KR200419687Y1 - 평판표시장치의 결함 검사장치 - Google Patents
평판표시장치의 결함 검사장치 Download PDFInfo
- Publication number
- KR200419687Y1 KR200419687Y1 KR2020060009140U KR20060009140U KR200419687Y1 KR 200419687 Y1 KR200419687 Y1 KR 200419687Y1 KR 2020060009140 U KR2020060009140 U KR 2020060009140U KR 20060009140 U KR20060009140 U KR 20060009140U KR 200419687 Y1 KR200419687 Y1 KR 200419687Y1
- Authority
- KR
- South Korea
- Prior art keywords
- flat panel
- panel display
- display device
- color filter
- defect
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Analytical Chemistry (AREA)
- Geometry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Optics & Photonics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2020060009140U KR200419687Y1 (ko) | 2006-04-06 | 2006-04-06 | 평판표시장치의 결함 검사장치 |
TW096100961A TWI409529B (zh) | 2006-04-06 | 2007-01-10 | 用以檢查平面顯示器上的缺陷之裝置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2020060009140U KR200419687Y1 (ko) | 2006-04-06 | 2006-04-06 | 평판표시장치의 결함 검사장치 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR200419687Y1 true KR200419687Y1 (ko) | 2006-06-23 |
Family
ID=44482015
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2020060009140U KR200419687Y1 (ko) | 2006-04-06 | 2006-04-06 | 평판표시장치의 결함 검사장치 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR200419687Y1 (zh) |
TW (1) | TWI409529B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20150139103A (ko) * | 2014-06-02 | 2015-12-11 | 삼성디스플레이 주식회사 | 검사장치 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5958808B2 (ja) * | 2012-06-04 | 2016-08-02 | 株式会社Joled | 表示パネルの製造方法、その検査装置及び検査方法 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE69330709T2 (de) * | 1992-12-28 | 2002-07-11 | Canon K.K., Tokio/Tokyo | Blickrichtungsdetektor und Kamera mit diesem Detektor |
TWM261685U (en) * | 2004-06-15 | 2005-04-11 | Hirose Tech Co Ltd | Defect-detecting equipment of glass substrate disposed with polarizer thereon |
-
2006
- 2006-04-06 KR KR2020060009140U patent/KR200419687Y1/ko not_active IP Right Cessation
-
2007
- 2007-01-10 TW TW096100961A patent/TWI409529B/zh active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20150139103A (ko) * | 2014-06-02 | 2015-12-11 | 삼성디스플레이 주식회사 | 검사장치 |
KR102200691B1 (ko) * | 2014-06-02 | 2021-01-13 | 삼성디스플레이 주식회사 | 검사장치 |
Also Published As
Publication number | Publication date |
---|---|
TWI409529B (zh) | 2013-09-21 |
TW200739187A (en) | 2007-10-16 |
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