KR20060042502A - Device detecting automatically defect of backlight unit using image processing techniques - Google Patents

Abstract

The present invention automatically reduces defects in the backlight unit by automatically inspecting the defects of the backlight unit with a single device that in-line the entire inspection process from the input of the backlight unit to the discharge. The present invention relates to an automatic defect inspection apparatus for a backlight unit using an image processing technology.

Automatic defect inspection apparatus of the backlight unit using the image processing technology according to the present invention, the backlight unit to check whether there are various defects such as foreign matter, white spots, black spots, stains, scratches on the assembled backlight unit to determine whether there is a defect In the automatic defect inspection apparatus of the inlet, the inlet and the outlet is provided on both sides, the main body is formed in the inspection chamber, the guide rail extending through the inlet, the outlet and the inspection chamber of the main body in order to be movable on the guide rail A lighting jig in which the backlight unit is mounted so as to be lit on the upper part, a test jig of the main body, a vertical image acquisition camera for vertically scanning the backlight unit on the jig, and a test jig in the main body, Viewing angle image acquisition car that lines-scans the backlight unit on the lighting jig at a predetermined inclination angle And an image processing and control means installed at the lower part of the main body and detecting the defects of the backlight unit by comprehensively processing the images acquired by the cameras while controlling the cameras respectively, and installed at one side of the main body. And inspection result output means for displaying and outputting a defect of the backlight unit detected by the processing and control means.

Backlight unit, main body, guide rail, lighting jig, camera for acquiring vertical image, camera for acquiring viewing angle image, image processing and control means, inspection result output means

Description

Automatic defect inspection device for backlight unit using image processing technology {DEVICE DETECTING AUTOMATICALLY DEFECT OF BACKLIGHT UNIT USING IMAGE PROCESSING TECHNIQUES}             

1 is a schematic structural diagram of an automatic defect inspection apparatus of a backlight unit according to the present invention.

Figure 2 is an inspection process of the automatic defect inspection apparatus of the backlight unit according to the present invention.

Figure 3 is a detailed view of the lighting jig in the automatic defect inspection apparatus of the backlight unit according to the present invention.

Figure 4 is a detailed view of the iron blower in the automatic defect inspection apparatus of the backlight unit according to the present invention.

5 is a detailed view of a camera for vertical image acquisition in the automatic defect inspection apparatus of the backlight unit according to the present invention.

6 is a detailed view of a camera for obtaining a viewing angle image in an automatic defect inspection apparatus of a backlight unit according to the present invention;

Figure 7a is a front view of the inspection result output means in the automatic defect inspection apparatus of the backlight unit according to the present invention.

7B is a detailed view of a monitor screen.

8a to 8e is an operation of the automatic defect inspection apparatus of the backlight unit according to the present invention.

Explanation of symbols on the main parts of the drawings

1: Automatic defect inspection device of backlight unit

2: Backlight unit 10: Main body

12: laboratory 20: guide rail

30: lighting jig 35: slide unit

40: dust removal roller 50: iron blower

60: camera for acquiring vertical image 70: camera for acquiring viewing angle image

80; Image processing and control means 90: Inspection result output means

100: sound generating means

The present invention relates to an automatic defect inspection apparatus of a backlight unit using an image processing technology, and more particularly, to obtain a vertical image while moving the guide rail in a state where the assembled backlight unit is mounted on a lighting jig. Based on the images obtained by line scanning the entire area of the backlight unit with the camera for viewing and the viewing angle image, the defects such as foreign substances, white spots, black spots, stains, scratches, etc., which may exist on the backlight unit are automatically checked. The present invention relates to an automatic defect inspection apparatus for a backlight unit using an image processing technology, which can greatly reduce the cost and at the same time.

In general, a display unit such as an LCD (Liquid Crystal Display) is used essentially a backlight unit for converting the light from the light source to the plane light, such a backlight unit is a light source for generating light and the light from the light source And a laminated structure including a light guide plate made uniform over the entire area, a reflecting plate reflecting light exiting to the back side of the light guide plate toward the light guide plate, a diffusion plate for diffusing light toward the front side through the light guide plate, and other polarizing plates.

Accordingly, when manufacturing a backlight unit, a reflecting plate, a diffusion plate, a polarizing plate, etc. are stacked on a light guide plate including a light source. In this case, foreign matter may enter between each plate, and stains or scratches may be present on the plate itself. Since the light guide plate, the reflecting plate, the diffusion plate, or the polarizing plate may be stacked, various defects such as foreign matters, white spots, black spots, stains, scratches, etc. are likely to occur in the backlight unit.

Conventionally, such a defect of the backlight unit has been inspected by the naked eye only, and this visual inspection not only takes a lot of inspection time but also has a problem of lowering productivity due to an increase in labor costs by many inspection personnel.

In addition, the visual inspection is not only accurate inspection can not be made by causing fatigue in the eyes of the inspector, there was a problem that the error of the inspection standard is generated by the difference in visibility between the inspectors.

Therefore, an object of the present invention is to reduce the inspection time and at the same time by automatically inspecting the defect of the backlight unit with a single device in-line the entire inspection process from the input of the backlight unit to the discharge It is to provide an automatic defect inspection apparatus of a backlight unit using an image processing technology to reduce the cost and improve productivity.

It is also an object of the present invention to obtain a vertical image and a viewing angle image simultaneously through line scanning, so that defects of the backlight unit can be inspected more accurately than visual inspection according to the same inspection criteria. It is to provide a defect inspection apparatus.

The above object of the present invention,

In the defect inspection apparatus of the backlight unit to determine whether there are various defects such as foreign matter, white spots, black spots, stains, scratches on the assembled backlight unit to determine whether there is a defect,

An inlet and an outlet at both sides thereof, and a body in which an examination room is formed;

A guide rail extending through the inlet, the examination room, and the outlet of the main body;

A lighting jig movably installed on the guide rail and having a backlight unit mounted thereon so as to be lit;

A vertical image acquisition camera installed in the inspection room of the main body and vertically scanning the backlight unit on the lighting jig;

A viewing angle image acquisition camera installed in the inspection chamber of the main body and configured to line scan the backlight unit on the lighting jig at a predetermined inclination angle;

An image processing and control means installed at the lower part of the main body and controlling the cameras respectively and simultaneously processing the images acquired by the cameras to detect defects of the backlight unit; And

 And an inspection result output means for displaying and outputting a defect of the backlight unit detected by the image processing and control means, installed on one side of the main body. By providing.

According to a preferred feature of the present invention, a dust removal roller for automatically or manually removing dust on the backlight unit attached to the lighting jig is provided outside the inlet of the main body.

According to a more preferable feature of the present invention, an inside blower is provided with an ion blower inside the inlet of the main body, which blows air containing ions onto the backlight unit mounted to the lighting jig to suppress the generation of static electricity.

According to a more preferred feature of the invention, the above-described inspection chamber of the main body is provided with sound generating means for instructing the operator through the sound whether the entry and exit of the backlight unit.

According to a further preferred feature of the invention, the above-mentioned vertical image acquisition camera is formed to be adjustable height.

According to a further preferred feature of the present invention, the above-mentioned vertical image acquisition camera, the upper plate fixed in the upper part in the examination room, the lower plate connected to the upper plate by both guides, rotatably installed on both plates A ball screw, a bracket fixed on the ball screw and installed to be movable up and down along the guides on both sides, a CCD line scanning camera fixed to the bracket, and fixed on the upper plate to rotate the ball screw. And a driver for adjusting the height of the fixed CCD line scanning camera.

According to a still further preferred feature of the present invention, the viewing angle of the camera for acquiring the viewing angle image is 40 degrees to 45 degrees.

According to a further preferred feature of the invention, the above-described viewing angle image acquisition camera is formed to be adjustable in height and angle.

According to a further preferred feature of the present invention, the above-described viewing angle image acquisition camera, the upper plate fixed to the upper in the examination room, the lower plate connected to the upper plate by both guides, rotatably installed on both plates A ball screw to be fixed, a first bracket fixed on the ball screw to be installed to move up and down along the guides on both sides, a second bracket fixedly adjustable to the first bracket, and a CCD line fixed to the second bracket. A scanning camera and a driving unit for adjusting the height of the CCD line scanning camera fixed to the second bracket by rotating the ball screw is fixed on the upper plate.

According to a further preferred feature of the present invention, the third bracket is fixed to the above-described second bracket to which the reverse polarizer plate for the polarizing plate laminated on the backlight unit can be selectively fixed.

According to a further preferred feature of the present invention, the above-described inspection result output means includes a monitor which collectively displays the detected defect of the backlight unit, and a printer which outputs the detected defect of the backlight unit as a printed matter.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings, which are intended to describe in detail enough to be easily carried out by those skilled in the art to which the present invention pertains. This does not mean that the technical spirit and scope of the present invention is limited.

1 shows a schematic structural diagram of an automatic defect inspection apparatus 1 of a backlight unit according to the present invention.

As shown in FIG. 1, the automatic defect inspection apparatus 1 of the backlight unit according to the present invention has various defects such as foreign matters, white spots, black spots, stains, and scratches on the backlight unit 2 for a display apparatus such as an LCD. The main body 10 and the main body 10 having an inlet 13 and an outlet 14 on both sides, and an examination room 12 formed therein, by automatically checking whether the product is defective or not. A guide rail 20 extending through the inlet 13, the inspection chamber 12, and the outlet 14 in order, and movably installed on the guide rail 20, and a backlight unit 2 at the top thereof. It is installed outside the lighting jig 30 and the inlet 13 of the main body 10 which is mounted to enable lighting, and removes dust on the backlight unit 2 mounted on the lighting jig 30 automatically or manually. The back roller is installed inside the inlet of the roller 40 and the main body 10, and is attached to the lighting jig 30. An iron blower 50 which suppresses the generation of static electricity by injecting air containing ions onto the eat unit 2 and the back light unit 2 on the lighting jig 30 are installed in the inspection chamber 12 of the main body 10. ) Is installed in the vertical image acquisition camera 60 and the inspection chamber 12 of the main body 10, and the line-of-view of the backlight unit 2 on the jig 30 at a predetermined inclination angle. It is installed at the lower part of the image acquisition camera 70 and the main body 10, and controls the cameras 60 and 70, respectively, and simultaneously processes the images acquired by the cameras 60 and 70 in the backlight. The image processing and control means 80 for detecting a defect of the unit 2 and the outlet side of the main body 10 are provided, and the defect of the backlight unit 2 detected by the image processing and control means 80 is detected. In the inspection chamber 12 of the main body 10 and the inspection result output means 90 for displaying and outputting, the backlight unit 2 Includes a sound generating means (100) indicating whether the sound input through the defect and whether or not the operator.

The automatic defect inspection apparatus 1 of the backlight unit according to the present invention described above automatically inspects various defects of the backlight unit 2 for a display apparatus through a series of processes, and this inspection process is illustrated in FIG. 2.

As shown in FIG. 2, the inspection process by the automatic defect inspection device 1 of the backlight unit includes a process of mounting the assembled backlight unit 2 on the lighting jig 30 in the production line, and the lighting jig 30. By connecting the backlight unit 2 to the electrical connection member on the light), removing the dust on the backlight unit 2 with the dust removing roller 40, and lighting by the ion blower 50 The process of suppressing the generation of static electricity on the backlight unit 2, the process of line scanning the backlight unit 2 with the vertical image acquisition camera 60 and the viewing angle image acquisition camera 70, the image processing the line scanning results And a process of inspecting whether a defect exists on the backlight unit 2 and a process of outputting a test result through the test result output means 90.

The main body 10 forms a frame of the automatic defect inspection apparatus 1 of the backlight unit according to the present invention. The main body 10 is placed on the bottom so as to be horizontally adjustable, and the image processing and control means 80 therein. ) Is the base 11 is accommodated, and the test chamber 12 is formed integrally on the base 11 and the coupling inspection of the backlight unit 2 is performed. On both sides of the examination room 12, the inlet 13 and the outlet 14 for the entry and exit of the backlight unit 2 is formed, the lower portion of the main body 10 is provided with a horizontal adjusting member 15 and the caster 16. ..

The test chamber 12 of the main body 10 is penetrated by the guide rail 20. The guide rail 20 forms a moving path of the lighting jig 30 in which the backlight 2 is mounted. The lighting jig 30 mounted with (2) extends through the inlet 13, the test chamber 12, and the outlet 14 in order to move through the test chamber 12. The guide rail 20 is formed to engage both sides of the lower surface of the lighting jig 30 (see FIG. 3).

The lighting jig 30 mounted with the backlight 2 is movable on the guide rail 20 described above, and FIG. 3 shows a detailed view of the lighting jig 30.

As shown in FIG. 3, the lighting jig 30 is engaged with the guide rails 20 at both sides of the lower surface thereof, and a slide unit 35 such as a known toothed belt drive is formed at the center of the lower surface thereof. As it is fixed, it is installed to be moved back and forth along the guide rails 20, and an upper end of the engaging jaw 31 on which the back light unit 2 is seated, and an elastic support supporting the lower surface of the backlight unit 2; 32 is provided, and one side is provided with a printed circuit board 33 for turning on the backlight unit 2.

The conveying speed of the lighting jig 30 by the slide unit 35 can be adjusted according to the specifications of the backlight unit 2, it is preferably adjusted to take a test time of 6 seconds to 9 seconds per backlight unit (2). .

Since the backlight unit 2 mounted on the above-described lighting jig 30 may have dust attached to its upper surface during transfer, it is necessary to remove dust before entering the inspection chamber 12. Outside the inlet 13 of 10), it is preferable that a dust removal roller 40 for automatically or manually removing dust on the backlight unit 2 mounted on the lighting jig 30.

Since the roller 40 is rotatably installed in the frame having the handle, the worker grips the handle and pushes the upper surface of the backlight unit 2 with the roller to manually remove the dust on the backlight unit 2. It may be configured to remove the, in accordance with an embodiment is rotatably installed at a predetermined height of the inlet (13) is automatic through the contact rotation with the upper surface of the backlight unit (2) during the automatic transfer of the lighting strip (30) It may be configured to remove the dust on the backlight unit (2).

The backlight unit 2 needs to suppress the generation of static electricity prior to line scanning as static electricity is generated when the backlight unit 2 is turned on. To this end, the backlight unit 2 is mounted on the lighting jig 30 inside the inlet 13 of the main body 10. It is preferable that the iron blower 50 which blows air containing ions on the backlight unit 2 to suppress the generation of static electricity is provided.

As shown in FIG. 4, the iron blower 50 is hinged on both sides of the bracket 51 fixed to the inside of the inlet 13 of the main body 10 so as to be adjustable in angle. An ion generator (not shown) for generating ions for and a blowing fan 52 for blowing are provided.

The backlight unit 2 whose static electricity is suppressed by the above-described iron blower 50 is penetrated to the entire area by the vertical image acquisition camera 60 and the viewing angle image acquisition camera 70 while passing through the examination room 12. Line-scanned across, FIG. 5 shows a detailed view of a camera 60 for vertical image acquisition.

The vertical image acquisition camera 60 obtains a vertical image by line scanning at a 90 degree angle with respect to the backlight unit 2, and as shown in FIG. 5, the upper plate fixed to the upper part in the examination room 12. 61, a lower plate 62 connected to the upper plate 61 by both side guides 63, a ball screw 64 rotatably installed at the center of both plates 61 and 62, and a ball. A bracket 65 fixed on a screw 64 and installed to be movable up and down along both guides 63, a CCD line scanning camera 66 fixed to the bracket 65, and an upper plate 61. It is fixed to the drive screw 67 includes a driving unit 67 for adjusting the height of the CCD line scanning camera 66 fixed to the bracket 65 as the ball screw 64 rotates.

Two CCD line scanning cameras 66 are preferably provided at both sides to enable line scanning of the entire width of the backlight unit 2, and the driving unit 67 is a gear operated by manual rotation of the handle 67a. It is preferable that the box 67b has a structure for rotating the ballscrew 64. According to an embodiment, although the worm gear coupled to the rotation shaft of the motor rotates the ballscrew 64, the box 67b may rotate. It may be.

Therefore, when the handle 67a is manually rotated, the ball screw 64 is rotated by the gearbox 67b, and when the ball screw 64 is rotated, the bracket 65 and the CCD line fixed thereto are fixed. The scanning camera 66 can be moved up and down along the guides 63 on both sides of the ball screw 64, so that the height of the vertical image acquisition camera 60 is properly adjusted according to the specifications of the backlight unit 2 to be inspected. It becomes possible.

Since the backlight unit 2 is formed by stacking a light guide plate, a reflecting plate, a diffusion plate, and a polarizing plate, only the vertical image accurately locates various defects such as foreign matter, white spots, black spots, stains, and scratches on the backlight unit 2. In the automatic defect inspection apparatus 1 of the backlight unit according to the present invention can not be detected, the viewing angle image acquisition camera 70 is used together with the vertical image acquisition camera 60, Figure 6 is such a viewing angle image acquisition camera A detailed view of 70 is shown.

The viewing angle image acquisition camera 70 acquires a viewing angle image by diagonally scanning the backlight unit 2 at a predetermined angle with respect to the backlight unit 2, similarly to looking at the backlight unit 2 with the naked eye. As described above, the upper plate 71 fixed to the upper part in the examination room 12, the lower plate 72 connected to the upper plate 71 by both guides 73, and the plates 71 and 72. A ball screw 74 rotatably installed in the center, a first bracket 75 fixed to the ball screw 74 and installed to be moved up and down along the guides 73 on both sides, and a first bracket 75 The second bracket 76 is fixed to the angle adjustable), the CCD line scanning camera 77 is fixed to the second bracket 76, and is fixed on the upper plate 71 to rotate the ball screw 74 CCD line scanning camera 77 fixed to second bracket 76 as desired. And a driving unit 78 for adjusting the height.

The viewing angle of the camera 70 for acquiring an image is preferably 40 degrees to 45 degrees, and particularly 42 degrees to best distinguish various defects such as foreign matter, white spots, black spots, stains, and scratches on the backlight unit 2. Do.

An arc groove 76a is formed at an end portion of the second bracket 76 fixed to the first bracket 75, and the second bracket 76 penetrates the arc groove 76a to allow the first bracket 75 to pass through. An angle adjustment is fixed to the first bracket 75 by a fastening member 76b fastened to the first bracket 75.

Two CCD line scanning cameras 77 are preferably provided at both sides to enable line scanning of the entire width of the backlight unit 2, and the driving unit 78 is a gear operated by manual rotation of the handle 78a. It is preferable that the box 78b has a structure for rotating the ball screw 74. According to an embodiment, although the worm gear coupled to the rotating shaft of the motor rotates the ball screw 74, the box screw may be rotated. It may be.

Therefore, when the handle 78a is manually rotated, the ball screw 74 is rotated by the gearbox 78b, and when the ball screw 74 is rotated, the first bracket 75 and the second bracket ( 76) and the CCD line scanning camera 77 fixed thereto can be moved up and down along the guides 73 on both sides of the ball screw 74, so as to obtain a viewing angle image according to the specifications of the backlight unit 2 to be inspected. The height of the camera 70 can be adjusted appropriately.

Further, after loosening the fastening member 76b, the second bracket 76 is rotated with respect to the first bracket 75 at an angle along the arc-shaped groove 76a, and then the fastening member 76b is fixed again. According to the specification of the backlight unit 2 to be inspected, it is possible to appropriately adjust the angle of the viewing angle image acquisition camera 70.

When a predetermined polarizing plate is stacked on the backlight unit 2, line scanning by the viewing angle image acquisition camera 70 may not be performed properly. Thus, the aforementioned second bracket 76 may include a polarizing plate laminated to the backlight unit 2. It is preferred that a third bracket 79 is secured to which the reverse polarizer plate can be selectively fixed.

The base 11 of the main body 10 is accommodated in the image processing and control means 80, the image processing and control means 80 is a vertical image acquisition camera 60 and a viewing angle image acquisition camera 70 Control the line scanning operation of the control panel) and simultaneously process the images acquired by the vertical image acquisition camera 60 and the viewing angle image acquisition camera 70 to detect defects in the backlight unit 2. Each computer 81 controls the line scanning operation of the vertical image capturing camera 60 and the viewing angle image capturing camera 70 and processes the line scanning result to obtain an image, and the computers 81. A server 82 for comprehensively processing the image processing result transmitted by the server and providing the test result output means to be described later, and a hub 83 connecting the respective computers 81 and the server 82 to each other. Include.

Image processing by the image processing and control means 80 obtains vertical and viewing angle images through line scanning by the respective cameras 60 and 70, and after cutting the obtained image, the pixels ( Various defects of the backlight unit 2 are recognized through comparison of gray between pixels, and then predetermined image processing software is used to display various kinds of combinations, positions, and the like.

The image processing result by the above-described image processing and control means 80 is displayed by the inspection result output means 90, and FIG. 7A shows an installation state diagram of the inspection result output means 90. As shown in FIG.

As shown in FIG. 7A, the inspection result output means 90 is installed at the outlet side of the main body 10 to visually display and display a defect of the backlight unit 2 detected by the image processing and control means 80. A monitor 91 which is rotatably installed at a top of the exit side of the main body 10 by a predetermined pivoting means 91a and displays the result of image processing by the server 82 on the screen; It is installed below the 91 and includes a printer 92 for outputting the results processed by the server 82 on the printing paper.

As shown in FIG. 7B, the monitor 91 connected to the server 82 indicates which defects are present in which part on the backlight unit 2, whether the backlight unit 2 is defective or not, and the like. This display state can be printed through the printer 92.

In the test chamber 12 of the main body 10 is provided with sound generating means 100 for instructing the operator whether the entry and exit of the backlight unit 2 through a sound such as a buzzer, a warning sound, for example. It is preferable.

8A to 8E show an operation diagram of the automatic defect inspection apparatus 1 of the backlight unit according to the present invention.

8A to 8E, the overall operation of the automatic defect inspection apparatus 1 of the backlight unit according to the present invention described above is as follows:

When the assembled backlight unit 2 in the production line is transferred to the automatic defect inspection device 1 of the backlight unit by a transportation means (not shown) such as a conveyor, the operator turns on the jig (as shown in FIG. 8A). After mounting the backlight unit 2 on the 30, the backlight unit 2 is connected to the printed circuit board 33 of the lighting jig 30 to be turned on.

Since dust or the like may be attached to the upper surface of the backlight unit 2 mounted on the lighting jig 30, as shown in FIG. 8B, the dust removal roller 40 before entering the inspection chamber 12. Dust on the backlight unit 2 is removed automatically or manually.

When the lighting jig 30 mounted with the lit backlight unit 2 enters the examination room 12 along the guide rail 20, a predetermined sound for informing the other worker of the start of the sound is generated by the sound generating means 100. Is caused by.

Since the backlight unit 2 generates static electricity by lighting, the backlight unit 2 mounted on the lighting jig 30 enters the examination room 12 through the entrance 13 as shown in FIG. 8C. As soon as the air containing the ion particles is blown on the backlight unit 2 by the iron blower 50 provided inside the inlet 13, the generation of static electricity on the backlight unit 2 is suppressed.

While the lighting jig 30 mounted with the lit backlight unit 2 is transported in the examination room 12 along the guide rail 20, the backlight unit 2 on the lighting jig 30 is shown in FIG. 8D. As described above, the line is vertically scanned by the vertical image acquisition camera 60, and the line is scanned by the viewing angle image acquisition camera 70 at a predetermined tilt angle.

As the line scanning results of the cameras 60 and 70 are processed by the image processing and control means 80 according to a predetermined software, various kinds of foreign matters, white spots, black spots, spots, scratches, etc. on the backlight unit 2 are generated. It is detected whether a defect exists, and at the time of detecting the defect, a predetermined sound such as a buzzer is generated by the sound generating means 100.

When line scanning is completed over the entire area of the backlight unit 2, as shown in FIG. 8E, the backlight unit 2 mounted on the lighting jig 30 is moved out of the examination room 12 through the exit 14. At the same time, a predetermined sound is generated by the sound generating means 100 informing the operator of the completion of the inspection, and what defect is present in which part and how much is present on the backlight unit 2 of the monitor 91. As it is displayed on the screen and the result is output through the printer 92, the operator determines whether there is a failure of the backlight unit 2 through this.

Therefore, according to the automatic defect inspection apparatus of the backlight unit using the image processing technology according to the present invention, the defect of the backlight unit can be automatically detected within a few seconds with one device inlining the entire inspection process from the input of the backlight unit to the discharge. Since the inspection can be performed, the inspection time can be much shorter than that of the conventional visual inspection, and the labor cost required for the employment of the inspector can be reduced.

In addition, the vertical unit and the viewing angle image can be simultaneously acquired through line scanning, and defects of the backlight unit can be inspected through image processing according to a predetermined software. There is an advantage to inspecting for defects.

In addition, by visually recognizing a defect of the backlight unit through a monitor and a printer, and at the same time by acoustic recognition through the sound generating means, it is much easier to determine the defective backlight unit.

Claims (11)

In the defect inspection apparatus of the backlight unit to determine whether there are various defects such as foreign matter, white spots, black spots, stains, scratches on the assembled backlight unit to determine whether there is a defect, An inlet and an outlet at both sides thereof, and a body in which an examination room is formed; A guide rail extending through the inlet, the examination room, and the outlet of the main body in order; A lighting jig movably installed on the guide rail and having a backlight unit mounted thereon so as to be lit; A vertical image acquisition camera installed in the inspection chamber of the main body and vertically scanning the backlight unit on the lighting jig; A viewing angle image acquisition camera installed in the inspection chamber of the main body and configured to line scan the backlight unit on the lighting jig at a predetermined inclination angle; Image processing and control means installed at the lower part of the main body and controlling the cameras respectively and simultaneously processing the images acquired by the cameras to detect defects in the backlight unit; And And inspection result output means installed on one side of the main body and displaying and outputting a defect of the backlight unit detected by the image processing and control means. Device. The method of claim 1, The outside of the entrance of the main body, the automatic defect inspection apparatus of the backlight unit using an image processing technology, characterized in that the dust removal roller for automatically or manually removing the dust on the backlight unit mounted on the lighting jig. The method of claim 2, Inside the inlet of the main body, there is provided an iron blower to suppress the generation of static electricity by blowing air containing ions on the backlight unit mounted on the lighting jig, automatic defect of the backlight unit using the image processing technology Inspection device. The method of claim 3, wherein And a sound generating means for instructing the operator of whether the backlight unit is in or out of the backlight unit by sound in the inspection chamber of the main body. The method according to any one of claims 1 to 4, The vertical image acquisition camera is characterized in that the height adjustable, automatic defect inspection apparatus of the backlight unit using the image processing technology. The method of claim 5, wherein The vertical image acquisition camera includes an upper plate fixed to an upper portion in the examination room, a lower plate connected to the upper plate by both guides, a ball screw rotatably installed on both plates, and the ball screw. A bracket fixed to the top to be movable up and down along the two guides, a CCD line scanning camera fixed to the bracket, and a CCD fixed to the bracket as the ball screw is fixed on the upper plate to rotate the ball screw. An automatic defect inspection apparatus of a backlight unit using an image processing technology, characterized in that it comprises a driving unit for adjusting the height of the line scanning camera. The method according to any one of claims 1 to 4, The viewing angle of the camera for acquiring the viewing angle image is characterized in that 40 degrees to 45 degrees, automatic defect inspection apparatus of the backlight unit using the image processing technology. The method according to any one of claims 1 to 4, The viewing angle image acquisition camera is characterized in that the height adjustment and the angle adjustable, automatic defect inspection apparatus of the backlight unit using the image processing technology. The method of claim 8, The camera for acquiring the viewing angle image includes: an upper plate fixed to an upper portion of the examination room, a lower plate connected to the upper plate by both side guides, and a ball screw rotatably installed on both plates; A first bracket fixed on a screw to be movable up and down along the guides on both sides, a second bracket fixedly adjustable to the first bracket, a CCD line scanning camera fixed to the second bracket, and And a driving unit fixed on the upper plate to adjust the height of the CCD line scanning camera fixed to the second bracket as the ball screw rotates. Inspection device. The method of claim 9, And a third bracket on which the reverse polarizer is selectively fixed to the second bracket on the polarizing plate stacked on the backlight unit, the apparatus for automatic defect inspection of a backlight unit using an image processing technology. The method according to any one of claims 1 to 4, The inspection result output means includes a monitor for comprehensively displaying the detected defect of the backlight unit, and a printer for outputting the detected defect of the backlight unit as a printed matter, the automatic defect of the backlight unit using the image processing technology. Inspection device.

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