KR20090008957A - 반도체 저압화학기상증착 설비의 플랜지 - Google Patents
반도체 저압화학기상증착 설비의 플랜지 Download PDFInfo
- Publication number
- KR20090008957A KR20090008957A KR1020070072338A KR20070072338A KR20090008957A KR 20090008957 A KR20090008957 A KR 20090008957A KR 1020070072338 A KR1020070072338 A KR 1020070072338A KR 20070072338 A KR20070072338 A KR 20070072338A KR 20090008957 A KR20090008957 A KR 20090008957A
- Authority
- KR
- South Korea
- Prior art keywords
- flange
- tube
- gas
- vapor deposition
- chemical vapor
- Prior art date
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4409—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber characterised by sealing means
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4407—Cleaning of reactor or reactor parts by using wet or mechanical methods
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
- H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
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- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
Abstract
Description
Claims (1)
- 석영 재질로 이루어지면서 상부는 밀폐됨과동시에 하부는 개구되고 하부 일측에는 가스배출구가 일체로 형성되는 튜브와;상기 튜브의 하부에 체결되고 금속재질로 이루어지면서 외주연상에는 다수개의 체결관이 외향돌출되게 형성되는 플랜지와;상기 튜브와 플랜지를 결합하여 다수의 보울트로 조립체결토록 하는 금속재질의 체결링과;상기 플랜지의 내부에서 다수의 체결관을 통하여 각각 삽입체결되고 석영재질로 절곡형성되어 가스를 공급토록 하는 가스포트;로 구성됨을 특징으로 하는 반도체 저압화학기상증착 설비의 플랜지.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070072338A KR100910373B1 (ko) | 2007-07-19 | 2007-07-19 | 반도체 저압화학기상증착기의 챔버 체결구조 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070072338A KR100910373B1 (ko) | 2007-07-19 | 2007-07-19 | 반도체 저압화학기상증착기의 챔버 체결구조 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20090008957A true KR20090008957A (ko) | 2009-01-22 |
KR100910373B1 KR100910373B1 (ko) | 2009-08-04 |
Family
ID=40488960
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020070072338A KR100910373B1 (ko) | 2007-07-19 | 2007-07-19 | 반도체 저압화학기상증착기의 챔버 체결구조 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100910373B1 (ko) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR200406614Y1 (ko) | 2005-11-04 | 2006-01-23 | 주식회사 케이에스엠 | 반도체 저압화학기상증착 설비의 플랜지 |
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2007
- 2007-07-19 KR KR1020070072338A patent/KR100910373B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR100910373B1 (ko) | 2009-08-04 |
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