KR20040059588A - 디티올 화합물을 이용한 양자점 박막 제조방법 - Google Patents
디티올 화합물을 이용한 양자점 박막 제조방법 Download PDFInfo
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- KR20040059588A KR20040059588A KR1020020085262A KR20020085262A KR20040059588A KR 20040059588 A KR20040059588 A KR 20040059588A KR 1020020085262 A KR1020020085262 A KR 1020020085262A KR 20020085262 A KR20020085262 A KR 20020085262A KR 20040059588 A KR20040059588 A KR 20040059588A
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- South Korea
- Prior art keywords
- quantum dot
- solvent
- quantum dots
- thin film
- substrate
- Prior art date
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- 239000002096 quantum dot Substances 0.000 title claims abstract description 151
- 238000000034 method Methods 0.000 title claims abstract description 58
- -1 Dithiol Compound Chemical class 0.000 title claims abstract description 31
- 239000010409 thin film Substances 0.000 title claims description 30
- 239000002904 solvent Substances 0.000 claims abstract description 51
- 239000002243 precursor Substances 0.000 claims abstract description 30
- 239000000758 substrate Substances 0.000 claims abstract description 24
- 239000004065 semiconductor Substances 0.000 claims abstract description 17
- 239000000126 substance Substances 0.000 claims abstract description 11
- 239000010408 film Substances 0.000 claims description 14
- 238000003618 dip coating Methods 0.000 claims description 11
- 239000011248 coating agent Substances 0.000 claims description 10
- 238000000576 coating method Methods 0.000 claims description 10
- 238000010438 heat treatment Methods 0.000 claims description 9
- 230000002194 synthesizing effect Effects 0.000 claims description 8
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 7
- 229910052737 gold Inorganic materials 0.000 claims description 7
- 239000010931 gold Substances 0.000 claims description 7
- 238000004519 manufacturing process Methods 0.000 claims description 6
- 229910052984 zinc sulfide Inorganic materials 0.000 claims description 6
- 238000001035 drying Methods 0.000 claims description 5
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 claims description 4
- 238000005406 washing Methods 0.000 claims description 4
- 238000006467 substitution reaction Methods 0.000 claims description 3
- 229910004613 CdTe Inorganic materials 0.000 claims description 2
- 229910004262 HgTe Inorganic materials 0.000 claims description 2
- 125000004432 carbon atom Chemical group C* 0.000 claims description 2
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 claims description 2
- 229910007709 ZnTe Inorganic materials 0.000 claims 1
- 229910052950 sphalerite Inorganic materials 0.000 claims 1
- 230000015572 biosynthetic process Effects 0.000 abstract description 12
- 238000003786 synthesis reaction Methods 0.000 abstract description 12
- 238000005649 metathesis reaction Methods 0.000 abstract 2
- 239000006185 dispersion Substances 0.000 description 19
- 238000006243 chemical reaction Methods 0.000 description 13
- 239000000243 solution Substances 0.000 description 13
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 12
- 150000004662 dithiols Chemical class 0.000 description 11
- 239000013078 crystal Substances 0.000 description 10
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 7
- 229910052980 cadmium sulfide Inorganic materials 0.000 description 6
- 238000005119 centrifugation Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 239000003960 organic solvent Substances 0.000 description 5
- 125000004434 sulfur atom Chemical group 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000001556 precipitation Methods 0.000 description 4
- 239000002356 single layer Substances 0.000 description 4
- SRZXCOWFGPICGA-UHFFFAOYSA-N 1,6-Hexanedithiol Chemical compound SCCCCCCS SRZXCOWFGPICGA-UHFFFAOYSA-N 0.000 description 3
- WUPHOULIZUERAE-UHFFFAOYSA-N 3-(oxolan-2-yl)propanoic acid Chemical compound OC(=O)CCC1CCCO1 WUPHOULIZUERAE-UHFFFAOYSA-N 0.000 description 3
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Natural products P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 3
- 239000005083 Zinc sulfide Substances 0.000 description 3
- 150000003973 alkyl amines Chemical class 0.000 description 3
- 238000009835 boiling Methods 0.000 description 3
- 239000011258 core-shell material Substances 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 239000002270 dispersing agent Substances 0.000 description 3
- 238000000295 emission spectrum Methods 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 3
- 229910052717 sulfur Inorganic materials 0.000 description 3
- 238000001308 synthesis method Methods 0.000 description 3
- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 2
- 238000000862 absorption spectrum Methods 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000001246 colloidal dispersion Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 description 2
- 238000001451 molecular beam epitaxy Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 2
- 230000008707 rearrangement Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000003756 stirring Methods 0.000 description 2
- 239000011593 sulfur Substances 0.000 description 2
- RMZAYIKUYWXQPB-UHFFFAOYSA-N trioctylphosphane Chemical compound CCCCCCCCP(CCCCCCCC)CCCCCCCC RMZAYIKUYWXQPB-UHFFFAOYSA-N 0.000 description 2
- MBBWTVUFIXOUBE-UHFFFAOYSA-L zinc;dicarbamodithioate Chemical compound [Zn+2].NC([S-])=S.NC([S-])=S MBBWTVUFIXOUBE-UHFFFAOYSA-L 0.000 description 2
- FGJUEFUBALDIGU-UHFFFAOYSA-N 2-hydroxy-2-sulfanylacetic acid Chemical compound OC(S)C(O)=O FGJUEFUBALDIGU-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- ZOGWUHADSPTOEI-UHFFFAOYSA-L cadmium(2+);dicarbamodithioate Chemical compound [Cd+2].NC([S-])=S.NC([S-])=S ZOGWUHADSPTOEI-UHFFFAOYSA-L 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- GPLRAVKSCUXZTP-UHFFFAOYSA-N diglycerol Chemical compound OCC(O)COCC(O)CO GPLRAVKSCUXZTP-UHFFFAOYSA-N 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 230000005281 excited state Effects 0.000 description 1
- ALPIESLRVWNLAX-UHFFFAOYSA-N hexane-1,1-dithiol Chemical compound CCCCCC(S)S ALPIESLRVWNLAX-UHFFFAOYSA-N 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 239000003446 ligand Substances 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- 238000005232 molecular self-assembly Methods 0.000 description 1
- PJUIMOJAAPLTRJ-UHFFFAOYSA-N monothioglycerol Chemical compound OCC(O)CS PJUIMOJAAPLTRJ-UHFFFAOYSA-N 0.000 description 1
- XTAZYLNFDRKIHJ-UHFFFAOYSA-N n,n-dioctyloctan-1-amine Chemical compound CCCCCCCCN(CCCCCCCC)CCCCCCCC XTAZYLNFDRKIHJ-UHFFFAOYSA-N 0.000 description 1
- 125000001971 neopentyl group Chemical group [H]C([*])([H])C(C([H])([H])[H])(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 238000000103 photoluminescence spectrum Methods 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 238000010791 quenching Methods 0.000 description 1
- 238000010992 reflux Methods 0.000 description 1
- 238000001338 self-assembly Methods 0.000 description 1
- 238000000935 solvent evaporation Methods 0.000 description 1
- 238000012916 structural analysis Methods 0.000 description 1
- 125000004354 sulfur functional group Chemical group 0.000 description 1
- 238000005211 surface analysis Methods 0.000 description 1
- MDDUHVRJJAFRAU-YZNNVMRBSA-N tert-butyl-[(1r,3s,5z)-3-[tert-butyl(dimethyl)silyl]oxy-5-(2-diphenylphosphorylethylidene)-4-methylidenecyclohexyl]oxy-dimethylsilane Chemical compound C1[C@@H](O[Si](C)(C)C(C)(C)C)C[C@H](O[Si](C)(C)C(C)(C)C)C(=C)\C1=C/CP(=O)(C=1C=CC=CC=1)C1=CC=CC=C1 MDDUHVRJJAFRAU-YZNNVMRBSA-N 0.000 description 1
- 125000003396 thiol group Chemical group [H]S* 0.000 description 1
- 150000003573 thiols Chemical group 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
- H01L21/02601—Nanoparticles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02551—Group 12/16 materials
- H01L21/02557—Sulfides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02551—Group 12/16 materials
- H01L21/0256—Selenides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02551—Group 12/16 materials
- H01L21/02562—Tellurides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/122—Single quantum well structures
- H01L29/127—Quantum box structures
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/962—Quantum dots and lines
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Luminescent Compositions (AREA)
- Ceramic Engineering (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
Abstract
Description
Claims (8)
- ⅰ) 단일계 전구체 및 용매를 이용한 화학적 습식방법으로, 용매가 배위된 반도체 양자점을 합성하는 단계, ⅱ) 상기 용매가 배위된 반도체 양자점의 표면을 디티올 화합물로 치환하는 단계, 및 ⅲ) 상기 치환된 양자점을 기판에 코팅 및 가열하여 양자점 박막을 수득하는 단계를 포함하는 양자점 박막의 제조 방법.
- 제 1항에 있어서, 상기 반도체 양자점은 CdSe, CdS, CdTe, ZnSe, ZnS, ZnTe, 또는 HgTe로 이루어진 것을 특징으로 하는 양자점 박막의 제조 방법.
- 제 1항에 있어서, 상기 디티올 화합물은 탄소수가 2 내지 18개인 알칸 디티올인 것을 특징으로 하는 양자점 박막의 제조 방법.
- 제 1항에 있어서, 상기 기판은 금으로 된 표면을 포함하는 것을 특징으로 하는 양자점 박막의 제조 방법.
- 제 1항에 있어서, 상기 코팅은 딥 코팅(dip coating)법을 사용하는 것을 특징으로 하는 양자점 박막의 제조 방법.
- 제 5항에 있어서, 상기 딥 코팅은 ⓐ 표면이 개질된 양자점이 콜로이드 상태로 분산되어 있는 용액에 코팅하고자 하는 기판을 소정의 각도로 잠기도록 하고, 소정의 속도 및 각도로 용액으로부터 끌어올리는 과정 및, ⓑ 기판 상에 코팅된, 약하게 결합한 양자점을 세척(washing)하는 과정, ⓒ 건조 과정, 및 ⓓ 기판을 일정한 온도로 열처리 하는 과정을 포함하는 것을 특징으로 하는 양자점 박막의 제조 방법.
- 제 6항에 있어서, 상기 ⓐ, ⓑ, ⓒ 및 ⓓ 과정을 수회 반복하여 다층의 양자점 막을 형성하는 것을 특징으로 하는 양자점 박막의 제조 방법.
- 제 1항에 따른 방법에 의해 제조된 양자점 박막.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR20020085262A KR100583364B1 (ko) | 2002-12-27 | 2002-12-27 | 디티올 화합물을 이용한 양자점 박막 제조방법 |
Applications Claiming Priority (1)
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KR20020085262A KR100583364B1 (ko) | 2002-12-27 | 2002-12-27 | 디티올 화합물을 이용한 양자점 박막 제조방법 |
Publications (2)
Publication Number | Publication Date |
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KR20040059588A true KR20040059588A (ko) | 2004-07-06 |
KR100583364B1 KR100583364B1 (ko) | 2006-05-25 |
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Family Applications (1)
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KR20020085262A KR100583364B1 (ko) | 2002-12-27 | 2002-12-27 | 디티올 화합물을 이용한 양자점 박막 제조방법 |
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Cited By (9)
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KR100657942B1 (ko) * | 2005-01-05 | 2006-12-14 | 삼성전자주식회사 | 광전 소자 봉지재 및 이를 채용한 태양 전지 모듈 |
KR100678285B1 (ko) * | 2005-01-20 | 2007-02-02 | 삼성전자주식회사 | 발광 다이오드용 양자점 형광체 및 그의 제조방법 |
US7569248B2 (en) | 2004-05-28 | 2009-08-04 | Samsung Electronics Co., Ltd. | Method for preparing multilayer of nanocrystals, and organic-inorganic hybrid electroluminescence device comprising multilayer of nanocrystals prepared by the method |
US8097304B2 (en) | 2006-02-08 | 2012-01-17 | Samsung Electronics Co., Ltd. | Method of forming nano-particle array by convective assembly, and convective assembly apparatus for the same |
US8120010B2 (en) | 2008-11-05 | 2012-02-21 | Samsung Electronics Co., Ltd. | Quantum dot electroluminescent device and method for fabricating the same |
WO2012099410A2 (ko) * | 2011-01-19 | 2012-07-26 | 서강대학교산학협력단 | 제올라이트 내 양자점 또는 양자선의 분산 방법 및 안정화 방법, 및 이에 의한 양자점 또는 양자선-함유 제올라이트 |
KR101176861B1 (ko) * | 2005-01-26 | 2012-08-23 | 삼성전자주식회사 | 발광재료 및 그 제조방법 |
US9287120B2 (en) | 2011-01-19 | 2016-03-15 | Sogang University Research Foundation | Method for dispersing quantum dots or quantum wires in zeolite, method for stabilizing quantum dots or quantum wires in zeolite, and zeolite containing quantum dots or quantum wires dispersed by the method |
KR101687019B1 (ko) | 2015-06-12 | 2016-12-16 | 창원대학교 산학협력단 | 다이티올 화합물을 포함하는 양자점 캡핑 리간드용 조성물, 다이티올-캡핑된 양자점 및 이를 이용한 태양 전지 |
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CN102119119B (zh) * | 2008-06-27 | 2015-06-17 | 叶夫根尼·彼得罗维奇·格列比翁尼科夫 | 纳米复合材料 |
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KR101983426B1 (ko) | 2015-01-23 | 2019-09-11 | 삼성디스플레이 주식회사 | 감광성 수지 조성물 및 표시장치 |
CN107955597A (zh) * | 2016-10-19 | 2018-04-24 | 苏州星烁纳米科技有限公司 | 量子点膜及其应用 |
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2002
- 2002-12-27 KR KR20020085262A patent/KR100583364B1/ko active IP Right Grant
Cited By (14)
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US8440254B2 (en) | 2004-05-28 | 2013-05-14 | Samsung Electronics Co., Ltd. | Method for preparing multilayer of nanocrystals, and organic-inorganic hybrid electroluminescence device comprising multilayer of nanocrystals prepared by the method |
US7569248B2 (en) | 2004-05-28 | 2009-08-04 | Samsung Electronics Co., Ltd. | Method for preparing multilayer of nanocrystals, and organic-inorganic hybrid electroluminescence device comprising multilayer of nanocrystals prepared by the method |
US10920134B2 (en) | 2004-05-28 | 2021-02-16 | Samsung Electronics Co., Ltd. | Method for preparing multilayer of nanocrystals, and organic-inorganic hybrid electroluminescence device comprising multilayer of nanocrystals prepared by the method |
US8188650B2 (en) | 2004-05-28 | 2012-05-29 | Samsung Electronics Co., Ltd. | Method for preparing multilayer of nanocrystals, and organic-inorganic hybrid electroluminescence device comprising multilayer of nanocrystals prepared by the method |
US9598634B2 (en) | 2004-05-28 | 2017-03-21 | Samsung Electronics Co., Ltd. | Method for preparing multilayer of nanocrystals, and organic-inorganic hybrid electroluminescence device comprising multilayer of nanocrystals prepared by the method |
KR100657942B1 (ko) * | 2005-01-05 | 2006-12-14 | 삼성전자주식회사 | 광전 소자 봉지재 및 이를 채용한 태양 전지 모듈 |
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KR101176861B1 (ko) * | 2005-01-26 | 2012-08-23 | 삼성전자주식회사 | 발광재료 및 그 제조방법 |
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WO2012099410A3 (ko) * | 2011-01-19 | 2012-09-20 | 서강대학교산학협력단 | 제올라이트 내 양자점 또는 양자선의 분산 방법 및 안정화 방법, 및 이에 의한 양자점 또는 양자선-함유 제올라이트 |
US9287120B2 (en) | 2011-01-19 | 2016-03-15 | Sogang University Research Foundation | Method for dispersing quantum dots or quantum wires in zeolite, method for stabilizing quantum dots or quantum wires in zeolite, and zeolite containing quantum dots or quantum wires dispersed by the method |
WO2012099410A2 (ko) * | 2011-01-19 | 2012-07-26 | 서강대학교산학협력단 | 제올라이트 내 양자점 또는 양자선의 분산 방법 및 안정화 방법, 및 이에 의한 양자점 또는 양자선-함유 제올라이트 |
KR101687019B1 (ko) | 2015-06-12 | 2016-12-16 | 창원대학교 산학협력단 | 다이티올 화합물을 포함하는 양자점 캡핑 리간드용 조성물, 다이티올-캡핑된 양자점 및 이를 이용한 태양 전지 |
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