KR20080050560A - 반도체 웨이퍼 세정장치 - Google Patents
반도체 웨이퍼 세정장치 Download PDFInfo
- Publication number
- KR20080050560A KR20080050560A KR1020080046331A KR20080046331A KR20080050560A KR 20080050560 A KR20080050560 A KR 20080050560A KR 1020080046331 A KR1020080046331 A KR 1020080046331A KR 20080046331 A KR20080046331 A KR 20080046331A KR 20080050560 A KR20080050560 A KR 20080050560A
- Authority
- KR
- South Korea
- Prior art keywords
- wafer
- cleaning
- unit
- cassette
- carrier
- Prior art date
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J11/00—Manipulators not otherwise provided for
- B25J11/0095—Manipulators transporting wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/67034—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Mechanical Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
Claims (3)
- 반도체 웨이퍼 세정장치에 있어서,복수 장의 웨이퍼(W)가 안치되도록 구성되되 상·하로 수직이동 가능한 카세트(110)와, 카세트(110)에 안착된 웨이퍼(W)가 한 장씩 인출되도록 하는 이송암(121)이 구비된 로딩부(100)와,로딩부(100)의 후방에 설치되되, 웨이퍼(W)의 수평 이동경로의 상·하로 하나 이상 배치되는 세정액이 분사되는 노즐(210)과 롤 브러쉬(220)가 구비된 세정부(200)와,세정부(200)의 후방에 설치되되, 웨이퍼(W)의 수평 이동경로의 상·하로 건조수단이 하나 이상 배치되는 건조부(300)와,건조부(300)의 후방에 설치되되, 상·하로 수직이동 가능한 캐리어(410)와, 웨이퍼(W)를 캐리어(410)에 안치시키는 이송암(421)이 구비된 언로딩부(400)로 구성되어, 각 공정부가 연속적이고 자동적으로 이루어져 최소한의 영역에 집적되도록 함을 특징으로 하는 반도체 웨이퍼 세정장치.
- 제 1항에 있어서,로딩부(100)는 카세트(110)에 수평의 회전축(113)을 형성하여 회전축(113)을 중심으로 카세트(110)가 90°회전가능하도록 구성하여 웨이퍼(W)가 용이하게 만입 되도록 하는 반도체 웨이퍼 세정장치.
- 제 2항에 있어서, 로딩부(100)는 카세트(110) 저부에 초음파 세척부(140)를 형성하여 웨이퍼(W)를 세정부(200)에서 세정하기 전에 초음파로 선세척하도록 하는 반도체 웨이퍼 세정장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080046331A KR100864262B1 (ko) | 2008-05-19 | 2008-05-19 | 반도체 웨이퍼 세정장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080046331A KR100864262B1 (ko) | 2008-05-19 | 2008-05-19 | 반도체 웨이퍼 세정장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20080050560A true KR20080050560A (ko) | 2008-06-09 |
KR100864262B1 KR100864262B1 (ko) | 2008-10-17 |
Family
ID=39805834
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020080046331A KR100864262B1 (ko) | 2008-05-19 | 2008-05-19 | 반도체 웨이퍼 세정장치 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100864262B1 (ko) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100971973B1 (ko) * | 2008-07-04 | 2010-07-23 | 주식회사 포스코 | 탈탄판 Mg0 파우더 제거장치 |
KR101672851B1 (ko) * | 2016-05-11 | 2016-11-04 | (주) 에스에스피 | 픽앤플레이스 시스템의 디바이스 세정 장치 |
CN115007510A (zh) * | 2022-06-13 | 2022-09-06 | 苏州司达夫超声科技有限公司 | 全自动磁片磁芯清洗线及其清洗方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19980056768U (ko) * | 1997-01-22 | 1998-10-15 | 문정환 | 반도체 카세트 핸들러 |
KR100500169B1 (ko) * | 2003-07-02 | 2005-07-07 | 주식회사 디엠에스 | 도킹형 기판 이송 및 처리 시스템과, 그를 이용한 이송 및 처리 방법 |
KR20070121204A (ko) * | 2006-06-21 | 2007-12-27 | 엘지.필립스 엘시디 주식회사 | 기판이송장치 및 이를 이용한 기판세정시스템 |
-
2008
- 2008-05-19 KR KR1020080046331A patent/KR100864262B1/ko active IP Right Grant
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100971973B1 (ko) * | 2008-07-04 | 2010-07-23 | 주식회사 포스코 | 탈탄판 Mg0 파우더 제거장치 |
KR101672851B1 (ko) * | 2016-05-11 | 2016-11-04 | (주) 에스에스피 | 픽앤플레이스 시스템의 디바이스 세정 장치 |
CN115007510A (zh) * | 2022-06-13 | 2022-09-06 | 苏州司达夫超声科技有限公司 | 全自动磁片磁芯清洗线及其清洗方法 |
CN115007510B (zh) * | 2022-06-13 | 2023-11-28 | 苏州司达夫超声科技有限公司 | 全自动磁片磁芯清洗线及其清洗方法 |
Also Published As
Publication number | Publication date |
---|---|
KR100864262B1 (ko) | 2008-10-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10607862B2 (en) | Substrate cleaning apparatus | |
KR100271772B1 (ko) | 반도체 습식 식각설비 | |
US7337792B2 (en) | Liquid processing apparatus and liquid processing method | |
EP1186006B1 (en) | Method and system for cleaning a semiconductor wafer | |
JP5454407B2 (ja) | 液処理装置及び液処理方法 | |
JP2003224097A (ja) | 組み合わせcmpおよびウエハ洗浄器具および関連方法 | |
JP7055467B2 (ja) | 半導体ウェハの洗浄方法及び洗浄装置 | |
US6368183B1 (en) | Wafer cleaning apparatus and associated wafer processing methods | |
CN101114578B (zh) | 基板处理方法及基板处理装置 | |
KR101899435B1 (ko) | 웨이퍼 처리 장치 | |
JPH0536658A (ja) | 基板洗浄・乾燥装置 | |
CN115053333A (zh) | 基板的spm处理 | |
JP2009195777A (ja) | 大型基板洗浄装置 | |
KR100864262B1 (ko) | 반도체 웨이퍼 세정장치 | |
US20040200409A1 (en) | Scrubber with integrated vertical marangoni drying | |
JP2001338904A (ja) | ウェハの洗浄装置 | |
JP3837720B2 (ja) | 基板処理方法及び基板処理装置 | |
KR100710685B1 (ko) | 기판수납용기용 건식세정장치 | |
JPH1126547A (ja) | ウエット処理装置 | |
JP2002520132A (ja) | 基板をクリーニングする方法及び装置 | |
JP4328342B2 (ja) | 基板処理方法及び基板処理装置 | |
JP4339299B2 (ja) | レジスト塗布装置 | |
JPS5931039A (ja) | 半導体ウェファ−の洗浄方法 | |
JP3661075B2 (ja) | 基板保持用チャックの洗浄・乾燥装置及び基板保持用チャックの洗浄・乾燥方法 | |
JP2018129476A (ja) | 基板処理装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
A302 | Request for accelerated examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20121012 Year of fee payment: 5 |
|
FPAY | Annual fee payment |
Payment date: 20131010 Year of fee payment: 6 |
|
FPAY | Annual fee payment |
Payment date: 20141010 Year of fee payment: 7 |
|
FPAY | Annual fee payment |
Payment date: 20151012 Year of fee payment: 8 |
|
FPAY | Annual fee payment |
Payment date: 20161010 Year of fee payment: 9 |
|
FPAY | Annual fee payment |
Payment date: 20171012 Year of fee payment: 10 |
|
FPAY | Annual fee payment |
Payment date: 20181015 Year of fee payment: 11 |
|
FPAY | Annual fee payment |
Payment date: 20191010 Year of fee payment: 12 |