KR20030073803A - Method for initializing of index robot in semiconductor test handler - Google Patents

Abstract

PURPOSE: A method for initializing an index device of a semiconductor device test handler is provided to prevent interference phenomenon between index devices during initialization, and thus to perform a smooth initialization operation. CONSTITUTION: According to the method for initializing an index device of a semiconductor device test handler, a plurality of front and rear position sensing sensors(6) are arranged equally in a side part of a test site, and a plurality of up and down position sensing sensors are arranged equally in the front or rear of the test site. The front and rear position sensing sensor and the up and down position sensing sensor sense front and rear position and up and down position of each of the first and the second index device(4,5). Then, an index device control part of a handler determines movement sequence and direction of the first and the second index device on the ground of the positions of the first and the second index device.

Description

Method for initializing an index device of a semiconductor device test handler {Method for initializing of index robot in semiconductor test handler}

The present invention relates to a handler for testing a semiconductor device. In particular, an interference phenomenon between index devices does not occur when initializing index devices that pick up a test target or a tested semiconductor device from a handler's test site and transfer it to a predetermined position. The present invention relates to a method for initializing an index device of a semiconductor device test handler, which enables a smooth initialization without a problem.

In general, semiconductor devices manufactured on a production line are tested to determine whether they are good or defective before shipping. Horizontal handlers are mainly QFP, BGA, PGA, This equipment is used to test various logic semiconductor devices such as SOP, and the semiconductor devices contained in the trays are transferred to the horizontal state between processes, and the test is carried out at test sites arranged horizontally, and then classified into various grades according to the test results. Unloaded into.

At the test site, the semiconductor devices to be tested are mounted in the test sockets and electrically connected, and unloaded to the tray or shuttle waiting for the surroundings after the test is performed for a predetermined time. The indexing device is a device that automatically transfers and mounts the tested semiconductor device of the socket and the test socket to the unloading tray or the unloading shuttle continuously. Two indexing devices are provided for this purpose.

Such an index device is one of the main factors for determining the time required for testing a semiconductor device of a handler. In recent years, the index device minimizes the index time, that is, the time required to transfer and mount the semiconductor device to be tested by the index device to a test socket. The main focus is on development.

However, in the related art, since the loading / unloading positions (positions for picking up and placing semiconductor elements) and the test socket connection positions of the two index apparatuses are generally configured differently, there is no problem in initializing the index apparatus. In the case where the loading / unloading positions and the connection positions of the two index apparatuses are identical, there is a problem such that the index apparatuses interfere with each other and cause collisions during the initialization operation.

That is, as shown in FIG. 1, the buffer shuttle 2 that supplies the semiconductor device to be tested and receives the tested semiconductor device is located at one side of the test site of the handler, and the semiconductor device is electrically connected to the opposite side thereof. The test socket (3) for performing the operation is located, the two first index device (4) and the second index device (5) the semiconductor shuttle while alternately reciprocating between the buffer shuttle (2) and the test socket (3) When the device is configured to be transported, the first index device 4 when the test operation is interrupted by some factor and the handler is initialized, that is, when the first and second index devices 4 and 5 are sent to any position of the test site. ) And the second index device 5 interfere with each other.

Accordingly, the present invention has been made to solve the above problems, so that when the index device is initialized, the index device controller of the handler automatically recognizes the positions of the index devices so that the movement order and direction of each index device can be designated. The present invention relates to a method of initializing an index device of a semiconductor device test handler, which prevents interference between index devices during initialization and thereby enables a smooth initialization operation.

1 is a plan view schematically showing the configuration of a test site in which the indexer of a conventional handler is installed;

FIG. 2 is a schematic view showing the side configuration of the test site and the operation of the indexing apparatus of FIG.

3 is a side configuration diagram of a test site to which an index device initialization method according to the present invention is applied;

4 is a plan view of the test site of FIG.

5 is a front configuration diagram of the test site of FIG.

6 is a flowchart illustrating a method of initializing an index device according to the present invention.

Explanation of symbols on the main parts of the drawings

1: base plate 2: buffer shuttle

3: test socket 4: first index device

4a, 5a: sensor detection dog 5: the second index device

6: Front and rear position sensor 7: Up and down position sensor

In order to achieve the above object, the present invention is provided with a buffer shuttle for supplying a semiconductor device to be tested in the front and a tested semiconductor device, and a test socket for performing a test by connecting the semiconductor device to the rear, At the test site of the handler, the first index device and the second index device alternately reciprocate between the buffer shuttle and the upper side of the test socket to load and unload the semiconductor element into the buffer shuttle and the test socket. In the method of initializing a two-index apparatus, a plurality of front and rear position detection sensors are arranged at equal intervals in the front and rear direction at the side portions of the test site, and the plurality of vertical position detection sensors in the vertical direction at the front or rear of the test site. Disposing at equal intervals; Sensing front and rear and up and down positions of each of the first and second index apparatuses using the front and rear position sensors and the vertical position sensors; Determining the movement order and the direction of the first and second index devices in the handler of the index device based on the positions of the first and second index devices detected in the step. Provides an index device initialization method.

Hereinafter, with reference to the accompanying drawings will be described in detail a preferred embodiment of the initialization method of the index apparatus according to the present invention.

3 to 5 show the configuration of a test site of a handler to which the index device initialization method according to the present invention is applied, and FIG. 6 is a flowchart showing the index device initialization method of the present invention.

First, as shown in FIGS. 3 to 5, a buffer shuttle 2 that receives a semiconductor device to be tested from the front of the handler and supplies it to the test site and receives the tested semiconductor device to the front of the handler is located in front of the test site. The test socket 3 is located at the rear of the test site for electrically connecting the semiconductor devices to perform a test for a predetermined time.

Then, the bases 1 are vertically opposite to both sides of the test site, and each base 1 picks up the semiconductor element while alternately reciprocating between the buffer shuttle 2 and the test socket 3. The first index device 4 and the second index device 5, which are transferred to the buffer shuttle 2 and the test socket 3, are horizontally and vertically movable.

On the other hand, a plurality of front and rear position detecting sensors 6 before and after the base 1 to detect the front and rear positions of the first index device 4 and the second index device 5 above each base 1. Are disposed at equal intervals in the direction, and a plurality of vertical position detecting sensors 7 are provided at the front of each base 1 to detect the vertical position of the first and second index devices 4 and 5. Are arranged at equal intervals in the vertical direction.

Then, the sensor detecting dog 4a which is detected by the front and rear / up and down position detecting sensors 6 and 7 on one side of the first and second index apparatuses 4 and 5, that is, the surface facing the base 1. 5a) is installed.

The front and rear position detecting sensors 6 are arranged at intervals of a size smaller than or equal to the width of the sensor detecting dogs 4a and 5a, and the upper and lower position detecting sensors 7 of the sensor detecting dogs 4a and 5a. At least one of the front and rear and top and bottom position detection sensors 6 and 7 may be disposed at intervals of the same or smaller size than the height, so that the first and second index devices 4 and 5 may be located at the test site. It can be detected by

Therefore, when the position of the first and second index devices 4 and 5 is recognized by the position detection sensors 6 and 7 configured at the test site as described above, the detection signal is transmitted to the first and second index devices of the handler. 4, 5 is transmitted to a control unit (not shown), and the control unit determines the movement order by determining the positions of the first and second index apparatuses 4 and 5 based on the detection signal transmitted during the initialization operation. .

For the sake of understanding, the initialization of the handler will be described in more detail. In the initial operation of the handler, the first and second index apparatuses 4 and 5 are located together above the buffer shuttle 2 at the front end of the test site. When the test operation is started, the first and second index devices 4 and 5 sequentially transfer the semiconductor elements of the buffer shuttle 2 to the test socket 3 to perform the test. If the test operation is to be stopped after the test operation is stopped due to such factors, it is necessary to perform an initialization operation to send all the components of the handler, including the first and second index devices 4 and 5, to the handler driving initial position.

By the way, for example, when performing the initialization operation after the first and second index devices 4 and 5 are stopped at the position as shown in FIG. When the position of 5) is not recognized, if the control unit commands the first index device 4 to move first, the first index device 4 moves and collides with the second index device 5. .

However, according to the present invention, the first index device 4 is characterized in that the sensor detecting dog 4a is detected by the second sensor 62 and the third sensor 63 among the front and rear position detecting sensors 6. At the same time, the first and second position detection sensors 7 are detected by the first sensor 71, and the second index device 5 has its sensor detecting dog 5a as the fourth sensor among the front and rear position detection sensors 6. As detected by the 64 and at the same time by the third sensor 73 of the up and down position sensors 7, the controller of the handler, the information transmitted by these front and rear and up and down position sensors 6, 7 After determining the positions of the first and second index apparatuses 4 and 5, the second index apparatus 5 is first sent to the initial position, that is, the test site forward position, and the first index apparatus 4 is then moved to the initial working height. As you move upward, you will move to the initial position in front of the test site.

As described above, according to the present invention, since the initialization operation is performed by automatically recognizing the position of the index devices in the test site, the index devices do not interfere with each other during the initialization operation, thereby ensuring a smooth initialization process. Damage to the equipment can be prevented.

Claims (2)

A buffer shuttle for supplying a semiconductor device to be tested and receiving a tested semiconductor device is provided in the front, and a test socket for connecting and testing the semiconductor device is provided in the rear, and the first index device and the second index device are provided in the buffer. A method of initializing the first and second index devices at a test site of a handler configured to load and unload a semiconductor device into a buffer shuttle and a test socket while alternately reciprocating between a shuttle and an upper side of a test socket, Arranging the plurality of front and rear position detection sensors at equal intervals in the front and rear direction at the side portions of the test site, and disposing the plurality of vertical position detection sensors at equal intervals in front of or behind the test site at equal intervals; Sensing front and rear and up and down positions of each of the first and second index apparatuses using the front and rear position sensors and the vertical position sensors; Determining the movement order and the direction of the first and second index devices in the handler of the index device based on the positions of the first and second index devices detected in the step. How to initialize the index device. According to claim 1, wherein the first and second index device is provided with a sensor sensing dog (dog) detected by the respective position sensing sensors (dog), the front and rear position sensing sensor is the width of the sensor sensing dog Smaller or equal intervals are disposed, the vertical position detection sensor indexing device initialization method of the semiconductor device test handler, characterized in that arranged at intervals less than or equal to the height of the sensor detection dog.