KR20020090656A - Six face inspection apparatus of chips using belts - Google Patents

Abstract

PURPOSE: A hexahedral chip surface tester is provided to shorten chip testing time and improve accuracy of surface test through the enhancement of chip alignment and vibration of belt. CONSTITUTION: A longer belt(16) and a shorter belt(15) are arranged to rotate at the same speed by using a single driving pulley(12), and the position of a hexahedral chip which is fed from a part feeder(20) is detected, regardless of the speed of the belt, through a pulley(40) having sensors and an encoder. The hexahedral chip have surfaces all of which surfaces are tested by using cameras(8,11) installed in a vertical direction so as to obtain images of top and bottom surfaces of the chip, cameras(27,18) installed to obtain images of left and right side surfaces of the chip, and cameras having an angle adjustable to the degree of 10 in accordance with the size of the chip, so as to obtain images of front and rear surfaces of the chip.

Description

Six face inspection apparatus of chips using belts

The present invention relates to an inspector for inspecting the surface of a condenser chip (9, MLCC; Multi Layer Ceramic Condensor) and chips of a similar size. Specifically, the present invention relates to a hexahedron using a long belt 16 and a short belt 15. It relates to a chip inspector for inspecting all surfaces of the mold chip (9).

In general, chips such as capacitor chips are released after checking the size, presence of cracks on the surface, plating amount, plating area, cracking, etc. according to the user's requirements.

However, as shown in FIG. 1, in the conventional chip inspection apparatus, chips are transferred to a belt and aligned by one roller 13, and using a camera 8 and a reflection mirror 14, a hexahedron type After inspecting the upper surface 1 and the left side 3 of the chip 9, the chip is overlaid by the long belt 16 and the short belt 15 on the drive rotary pulley 12 and then turned over once again. Aligned by the rollers 13, the camera 11 and the reflective mirror 42 is used to inspect the lower surface (2) and the right surface (5) of the hexahedral chip (9) to inspect the four sides.

Therefore, since the conventional chip inspection apparatus uses only one roller 13 when aligning the chips 9, the alignment of the chips is not performed smoothly, and the reflective mirror 14 is used to inspect the four sides of the chips. Therefore, in acquiring the two surfaces 1, 3 or 2, 5 of the hexagonal chip through one camera 8 or 11, the chip obtained through the image and the reflection mirror 14 of the chip obtained on the upper surface of the chip One of the images is that the camera is out of focus and does not have accurate inspections, and the chips stick out of the belt due to the static electricity and vibration generated in the chip inspection system using the belt.

The present invention solves the conventional problem and inspects all surfaces (1,2,3,4,5,6) of the hexahedral chip (9) and improves the alignment of the chip and the vibration and static electricity generated from the belt. The aim is to improve the chip sticking out and to automatically sort out higher quality chips.

1 is a perspective view showing a conventional chip tester.

Figure 2 is a perspective view showing a chip inspector using two belts according to the present invention.

3 is a perspective view of a chip that is the subject of the tester;

Figure 4a is a perspective view showing a chip alignment device according to the present invention.

4B is a schematic cross-sectional perspective view of the chip aligning device viewed in a traveling direction.

5A and 5B are perspective views of the chip inspection mechanism according to the present invention.

6 is a cross-sectional view of a pulley having a rectangular groove according to the present invention.

7 is a perspective view of a belt guide according to the present invention.

Figure 8 is a perspective view of the discharge mechanism portion of the chip due to static electricity in accordance with the present invention.

Figure 9 is a perspective view of the discharge hole built-in chip breaking prevention cloth according to the present invention.

Explanation of symbols on the main parts of the drawings

9: Hexagonal chip 12: Driven rotary pulley

15: short belt 16: long belt

19: roller alignment mechanism 21, 23: inspection mechanism

22: belt guide 38: chip ejection mechanism

24: Roller 25: Cam Follow

26: adjusting screw 29, 30: bad chip vacuum discharge device

35: sensor 37: mechanism for receiving the chip

A six-sided inspection machine of the chip using the belt according to the present invention for achieving the above object,

In FIG. 2, the hexahedron is formed by mutual contact while rotating at the same linear speed as the short belt 15 while serving to feed the hexahedral chip 9 supplied from a chip feeder such as a parts feeder 20. An elongated belt 16 used to flip the mold chip 9 and transfer the chip to the short belt 15;

A short belt 15 which rotates at the same linear velocity as the long belt 16 and inverts the hexahedral chip 9 and transfers the chips through mutual contact;

A drive rotary pulley 12 for rotating the belt to have the same linear speed while in contact with the long belt 16 and the short belt 15;

A pulley 40 including an encoder for detecting the position of the chip sensed from the sensor regardless of the speed of the belt;

Three rotations with staggered angles of 1 to 3 degrees with respect to the surface of the belt, arranged at regular intervals to make the hexahedral chip 9 or the chip on the belt supplied in FIGS. 4a and 4b easy to inspect. Roller 24, LM Stroke 41 supporting the rotating shaft of the roller, Cam follower 25 to prevent the belt from sagging down, and configured to adjust the gap between the roller and the roller Two roller alignment mechanisms 19, 43 with adjustment screws 26;

5a and 5b, respectively, the sensors 31 and 34 for detecting the chip, the hexahedral chip 9 lying on the surface of the long belt 16 and the short belt 15 for inspecting the hexahedral chip 9. Two cameras (27, 8, 11, 18) installed perpendicular to the surface of the belt for inspection of three sides, and one 8-degree tilting angle adjustable according to the size of the chip relative to the direction of belt flow. Cameras 28 and 17, defective chip vacuum ejectors 29 and 32 for ejecting defective chips, and retest chip vacuum ejectors 30 and 33 for ejecting chips requiring retesting due to inspection and chip supply failure. Two inspection instruments (19, 23) consisting of;

A belt guide 22 for suppressing vibration generated when the chips overlap the two belts;

In order to prevent chips from being transferred to the belt due to static electricity generated from the belt, the chip detection sensor 35, the jet nozzle 36 for discharging dust on the chip and the belt, and the chip to prevent the chip from sticking out of the belt. It comprises a chip discharge mechanism 38 consisting of a mechanism 37 for receiving.

Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

As shown in FIG. 2, the chip feeder such as the part feeder 20 serves to supply chips such that the spacing between the chips is constant on the long belt 16 that rotates the hexahedral chip 9 to be inspected.

4A and 4B, the hexahedral chip 9 to be transported on the long belt 16 has a lengthwise direction parallel to the direction of travel of the chip by three or more rollers 24 in the step before inspection. By being aligned, the chip 9 can perform a faster and more accurate analysis in the inspection system. At this time, the roller 24 is installed at an angle (1 to 3 degrees) with respect to the surface of the belt 15 and 16 to prevent damage that may occur due to excessive force on the belt, thereby minimizing resistance with the belt. By using the adjusting screw 26 to adjust the distance between the rollers according to the size and alignment of the chip to adjust the alignment of the chip more finely.

As shown in FIG. 5A, the chips aligned by the three rollers 24 are recognized by the sensor 31 and the time to the point of acquiring an image at a specific distance from the sensor is determined by the pulley including the encoder. 40) is used regardless of the speed of the belt. The camera (8) installed vertically to acquire the image of the top surface (1) of the chip placed on the long belt and the camera installed to acquire the image of the long left side (3) 27) In order to acquire an image of the rear surface 4 of the chip, the three sides (1, 3, 4) of the hexahedral chip are inspected using a camera 28 that can be adjusted by tilting the angle up to 10 according to the size of the chip. And a device for discharging the defective chip using the vacuum tube installed in the V-groove at a specific distance from the point of taking an image after determining whether the defective surface is defective. When a chip supplied from a chip feeder such as a part feeder has two or more chips within a reference interval or when the time for determining whether a defect is greater than the reference time is taken, an image of a retest chip using a vacuum tube at a certain distance is taken. The re-examination vacuum discharge device 30 is configured to inspect and discharge the hexahedral chip 9.

6 shows a cross section of the drive rotary pulley 12. As shown in FIG. 6, the chip having the three surfaces 1, 3, and 4 inspected on the long belt 16 generates shock vibration in an area overlapping the short belt 15 of the driving rotary pulley 12. In order to suppress the vibration of the chip, in order to suppress such vibrations, a rectangular groove is formed on the outer circumference of the driving rotary pulley 12 which contacts the short belt 15 so that the chip is shorted when the chip is fixed between the two belts. ) The center of the chip into this groove, and in order to prevent the belt from falling down, the alignment of the chip is established by installing the belt guide 22 from the inspection mechanism on the long belt 16 to the main rotating pulley 12. It can be improved.

Chips examined on three sides (1, 3, 4) are placed on the long belt (16) and transported so that the long belt (16) in the drive rotation pulley (12) for rotating the long belt (16) and the short belt (15). And the short belt 15 overlap each other and the chip is fixed and at the same time the driving rotation pulley 12 is rotated counterclockwise and the chip is turned over and the chip is placed on the short belt 15 and transferred. In this case, static electricity may be generated due to the friction of the belt, which causes the chip 9 to stick to the long belt 16 without being moved to the short belt 15 even after the chip is inverted and to be transported out of the tester. This happens. The main cause of the static electricity is dust on the surface of the belt. In order to remove this, air is blown through the spray nozzle 36 in FIG. 8 to remove dust and at the same time remove chips attached to the long belt 16. However, if the part receiving the chip by the injected air is made of metal, the surface of the chip is damaged by colliding with the chip, and the mechanism for receiving the chip containing the soft cloth 39 to prevent the shock and absorb the impact ( 37) was installed.

The flipped chip is placed on the short belt 15 and transferred, i.e., the lower surface 2 of the chip 9 on the long belt 16 becomes the upper surface and the front surface 6 becomes the rear surface. By three or more rollers 24, the long direction of the chip is rearranged in parallel with the direction of travel, allowing faster and more accurate analysis in the inspection system.

And, as shown in FIG. 5B, the chip aligned by the three rollers 24 is recognized by the sensor 34 and the time to the point of obtaining an image at a specific distance from the sensor 34 is determined by the encoder. An image of the camera 11 and the right side 5 of the chip installed vertically to obtain an image of the lower surface 2 of the chip placed on the short belt 15 by using the pulley 40 included therein. Three sides of the hexahedral chip (2) using the camera 18 installed to acquire the image, the camera 17 that can be adjusted by tilting the angle up to 10 according to the size of the chip to obtain the image of the front surface 6 of the chip (2) , 5, 6) and after deciding whether or not the three (2, 5, 6) is defective, the bad chip is a bad chip discharge device using a vacuum tube installed in the V groove at a certain distance in taking an image ( 32); In the case where there are two or more chips within a reference interval or when the time for determining whether a defect is greater than the reference time is taken, a re-examination vacuum discharge device 33 of a chip using a vacuum tube at a specific distance is provided. Inspection and discharge of the hexahedral chip 9 is made.

Finally, from the left end of the short belt 15, the chips of good quality inspected according to the needs of the user are discharged whether the size, the presence of cracks on the surface, the plating amount, the plating area, or the cracks.

As described above, the drawings and specification are merely exemplary of the invention, which are used for the purpose of illustrating the invention only and are not intended to limit the scope of the invention as defined in the claims or in the claims. Any device for inspecting a six-sided surface of a small component such as a chip aligning device using a plurality of rollers 24 or a hexahedral chip placed on a belt will be included in the scope of the present invention.

According to the present invention configured as described above, the entire surface of the chip can be inspected while continuously supplying and discharging the chip, and the chip inspection time and surface inspection precision are greatly improved due to the improved chip alignment, and the process can be automated. Do.

Claims (4)

In the chip inspector for inspecting the defect of the surface of the hexahedral chip, A single drive rotary pulley 12 is used to drive the two belts of the long belt 16 and the short belt 15 to rotate with the same linear velocity, and the hexahedral chips 9 supplied from the part feeder 20 The position can be detected regardless of the speed of the belt through the pulley 40 including the sensors 31 and 34 and the encoder, and the camera is installed vertically to acquire images of the upper and lower surfaces of the chip (1, 2). 8,11), the cameras 27 and 18 installed to acquire the images of the left and right sides 3 and 5 of the chip, and the size of the chip to acquire the images of the front and rear surfaces 6 and 4 of the chip. According to the chip inspector, characterized in that it is possible to inspect all sides of the hexahedral chip (9) using the camera (17, 28) that can be adjusted by tilting the angle up to 10. The cubic chip 9 supplied from the part feeder 20 has three or more rollers 24 inclined 1 to 3 degrees with respect to the belt surface, so that the length of the long direction is aligned in parallel with the direction of travel of the chip. Chip inspectors, which enable faster and more accurate analysis in inspection systems. Due to the static electricity generated in the belt, the chip 9 is not transferred to the short belt 15, but is stuck to the long belt 16 and is stuck to the long belt and dust causing the static electricity to prevent the chip 9 from being transported out of the inspector. Chip tray designed to discharge the chip safely by incorporating a sensor installed to remove the on chip, an air jet nozzle 36, and a soft cloth 39 to prevent the chip ejected by the air jet nozzle from colliding with a metal material. Chip inspector having a discharge pipe (37). Drive rotation with a square groove on the outer periphery designed to suppress vibration caused by overlapping of the long belt 16 and the short belt 15 by the chip 9 in the drive rotation pulley 12 and to prevent the belt from sagging. Chip inspector having a pulley (12) and a belt guide (22).