional view showing a XXXIIIB-XXXIIIB cross section in FIG. 33A. FIG. 33C is a sectional view showing a XXXIIIC-XXXIIIC cross section in FIG. 33A;

34A is a diagram showing an example of a final position of a slit, a color filter region, a black matrix region, and a defect position. FIG. 34B is a sectional view of the XXXIVB-XXXIVB cross section in FIG. 34A; FIG. 34C is a cross-sectional view illustrating a XXXIVC-XXXIVC cross section in FIG. 34A.

35A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. (B) is sectional drawing which shows the XXXVB-XXXVB cross section in (a) of FIG. (C) is sectional drawing which shows the XXXVC-XXXVC cross section in FIG.

36A is a diagram showing an example of a final position of a slit, a color filter region, a black matrix region, and a defect position. FIG. 36B is a cross-sectional view showing a XXXVIB-XXXVIB cross section in FIG. 36A. FIG. 36C is a cross-sectional view showing a XXXVIC-XXXVIC cross section in FIG. 36A.

37A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. FIG. 37B is a cross-sectional view showing a XXXB-XXXXXXB cross section in FIG. 37A. FIG. FIG. 37C is a cross-sectional view showing a cross-sectional view of XXXC-XXXXXXC in FIG. 37A. FIG.

38A is a diagram showing an example of a final position of a slit, a color filter area, a black matrix area, and a defect location. FIG. 38 (b) is a cross-sectional view showing a XXX ′ B-XXX ′ B cross section in FIG. 38 (a). FIG. FIG. 38 (c) is a cross-sectional view showing a cross-sectional view of XXXC-XXXXXXC in FIG. 38A. FIG.

FIG. 39A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position; FIG. FIG. 39B is a cross-sectional view showing a XXXB-XXXXXXB cross section in FIG. 39A. FIG.

40A is a diagram showing an example of a final position of a slit, a color filter area, a black matrix area, and a defect location. (B) is sectional drawing which shows XLB-XLB cross section in FIG. 40 (a).

41A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. (B) is sectional drawing which shows the XLIB-XLIB cross section in FIG. 41 (a).

FIG. 42A is a diagram showing an example of a final position of a slit, a color filter region, a black matrix region, and a defect position; FIG. (B) is sectional drawing which shows XLIIB-XLIIB cross section in FIG. 42 (a).

FIG. 43A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position; (B) is sectional drawing which shows XLIIIB-XLIIIB cross section in FIG. 43 (a).

FIG. 44A shows an example of the final position of the slit, the color filter region, the black matrix region, and the defect position. FIG. 44B is a cross-sectional view showing a XLIV-xLIVB cross section in FIG. 44A.

45A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. FIG. 45B is a cross-sectional view showing a cross section of XLVB-XLVB in FIG. 45A. FIG.

FIG. 46A is a diagram showing an example of a final position of a slit, a color filter region, a black matrix region, and a defect position; (B) is sectional drawing which shows XLVIB-XLVIB cross section in FIG. 46 (a).

FIG. 47A shows an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position; FIG. 47B is a cross-sectional view showing a XL_B-xL_B cross section in FIG. 47A. FIG. FIG. 47C is a cross-sectional view illustrating a cross-sectional view of XLC-XL_C in FIG. 47A. FIG.

FIG. 48A is a diagram showing an example of a final position of a slit, a color filter area, a black matrix area, and a defect location; FIG. 48B is a cross-sectional view illustrating a cross-sectional view of XL_B-XL_B in FIG. 48A. FIG. FIG. 48C is a cross-sectional view showing a cross-section of XLC-XL_C in FIG. 48A. FIG.

FIG. 49A shows an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position; FIG. 49B is a cross-sectional view illustrating a cross-sectional view of XL_B-XL_B in FIG. 49A. FIG. FIG. 49C is a cross-sectional view illustrating a cross-sectional view of XLC-XL_C in FIG. 49A. FIG.

50A is a diagram showing an example of a final position of a slit, a color filter region, a black matrix region, and a defect position. (B) is sectional drawing which shows the LB-LB cross section in (a) of FIG. (C) is sectional drawing which shows the LC-LC cross section in (a) of FIG.

51A is a diagram showing an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position. (B) is sectional drawing which shows the LIB-LIB cross section in FIG. 51 (a). (C) is sectional drawing which shows the LIC-L1C cross section in (a) of FIG.

FIG. 52A is a diagram showing an example of a final position of a slit, a color filter region, a black matrix region, and a defect position; (B) is sectional drawing which shows LIIB-LIIB cross section in (a) of FIG. FIG. 52C is a cross-sectional view illustrating a LIIC-LIIC cross section in FIG. 52A.

FIG. 53A shows an example of an initial position of a slit, a color filter region, a black matrix region, and a defect position; (B) is sectional drawing which shows LIIIB-LIIIB cross section in FIG. 53 (a). (C) is sectional drawing which shows LIIIC-LIIIC cross section in (a) of FIG.

FIG. 54A is a diagram showing an example of a final position of a slit, a color filter area, a black matrix area, and a defect location; FIG. FIG. 54B is a sectional view of the LIVB-LIVB cross section in FIG. 54A. FIG. FIG. 54C is a sectional view of the LIVC-LIVC cross section in FIG. 54A. FIG.

Fig. 55 is a diagram showing a state in which defects exist over the black matrix area and the color filter area.

Fig. 56 is a diagram showing a state where a defect exists over a black matrix area and a color filter area.

57A to 57C show slit positions SL when all regions of defects exist in the black matrix region.

58A to 58E show the case where the color filter defect correction apparatus according to the embodiment of the present invention corrects a defect in the case where the entire region of the defect exists in the black matrix region extending in the paper longitudinal direction. A diagram showing the operation of the.

59A to 59E show a case in which the color filter defect correction apparatus according to the embodiment of the present invention corrects a defect in the case where the entire region of the defect exists in the black matrix region extending in the paper transverse direction; A diagram showing the operation of the.

Claims (16)

A color filter defect correction apparatus for correcting a defect of a color filter having a light transmitting area and a light shielding area adjacent to the light transmitting area, An image processing unit which detects a defect of the color filter and determines an area to be corrected in the color filter based on the detected defect, the positional relationship between the light transmission area and the light shielding area; And a correction processing unit that performs at least one correction processing of irradiating laser light and applying ink to the determined area of the color filter. The method of claim 1, The correction processing unit, A slit portion forming a slit, It includes a laser irradiation unit for irradiating a laser light to the color filter through the slit, When the entire area of the detected defect exists in the light transmission area, the image processing unit includes an area of the color filter to which the laser light is irradiated includes at least a part of the detected defect, and further includes the light shielding area. Determine the position of the slit so that it does not overlap with, And the laser irradiator irradiates a laser beam to the color filter through the slit at the determined position. The method of claim 1, The correction processing unit, A slit portion forming a slit, It includes a laser irradiation unit for irradiating a laser light to the color filter through the slit, The image processing unit, when the detected defect exists over the light shielding area and the light transmission area, the area of the color filter to which the laser light is irradiated includes at least a part of the detected defect, The position of the slit is determined such that an area of the color filter to which laser light is irradiated overlaps with the area of the light shielding area to be minimum, And the laser irradiator irradiates a laser beam to the color filter through the slit at the determined position. The method of claim 1, The image processing unit is further configured to determine the size of a defect in the light shielding region and the defect in the light transmission region among the detected defects when the detected defect exists over the light shielding region and the light transmission region. By comparing the size, The correction processing unit, An ink coating unit for selecting ink of a color corresponding to the area of the larger defect among the light blocking area and the light transmitting area, and applying the ink of the selected color to the determined area of the color filter; Color filter defect correction device, characterized in that. The method of claim 1, The color filter has a first light transmission region and a second light transmission region disposed to face each other through the light blocking region, The correction processing unit, A slit portion for forming a slit having a width greater than a distance between the first light transmitting region and the second light transmitting region; It includes a laser irradiation unit for irradiating a laser light to the color filter through the slit, When the entire area of the detected defect exists in the light shielding area, the image processing unit includes an area of the color filter to which the laser light is irradiated, includes at least a part of the detected defect, and further includes the light shielding area and Determine the position of the slit to overlap one of the light transmission areas, And the laser irradiator irradiates a laser beam to the color filter through the slit at the determined position. The method of claim 1, The color filter has a first light transmission region and a second light transmission region disposed to face each other through the light blocking region, The correction processing unit, The color filter comprising an ink coating portion for applying ink to a region having a width greater than a distance between the first light transmitting region and the second light transmitting region, The image processing unit includes, when the entire area of the detected defect exists in the light shielding area, an area of the color filter to which the ink is applied includes at least a part of the detected defect, and the light shielding area and one Determine the position of the ink coating portion so as to overlap the light transmitting region of And the ink applying unit applies ink to the color filter at the determined position. The method of claim 1, The correction processing unit, A slit portion forming a slit, It includes a laser irradiation unit for irradiating a laser light to the color filter through the slit, The image processing unit determines the first position of the slit based on the position of the detected defect, and when the entire area of the detected defect exists in the light transmission area, Determining a second position of the slit by correcting the first position based on an overlapping area of the light shielding region with the region of the color filter to which the laser light is to be irradiated through the slit, And the laser irradiator irradiates the color filter with a laser beam through the slit at the second position. The method of claim 1, The correction processing unit, A slit portion forming a slit, It includes a laser irradiation unit for irradiating a laser light to the color filter through the slit, The image processing unit determines the first position of the slit based on the position of the detected defect, and when the entire area of the detected defect exists in the light shielding region, the image at the first position Determine a second position of the slit by correcting the first position based on an overlapping region of the color filter region and the light transmission region to which the laser light is to be irradiated through a slit, And the laser irradiator irradiates the color filter with a laser beam through the slit at the second position. A color filter defect correction method for correcting a defect of a color filter having a light transmitting area and a light shielding area adjacent to the light transmitting area, Detecting a defect of the color filter; Determining an area to be corrected in the color filter based on the detected defects and the positional relationship between the light transmitting area and the light blocking area; And correcting at least one of irradiating laser light and applying ink to the determined area of the color filter. The method of claim 9, The color filter defect correction method, Including a step of forming a slit, In the step of determining an area to be subjected to the correction process, when the entire area of the detected defect exists in the light transmission area, the area of the color filter to which the laser light is irradiated is at least the detected defect. Determine the location of the slit, including a portion and not overlapping with the light shielding area, And in the step of performing the correction processing, laser light is irradiated to the color filter through the slit at the determined position. The method of claim 9, The color filter defect correction method, Including a step of forming a slit, In the step of determining an area to be subjected to the correction process, when the detected defect exists over the light shielding area and the light transmission area, the area of the color filter to which the laser light is irradiated is detected. And determine the position of the slit so that the region of the color filter to which the laser light is irradiated and the overlapping region of the light shielding region are minimized, And in the step of performing the correction processing, laser light is irradiated to the color filter through the slit at the determined position. The method of claim 9, In the step of determining the area to be subjected to the correction process, further, when the detected defect exists over the light shielding area and the light transmission area, the size of the defect in the light shielding area among the detected defects And the size of the defect in the light transmission region, In the step of performing the correction process, an ink of a color corresponding to a region having the larger defect is selected from the light shielding region and the light transmission region, and the ink of the selected color is selected in the determined region of the color filter. Color filter defect correction method characterized in that the coating. The method of claim 9, The color filter has a first light transmission region and a second light transmission region disposed to face each other through the light blocking region, The color filter defect correction method, Forming a slit having a width greater than a distance between the first light transmissive region and the second light transmissive region, In the step of determining an area to be subjected to the correction process, when the entire area of the detected defect exists in the light shielding area, the area of the color filter to which the laser light is irradiated is at least part of the detected defect. And determining a position of the slit so as to overlap the light blocking area and the one light transmitting area, And in the step of performing the correction processing, laser light is irradiated to the color filter through the slit at the determined position. The method of claim 9, The color filter has a first light transmission region and a second light transmission region disposed to face each other through the light blocking region, In the step of performing the correction process, ink is applied to an area of the color filter having a width larger than the distance between the first light transmission area and the second light transmission area, In the step of determining an area to be subjected to the correction process, when the entire area of the detected defect is present in the light shielding area, the area of the color filter to which the ink is applied is at least a part of the detected defect. And determine a position at which ink is applied so as to overlap the light blocking region and one light transmitting region, And in the step of performing the correction process, ink is applied to an area of the color filter at the determined position. The method of claim 9, The color filter defect correction method, Including a step of forming a slit, The step of determining the area to be subjected to the correction process, Determining a first position of the slit based on the detected position of the defect; In the case where the entire area of the detected defect exists in the light transmission area, the area of the color filter to which the laser light is to be irradiated through the slit at the first position is based on the overlapping area of the light shielding area. Determining the second position of the slit by correcting the first position, And in the step of performing the correction process, laser light is irradiated to the color filter through the slit at the second position. The method of claim 9, The color filter defect correction method, Including a step of forming a slit, The step of determining the area to be subjected to the correction process, Determining a first position of the slit based on the detected position of the defect; When the entire area of the detected defect exists in the light shielding area, the area of the color filter to which the laser light is to be irradiated through the slit at the first position is based on an overlapping area of the light transmitting area. Determining the second position of the slit by correcting the first position, And in the step of performing the correction process, laser light is irradiated to the color filter through the slit at the second position.

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