KR20070041680A - 피시험 소자를 위한 근접 제어 온도 관리 기능을 갖는마이크로 열 챔버 - Google Patents

피시험 소자를 위한 근접 제어 온도 관리 기능을 갖는마이크로 열 챔버 Download PDF

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Publication number
KR20070041680A
KR20070041680A KR1020067023364A KR20067023364A KR20070041680A KR 20070041680 A KR20070041680 A KR 20070041680A KR 1020067023364 A KR1020067023364 A KR 1020067023364A KR 20067023364 A KR20067023364 A KR 20067023364A KR 20070041680 A KR20070041680 A KR 20070041680A
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KR
South Korea
Prior art keywords
under test
temperature
device under
actuator
heater block
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020067023364A
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English (en)
Korean (ko)
Inventor
샴부 엔. 로이
Original Assignee
가부시키가이샤 어드밴티스트
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 어드밴티스트 filed Critical 가부시키가이샤 어드밴티스트
Publication of KR20070041680A publication Critical patent/KR20070041680A/ko
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2862—Chambers or ovens; Tanks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
    • G01R31/2877—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to cooling

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
KR1020067023364A 2004-04-13 2005-04-13 피시험 소자를 위한 근접 제어 온도 관리 기능을 갖는마이크로 열 챔버 Withdrawn KR20070041680A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/822,841 2004-04-13
US10/822,841 US7304264B2 (en) 2004-04-13 2004-04-13 Micro thermal chamber having proximity control temperature management for devices under test

Publications (1)

Publication Number Publication Date
KR20070041680A true KR20070041680A (ko) 2007-04-19

Family

ID=34965349

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020067023364A Withdrawn KR20070041680A (ko) 2004-04-13 2005-04-13 피시험 소자를 위한 근접 제어 온도 관리 기능을 갖는마이크로 열 챔버

Country Status (5)

Country Link
US (1) US7304264B2 (https=)
JP (1) JP4994842B2 (https=)
KR (1) KR20070041680A (https=)
CN (1) CN1997907A (https=)
WO (1) WO2005101040A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20150104876A (ko) * 2014-03-06 2015-09-16 한양대학교 에리카산학협력단 극저온 냉매를 이용한 국부적 저온 챔버

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US8057094B2 (en) * 2007-11-16 2011-11-15 Infineon Technologies Ag Power semiconductor module with temperature measurement
FR2933201B1 (fr) * 2008-06-30 2010-11-19 Airbus France Systeme et procede de deverminage d'equipements
DE102008052898B4 (de) * 2008-10-23 2014-01-16 Gerhard Bauer Vorrichtung und Verfahren zum Temperieren von Bauteilen
WO2012127383A1 (en) 2011-03-18 2012-09-27 Ecolab Usa Inc. Heat system for killing pests
US9101125B2 (en) 2012-04-06 2015-08-11 Elizabeth Knote Heat chamber for termination of bed bugs and other arthropods
US9400291B2 (en) 2012-08-31 2016-07-26 Intel Corporation Integrated circuit test temperature control mechanism
US9029740B2 (en) * 2013-01-15 2015-05-12 Nordson Corporation Air impingement heater
US9454499B2 (en) 2013-06-11 2016-09-27 Intel Corporation Asynchronous communication between devices
AT516900A1 (de) * 2015-03-09 2016-09-15 Dr Collin Gmbh Vorrichtung und Verfahren zum Testen von Werkstoffen
CN108037064A (zh) * 2017-12-26 2018-05-15 华测检测认证集团股份有限公司 多任务多温度段同时进行汽车电子元器件可靠性测试装置
US20190339751A1 (en) * 2018-05-02 2019-11-07 Microsoft Technology Licensing, Llc Server testing applying controlled flow and temperature
JP2023149981A (ja) 2022-03-31 2023-10-16 株式会社アドバンテスト 温度調整装置、電子部品ハンドリング装置、電子部品試験装置、及びｄｕｔの温度調整方法
US11693051B1 (en) * 2022-10-21 2023-07-04 AEM Holdings Ltd. Thermal head for independent control of zones
US11828795B1 (en) 2022-10-21 2023-11-28 AEM Holdings Ltd. Test system with a thermal head comprising a plurality of adapters for independent thermal control of zones
CN120677396A (zh) 2022-10-21 2025-09-19 新加坡商永科股份有限公司 用于对多个区域进行独立的控制的热头
US11796589B1 (en) 2022-10-21 2023-10-24 AEM Holdings Ltd. Thermal head for independent control of zones
US11656272B1 (en) 2022-10-21 2023-05-23 AEM Holdings Ltd. Test system with a thermal head comprising a plurality of adapters and one or more cold plates for independent control of zones
US11828796B1 (en) 2023-05-02 2023-11-28 AEM Holdings Ltd. Integrated heater and temperature measurement

Family Cites Families (12)

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Publication number Priority date Publication date Assignee Title
US6002109A (en) * 1995-07-10 1999-12-14 Mattson Technology, Inc. System and method for thermal processing of a semiconductor substrate
JPH10256353A (ja) * 1997-03-13 1998-09-25 Sony Corp ヒートアップステージの冷却装置およびその冷却方法
US5821505A (en) * 1997-04-04 1998-10-13 Unisys Corporation Temperature control system for an electronic device which achieves a quick response by interposing a heater between the device and a heat sink
US5844208A (en) * 1997-04-04 1998-12-01 Unisys Corporation Temperature control system for an electronic device in which device temperature is estimated from heater temperature and heat sink temperature
US6280790B1 (en) * 1997-06-30 2001-08-28 Applied Materials, Inc. Reducing the deposition rate of volatile contaminants onto an optical component of a substrate processing system
US5966940A (en) * 1997-11-18 1999-10-19 Micro Component Technology, Inc. Semiconductor thermal conditioning apparatus and method
US6091062A (en) * 1998-01-27 2000-07-18 Kinetrix, Inc. Method and apparatus for temperature control of a semiconductor electrical-test contractor assembly
US6248671B1 (en) * 1998-08-19 2001-06-19 Micron Technology, Inc. Semiconductor processing apparatuses, and methods of forming antireflective coating materials over substrates
US6307388B1 (en) * 2000-02-23 2001-10-23 Unisys Corporation Electromechanical apparatus for testing IC chips using first and second sets of substrates which are pressed together
US6893505B2 (en) * 2002-05-08 2005-05-17 Semitool, Inc. Apparatus and method for regulating fluid flows, such as flows of electrochemical processing fluids
US6857283B2 (en) * 2002-09-13 2005-02-22 Isothermal Systems Research, Inc. Semiconductor burn-in thermal management system
US6768084B2 (en) * 2002-09-30 2004-07-27 Axcelis Technologies, Inc. Advanced rapid thermal processing (RTP) using a linearly-moving heating assembly with an axisymmetric and radially-tunable thermal radiation profile

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20150104876A (ko) * 2014-03-06 2015-09-16 한양대학교 에리카산학협력단 극저온 냉매를 이용한 국부적 저온 챔버

Also Published As

Publication number Publication date
US7304264B2 (en) 2007-12-04
CN1997907A (zh) 2007-07-11
JP4994842B2 (ja) 2012-08-08
US20050224492A1 (en) 2005-10-13
WO2005101040A1 (en) 2005-10-27
JP2007532863A (ja) 2007-11-15

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PA0105 International application

Patent event date: 20061107

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid