KR20090003755A - Ejector for ejecting a test board - Google Patents

Ejector for ejecting a test board Download PDF

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Publication number
KR20090003755A
KR20090003755A KR1020070066684A KR20070066684A KR20090003755A KR 20090003755 A KR20090003755 A KR 20090003755A KR 1020070066684 A KR1020070066684 A KR 1020070066684A KR 20070066684 A KR20070066684 A KR 20070066684A KR 20090003755 A KR20090003755 A KR 20090003755A
Authority
KR
South Korea
Prior art keywords
ejector
test
test board
force
guide groove
Prior art date
Application number
KR1020070066684A
Other languages
Korean (ko)
Inventor
함응진
Original Assignee
주식회사 엑시콘
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 엑시콘 filed Critical 주식회사 엑시콘
Priority to KR1020070066684A priority Critical patent/KR20090003755A/en
Publication of KR20090003755A publication Critical patent/KR20090003755A/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
    • H01R33/765—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket the terminal pins having a non-circular disposition

Abstract

An ejector for a test board is provided to draw out the test board from a test head by moving a hitching protrusion of the test board to an upper part by rotating a body unit through a lever. An ejector(100) includes a body unit(110), a lever(120) and an operating unit(130). The body unit is supported and inserted to a guide groove(26) formed in an upper part of the sidewall of a test head(10). The body unit includes a support unit contacting the guide groove. The lever is extended to a first direction from the body unit. The force is applied to a force point to be separated from the support unit as much as the first distance in the lever. The operating unit includes a contact pin contacting a hitching protrusion(12) of the test board. The contact pin is extended and formed to a second direction from the body unit. The force is applied to an operating point to be separated from the support unit as much as a second distance shorter than the first distance. The contact pin is combined with two cantilevers extended to the second direction from the body unit.

Description

Ejector for ejecting a test board

The present invention relates to an ejector for a test board, and more particularly, to an ejector for a test board for drawing out a test board inserted in a test head.

In general, a semiconductor device includes a Fab process for forming an electrical circuit including electrical elements on a silicon wafer used as a semiconductor wafer, and an EDS (electrical) for inspecting electrical characteristics of the semiconductor devices formed in the fab process. die sorting) and a package assembly process for encapsulating and individualizing the semiconductor devices with an epoxy resin.

Subsequently, an electrical test signal pattern is applied to the lead exposed to the outside of the manufactured semiconductor package to compare the output pattern according to the internal operation of the semiconductor chip with the applied test signal to test whether the semiconductor package is defective.

Recently, in order to test semiconductor memory chips of a semiconductor device, test apparatuses for a semiconductor device that are equipped with tens or hundreds of chips at a time and test at a high speed are being developed.

The conventional test apparatus includes a test head for receiving a test board for generating a test signal pattern as an electrical signal, a socket board on which a semiconductor device is mounted, and high-fixes including connection cables electrically connecting the test board and the socket board to each other. Contains interface units such as (hifix).

Recently, test boards are densely arranged in parallel in the test head to test numerous semiconductor devices at the same time. In addition, in order to test various kinds of semiconductor devices, test boards suitable for the types of semiconductor devices are replaced and used.

Conventional test boards are inserted in a direction perpendicular to the test head. The test board has a relatively large volume and considerable weight. Therefore, it is difficult and difficult for an operator to separate the test board from the test head for the replacement or repair of the test board, and the work takes a long time, thereby reducing the yield.

An object of the present invention is to provide an ejector for easily withdrawing a test board from a test head using the principle of the lever.

In order to achieve the object of the present invention, the ejector for the test board according to the present invention includes a body portion, a lever and an acting portion. The body portion is inserted into a guide groove formed on the sidewall of the test head, and has a support point in contact with the guide groove. The lever extends from the body portion in a first direction and a force is applied to a force point spaced apart from the support point by a first distance. The actuating part extends in a second direction from the body part to contact a catching jaw formed at one side of the test board inserted into the test head, and is spaced apart from the supporting point by a second distance shorter than the first distance. The force is applied.

In one embodiment of the present invention, the action portion includes a contact pin in contact with the locking jaw, the contact pin may be coupled with two cantilever beams extending in the second direction from the body portion. At this time, the contact pin may be fixed to the cantilever beam by a fixing ring.

In one embodiment of the present invention, the first direction may be orthogonal to the second direction.

In one embodiment of the present invention, the guide groove may have a U-shaped cross-sectional shape.

The ejector for the test board according to the present invention configured as described above includes a body portion, a lever extending in the first direction from the body portion, and an action portion extending in the second direction from the body portion. In order to take out the test board inserted in the test head, the body of the ejector is inserted into the guide groove formed in the test head, and the body is rotated by applying a force to the lever. Accordingly, the actuating part moves the locking jaw of the test board to the upper portion, thereby allowing the test board to be easily withdrawn from the test head.

Hereinafter, an ejector for a test board according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings. As the inventive concept allows for various changes and numerous embodiments, particular embodiments will be illustrated in the drawings and described in detail in the text. However, this is not intended to limit the present invention to the specific disclosed form, it should be understood to include all modifications, equivalents, and substitutes included in the spirit and scope of the present invention. In describing the drawings, similar reference numerals are used for similar elements. In the accompanying drawings, the dimensions of the structures are shown in an enlarged scale than actual for clarity of the invention.

Terms such as first and second may be used to describe various components, but the components should not be limited by the terms. The terms are used only for the purpose of distinguishing one component from another. For example, without departing from the scope of the present invention, the first component may be referred to as the second component, and similarly, the second component may also be referred to as the first component.

The terminology used herein is for the purpose of describing particular example embodiments only and is not intended to be limiting of the present invention. Singular expressions include plural expressions unless the context clearly indicates otherwise. In this application, the terms "comprise" or "have" are intended to indicate that there is a feature, number, step, action, component, part, or combination thereof described in the specification, and one or more other features. It should be understood that it does not exclude in advance the possibility of the presence or addition of gongs or numbers, steps, actions, components, parts or combinations thereof.

Unless defined otherwise, all terms used herein, including technical or scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art. Terms such as those defined in the commonly used dictionaries should be construed as having meanings consistent with the meanings in the context of the related art and shall not be construed in ideal or excessively formal meanings unless expressly defined in this application. Do not.

1 is a perspective view illustrating a part of a test head 20 in which a test board 10 drawn out by an ejector according to an embodiment of the present invention is accommodated.

Referring to FIG. 1, a test board 10 generating a test signal pattern as an electrical signal is inserted into a test head 20 to test a semiconductor device.

The test board 10 is inserted into the test head 20 in the vertical direction. Specifically, the test head 20 includes a first sidewall 22 and a second sidewall (not shown) facing the first sidewall 22. Receiving grooves 24 extending in the vertical direction are formed in the first sidewall 22 and the second sidewall of the test head 20. The test boards 10 are inserted in parallel in the receiving grooves 24.

On the test board 10, an electronic circuit used for testing a semiconductor device under test (DUT) may be mounted. In addition, the semiconductor device may be a semiconductor package or a semiconductor module including the semiconductor package.

A connector 30 is installed at an upper end of the test board 10, and connector pins (not shown) of the connector 30 are electrically connected to the test board 10. In addition, a plurality of connectors 30 may be disposed along the upper side of the test board 10. For example, the connector 30 may be a female connector type, and may be a ZIF (zero insertion force) type connector that may reduce frictional force due to insertion / separation.

Guide grooves 26 are formed on the first sidewall 22 and the second sidewall, respectively. Guide groove 26 has a curved cross-sectional shape. For example, the guide groove 26 may have a U-shaped cross-sectional shape.

A locking jaw 12 is formed at one side of the test board 10. The locking jaw 12 is formed to extend from one side of the test board 10. For example, the locking jaw 12 may have a ring shape, and specifically, may have a '-' shape.

Hereinafter, the ejector for extracting the test board 10 mentioned above will be described.

2A and 2B are cross-sectional views illustrating an ejector 100 according to an embodiment of the present invention, and FIG. 3 is a side view illustrating an ejector 100 according to an embodiment of the present invention.

2A, 2B, and 3, the ejector 100 according to the embodiment of the present invention includes a body portion 110, a lever 120, and an action portion 130. In this case, the ejector 100 may be used to pull out the test board 10 inserted into the test head 20.

The body part 110 of the ejector 100 is inserted and supported in the guide groove 26 formed on the side wall of the test head 10. In addition, the body portion 110 has a support point P in contact with the guide groove 26 and is supported by the guide groove 26.

For example, the guide groove 26 may have a U-shaped cross-sectional shape, and one end of the body portion 110 inserted into the guide groove 26 may have a shape corresponding to the shape of the guide groove 26. Therefore, the body 110 may be inserted into the guide groove 26 to rotate.

The lever 120 of the ejector 100 extends in the first direction from the body portion 110. The lever 120 also has a force point F to which a force is applied. Specifically, the force point F is a point where the body portion 110 is spaced apart from the support point P in contact with the guide groove 26 by the first distance D1.

The operator applies a force to the force point F of the lever 120 to rotate the lever 120 with the support point P as the origin.

The acting portion 130 of the ejector 100 extends from the body portion 110 in the second direction. The action part 130 contacts the locking step 12 formed at one side of the test board 10. Specifically, the action part 130 contacts the locking step 12 at a point spaced apart from the support point P by a second distance D2. In this case, the second distance D2 may be shorter than the first distance D1.

The point of contact with the locking jaw 12 becomes the working point W, and the force applied to the lever 120 is transmitted to the working point W to act on the locking jaw 12. Thus, even if a small force is applied to the lever 120, the test board 10 can be easily separated from the receiving groove 24.

According to one embodiment of the present invention, the first direction in which the lever 120 is extended may be orthogonal to the second direction in which the acting portion 130 is extended. However, one of ordinary skill in the art may understand that the angle of the first direction and the second direction may be adjusted in consideration of the weight of the test board 10 and the shape of the test head 20. will be.

In addition, the action part 130 may include a contact pin 132 in contact with the locking projection 12 of the test board 10. The contact pin 132 is coupled to and supported by two cantilever beams 112 extending in the second direction from the body portion 110.

Both ends of the contact pins 132 are coupled and supported by two cantilever beams 112. Therefore, the two cantilever 112 supports both ends of the contact pin 132 at the same time, it is possible to prevent the bending of the contact pin 132.

Specifically, both ends of the contact pin 132 is fixed by a fixing ring 134 that is coupled to the outside of the cantilever 112. The fixing ring 134 fixed to the contact pin 132 is fixed to the cantilever 112 by the fixing pin 136. Thus, the contact pin 132 can be more firmly fixed to the cantilever 112.

Referring again to FIG. 2A, the test board 10 is inserted into the test head 20. In order to take out the test board 10, the working part 130 of the ejector 100 is inserted between the locking jaw 12 and one side of the test board 10, and the body part 110 of the ejector 100 is guided. It is inserted into and supported in the groove 26.

Referring to FIG. 2B again, a force is applied to the action point F of the lever 120 to rotate the ejector 100 with the support point P as the origin. The force applied to the lever 120 is transmitted to the working point W of the ejector 100, and the locking jaw 12 of the test board 10 moves upward.

Thus, the test board 10 can be easily withdrawn from the receiving groove 24 of the test head 20.

4 is a cross-sectional view of the test head 20 to which the ejector 100 of FIG. 3 is inserted and supported.

Referring to FIG. 4, the test head 20 into which the test board 10 is inserted is formed with a guide groove 26 into which the body part 100 of the ejector 100 is inserted.

According to one embodiment of the present invention, the rotation guide portion 28 is formed at one end of the guide groove 26 of the test head 20. The rotation guide portion 28 is formed at the portion where the bending of the guide groove 26 starts. The rotation guide part 28 is formed to protrude from the lower surface of the guide groove 26 by the first height h1 in the first direction. The rotation guide part 28 serves to guide the body part 110 of the ejector 100 to be easily seated and rotated in the guide groove 26.

In addition, at the other end of the guide groove 26, the separation prevention part 29 is formed. The departure prevention part 29 is formed to protrude by the second height h2 in the first direction from the end of the bending of the guide groove 26. The departure prevention part 29 serves to prevent the body part 100 from leaving in the second direction when the body part 110 of the ejector 100 rotates.

Accordingly, an opening 30 having a third height h3 is formed between the rotation guide portion 28 and the separation prevention portion 29. In particular, the opening 30 serves to allow the body portion 110 of the ejector 100 to be easily inserted into and detached from the guide groove 26 in the second direction.

As described above, the ejector for the test board according to the preferred embodiment of the present invention includes a body portion, a lever extending in the first direction from the body portion and an action portion extending in the second direction from the body portion. In order to take out the test board inserted in the test head, the body of the ejector is inserted into the guide groove formed in the test head, and the body is rotated by applying a force to the lever.

Accordingly, the actuating part moves the latching jaw of the test board to the upper side, so that the test board can be easily withdrawn from the test head.

1 is a perspective view illustrating a part of a test head in which a test board drawn out by an ejector according to an embodiment of the present invention is accommodated.

2A and 2B are sectional views illustrating an ejector according to an embodiment of the present invention.

Figure 3 is a side view showing an ejector according to an embodiment of the present invention.

4 is a cross-sectional view illustrating a test head to which the ejector of FIG. 3 is inserted and supported.

Explanation of symbols on the main parts of the drawings

10: test board 12: jam jaw

20: test head 24: receiving groove

26: guide groove 30: connector

100: ejector 110: body portion

112: cantilever 120: lever

130: working part 132: contact pin

134: retaining ring

Claims (4)

A body part inserted into a guide groove formed on the sidewall of the test head and having a support point in contact with the guide groove; A lever extending from the body portion in a first direction and exerting a force on a force point spaced apart from the support point by a first distance; The force extends in the second direction from the body to contact the locking step formed on one side of the test board inserted into the test head, and the force is applied to an operating point spaced apart from the support point by a second distance shorter than the first distance. Ejector for test boards containing acting parts. The test board of claim 1, wherein the action part includes a contact pin contacting the locking jaw, and the contact pin is coupled to two cantilever beams extending from the body part in the second direction. Ejector. The ejector of claim 2, wherein the contact pin is fixed to the cantilever beams by a fixing ring. The ejector of claim 1, wherein the first direction is orthogonal to the second direction.
KR1020070066684A 2007-07-03 2007-07-03 Ejector for ejecting a test board KR20090003755A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020070066684A KR20090003755A (en) 2007-07-03 2007-07-03 Ejector for ejecting a test board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020070066684A KR20090003755A (en) 2007-07-03 2007-07-03 Ejector for ejecting a test board

Publications (1)

Publication Number Publication Date
KR20090003755A true KR20090003755A (en) 2009-01-12

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020070066684A KR20090003755A (en) 2007-07-03 2007-07-03 Ejector for ejecting a test board

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101249018B1 (en) * 2012-08-10 2013-04-02 (주)디지털프론티어 Ejector and ejecting system using ejector
KR101249017B1 (en) * 2012-08-10 2013-04-02 (주)디지털프론티어 Ejector and ejector system using ejector
KR101327979B1 (en) * 2012-04-05 2013-11-13 삼성탈레스 주식회사 Ejector supporting device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101327979B1 (en) * 2012-04-05 2013-11-13 삼성탈레스 주식회사 Ejector supporting device
KR101249018B1 (en) * 2012-08-10 2013-04-02 (주)디지털프론티어 Ejector and ejecting system using ejector
KR101249017B1 (en) * 2012-08-10 2013-04-02 (주)디지털프론티어 Ejector and ejector system using ejector

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E601 Decision to refuse application