KR20070085589A - 표면의 시각적 특성을 분석하는 방법 및 장치 - Google Patents

표면의 시각적 특성을 분석하는 방법 및 장치 Download PDF

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Publication number
KR20070085589A
KR20070085589A KR1020077012281A KR20077012281A KR20070085589A KR 20070085589 A KR20070085589 A KR 20070085589A KR 1020077012281 A KR1020077012281 A KR 1020077012281A KR 20077012281 A KR20077012281 A KR 20077012281A KR 20070085589 A KR20070085589 A KR 20070085589A
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KR
South Korea
Prior art keywords
cavity
sample
image
wall
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020077012281A
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English (en)
Korean (ko)
Inventor
스위 란 엔조
데 랑스 이보 베르나르더스 니콜라스 반
Original Assignee
아크조노벨코팅스인터내셔널비.브이.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 아크조노벨코팅스인터내셔널비.브이. filed Critical 아크조노벨코팅스인터내셔널비.브이.
Publication of KR20070085589A publication Critical patent/KR20070085589A/ko
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/48—Photometry, e.g. photographic exposure meter using chemical effects
    • G01J1/52—Photometry, e.g. photographic exposure meter using chemical effects using photographic effects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0214—Constructional arrangements for removing stray light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0223—Sample holders for photometry

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
KR1020077012281A 2004-12-14 2005-12-13 표면의 시각적 특성을 분석하는 방법 및 장치 Withdrawn KR20070085589A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04078382 2004-12-14
EP04078382.1 2004-12-14

Publications (1)

Publication Number Publication Date
KR20070085589A true KR20070085589A (ko) 2007-08-27

Family

ID=34928732

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020077012281A Withdrawn KR20070085589A (ko) 2004-12-14 2005-12-13 표면의 시각적 특성을 분석하는 방법 및 장치

Country Status (9)

Country Link
US (1) US20070273885A1 (https=)
EP (1) EP1831655A1 (https=)
JP (1) JP2008523521A (https=)
KR (1) KR20070085589A (https=)
CN (1) CN101076712A (https=)
AU (1) AU2005315602A1 (https=)
BR (1) BRPI0519038A2 (https=)
RU (1) RU2007126795A (https=)
WO (1) WO2006064010A1 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12067168B2 (en) 2021-11-12 2024-08-20 POSTECH Research and Business Development Foundation Method and apparatus for generating and merging image-based texture motion
US12148146B2 (en) 2019-09-19 2024-11-19 Ppg Industries Ohio, Inc. Systems and methods for mapping coatings to a spatial appearance space

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2462121A (en) * 2008-07-25 2010-01-27 Diamond Trading Company Ltd Gemstone Viewer
JP2019184537A (ja) * 2018-04-17 2019-10-24 日本ペイント・オートモーティブコーティングス株式会社 外観評価装置及び外観評価方法
WO2022065038A1 (ja) * 2020-09-25 2022-03-31 コニカミノルタ株式会社 光学特性測定装置及び光学特性測定方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4032327A1 (de) * 1990-10-11 1992-04-16 Abos Automation Bildverarbeitu Verfahren und vorrichtung zur automatisierten ueberwachung der herstellung von halbleiterbauteilen
US5365084A (en) * 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
DE4413832C2 (de) * 1994-04-20 2000-05-31 Siemens Ag Vorrichtungen zur Kontrolle von Halbleiterscheiben
US6034769A (en) * 1997-06-27 2000-03-07 Yufa; Aleksandr L. Method and device for counting and measuring particles
US6207946B1 (en) * 1998-09-03 2001-03-27 Semiconductor Technologies & Instruments, Inc. Adaptive lighting system and method for machine vision apparatus
JP3626387B2 (ja) 2000-02-04 2005-03-09 関西ペイント株式会社 コンピュータ調色装置及びこの装置を用いた塗料の調色方法
DE10106032B4 (de) * 2000-02-25 2006-11-16 Laser-Laboratorium Göttingen eV Vorrichtung zur homogenen Ausleuchtung einer kleinen Fläche mit einer Ulbricht'schen Kugel
US20050018191A1 (en) 2001-10-04 2005-01-27 Luo Ming Ronnier Apparatus and method for measuring colour
EP1516284A2 (en) * 2002-06-21 2005-03-23 Pressco Technology, Inc. Patterned illumination method and apparatus for machine vision systems

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12148146B2 (en) 2019-09-19 2024-11-19 Ppg Industries Ohio, Inc. Systems and methods for mapping coatings to a spatial appearance space
US12067168B2 (en) 2021-11-12 2024-08-20 POSTECH Research and Business Development Foundation Method and apparatus for generating and merging image-based texture motion

Also Published As

Publication number Publication date
RU2007126795A (ru) 2009-01-27
JP2008523521A (ja) 2008-07-03
US20070273885A1 (en) 2007-11-29
CN101076712A (zh) 2007-11-21
BRPI0519038A2 (pt) 2008-12-23
AU2005315602A1 (en) 2006-06-22
EP1831655A1 (en) 2007-09-12
WO2006064010A1 (en) 2006-06-22

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Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20070531

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid