KR20020079650A - Guide rail apparatus of semiconductor package singulation system - Google Patents

Guide rail apparatus of semiconductor package singulation system Download PDF

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Publication number
KR20020079650A
KR20020079650A KR1020020052385A KR20020052385A KR20020079650A KR 20020079650 A KR20020079650 A KR 20020079650A KR 1020020052385 A KR1020020052385 A KR 1020020052385A KR 20020052385 A KR20020052385 A KR 20020052385A KR 20020079650 A KR20020079650 A KR 20020079650A
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KR
South Korea
Prior art keywords
package
guide rail
semiconductor package
guide block
singulation system
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KR1020020052385A
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Korean (ko)
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김진천
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주식회사 한미
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Priority to KR1020020052385A priority Critical patent/KR20020079650A/en
Publication of KR20020079650A publication Critical patent/KR20020079650A/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67121Apparatus for making assemblies not otherwise provided for, e.g. package constructions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67259Position monitoring, e.g. misposition detection or presence detection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H01L21/681Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67092Apparatus for mechanical treatment

Abstract

PURPOSE: A guide rail apparatus of semiconductor package singulation system is provided to prevent bad process beforehand by monitoring the ordering state of semiconductor package with photo sensors during the transporting the package from a cutting device to an unloading device. CONSTITUTION: A guide block(110) installed next to a die(200) is composed of the first transporting part(112) and the second transporting part, to each of which the singulation package is sent through walking beam(130) and on each of which, holes for photo emission sensors(112a,113a) and photo detection sensors(112b,113b) are formed so that each pair of photo sensors installed in the holes senses the existence of package on top surface of the walking beam. The photo sensors are connected to the system controller, taking follow-up measures in case of observing any problem of the transported package.

Description

반도체 패키지 싱귤레이션 시스템의 가이드레일장치{GUIDE RAIL APPARATUS OF SEMICONDUCTOR PACKAGE SINGULATION SYSTEM}Guide rail device for semiconductor package singulation system {GUIDE RAIL APPARATUS OF SEMICONDUCTOR PACKAGE SINGULATION SYSTEM}

본 발명은 반도체 패키지 싱귤레이션 시스템의 가이드레일장치에 관한 것으로, 특히 가이드레일의 양 측단에 포토센서를 설치하여 가이드레일을 따라 이송되는 워킹빔에 안착된 패키지의 존재 유무를 감지하도록 한 것이다.The present invention relates to a guide rail device of a semiconductor package singulation system. In particular, photosensors are installed at both ends of the guide rail to sense the presence or absence of a package seated on a walking beam transported along the guide rail.

일반적으로 반도체 패키지는 실리콘으로 된 반도체기판 상에 트랜지스터 및 커패시터 등과 같은 고집적회로가 형성된 반도체칩을 붙인 후에 반도체기판의 상면에 수지로 몰딩한 후, 상기 반도체칩과 통전되도록 리드프레임을 접착시켜서 제조된다. 이와 같이 제조된 반도체 패키지는, 리드프레임에 탑재된 패키지를 절단하여 별개로 분리하는 싱귤레이션 공정을 거치게 된다.Generally, a semiconductor package is manufactured by attaching a semiconductor chip having a high integrated circuit such as a transistor and a capacitor on a semiconductor substrate made of silicon, molding the resin on the upper surface of the semiconductor substrate, and then adhering a lead frame to conduct electricity with the semiconductor chip. . The semiconductor package manufactured as described above is subjected to a singulation process of cutting and separately separating a package mounted on a lead frame.

이러한 공정을 수행하는 싱귤레이션 시스템은 반도체의 리드프레임을 절단장치에서 각각의 패키지로 절단하여 미리 설정된 품질에 따라 분리 적재시키도록 하는 것으로서, 도 1에 도시한 바와 같이, 공정을 진행하기 위한 리드프레임이 로딩되는 로딩장치(10), 이 로딩장치(10)에 로딩된 리드프레임을 픽업하여 이송하는 인렛장치(20), 이 인렛장치(20)에 의해 이송된 리드프레임을 개개의 패키지로 절단하는 절단장치(30), 이 절단장치(30)에서 개개로 절단된 패키지를 소정의 장소로 이송하는 이송장치(40), 이 이송장치(40)에 의해 이송된 패키지를 정렬하여 적재하는 적재장치(50), 상기 절단장치(50)로부터 절단된 불량 패키지를 선별하여 배출하는 리젝트장치(60)를 포함하여 구성된다.The singulation system which performs such a process is to cut the lead frame of the semiconductor into respective packages in the cutting device and separate and load the chips according to a predetermined quality. As shown in FIG. 1, the lead frame for the process is performed. The loading device 10 to be loaded, the inlet device 20 for picking up and transporting the lead frame loaded in the loading device 10, and cutting the lead frame transferred by the inlet device 20 into individual packages. A cutting device 30, a transfer device 40 for transferring the packages individually cut by the cutting device 30 to a predetermined place, and a stacking device for aligning and stacking the packages transferred by the transfer device 40 ( 50) and a reject device 60 for sorting and discharging the defective package cut from the cutting device 50.

이때, 상기 절단장치(30)의 일측에는 절단된 패키지들을 절단장치(30) 외부로 추출해 내는 역할을 하는 워킹빔(32)이 가이드레일(31)을 따라 이동되도록 구비된다.At this time, one side of the cutting device 30 is provided with a walking beam 32 that serves to extract the cut package to the outside of the cutting device 30 to move along the guide rail (31).

즉, 상기 절단장치(30)에 의해 개개로 절단된 단품 패키지를 이송장치(40) 및 적재장치(50)에 의해 트레이(T1)로 이송할 때, 절단된 패키지들은 가이드레일(31)의 워킹빔(32) 상에 안착된 상태로 가이드레일(31)을 따라 이송된 후 픽커 등으로 패키지들을 픽업하여 적재장소로 이송하게 되는데, 이때 종래 기술에 의한 싱귤레이션 시스템에서는 패키지의 존재 유무 또는 정렬 상태를 확인하지 않고 이송이 이루어지므로 공정 불량을 야기시킬 우려가 있었다.That is, when the single package individually cut by the cutting device 30 is transferred to the tray T1 by the transfer device 40 and the loading device 50, the cut packages are walking of the guide rail 31. After being transported along the guide rail 31 in a state seated on the beam 32, the pickers are picked up by a picker or the like and transported to a loading place. In the singulation system according to the related art, the presence or absence of the package is present. Since the transfer is made without checking, there was a risk of causing a process failure.

본 발명은 이러한 점을 감안하여 안출된 것으로, 리드프레임으로부터 개개로 절단된 단품 패키지를 절단장치에서 적재장치로 이송할 때, 단품 패키지의 정렬 상태를 감지하여 이송할 수 있도록 한 반도체 패키지 싱귤레이션 시스템의 가이드레일장치를 제공하는데 그 목적이 있다.SUMMARY OF THE INVENTION The present invention has been made in view of this point, and the semiconductor package singulation system is capable of detecting and transferring the alignment status of the single package when transferring the single package individually cut from the lead frame from the cutting device to the loading device. The purpose is to provide a guide rail device of the.

도 1은 일반적인 반도체 패키지 싱귤레이션 시스템을 개략적으로 블록화하여 보인 평면도.1 is a plan view schematically showing a block of a general semiconductor package singulation system.

도 2는 본 발명에 의한 가이드레일장치를 보인 사시도.Figure 2 is a perspective view showing a guide rail device according to the present invention.

도 3은 본 발명에 적용되는 워킹빔을 보인 측면도.Figure 3 is a side view showing a walking beam applied to the present invention.

도 4는 본 발명에 의한 가이드레일장치가 적용된 싱귤레이션 시스템의 일부를 보인 종단면도.Figure 4 is a longitudinal sectional view showing a part of a singulation system to which the guide rail device according to the present invention is applied.

도 5는 도 4의 요부를 상세히 보인 단면도.5 is a cross-sectional view showing in detail the main portion of FIG.

** 도면의 주요부분에 대한 부호의 설명 **** Explanation of symbols for main parts of drawings **

100 ; 가이드레일장치110 ; 가이드블록100; Guide rail device 110; Guide Block

111 ; 가이드홀112 ; 제1이송부111; Guide hole 112; 1st Transfer Department

113 ; 제2이송부112a,113a ; 발광센서홈113; Second conveying sections 112a, 113a; Light Sensor Home

112,113b ; 수광센서홈120 ; 가이드레일112,113b; Receiver sensor groove 120; Guide rail

130 ; 워킹빔131 ; 패키지 안착부130; Working beam 131; Package seat

140a ; 발광센서140b ; 수광센서140a; Luminescence sensor 140b; Receiver

상기 목적을 달성하기 위한 본 발명은, 싱귤레이션 시스템의 절단장치의 일측에 연결 설치되어 절단된 패키지를 배출하기 위한 가이드블록과, 이 가이드블록의 하측에 설치되는 가이드레일과, 이 가이드레일 상으로 직선 이동하도록 설치되는 워킹빔을 포함하여 구성되는 반도체 패키지 싱귤레이션 시스템의 가이드레일장치에 있어서, 상기 가이드블록에는 워킹빔에 안착된 패키지의 정렬 상태를 감지하는 감지수단이 설치되는 것을 특징으로 한다.The present invention for achieving the above object is a guide block for discharging the package is connected and installed on one side of the cutting device of the singulation system, a guide rail installed on the lower side of the guide block, and on the guide rail In the guide rail device of the semiconductor package singulation system comprising a walking beam which is installed to move in a straight line, the guide block is characterized in that the sensing means for detecting the alignment of the package seated on the walking beam.

상기 감지수단은 가이드블록의 일측에 형성된 센서홈에 설치되어 빔을 조사하는 발광센서와, 상기 가이드블록의 타측에 형성된 센서홈에 설치되어 조사된 빔을 수광하는 수광센서로 구성된다.The sensing means includes a light emitting sensor installed in the sensor groove formed on one side of the guide block and irradiating the beam, and a light receiving sensor installed in the sensor groove formed on the other side of the guide block to receive the irradiated beam.

이하, 본 발명에 의한 반도체 패키지 싱귤레이션 시스템의 가이드레일장치를 첨부도면에 도시한 실시예에 따라 설명하면 다음과 같다.Hereinafter, the guide rail device of the semiconductor package singulation system according to the present invention will be described according to the embodiment shown in the accompanying drawings.

도 2는 본 발명에 의한 가이드레일장치를 보인 사시도이고, 도 3은 본 발명에 적용되는 워킹빔을 보인 측면도이며, 도 4는 본 발명에 의한 가이드레일장치가 적용된 싱귤레이션 시스템의 일부를 보인 종단면도이고, 도 5는 도 4의 요부를 상세히 보인 단면도이다.Figure 2 is a perspective view showing a guide rail device according to the present invention, Figure 3 is a side view showing a walking beam applied to the present invention, Figure 4 is a longitudinal section showing a part of a singulation system to which the guide rail device according to the present invention is applied. 5 is a cross-sectional view showing the main portion of FIG. 4 in detail.

도시한 바와 같이, 본 발명에 의한 가이드레일장치(100)는 싱귤레이션 시스템의 절단장치(200)의 일측에 연결 설치되는 가이드블록(110)과, 이 가이드블록(110)의 하측에 설치되는 가이드레일(120)과, 이 가이드레일(120) 상으로 직선 이동하도록 설치되는 워킹빔(130)을 포함하여 구성된다.As shown, the guide rail device 100 according to the present invention is a guide block 110 is connected to one side of the cutting device 200 of the singulation system and the guide is installed on the lower side of the guide block 110 Rail 120 and the walking beam 130 is installed so as to move linearly on the guide rail (120).

상기 절단장치(200)는 다이블록(210) 상면에 설치되어 이송된 리드프레임이 안착되는 다이(220)와, 이 다이(220)의 소정 높이 상측에 위치하며 수직 하강 운동에 의해 리드프레임에 있는 패키지를 각각의 단품 패키지로 절단하는 펀치(도시 생략)를 포함하여 구성된다. 이때, 상기 다이(220)는 리드프레임의 사각형상의 칩부분 중 4개의 모서리 부분을 절단하기 위한 모서리 절단다이(221), 칩부분의 X축 부분을 절단하기 위한 X축 절단다이(222) 및 칩부분의 Y축 부분을 절단하기 위한 Y축 절단다이(223)가 순차적으로 배치되며, 이 각각의 다이(221)(222)(223)는 소정 피치만큼 이격 거리를 유지한 상태로 배치된다.The cutting device 200 is a die 220 is installed on the upper surface of the die block 210 is seated on the die 220, and the predetermined height of the die 220 is located on the lead frame by the vertical downward movement And a punch (not shown) for cutting the package into individual single packages. At this time, the die 220 is an edge cutting die 221 for cutting four corners of the rectangular chip portion of the lead frame, X-axis cutting die 222 for cutting the X-axis portion of the chip portion and the chip Y-axis cutting dies 223 for cutting the Y-axis portion of the portion are arranged in sequence, and each of the dies 221, 222, 223 is disposed with the separation distance maintained by a predetermined pitch.

상기 가이드블록(110)은 절단장치(200)로부터 절단된 단품 패키지들이 안착된 워킹빔(130)이 위치되는 것으로, 그 중앙에는 워킹빔(130) 상면에 안착된 패키지가 노출되도록 길이 방향으로 소정 너비의 가이드홀(111)이 길게 형성된다.The guide block 110 is located in the walking beam 130 is placed on the single-piece package cut from the cutting device 200, the center is predetermined in the longitudinal direction to expose the package seated on the upper surface of the walking beam (130) The width of the guide hole 111 is formed long.

상기 가이드블록(110)은 절단장치(200)의 다이(220)와 연결 설치되어 다이(220)에 위치한 패키지들을 워킹빔(130)에 의해 이송되어 일차적으로 위치되는 제1이송부(112)와, 이 제1이송부(112)의 일측에 일체로 연장되어 절단장치(200)의 연속작업에 의해 워킹빔(130)이 이차적으로 패키지를 이송하여 위치되는 제2이송부(113)로 이루어진다.The guide block 110 is connected to the die 220 of the cutting device 200 is installed in the first transport unit 112 is primarily located by transporting the packages located in the die 220 by the working beam 130, The second beam part 113 is integrally extended to one side of the first conveying part 112 and the working beam 130 is secondly transported by the package by the continuous operation of the cutting device 200.

상기 각각의 이송부(112)(113)에는 가이드홀(111)을 중심으로 그 양측에 각각 발광센서홈(112a)(113a) 및 수광센서홈(112b)(113b)이 형성되고, 이 각각의 센서홈(112a)(113a)(112b)(113b)에는 가이드레일(120) 상에서 가이드홀(111)을 따라 이동되는 워킹빔(130)의 상면에 안착된 패키지의 존재 유무를 감지하기 위한 발광센서(140a) 및 수광센서(140b)가 대향되도록 안착 고정된다. 이때, 상기 각 발광센서홈(112a)(113a)과 수광센서홈(112b)(113b) 사이에는 발광센서(140a)로부터 조사된 빔(beam)이 수광센서(140b) 측으로 전달되도록 빔 이동공(114)이 형성된다.Each of the transfer parts 112 and 113 is formed with light emitting sensor grooves 112a and 113a and light receiving sensor grooves 112b and 113b on both sides of the guide hole 111, respectively. A light emitting sensor for detecting the presence or absence of a package seated in the grooves 112a, 113a, 112b, and 113b on the upper surface of the walking beam 130 moving along the guide hole 111 on the guide rail 120 ( 140a) and the light receiving sensor 140b are seated and fixed to face each other. At this time, between the light emitting sensor grooves 112a and 113a and the light receiving sensor grooves 112b and 113b, a beam moving from the light emitting sensor 140a is transmitted to the light receiving sensor 140b. 114) is formed.

상기 발광센서(140a) 및 수광센서(140b)는 반도체 싱귤레이션 시스템의 작동을 제어하는 제어수단(도시 생략)에 연결되며, 가이드레일(120)이 상승된 상태에서 발광센서(140a)로부터 조사되는 빔이 가이드홀(111) 상으로 노출된 패키지에 의해 차단되면 정상상태이고, 광이 차단되지 않으면 패키지가 존재하지 않는 것으로 판단하게 된다.The light emitting sensor 140a and the light receiving sensor 140b are connected to control means (not shown) for controlling the operation of the semiconductor singulation system, and are irradiated from the light emitting sensor 140a while the guide rail 120 is raised. If the beam is blocked by the package exposed on the guide hole 111 is normal, and if the light is not blocked it is determined that the package does not exist.

상기 제어수단은 일반적으로 동력원인 구동수단(도시 생략)과, 작동상태의 이상유무를 감지하고 성형작업 및 이송작업이 정상적으로 수행되고 있는가를 판별하는 각종 감지수단(도시 생략), 혹은 급제동을 위한 정지수단 등에 연결되어, 반도체 싱귤레이션 시스템의 전반적인 작동을 제어하는 것으로, 상기 감지센서(140a)(140b)로부터의 입력신호에 의한 제어수단의 판별이 정상인 경우에는 싱귤레이션작업을 정상적으로 수행할 수 있도록 제어신호를 출력하고, 제어수단의 판별이 비정상인 경우에는 구동모터를 직접 제어하거나, 정지수단을 제어하여 구동모터를 급제동시킴으로써, 오작동에 의한 각 장치의 손상을 방지하고, 불량품 발생이 억제되도록 한다.The control means generally includes a driving means (not shown) which is a power source, various sensing means (not shown) for detecting an abnormality of an operating state and determining whether molding and conveying operations are normally performed, or stopping means for rapid braking. And a control signal for controlling the overall operation of the semiconductor singulation system, and when the determination of the control means by the input signal from the detection sensors 140a and 140b is normal, the control signal to perform the singulation operation normally. If the determination of the control means is abnormal, the drive motor is directly controlled or the stop means is controlled to rapidly brake the drive motor, thereby preventing damage to each device due to a malfunction and suppressing occurrence of defective products.

상기 워킹빔(130)은, 도 3에 도시한 바와 같이, 절단장치(200)가 반도체 패키지를 절단할 때, 다이(220)의 일측에 대기하고 있다가 펀치의 펀칭작업이 완료된 후 가이드레일(120)을 따라 이동되어 절단장치(200) 외부로 패키지들을 추출해 내도록 하는 것으로서, 싱귤레이션 시스템의 메인 플레이트(10) 하측에 결합되는 몸체(131)와, 이 몸체(131)의 일측에 일체로 연장 형성되는 제1,2 패키지 안착부(132)(133)로 구성된다. 상기 각각의 안착부(132)(133)에는 공급되는 리드프레임의 컬럼 당 탑재된 패키지의 갯수 및 정렬 간격과 동일하게 안착홈(132a)(133a)이 형성된다.As shown in FIG. 3, when the cutting device 200 cuts the semiconductor package, the walking beam 130 is waiting on one side of the die 220 and then the punching operation of the punch is completed. Moving along 120 to extract the packages out of the cutting device 200, the body 131 is coupled to the lower side of the main plate 10 of the singulation system, and integrally extended to one side of the body 131 The first and second package seating portions 132 and 133 are formed. Each of the seating portions 132 and 133 is provided with mounting grooves 132a and 133a in the same manner as the number of packages mounted per column of the lead frame to be supplied and the alignment interval.

상기 워킹빔(130)은 가이드블록(110)에 형성된 가이드홀(111)에 패키지 안착부(131)가 노출된 상태로 메인플레이트(10)의 하측에 연결 설치된 캠(135) 및 업다운로드(136)의 작동에 의해 수직 운동을 하게 된다.The working beam 130 is connected to the cam 135 installed on the lower side of the main plate 10 in a state in which the package seating portion 131 is exposed in the guide hole 111 formed in the guide block 110 and the up download 136. ), The vertical movement is performed.

미설명부호 (134)는 워킹빔(130)의 수평 운동에 대한 구동력을 제공하기 위한 구동모터이고, (300)은 워킹빔(130) 상면에 안착된 패키지를 소정의 장소로 이송하기 위한 유니트 픽커이다.Reference numeral 134 is a drive motor for providing a driving force for the horizontal motion of the walking beam 130, 300 is a unit picker for transferring a package seated on the upper surface of the working beam 130 to a predetermined place to be.

이와 같이 구성된 본 발명에 의한 가이드레일장치의 작용을 설명하면 다음과 같다.Referring to the operation of the guide rail device according to the present invention configured as described above are as follows.

리드프레임이 공정진행 방향으로 전진하여 다이(220) 상면에 위치되면, 이후 펀치가 하강하여 다이(220)에 놓여진 리드프레임을 절단한 후 절단작업을 반복적으로 수행하기 위하여 원위치로 상승하면 가이드레일(120)이 상승하여 절단된 패키지들이 다음 공정을 수행하기 위하여 전진하게 된다.When the lead frame is advanced in the process progress direction and positioned on the upper surface of the die 220, the punch is then lowered to cut the lead frame placed on the die 220, and then ascends to the original position to repeatedly perform the cutting operation. 120 is raised and the cut packages are advanced to carry out the next process.

그후 펀치가 펀칭을 완료하면, 워킹빔(130)의 제1 패키지 안착부(132)가 절단된 단품 패키지를 가이드블록(110)의 제1이송부(112)까지 이송 및 안착시키고, 그 후에 하방으로 내려가서 다시 Y축 절단다이(223)의 내부로 들어가서 상방으로 움직인다. 이때, 상기 Y축 절단다이(223)에 설치된 워킹빔 커버(도시 생략)가 상기 단품 패키지의 상면을 덮음으로써 펀칭 작업시 패키지의 이탈을 방지해 준다.Then, when the punch completes punching, the single package package in which the first package seating portion 132 of the walking beam 130 is cut is transferred and seated to the first transfer portion 112 of the guide block 110, and then downwards. Go down and enter the inside of the Y-axis cutting die 223 to move upward. At this time, the working beam cover (not shown) installed on the Y-axis cutting die 223 covers the upper surface of the single piece package to prevent the package from being separated during the punching operation.

즉, 펀치가 펀칭을 하기 전에 워킹빔(130)이 금형 속으로 들어가서 상부로 이동하고, 펀치가 펀칭을 완료하면 워킹빔(130)이 다이(220)의 외부로 빠져나와 가이드블록(110)의 제1이송부(112)에 패키지를 안착시키고 나면, 워킹빔(130)이 하향 이동한 후 곧바로 다이(220)로 이송한다. 워킹빔(130)은 이러한 작동 시퀀스를 계속해서 반복하게 된다.That is, before the punch punches, the walking beam 130 enters the mold and moves upward. When the punch completes the punching, the walking beam 130 exits the outside of the die 220 and the After the package is seated on the first transfer part 112, the working beam 130 is moved downward and immediately transferred to the die 220. Working beam 130 will continue to repeat this operating sequence.

다시 절단장치가 펀칭을 완료하여, 워킹빔(130)의 제1 패키지 안착부(132)가 절단된 또다른 단품 패키지를 가이드블록(110)의 제1이송부(112)로 이송시킬 때 이와 동시에 워킹빔(130)의 제2 패키지 안착부(133)가 이전에 제1이송부(112)에 안착되어 있던 단품 패키지를 안착시켜 제2이송부(113)로 이동시키게 된다.Again, the cutting device completes the punching, and at the same time when the single package package in which the first package seating portion 132 of the working beam 130 is cut is transferred to the first transfer portion 112 of the guide block 110, The second package seating part 133 of the beam 130 is mounted on the single package package previously seated on the first transporting part 112 to be moved to the second transporting part 113.

이때, 상기 가이드블록(110)의 제1이송부(112) 및 제2이송부(113) 상면에 수평적으로 대향되게 설치된 발광센서(140a)와 수광센서(140b)로 이루어진 한쌍의 감지센서에 의해 다이(220)에서 절단된 패키지들의 존재 유무를 감지하게 된다.In this case, the die may be formed by a pair of sensing sensors including a light emitting sensor 140a and a light receiving sensor 140b which are horizontally opposed to the upper surfaces of the first transporting unit 112 and the second transporting unit 113 of the guide block 110. At 220, the presence of the cut packages is detected.

즉, 픽커가 절단된 반도체 패키지를 워킹빔(130)의 제1,2 패키지 안착부(132)(133)에 안착시키고 워킹빔(130)이 다이(220)로부터 가이드블록(110) 방향으로 이동하여 가이드블록(110)의 가이드홀(111) 상으로 상승하면, 발광센서(140a)로부터 조사된 빔이 이동하여 가이드홀(111)에 위치된 워킹빔(130)에 안착된 패키지에 부딪히게 된다.That is, the picker cut semiconductor package is mounted on the first and second package seating portions 132 and 133 of the working beam 130 and the working beam 130 moves from the die 220 toward the guide block 110. As a result, ascending onto the guide hole 111 of the guide block 110, the beam irradiated from the light emitting sensor 140a is moved to hit the package seated on the walking beam 130 located in the guide hole 111. .

이때, 워킹빔(130)의 제1,2 패키지 안착부(132)(133)에 패키지가 안착된 경우에는 빔이 타측에 있는 수광센서(140b)에 감지되지 않아 정상적인 배치가 이루어졌다고 판단하게 되고, 반대로 패키지가 안착되지 않은 경우에는 빔이 수광센서(140b)에 감지되므로 가이드레일(120) 상에 패키지가 존재하지 않음을 작업자에게 통보해 줌으로써 작업자로 하여금 신속한 조치를 취할 수 있도록 해 주게 된다.At this time, when the package is seated on the first and second package seating portions 132 and 133 of the walking beam 130, the beam is not detected by the light receiving sensor 140b on the other side, and it is determined that a normal arrangement is made. On the contrary, when the package is not seated, the beam is sensed by the light receiving sensor 140b so that the worker can be notified that the package does not exist on the guide rail 120 so that the worker can take a prompt action.

이상에서 설명한 바와 같이, 본 발명에 의하면 절단장치에 의해 절단된 패키지가 가이드레일 상에 위치한 후 적재장치에 의해 별도의 적재장소로 이송되기 전, 가이드레일 상에 설치된 감지수단에 의해 패키지의 안착 여부를 감지한 후 정렬된 상태로 적재장소로 이송됨으로써 미연에 공정 불량을 방지할 수 있게 된다.As described above, according to the present invention, after the package cut by the cutting device is placed on the guide rail and before being transferred to a separate loading place by the loading device, whether the package is seated by the sensing means installed on the guide rail. After detecting the transfer to the stacking place in the aligned state it is possible to prevent the process failure in advance.

Claims (2)

싱귤레이션 시스템의 절단장치의 일측에 연결 설치되어 절단된 패키지를 배출하기 위한 가이드블록과, 이 가이드블록의 하측에 설치되는 가이드레일과, 이 가이드레일 상으로 직선 이동하도록 설치되는 워킹빔을 포함하여 구성되는 반도체 패키지 싱귤레이션 시스템의 가이드레일장치에 있어서, 상기 가이드블록에는 워킹빔에 안착된 패키지의 정렬 상태를 감지하는 감지수단이 설치되는 것을 특징으로 하는 반도체 패키지 싱귤레이션 시스템의 가이드레일장치.A guide block connected to one side of the cutting device of the singulation system for discharging the cut package, a guide rail installed under the guide block, and a walking beam installed to move linearly on the guide rail. A guide rail device of a semiconductor package singulation system, wherein the guide block is provided with sensing means for sensing an alignment state of a package seated on a walking beam. 제1항에 있어서, 상기 감지수단은 가이드블록의 일측에 형성된 센서홈에 설치되어 빔을 조사하는 발광센서와, 상기 가이드블록의 타측에 형성된 센서홈에 설치되어 조사된 빔을 수광하는 수광센서로 구성된 것을 특징으로 하는 반도체 패키지 싱귤레이션 시스템의 가이드레일장치.According to claim 1, wherein the detection means is a light emitting sensor installed in the sensor groove formed on one side of the guide block to irradiate the beam, and a light receiving sensor installed in the sensor groove formed on the other side of the guide block to receive the beam A guide rail device of a semiconductor package singulation system, characterized in that configured.
KR1020020052385A 2002-09-02 2002-09-02 Guide rail apparatus of semiconductor package singulation system KR20020079650A (en)

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KR100516179B1 (en) * 2002-11-16 2005-09-21 한미반도체 주식회사 Semiconductor manufacturing equipment having driving mean for walking beam

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KR940016662A (en) * 1992-12-12 1994-07-23 김주용 Semiconductor Package Automatic Transfer Device
KR950021448U (en) * 1993-12-29 1995-07-28 Semiconductor chip loading device
KR19980034117A (en) * 1996-11-05 1998-08-05 김광호 Semiconductor Device Detection Method
JP2000077439A (en) * 1998-08-31 2000-03-14 Matsushita Electric Ind Co Ltd Electronic component bonding device
KR20010044643A (en) * 2001-03-13 2001-06-05 박상규 A sigulation system for separating a chip package of semiconductor

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Publication number Priority date Publication date Assignee Title
KR940016662A (en) * 1992-12-12 1994-07-23 김주용 Semiconductor Package Automatic Transfer Device
KR950021448U (en) * 1993-12-29 1995-07-28 Semiconductor chip loading device
KR19980034117A (en) * 1996-11-05 1998-08-05 김광호 Semiconductor Device Detection Method
JP2000077439A (en) * 1998-08-31 2000-03-14 Matsushita Electric Ind Co Ltd Electronic component bonding device
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* Cited by examiner, † Cited by third party
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