KR20080076152A - System for testing a flat panel display device and mehtod thereof - Google Patents

Abstract

A system and a method for testing a flat display device are provided to determine accurately whether the flat display device is defective by the pixel unit, by analyzing a spectrum, which transmits plural pixels periodically arranged in the flat display device. An LCD(Liquid Crystal Display) panel assembly(10) is disposed on a test stage(100). A measuring unit(200) applies light to the LCD panel assembly to measure a spectrum of transmission light. A defect-notifying unit(300) displays a spectrum distribution for each pixel of the LCD panel assembly. The defect-notifying unit includes a memory(311) for store optical data transmitted from a photoelectric conversion sensor, a spectrum computation unit(313) for computing average value of spectral intensity for each measured region from the stored data, an enhancement-operating unit(315) for performing an enhancement-operating process if the spectral intensity for each measured region is larger than the average value, and a three-dimensional image display unit(317) for displaying the spectral intensity for each measured region three-dimensionally. The three-dimensional image display unit includes a defect notifier(318). The defect notifier compares the spectral intensity for each measured region with the average value, and then determines and notifies whether or not any defects, kinds of the defects, and degrees of the defects, considering a database of the memory.

Description

Inspection system and inspection method of flat panel display device {SYSTEM FOR TESTING A FLAT PANEL DISPLAY DEVICE AND MEHTOD THEREOF}

1 is a perspective view schematically illustrating an inspection system of a flat panel display device according to an exemplary embodiment of the present invention.

2 is a schematic perspective view illustrating a measuring device of an inspection system of a flat panel display device according to an exemplary embodiment of the present invention.

3 is a flowchart illustrating a method of inspecting a flat panel display device according to an exemplary embodiment of the present invention.

4A and 4B are graphs showing the difference between the periodic pattern of red subpixels having defects at different positions and the spectral distribution passing through the red subpixels having defects at different positions, respectively.

5A and 5B are graphs showing the difference between the periodic pattern of green subpixels having defects at different positions and the spectral distribution passing through the green subpixels having defects at different positions, respectively.

6A and 6B are graphs showing the difference in the cyclic distribution of periodic patterns of blue subpixels having defects at different positions and blue subpixels having defects at different positions, respectively.

7 is a three-dimensional view of the spectral distribution per display unit of the flat panel display assembly displayed on the stereoscopic image portion of the inspection system of the flat panel display apparatus according to an embodiment of the present invention.

The present invention relates to an inspection system for a flat panel display device and a method for inspecting the same. More particularly, the present invention relates to a method for determining a defect or defect in units of pixels by analyzing a spectrum passing through a plurality of periodically arranged pixels of the flat panel display device. An inspection system for a flat panel display device and an inspection method thereof.

In general, flat panel displays include liquid crystal displays (LCDs), plasma display panels (PDPs), organic electroluminescence displays (OLEDs), and field emission displays. And a field emission display (FED).

Among them, the liquid crystal display device is most actively studied because of its high resolution and fast reaction speed sufficient to realize a moving image.

In the liquid crystal display, a liquid crystal material is injected between a color filter display panel in which a common electrode and a color filter are formed, and a thin film transistor display panel in which a pixel electrode and a thin film transistor are formed, and the common electrode is formed. By controlling the voltage of the image information applied to the pixel electrode while the voltage is applied to the liquid crystal molecules having dielectric anisotropy according to the electric field between the common electrode and the pixel electrode to transmit or block light for each pixel I will display the image.

In particular, the color filter display panel and the thin film transistor display panel are assembled into a vacuum and then cut into unit panels. Such a unit panel is called a "liquid crystal display panel assembly". To test this, a test pattern is connected to the display panel assembly by connecting a contactor to a common electrode and a pixel electrode on the color filter display panel and the thin film transistor array display panel and applying a driving signal. Is displayed and a defect is detected from the displayed test pattern.

Conventionally, defects or defects of the flat panel display were detected by observing an image of the flat panel display using the naked eye or a microscope.

However, since the visual inspection method is judged by the subjective standard of the inspector, the yield may not only vary, but also requires a long time and labor for visual inspection.

In addition, the automatic inspection apparatus using a television camera and an image processing technology has been used in the past, but the apparatus itself is expensive because it requires a high resolution and high definition television camera having a pixel density higher than that of a panel substrate. Visual inspection of the image taken from the high resolution camera to visually inspect the defects or defects of the panel substrate has the problem of visual inspection as it is.

In addition, the visual inspection or the conventional automatic inspection device could not detect minute stains, fine panel thickness defects, etc. of the panel substrate due to the limitation of the resolution.

SUMMARY OF THE INVENTION The present invention has been made to solve such a problem, and an object of the present invention is to provide an inspection system and method for a flat panel display device for accurately and quickly detecting defects or defects of the flat panel display device.

SUMMARY OF THE INVENTION An object of the present invention is to provide an inspection system and method for a flat panel display device which can inspect minute stains, poor thicknesses, and the like, and which is inexpensive without requiring a high resolution and high precision television camera.

SUMMARY OF THE INVENTION An object of the present invention is to provide an inspection system and method for a flat panel display device having excellent processing capability for automatically inspecting a defect of the flat panel display device.

An inspection system of a flat panel display device having a flat panel display panel assembly according to an exemplary embodiment of the present invention includes an inspection stage for arranging the flat panel display panel assembly, a measurement stage disposed above the inspection stage, and measuring the flat panel display panel assembly. A measuring device for measuring a spectrum of transmitted light passing through an area, a transfer device for transferring the measuring device at an equivalent speed on the inspection stage, and an electrical signal of a spectrum electrically connected to the measuring device and transmitted from the measuring device. It includes a defect notification device that reports the status of defects, types of defects, and the severity of the defects.

The measuring device includes a focusing unit for focusing light transmitted through a measurement region of the flat panel display panel inside a case having a measuring head in front, a spectroscopic unit for separating the focused light for each wavelength, and a separation for the wavelength. It includes a photoelectric conversion sensor for absorbing light and converting the wavelength of light into an electrical signal, respectively, wherein the focusing unit and the spectroscopic unit may be connected by an optical fiber.

The photoelectric conversion sensor may be processed by any one of a photodiode array, a CCD, and a CMOC.

The focusing unit may include any one of a focusing lens and a concave mirror to control the area of the measurement area.

The measuring device may be replaceable in the case of a partial failure since the plurality of measuring heads are detachable, and for this purpose, it may be preferable to provide a contact inside the bar.

Both ends of the measuring device are connected by the transfer device, and the transfer device moves the measuring device at equivalent speed, and may be driven by a stepper motor.

The defect notification device includes a memory unit for storing optical data transmitted from the photoelectric conversion sensor, a spectroscopic calculator for calculating an average value of spectral intensity for each measurement region from the data stored in the memory unit, and a spectral intensity for each measurement region. And a three-dimensional image display unit for three-dimensionally displaying the spectral intensity for each measurement region in three cases. The three-dimensional image display unit compares the spectral intensity for each measurement region with an average value. The memory unit may include a defect notification unit that determines whether a defect is present, a defect type, and a severity of the defect by referring to a database of the memory unit.

The defect notification unit may further include a database unit configured to database a pattern according to a type of a defect, and the database unit may include a first unevenness caused by a malfunction occurring in the color filter display panel due to a change in electrical characteristics of the thin film transistor array panel of the liquid crystal display panel assembly. A second unevenness due to a thickness difference of a color filter formed in the color filter display panel of the liquid crystal display panel assembly, a third unevenness due to a thickness difference of a black matrix formed in the color filter display panel of the liquid crystal display panel assembly, the liquid crystal display Fourth stain remaining on the color filter display panel in the panel assembly, fifth stain caused by contamination of the liquid crystal display panel assembly, sixth stain caused by contamination of liquid crystal molecules of the liquid crystal display panel assembly, liquid crystal of the liquid crystal display panel assembly 7th due to misalignment of molecules Look, and it may be store and contains data according to the eighth non-uniformity due to the alignment layer defects of the liquid crystal display panel assembly, to classify the material deficiencies to discard the data of the healing available or display defects and the liquid crystal can be ignored Panel.

Preferably, the light source is a parallel plane light source, and the light source has a wavelength of 200 nm to 2100 nm, and is preferably a white light source.

According to another aspect of the present invention, there is provided a method of inspecting a flat panel display device, the method comprising: disposing a flat panel display assembly above an inspection stage, applying a test driving signal to perform the test operation on the flat panel display assembly, and Setting a measurement area of the flat panel display assembly by controlling a measuring device above the flat panel display assembly, measuring the light transmitted from a light source below the flat panel display assembly, and measuring the measured device. Transmitting a spectrum to the defect notification device, obtaining a mean value by overlapping the spectrum measured from the measurement area, and informing a defect when the spectrum value measured from the measurement area exceeds the average value. It may include.

On the other hand, when the spectrum value measured from the measurement area exceeds the average value, the step of notifying the defect may further include the step of emphasizing the portion exceeding the average value of the measurement area.

The notifying of the defect may include three-dimensionally displaying a spectral intensity value corresponding to the measurement area, comparing the three-dimensionally displayed spectral intensity value with data of a database, and determining a kind of a defect and a severity of the defect; Alerting the type of the defect and the severity of the defect with sound, color, and the like.

Preferably, the short side m and the long side n of the measurement region are set to be substantially the same, and when the spectral value measured from the measurement region exceeds the average value, the step of emphasizing the excess portion of the average value of the measurement region may include At least one of the x, y, and z components may be drained.

The measuring device measuring light transmitted from a light source below the flat panel display assembly may control the light irradiated from the light source to be incident on the head of the measuring device without a difference in optical path.

The measuring device may be transferred at an equivalent speed using a transfer device.

When the flat panel panel assembly includes a color filter array, each of the plurality of measurement regions may be at least one subpixel or at least one pixel of the color filter panel.

The measuring device may include a convex lens to vary the measuring area.

The defect notification unit may include a first unevenness caused by a malfunction occurring in the color filter display panel due to a change in electrical characteristics of the thin film transistor array panel of the liquid crystal display panel assembly, and a thickness of the color filter formed in the color filter display panel of the liquid crystal display panel assembly. A second unevenness due to a difference, a third unevenness due to a thickness difference of a black matrix formed in the color filter display panel of the liquid crystal display panel assembly, a fourth unevenness remaining in the color filter display panel of the liquid crystal display panel assembly, the liquid crystal display Fifth stain caused by contamination of the panel assembly, sixth stain caused by contamination of liquid crystal molecules of the liquid crystal display panel assembly, seventh stain caused by misalignment of liquid crystal molecules of the liquid crystal display panel assembly, and of the liquid crystal display panel assembly At least one of the eighth spots due to the alignment film defect The measuring device may include the color filter display panel, the thin film transistor array panel, and the thickness of the liquid crystal material layer filled therebetween as a result of the difference between the electrical signal and the reference signal. At least one of the thickness of the thin film transistor formed on the panel, the thickness of the color filter and the black matrix formed on the color filter display panel, and the thickness of the optical compensation panel other than the panel may be measured.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art may easily implement the present invention. As those skilled in the art would realize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the present invention.

In particular, according to an embodiment of the present invention, the light-receiving type liquid crystal display is described as an example, but is not limited thereto. An active liquid crystal display, a plasma display, an organic electroluminescence display (OLED), and It may be used for defect or defect inspection of a field emission display (FED).

In one embodiment of the present invention, the defect or defect of the liquid crystal display device is a black defect that does not allow light to pass through in the white display state, a white defect that transmits light in the black display state, or a black spot or a curve in the form of a line. Examples include line defects in which dots occur, and display unevenness in which part of an image is displayed with contrast or chromaticity.

1 is a perspective view schematically showing an inspection system of a flat panel display device according to an embodiment of the present invention, and is a schematic perspective view showing a measuring device of an inspection system of a flat panel display device according to an embodiment of the present invention.

1 and 2, an inspection system 1 of a flat panel display device according to an embodiment of the present invention includes an inspection stage 100 in which a liquid crystal display panel assembly 10 to be inspected is disposed, and the inspection system 1. Measuring device 200 for measuring the spectrum of the transmitted light by irradiating light to the liquid crystal display panel assembly 10 disposed on the stage 100, and the spectrum, that is, the optical data measured from the measuring device 200 is an electrical signal And a defect notification device (300) for three-dimensionally displaying the spectral distribution of each pixel of the liquid crystal display panel assembly (10) by storing the received data, storing the data into a database, and emphasizing at least one component of the optical data.

On the other hand, the inspection system 1 of the flat panel display device according to an embodiment of the present invention provides a liquid crystal display panel assembly driving unit 11 for applying a driving signal to the common electrode and the pixel electrode of the liquid crystal display panel assembly 10. Further, the pixel of the liquid crystal display panel assembly 10 is selected to check the minute defects or defects such as color unevenness generated while displaying the test pattern.

The liquid crystal display panel assembly driving unit 11 includes a plurality of contacts in contact with electrodes of the liquid crystal display panel assembly 10, and selects a pixel of the liquid crystal display panel assembly 10 by applying a driving signal to a test pattern. Can be displayed.

The inspection stage 100 is a UVW stage capable of moving along an angle Θ between the X, Y, and XY axes. As such, by selecting the inspection stage 100 as a UVW stage, the measurement head 210, which will be described later, of the measurement apparatus 200 is aligned to correspond one-to-one to the measurement area A of the liquid crystal display panel assembly 10 and measured. The error can be reduced.

The measuring device 200 emits light in one direction to the measuring unit 210 and the transfer unit 250 for transferring the measuring head 210 in a predetermined direction, and the light receiving surface 210a of the measuring head 210. It includes a light source 220 to irradiate.

The measuring head 210 of the measuring device 200 includes a focusing unit 211 for receiving the transmitted light transmitted through the liquid crystal display panel assembly 10 therein, and a spectroscopic unit 213 for spectroscopy the spectrum of the focused transmitted light. And a photoelectric conversion sensor 215 for converting the spectroscopic spectrum into an electrical signal.

The light source 220 is generally disposed below the inspection stage 100, but may be disposed above and use light reflected from the liquid crystal display panel assembly 10. Specifically, the light source 220 may have a wavelength of 200 nm to 2100 nm to include the wavelength of the ultraviolet band displayable from the liquid crystal panel assembly. In addition, a backlight (not shown) mounted on the rear surface of the liquid crystal panel assembly may be used as the light source 220.

According to one embodiment of the invention, it is preferable to use a parallel plane light source in order to prevent the measurement error caused by the light path from the light source 220 to the measuring device 200 is changed. The parallel plane light source may be formed by combining a series of lenses or using a polarizer or a light guide plate 700. The light source 220 may be white light using a short wavelength laser or UV lamp.

Light emitted from the light source 220 passes through the liquid crystal display panel assembly 10. Light transmitted through the liquid crystal display panel assembly 10 is incident and focused on the focusing unit 211 through the measurement head 210 of the measurement device 200.

The spectroscopic unit 213 separates the focused light for each wavelength. Specifically, the spectroscopic unit 213 may include a prism for separating focused light for each wavelength and may be fixed or directly fixed to the inside of the measurement head using a bracket.

The photoelectric conversion sensor 215 is a sensor of a pixel unit or less to absorb light separated for each wavelength and to change the wavelength of light into an electrical signal. In one embodiment of the present invention, a plurality of photodiode arrays or charges are provided. It may be processed by a charge coupled device (CCD).

The measuring head 210 may be detachably installed in the bar-shaped case 231 so as to simultaneously measure a plurality of measuring areas, and may be simultaneously driven by the transfer unit 250. Since the electrical contact is provided in a line in the case 231, the measuring head 210 may be fixed to the corresponding contact, and may be removed and replaced in the event of any failure.

The cross-sectional area of the measuring head 210 and the number of photoelectric conversion sensors are preferably determined to have a pixel density corresponding to the pixel density of the liquid crystal display panel assembly. Accordingly, the measurement head 210 does not have to have a higher resolution and a higher precision than the pixel density of the liquid crystal display panel assembly.

In addition, the measurement head 210 may further include a convex lens to measure a wider measurement area. That is, by moving the convex lens in the vertical direction, the area of the plurality of measurement regions can be controlled. Therefore, there may be ten pixels or five pixels in the plurality of measurement areas.

The photoelectric conversion sensor 215 of the measuring head 210 is electrically coupled with the defect notification device 300. The defect notification device 300 includes a memory unit 311 for storing optical data transmitted from the photoelectric conversion sensor 215 to a CPU, and a spectrum intensity for each measurement area from the data stored in the memory unit 311. A spectroscopic calculation unit 313 for calculating an average value, an emphasis processing unit 315 for performing an emphasis calculation process when the spectral intensity for each measurement region is equal to or greater than the average value, and a stereoscopic image display unit for displaying the spectral intensity for each measurement region in three dimensions The stereoscopic image display unit 317 compares the spectral intensity for each measurement region with an average value, and determines whether there is a defect, a kind of defect, and a severity of the defect by referring to a database of the memory unit 311. It may further include a defect notification unit 318 for indicating this.

As shown in FIG. 2, the measurement area may be at least one sub-pixel (SP) or at least one pixel (P). Here, the sub-pixel SP refers to any one of the individual R, G, and B in the color filter CF, and the pixel P or the pixel refers to the pair of individual R, G, and B in the color filter CF. According to an embodiment of the present invention, at least the defects for each pixel can be measured.

In addition, the memory unit 311 further includes a database for databaseing patterns according to types of defects, and the database is displayed on the color filter display panel by a change in electrical characteristics of the thin film transistor array panel of the liquid crystal display panel assembly. A second unevenness due to a malfunction, a second unevenness due to a thickness difference of a color filter formed in the color filter display panel of the liquid crystal display panel assembly, and a difference in thickness of a black matrix formed in the color filter display panel of the liquid crystal display panel assembly. A third stain, a fourth stain remaining on a color filter display panel of the liquid crystal display panel assembly, a fifth stain by contamination of the liquid crystal display panel assembly, a sixth stain by contamination of liquid crystal molecules of the liquid crystal display panel assembly, Misalignment of liquid crystal molecules in the liquid crystal display panel assembly The seventh unevenness and data relating to the eighth unevenness due to the alignment film defect of the liquid crystal display panel assembly, the curable or negligible defects among the data, and the critical defects to discard the liquid crystal display panel are classified and stored, The notification unit 318 may refer to the database to classify the defects that can be repaired or ignored and the critical defects to discard the liquid crystal display panel to highlight the sound or color.

A method of inspecting a flat panel display device according to an exemplary embodiment of the present invention will now be described in detail with reference to FIGS. 3 to 7.

3 is a flowchart illustrating a method of inspecting a flat panel display device according to an exemplary embodiment of the present invention, and FIGS. 4A and 4B, 5A and 5B, and 6A and 6B respectively have defects at different positions. It is a graph showing the difference between the periodic patterns of the red, green, and blue subpixels, and the spectral distribution passing through the red, green, and blue subpixels, each having a defect at different positions.

Referring to FIG. 3, first, the liquid crystal display panel assembly 10 is arranged and arranged on the test stage 100 (S10), and the liquid crystal display such as a common electrode and a pixel electrode of the liquid crystal display panel assembly 10 is disposed. The driving pattern is applied by the panel assembly driving unit 11 to form and store a test pattern in the liquid crystal display panel assembly 10 (S20).

For example, when the point or line defect is to be detected, the intensity of the spectrum of transmitted light transmitted through the liquid crystal display panel assembly 10 can be detected by turning all pixels off or on, that is, in a black or white state. have.

As shown in FIGS. 4A to 6B, when the red, green, and blue subpixels having a periodic pattern have point defects at different positions, respectively, the red, green, and blue subpixels having defects at different positions are transmitted. It can be seen that the spectra exhibit different distributions.

Subsequently, the sub-pixel or the pixel selected by the test pattern is divided into a plurality of measurement regions A, and the measurement apparatus 200 controls to simultaneously inspect the plurality of measurement regions (S30).

In this case, the liquid crystal display panel assembly has a pattern in which three types of filters transmitting three types of light of red, green, and blue, respectively, are periodically arranged repeatedly. Since the size of the pixel is close to a square, the measurement area is pixel-by-pixel. Even if two or more types of filters are included at the same time, the mixing ratio of light passing through each of the blue, red, and green filters is less likely to vary depending on the measurement position.

That is, when dividing the mxn measurement areas by dividing the short side of the measuring area A by m and the long side by n, it is preferable that m and n are almost the same because the possibility of light mixing ratio can be reduced, and the convex lens May be controlled in the up and down direction to control the measurement area A, or the case 231 of the measuring device may be moved in the up and down direction to simultaneously focus control the plurality of measurement heads.

Check that the pixels of the measuring area A and the measuring head of the measuring device are arranged in one-to-one correspondence, that is, whether 2 ⁿ pixels such as one pixel, four pixels, etc. are included in the measuring area A. And checking whether the moving acceleration for moving the case 231 on which the measuring head is mounted is set to a constant (S40), checking whether the incident light from the light source 225 is parallel (S50) and starting the measurement of the spectrum. This allows for quick measurements without the need for a high resolution camera.

The measured spectral intensities are measured and stored in the memory unit 311 (S60), and the stored spectral intensities are calculated by the spectroscopic calculator 313 to obtain an average value for each measurement area (S70). Comparing whether the measured spectral intensity of each measurement region is greater than the average value, if the average value is greater than or equal to the average value, the spectral intensity for each measurement region is multiplied by an integer multiple or the color is emphasized.

For example, according to an embodiment of the present invention, since one pixel has a periodic pattern when the pixel is set as the measurement region, if the average value of the ten pixels is also normal, the measured spectral intensity of one pixel is the same. The average value can be obtained without measuring the whole liquid crystal display panel assembly.

In addition, assuming that the measurement area is 10 pixels and the average value is 100, a measurement area that is represented by, for example, 90, which is less than 100 is selected among the plurality of measurement areas, and the area less than the average value is further reduced by reducing the area of the measurement area to 5 pixels. And repeat this method to find the exact defect or defect of at least one pixel.

Therefore, it is possible to determine whether or not a defect is made by dividing the measurement area into a plurality of pixels as one measurement area, so that the defect inspection can be performed quickly, and each pixel is compared with the average value so that the defect can be accurately detected. Can be.

The stereoscopic image display unit 317 displays the values calculated by the spectroscopic calculation unit 313 and the emphasis processing unit 315 in three dimensions for each measurement area (S90).

Therefore, the inspector can easily recognize the color unevenness, which is difficult to inspect due to the extremely small change in the film thickness.

Meanwhile, the defect notification unit 318 compares the electrical signal and spectral intensity of the measurement area transmitted from the photoelectric conversion sensor 215 with data stored in the memory unit 311 to determine whether there are defects, defect types, and defects. Informs the severity of the color or sound (S100).

That is, the first unevenness and the liquid crystal of the liquid crystal display panel assembly in which the pattern according to the type of the defect displayed on the stereoscopic image display unit 317 is displayed on the color filter display panel due to a change in electrical characteristics of the thin film transistor array panel. A second unevenness due to a difference in thickness of the color filter formed in the color filter display panel of the display panel assembly, a third unevenness due to a difference in thickness of the black matrix formed in the color filter display panel of the liquid crystal display panel assembly, among the liquid crystal display panel assembly A fourth spot remaining on a color filter display panel, a fifth spot caused by contamination of the liquid crystal display panel assembly, a sixth spot caused by contamination of liquid crystal molecules of the liquid crystal display panel assembly, and an arrangement of liquid crystal molecules of the liquid crystal display panel assembly Seventh unevenness caused by defect and the liquid crystal display panel Compared to the data on the eighth unevenness caused by the defective alignment film of the assembly, it is determined whether the defect is curable or negligible or a serious defect that should be discarded, thereby discarding the curable or negligible defect and the liquid crystal display panel. The major defects can be categorized and highlighted with sound or color.

7 is a three-dimensional view of the spectral distribution per display unit of the flat panel display assembly displayed on the defect display unit of the inspection system of the flat panel display apparatus according to the embodiment of the present invention.

As shown in FIG. 7, the detection area of each defect is compared with the detection area by means of spectral measurement, and the case where the spectral intensity is out of a certain range or more is defined as the linear bright point A, and the detection area for each measurement area is defined. When the detection area is local and the mean value is out of a certain range, it is defined as a point bright spot (B) .If the detection area has a certain range and the variability is out of a certain range, that is, it has a tendency more than a certain distance, The case can be marked as stain (C).

That is, according to an embodiment of the present invention, it is possible to display various defects for each measurement area at the same time, it is possible to determine whether to discard the flat panel display panel assembly by determining the type and the severity of the defects for each measurement area.

That is, the defect notification device 300 displays a color filter by a difference between a defect pattern stored in a database and a spectral intensity measured for each measurement area, for example, by a change in electrical characteristics of a thin film transistor array panel of a liquid crystal display panel assembly. Unevenness caused by malfunctions appearing in the panel, unevenness caused by the thickness difference of the color filter formed in the color filter display panel of the liquid crystal display panel assembly, unevenness caused by the difference in thickness of the black matrix formed in the color filter display panel of the liquid crystal display panel assembly, In the liquid crystal display panel assembly, stains remaining on the color filter display panel, stains caused by contamination of the liquid crystal display panel assembly, stains caused by contamination of the liquid crystal molecules of the liquid crystal display panel assembly, and arrangement of liquid crystal molecules of the liquid crystal display panel assembly Unevenness due to defects and LCD panel assembly The dirt by Lee alignment film defects can be accurately tell.

In this case, the defect notification device 300 may include, for example, a color filter display panel, a thin film transistor array panel, and the like, wherein wavelengths of light incident from the light source 200 to the liquid crystal display panel assembly constitute the liquid crystal display panel assembly. Measuring at least one of the filled liquid crystal material layer, the thickness of the alignment layer, as well as the thickness of the thin film transistor formed on the thin film transistor panel, the thickness of the color filter and black matrix formed on the color filter display panel, and the thickness of the optical compensation panel other than the panel Since the thickness of the liquid crystal display panel, the alignment layer formed on the liquid crystal display panel, the photoresist layer, the color filter, or the black mattress changes depending on the thickness, each of these thicknesses can be measured to determine contamination.

Since the wavelength of the incident light is changed by the difference in the refractive index and the thickness of the medium, it will be well known to those skilled in the art, and thus the detailed description thereof will be omitted.

As described above, the inspection system of the flat panel display according to the embodiment of the present invention has the following effects.

According to the embodiment of the present invention, the defect of the flat panel display can be detected accurately. In particular, since light passing through each of the plurality of focusing lenses is separated by wavelength by a prism and absorbed by the plurality of photodiode arrays, defects in an image displayed on the flat panel display can be accurately detected.

Although the preferred embodiments of the present invention have been described in detail above, the scope of the present invention is not limited thereto, and various modifications and improvements of those skilled in the art using the basic concepts of the present invention defined in the following claims are also provided. It belongs to the scope of rights.

Claims (23)

In the inspection system of a flat panel display device having a flat panel display panel assembly An inspection stage for aligning and arranging the flat panel display panel; A measuring device disposed above the inspection stage and measuring a spectrum of transmitted light transmitted from a light source through a measurement region of the flat panel display panel assembly; A transfer device for transferring the measuring device at an equivalent speed on the inspection stage; And a defect notification device that is electrically connected to the measuring device and processes an electrical signal of the spectrum transmitted from the measuring device to indicate whether there is a defect, a kind of defect, and a severity of the defect. The method of claim 1, The measuring device includes a focusing unit for focusing light transmitted through the measuring area of the flat panel display panel inside a case having a measuring head in front; A spectroscopic unit for separating the focused light for each wavelength; It includes a photoelectric conversion sensor for absorbing the separated light for each wavelength and converts the wavelength of the light into an electrical signal, And said focusing unit and said spectroscopic unit are connected by an optical fiber. The method of claim 2, And the photoelectric conversion sensor is processed by any one of a photodiode array, a CCD, and a CMOC. The method of claim 2, The focusing unit may include any one of a focusing lens and a concave mirror to control the area of the measurement area. The method of claim 1, The measuring device is a test system for a flat panel display device having a bar shape to which the plurality of measuring heads are attached and detached. The method of claim 1, Both ends of the measuring device are connected by the transfer device, the transfer device moves the measuring device at an equivalent speed, and is driven by a stepper motor. The method of claim 1, A memory unit for storing optical data transmitted from the photoelectric conversion sensor, a spectroscopic calculator for calculating an average value of spectral intensities for each measurement region from the data stored in the memory unit, and a case where the spectral intensities for each measurement region are greater than or equal to the average value An emphasis processing unit for performing weighted calculation processing, and a stereoscopic image display unit for displaying the spectral intensities for each measurement area in three dimensions, wherein the stereoscopic image display unit compares the spectral intensities for each measurement area with an average value and references a database of the memory unit. Inspection system of the flat panel display device including a defect notification unit for determining whether the defect, the defect type, the severity of the defect and informs it. The method of claim 7, wherein The defect notification unit may further include a database unit configured to database a pattern according to a type of a defect, and the database unit may include a first unevenness caused by a malfunction occurring in the color filter display panel due to a change in electrical characteristics of the thin film transistor array panel of the liquid crystal display panel assembly. A second unevenness due to a thickness difference of a color filter formed in the color filter display panel of the liquid crystal display panel assembly, a third unevenness due to a thickness difference of a black matrix formed in the color filter display panel of the liquid crystal display panel assembly, the liquid crystal display Fourth stain remaining on the color filter display panel in the panel assembly, fifth stain caused by contamination of the liquid crystal display panel assembly, sixth stain caused by contamination of liquid crystal molecules of the liquid crystal display panel assembly, liquid crystal of the liquid crystal display panel assembly 7th due to misalignment of molecules A flat panel display including data relating to a look and an eighth unevenness due to an alignment film defect of the liquid crystal display panel assembly, and storing and repairing a curable or negligible defect among the data and a serious defect to discard the liquid crystal display panel. Inspection system. The method of claim 1, And said light source is a parallel plane light source. The method of claim 9, The light source has a wavelength of 200 nm to 2100 nm and is a white light source. In the inspection method of a flat panel display device, Placing the plate display assembly above the inspection stage; Applying a test driving signal to allow the flat panel display assembly to perform a test operation; Setting a measurement area of the flat panel display assembly by controlling a measurement device above the flat panel display assembly; Measuring the light transmitted from a light source under the flat panel display assembly by the measuring device; The measuring device transmits the measured spectrum to the defect notification device; The defect notification device obtains an average value by overlapping the spectrum measured from the measurement area; And notifying a defect when the spectral value measured from the measurement area exceeds the average value. The method of claim 11, And notifying the defect when the spectrum value measured from the measurement area exceeds the average value further includes emphasizing the excess portion of the average value of the measurement area. The method of claim 11, And notifying the defect when the measured spectral value exceeds the average value in comparison with the average value further comprises three-dimensionally displaying the spectral intensity value corresponding to the measured area. The method of claim 11, The step of informing a defect when the measured spectral value exceeds the average value compares the average value to determine the type of the defect and the severity of the defect by comparing the three-dimensionally displayed spectral intensity value with data of the database; And informing the type of the defect and the severity of the defect. The method of claim 11, The short side m and the long side n of the measurement area are set to be substantially the same. The method of claim 11, When the spectrum value measured from the measurement region exceeds the mean value, the step of emphasizing the portion exceeding the mean value of the corresponding measurement region may be a test of the flat panel display which multiplies at least one of the x, y, and z components of the mean value excess portion. Way. The method of claim 11, And measuring the light transmitted from the light source under the flat panel display assembly by controlling the light irradiated from the light source to be incident on the head of the measuring device without difference in an optical path. The method of claim 11, An inspection method of a flat panel display device for transferring the measuring device at a constant acceleration using a transfer device. The method of claim 11, The flat panel panel assembly includes an array of color filters, And each of the plurality of measurement areas is at least one sub-pixel of the color filter panel. The method of claim 19, And each of the plurality of measurement areas is at least one pixel of the color filter panel. The method of claim 11, And the measuring device includes a convex lens to vary the measuring area. The method of claim 11, The defect notification unit, A first unevenness caused by a malfunction in the color filter display panel due to a change in electrical characteristics of the thin film transistor array panel of the liquid crystal display panel assembly; A second unevenness due to a difference in thickness of color filters formed in the color filter display panel of the liquid crystal display panel assembly; A third unevenness due to a difference in thickness of the black matrix formed on the color filter display panel of the liquid crystal display panel assembly; A fourth spot remaining on the color filter display panel of the liquid crystal display panel assembly; Fifth stain caused by contamination of the liquid crystal display panel assembly, Sixth unevenness due to contamination of liquid crystal molecules of the liquid crystal display panel assembly, Seventh unevenness due to misalignment of liquid crystal molecules in the liquid crystal display panel assembly, and And a method for inspecting at least one of eighth spots caused by a defective alignment film of the liquid crystal display panel assembly. The method of claim 11, The measuring device may be formed on the thin film transistor panel as well as the thickness of the color filter display panel, the thin film transistor array panel, and the liquid crystal material layer filled therebetween constituting the liquid crystal display panel assembly due to the difference between the electrical signal and the reference signal. And a thickness of a thin film transistor, a thickness of a color filter and a black matrix formed on the color filter display panel, and a thickness of an optical compensation panel other than the panel.

Images