KR200264548Y1 - socket apparatus for testing - Google Patents

Abstract

The present invention relates to a socket device, which is installed on the base circuit board, the lower base plate 100 is formed in the longitudinal direction of the probe coupling hole 101 at equal intervals and the flow prevention jaw 150 in the lower direction; An alignment pin 110 formed on an upper surface of the lower base plate 100; A coupling hole (not shown) is formed from the lower side to the upper side and is inserted into the alignment pin 110 to be coupled to the upper surface of the lower base plate 100, and the probe coupling hole 101 of the lower base plate 100 is formed. An upper base plate 120 formed at equal intervals between the probe coupling holes 101 communicating with each other and having a flow preventing jaw 150 formed in the probe coupling holes 101 in an upward direction; A probe 130 inserted into the communication probe coupling hole 101 of the lower base plate 100 and the upper base plate 120 and having a flow pin 131 elastically moving up and down at both ends; A housing which is formed integrally with the upper base plate 120 so as to protrude from the upper surface of the upper base plate 120 and communicates with the probe coupling hole 101 is formed to support the adjacent end portion of the probe 130. The chip inspection socket device is configured to include a 140; Accordingly, there is an advantage that the reliability of the test is improved by the flow of the pins of the probe during the chip test, and the test pins are uniformly contacted, thereby preventing the left and right flow of the probe accommodated in the socket, thereby making the test stable.

Description

Socket apparatus for testing

The present invention relates to a socket device, and more specifically, a bidirectional flow probe is installed to minimize the contact distance between the test object and the base circuit board, and when the test object is contacted by the contact pressure, the probe is compressed by a predetermined pressure The present invention relates to a socket inspection socket device which prevents damage to a contact terminal.

In general, a printed circuit board (PCB) is an electronic component in which a plurality of chips are mounted on a plate surface and these chips are connected by a connection bus formed on the plate surface. Each of these chips can perform various functions, and electrical signals can be transmitted to each chip through a bus. A chip made of such a high density integrated circuit board is a high density integrated micro chip, and the micro chip is mounted on an electronic product to play an important role in determining the performance of the product.

Therefore, it is necessary to inspect by the inspection apparatus to confirm whether the microchip of the electronic product is in a normal state. In order to perform such an inspection, an inspection probe device is employed, and many inspection probe devices are mounted and used in an inspection socket device.

The conventional inspection socket device is introduced under the title of the semiconductor test connector in the Republic of Korea Patent Office Utility Model Registration Number No. 122164.

In the prior art, as shown in FIG. 1 or 2, a plurality of insertion grooves 9 and 10 are formed side by side in the longitudinal direction in the main body 8, which is an insulator, and each insertion groove 9 of the one side. The terminal pin 12 having the first cutout portion 11 formed therein is detachably coupled therein, and the first cutout portion 11 formed at the terminal pin 12 is inserted into each of the insertion grooves 10 on the other side. The connection pin 13 is detachably coupled to be exposed to the upper part of the main body 8 so that the connection pin 13 is closely cooperated, and the connection pin 13 is configured to be capable of lifting and lowering as the lead of the element 3 is connected.

The connecting pin 13 is formed of an elastic member 16 such as a coil spring so that the lifting bar 15 may be retracted in the cylindrical sleeve 14 that is inserted into and fixed to the first cutout 11 of the terminal pin 12. It is elastically installed, the sleeve 14 is formed in the neck portion (15a) of the diameter smaller than the diameter of the elevating rod within the elevating range of the elevating rod 15 so that the elevating rod (15) is not separated from the sleeve (14) ) Is formed wrinkles (14a) located in the neck portion.

On the upper surface of the elevating rod 15, a plurality of pointed protrusions 15b are formed to be in point contact without contact with the lead 3a of the element 3.

In addition, the first cutout 11 of the terminal pin 12 coupled to the insertion groove 9 of the main body 8 is disposed at both sides such that the gap between the inlet side is smaller than the outer diameter of the sleeve 14 of the connecting pin 13. A corresponding locking step 11a is formed, and a second cutout 18 is formed at one side of the first cutout 11 to serve as an elastic piece 17.

This is because when the sleeve 14 of the connecting pin 13 is sandwiched between the first cutouts 11 smaller than the diameter of the sleeve 14, the elastic piece 17 is deformed to the outside by the locking jaw 11a, thereby compressing the compressive force. It is configured to prevent a poor connection between the terminal pin 12 and the connecting pin 13 and to prevent the sleeve 14 fitted into the first cutout portion 11 of the terminal pin 12 from coming off.

However, the prior art has a problem that the electrical connection is made through the terminal pin and the connecting pin is long, the electrical path is long, and the contact resistance is generated at the contact portion of the terminal pin and the connecting pin to reduce the reliability of the inspection.

In addition, as another conventional technique, the socket device is filed and filed by the applicant of the present invention in the Korean Utility Model Publication No. 1999-8143, 1999-33160 and the Korean Utility Model Publication No. 20-163193 have.

The prior art is provided with a separate elastic spring in the socket device, when the microchip is contact pressure, the elastic spring is compressed to a predetermined contact to evenly contact the chip and the probe to prevent damage to the chip contact terminal, but separately elastic The spring should be provided, and the probe accommodated in the socket device will be moved to the left and right, so that the precise contact between the probe and the contact terminal cannot be made, and the length of the probe is increased by the length of the elastic spring. There is a problem that the distance of the.

Therefore, the present invention has been devised to solve the problems of the above-described prior arts, and provides a chip inspection socket device in which a bidirectional flow probe is accommodated in the socket so that the contact between the chip and the probe is equal to prevent damage of the chip inspection terminal. It aims to do it.

In addition, since the electrical contact between the base circuit board and the chip is made only by the probe, another object of the present invention is to provide a chip inspection socket device in which inspection reliability is improved by minimizing the separation distance between the base circuit board and the chip.

In addition, an object of the present invention is to provide a chip inspection socket device in which the left and right flow of a probe accommodated in a socket is prevented and thus a stable inspection is performed.

1-a perspective view of a test socket device according to the prior art;

Figure 2-a longitudinal cross-sectional view of the engaged state of Figure 1;

Figure 3-perspective view of the chip inspection socket device according to the present invention.

4-exploded perspective view.

Figure 5-Cross section of the base plate.

6 is a cross-sectional view showing the shape of the probe installed on the base plate.

<Description of Symbols for Major Parts of Drawings>

100: lower base plate 101: probe coupling hole

102: hollow portion 110: dowel pin

120: upper base plate 130: probe

131: floating pin 132: body

140: housing 150: flow prevention jaw

The present invention for achieving the above object is provided with a base circuit board, a lower base plate formed with equally spaced probe coupling holes in the longitudinal direction and the flow prevention jaw is formed in the lower direction; An alignment pin formed on an upper surface of the lower base plate; Coupling hole is formed from the lower side to the upper side is inserted and coupled to the dowel pin is coupled to the upper surface of the lower base plate, the probe coupling hole communicating with the probe coupling hole of the lower base plate is formed at equal intervals, the upper direction in the probe coupling hole An upper base plate having a flow preventing jaw formed therein; A probe which is inserted into the communication probe coupling hole of the lower base plate and the upper base plate, and has a flow pin formed to elastically move up and down at both ends; And a housing formed integrally with the upper base plate to protrude on an upper surface of the upper base plate and having a through hole communicating with the probe coupling hole to support an end portion adjacent to the probe. Make a point.

Here, the hollow portion is preferably formed in the coupling portion of the lower base plate and the upper base plate.

Accordingly, the flow pin of the probe flows up and down by the contact force to equalize the contact between the chip and the probe to prevent damage to the chip inspection terminal, and to prevent the left and right flow of the probe accommodated in the socket, thereby providing a stable inspection. have.

Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

Figure 3 is a perspective view of a socket inspection socket device according to the present invention, Figure 4 is an exploded perspective view, Figure 5 is a cross-sectional view of the base plate, Figure 6 is a cross-sectional view showing the shape of the probe installed on the base plate.

As shown, the chip inspection socket device according to the present invention is largely composed of the lower base plate 100, the dowel pin 110, the upper base plate 120, the probe 130 and the housing 140. .

First, the lower base plate 100 will be described.

The lower base plate 100 is formed in a substantially plate shape and is installed on an upper surface of the base circuit board.

In addition, the lower base plate 100 is formed with a probe coupling hole 101 penetrated up and down, and the probe coupling hole 101 is formed in plural at equal intervals in parallel with a predetermined distance.

In addition, the probe coupling hole 101 is formed in a depression in communication with the probe coupling hole in the shape recessed to form a hollow portion 102, such as the depression of the upper base plate 120 to be described later. And when the probe 130 is inserted into the probe coupling hole 101 is formed in the probe coupling hole 101 of the lower base plate 100 protrudes in a downward direction, the probe 130 The flow pin 131 portion of the protruding downward and prevents the end of the body 132 is caught by the flow preventing jaw 150 to prevent the endless separation of the probe 130 and at the same time supports the probe 130 .

In addition, the upper surface of the lower base plate 100 is formed with an alignment pin 110 protruding upwards is coupled to the coupling hole (not shown) formed by a predetermined depth from the lower side to the upper side of the upper base plate 120 to be described later By doing so, the lower base plate 100 and the upper base plate 120 can be accurately aligned.

The upper base plate 120 is formed in a plate shape having a predetermined width is coupled to the upper surface of the lower base plate 100. And a coupling hole (not shown) is formed by a predetermined depth from the lower side of the upper base plate 120 to the upper side by the coupling hole (not shown) is inserted into the alignment pin 110 of the lower base plate 100 The upper base plate 120 and the lower base plate 100 are aligned. In addition, the upper base plate 120 is formed through the upper and lower probe coupling hole 101 is in communication with the probe coupling hole 101 of the lower base plate 100, the probe coupling hole 101 in the upward direction When a predetermined protruding flow barrier 150 is formed and the probe 130 to be described later is inserted into the probe coupling hole 101, a portion of the flow pin 131 of the probe 130 penetrates the probe coupling hole 101. By protruding upward and the end of the body 132 is caught by the flow preventing jaw 150, the stepless separation of the upper side of the probe 130 is prevented and supports the probe 130.

In addition, a depression having a shape recessed upward is formed in the probe coupling hole 101 forming portion of the lower base plate 100 to form a hollow portion 102 when combined with the upper base plate 120.

The probe 130 is formed at both ends of the body 132 and the body 132 is formed with a flow pin 131 is a predetermined flow up and down by the elastic force of the spring, one side of the flow pin 131 is a base circuit board Is connected to the connection terminal of the other side of the floating pin 131 is connected to the chip connection terminal of the inspection object. Therefore, when the chip is in contact for the inspection of the chip by the flow pin 131 flows up and down by the connection pressure is equal connection between the probe 130 and the chip and the chip and the base circuit board.

The housing 140 is formed in a shape protruding integrally with the upper base plate 120 on the upper surface of the upper base plate 120, and a through hole is formed at a position corresponding to the probe coupling hole 101 so that the through The flow pin 131 of the probe 130 is projected through the ball. That is, the inner wall surface of the through-hole of the housing 140 is formed to surround the outer surface of the probe 130 flow pin 131 to support the probe 130 flow pin 131 at the time of needle inspection. The probe 130 is prevented from flowing back and forth while at the same time supporting the end portion of the probe 130 to ensure a stable inspection.

The operation effect by the above configuration is as described later.

The user first accommodates the probe 130 in the probe coupling hole 101 of the lower base plate 100. Then, the upper base plate 120 is coupled to the upper surface of the lower base plate 100. The upper base plate 120 is coupled to the upper base plate 120 and the lower base plate 100 by inserting the coupling hole (not shown) into the alignment pin 110 of the lower base plate 100. Position is aligned. At this time, the upper portion of the probe 130 is naturally inserted into the probe coupling hole 101 of the upper base plate 120, one side of the flow pin 131 of the probe 130 is the probe of the lower base plate 100 A predetermined protrusion protrudes to the outside of the coupling hole 101, and the other flow pin 131 is protruded to the outside of the through hole of the housing 140. And the probe 130 is accommodated in the upper and lower base plate 100, 120 probe coupling hole 101, the body 132 of the probe 130 is supported by the flow preventing jaw 150 is a probe ( 130) Stepless flow of the body 132 is prevented.

In the above state, when the base plate is coupled to the upper surface of the base circuit board, the one side floating pin 9131 of the probe 130 is connected to the connection terminal of the base circuit board.

In the above state, the chip to be examined is approached to the upper base plate 120 so that the connection terminal of the chip is connected to the other side of the flow pin 131 of the probe 130. In the above process, the chip is applied with a predetermined pressure to the probe 130, the flow pin 131 is up and down predetermined flow is to be in close contact with the chip and the flow pin 131 is in close contact and at the same time is made This improves inspection reliability.

The present invention by the above configuration has the effect of preventing the damage of the chip inspection terminal while improving the reliability of the inspection by making a uniform flow of the flow pin of the probe during chip inspection.

In addition, since the electrical contact between the base circuit board and the chip is made only by the probe, the inspection reliability is also improved by minimizing the separation distance between the base circuit board and the chip.

In addition, the left and right flow of the probe accommodated in the socket is prevented there is an effect that a stable inspection is made.

Claims (2)

A lower base plate 100 installed on the base circuit board, the probe coupling holes 101 having equal intervals in the longitudinal direction, and the flow preventing jaw 150 formed in the lower direction; An alignment pin 110 formed on an upper surface of the lower base plate 100; The coupling hole is formed from the lower side to the upper side is inserted and coupled to the alignment pin 110 is coupled to the upper surface of the lower base plate 100, the probe coupling to communicate with the probe coupling hole 101 of the lower base plate 100 Ball base 101 is formed at equal intervals, the upper base plate 120 formed with a flow preventing jaw 150 in the upper direction in the probe coupling hole 101; A probe 130 inserted into the communication probe coupling hole 101 of the lower base plate 100 and the upper base plate 120 and having a flow pin 131 elastically moving up and down at both ends; A housing which is formed integrally with the upper base plate 120 so as to protrude from the upper surface of the upper base plate 120 and communicates with the probe coupling hole 101 is formed to support the adjacent end portion of the probe 130. 140, a chip inspection socket device, characterized in that comprises a. According to claim 1, The socket portion for chip inspection, characterized in that the hollow portion 102 is formed in the coupling portion of the lower base plate 100 and the upper base plate (120).