KR20020056070A - Epoxy resin composition for sealing semiconductor element - Google Patents

Abstract

PURPOSE: Provided is an epoxy resin composition as high reliability sealant which does not show the crack or interfacial peeling phenomenon even in solder reflow process at 260 deg.C or more. CONSTITUTION: The epoxy resin composition comprises epoxy resin, hardener, hardening stimulator, inorganic filler, fire retardant, colorant, and other additives. The epoxy resin or hardener component is a resin represented by formula 3(wherein R1 represents OH or formula(a), each of R2 and R3 is selected from H, formula(b) and formula(c), provided that both of R2 and R3 is not H, and X and Y are one of O, S, N, and P) only, or a mixture of the resin and at least one selected from the group consisting of ortho cresol novolac epoxy resin, non-phenyl epoxy resin, polyfunctional epoxy resin, naphthalene type epoxy resin, dicyclopentadiene type epoxy resin, novolac phenol resin, xyloc phenol resin, polyfunctional phenol resin, naphthalene type phenol resin and dicyclopentadiene type phenol resin. The resin is used in amount of 10 wt% based on amount of total epoxy resin or hardener.

Description

Epoxy resin composition for sealing semiconductor element

The present invention relates to an epoxy resin composition for semiconductor element encapsulation, and more particularly, to improve adhesion between a lead frame and an epoxy resin composition, including an epoxy resin or a curing agent of a specific structure, and solder reflow (solder). It is related with the epoxy resin composition for semiconductor element sealing which reduces interface peeling after a reflow process and improves the reliability of a package.

In general, manufacturing steps of a semiconductor device may be divided into a pattern design step, a substrate manufacturing step, a component insertion step, a soldering step, a cutting step, and a cleaning step. Since the solder reflow process of the soldering step is rapidly processed with a high temperature lead solution that is 20 ° C. or higher than the temperature of other steps, the reliability of the sealing material of the semiconductor device is particularly required, and this quality is the quality of the final semiconductor device. It becomes a big factor influencing.

According to this trend, high reliability encapsulants that do not cause cracks or interfacial delamination even in solder reflow processes of 260 ° C. or higher have been demanded and developed instead of the conventional semiconductor encapsulants.

For example, although a composition containing an epoxy resin and a phenol noblock type curing agent represented by the following formula (1) and a xylloc type curing agent represented by the following formula (2) are known, these compositions of the prior art are applied. In this case, in the solder reflow process of 260 ° C. or more, cracks are severely generated or the interface peeling phenomenon between the lead frame and the encapsulant is bad.

Here, n is an integer of 0-10.

Here, n is an integer of 0-10.

Accordingly, the present inventors have solved the above-mentioned problems of the prior art, and have studied a composition capable of maintaining high reliability of the encapsulant even after a high temperature solder reflow process. It has been found to be significantly improved, and on the basis of this, the present invention has been completed.

Accordingly, it is an object of the present invention to provide an epoxy resin composition as a highly reliable encapsulant that does not cause cracks or interfacial delamination even in a solder reflow process having a high temperature of 260 ° C. or higher in a semiconductor manufacturing step.

In the epoxy resin composition for semiconductor element encapsulation of the present invention for achieving the above object, in the epoxy resin composition for semiconductor element encapsulation consisting of an epoxy resin, a curing agent, a curing accelerator, an inorganic filler, a flame retardant, a colorant and other additives, the epoxy resin Or a resin represented by the following formula (3) alone or as a curing agent component, ortho cresol noblock type epoxy resin, biphenyl type epoxy resin, polyfunctional type epoxy resin, naphthalene type epoxy resin, dicyclopentadiene type epoxy resin, Noble type phenol resin, xylox phenol resin, polyfunctional phenol resin, naphthalene type phenol resin, and used in combination with one resin selected from the group consisting of a digglopentadiene type phenol resin, the resin represented by the following formula (3) At least 10% by weight of the total epoxy resin or the content of the curing agent Included.

Where R ₁ is OH or ego,

R ₂ and R ₃ are simultaneously H, except

H, or Wherein X and Y are one of O, S, N, P,

n is an integer from 1 to 10.

1 is a device for testing the adhesion of the composition with the frame according to the invention.

* Brief description of the code *

1) epoxy resin composition, 2) copper frame

Hereinafter, the present invention will be described in more detail.

As described above, the epoxy resin composition for semiconductor element encapsulation according to the present invention may be used alone or the resin represented by the formula (3) or ortho cresol noblock type epoxy resin, biphenyl type epoxy resin, polyfunctional epoxy resin, One conventional one selected from the group consisting of naphthalene type epoxy resins, dicyclopentadiene type epoxy resins, noblock type phenol resins, xylock type phenol resins, polyfunctional type phenol resins, naphthalene type phenol resins and disiglopetadiene type phenol resins It is used in combination with a resin, wherein the resin represented by the formula (3) is preferably included in at least 10% by weight of the total content of the epoxy resin or curing agent. When the content of the resin represented by the formula (3) is less than 10% by weight of the total epoxy resin or hardener content, it is impossible to achieve the high reliability aimed by the present invention, more preferably 20% by weight or more is applied.

In Chemical Formula 3, R ₁ is OH or Is,

When R ₁ is OH, this resin is used alone as a curing agent or selected from the group consisting of noblock phenol resins, xylox phenol resins, polyfunctional phenol resins, naphthalene type phenol resins, and dicyclopentadiene type phenol resins. It can be used in combination with one phenol resin, and the content of the resin of formula (3) when R ₁ is OH is at least 10% by weight, preferably at least 20% by weight of the total curing agent content as described above.

In addition, R ₁ is In the case of this resin is used alone as an epoxy resin or from the group consisting of ortho cresol noblock type epoxy resin, biphenyl type epoxy resin, polyfunctional epoxy resin, naphthalene type epoxy resin, and dicyclopentadiene type epoxy resin It can be mixed with one selected epoxy resin and R ₁ is The content of the resin of Formula 3 in the case of is at least 10% by weight, preferably at least 20% by weight of the total epoxy resin content as described above.

On the other hand, except that R ₂ and R ₃ are simultaneously H, H, or X and Y are one of O, S, N, and P, and the adhesion between the unshared electron pair of these elements and the lead frame improves the adhesion to withstand the high temperature solder reflow process.

The epoxy resin composition according to the present invention comprises 5 to 15 wt% epoxy resin, 3 to 15 wt% curing agent, 0.1 to 1.0 wt% curing accelerator, 70 to 90 wt% inorganic filler, colorant within 1.0 wt%, Flame retardants within 2% by weight, and 1 to 5% by weight of other additives.

Examples of the inorganic filler used in the present invention include high purity natural silica, synthetic silica, fused silica, alumina, and the like, and the shape may be applied to both spherical and spherical phases. In order to achieve the desired high reliability in the present invention, it is preferable to apply 70 to 90% by weight, more preferably 80 to 90% by weight.

In addition, in the present invention, other additives such as colorants, flame retardants, curing accelerators and release agents, coupling agents, and modifiers generally applied can be used.

The epoxy resin composition for encapsulating a semiconductor device according to the present invention is mixed with each raw material by melting and mixing at a temperature of 100 ℃ to 130 ℃ using a melt mixer (Kneader) to cool to room temperature and pulverized to a powder state blending process Can be prepared by a general manufacturing method through.

Hereinafter, the present invention will be described in more detail, but the scope of the present invention is not limited thereto.

Examples 1 to 3

Ortho-cresol noblock type epoxy resin represented by the following formula (4) (epoxy equivalent = 199 g / eq) and the curing agent represented by the formula (5) (hydroxyl equivalent = 145 g / eq), the resin of the formula (hydroxyl equivalent = 107 g / eq) and the resin of Formula 2 (hydroxyl equivalent = 175 g / eq) were weighed in the composition ratio of Table 1 below, mixed with the other ingredients, followed by melt mixing, cooling, grinding, and blending to a certain size. It was compressed into to prepare an epoxy resin composition.

Where n is an integer of 1 to 10.

Where n is an integer of 1 to 10.

By using the epoxy resin composition thus prepared, a specimen for measuring the adhesive force was manufactured in a heat transfer molding machine (pressure = 70㎏ / ㎠, temperature = 175 ° C, curing time = 120 seconds) and then subjected to constant temperature and humidity (85 ° C / 85% RH) conditions. Adhesion was measured before and after the absorption at, and molded in an MQFP package (body size: 28 mm x 28 mm, 208 leads) with SiN chip, followed by post-curing at 175 ℃ for 6 hours, constant temperature and humidity (85 ℃ / 85% RH) and then subjected to three consecutive IR-reflow (maximum temperature 260 ℃), and then measured the interface peeling phenomenon between the lead frame and the encapsulant using an ultrasonic flaw detector (SAT) Table 1 Shown in

Comparative Examples 1 to 3

Ortho-cresol noblock type epoxy resin represented by the formula (4) (epoxy equivalent = 199 g / eq), the curing agent represented by the formula (1) (hydroxyl equivalent = 107 g / eq), and the resin of the formula (2 (hydroxyl equivalent = 175 g) / eq) was carried out in the same manner as in Examples 1 to 3 except that the composition was weighed according to the composition ratio shown in Table 1 below.

division unit Slashing Example 1 Example 2 Example 3 Comparative Example 1 Comparative Example 2 Comparative Example 3 Formula 1 weight% 2 4 2 Formula 2 weight% 2 4 2 Formula 4 weight% 8 8 8 8 8 8 Formula 5 weight% 4 2 2 Bromine epoxy weight% One One One One One One Silica weight% 84 84 84 84 84 84 additive weight% 2.8 2.8 2.8 2.8 2.8 2.8 Curing accelerator weight% 0.2 0.2 0.2 0.2 0.2 0.2 Property evaluation result Adhesion (Before Hygroscopic) MPa 4.3 3.9 3.8 2.8 3.0 2.9 Adhesion (after moisture absorption) MPa 4.1 3.6 3.5 2.6 2.8 2.7 Package peeling off (the upper part of the pede) % 10 13 12 20 22 21 Package peeling off (the lower part of the fed) % 0 0 0 35 31 33

Examples 4-5

Ortho-cresol noblock type epoxy resin represented by the formula (4) (epoxy equivalent = 199 g / eq) and the epoxy resin represented by the following formula (6) (epoxy equivalent = 175 g / eq), the resin of the formula (hydroxyl equivalent = 107 g / eq) of the curing agent was weighed in the composition ratio of Table 2 and mixed with the other constituent raw materials, and then subjected to melt mixing, cooling, grinding, blending process and compressed to a certain size to prepare an epoxy resin composition.

Where n is an integer of 1 to 10.

By using the epoxy resin composition thus prepared, a specimen for measuring the adhesive force was manufactured in a heat transfer molding machine (pressure = 70㎏ / ㎠, temperature = 175 ° C, curing time = 120 seconds) and then subjected to constant temperature and humidity (85 ° C / 85% RH) conditions. Adhesion was measured before and after the absorption at, and molded in an MQFP package (body size: 28 mm x 28 mm, 208 leads) with SiN chip, followed by post-curing at 175 ℃ for 6 hours, constant temperature and humidity (85 ℃ / 85% RH) and then subjected to three consecutive applications of IR-reflow (maximum temperature 260 ℃), and then measured the interface peel between the lead frame and the encapsulant using an ultrasonic flaw detector (SAT) Table 2 Shown in

Comparative Example 4

Except that the ortho-cresol noblock type epoxy resin represented by the formula (4) (epoxy equivalent = 199 g / eq) and the curing agent of the resin of the formula (1 (hydroxyl equivalent = 107 g / eq)) was measured in the composition ratio of Table 2 below Was carried out in the same manner as in Examples 4 to 5.

division unit Example 4 Example 5 Comparative Example 4 Formula 1 weight% 4 4 4 Formula 4 weight% 4 8 Formula 6 weight% 8 4 Bromine epoxy weight% One One One Silica weight% 84 84 84 additive weight% 2.8 2.8 2.8 Curing accelerator weight% 0.2 0.2 0.2 Property evaluation result Adhesion (Before Hygroscopic) MPa 4.2 3.9 2.7 Adhesion (after moisture absorption) MPa 4.0 3.7 2.5 Package Peeling (Upper Pad) % 11 14 22 Package peeling (lower pad) % 0 0 34

The measuring method of each physical property is as follows.

※ Measurement of adhesion

In order to produce a specimen of the form as shown in Figure 1 using a copper frame and a mold in a heat transfer molding machine (pressure = 70kg / ㎠, temperature = 175 ℃, curing time = 120 seconds) after molding for 6 hours in an oven at 175 ℃ After curing for a period of 48 hours at 85 ° C./85% RH, and then subjected to a tensile force in the direction of the arrow of FIG. 1 with a UTM (Universal Testing Machine) to remove the load when the copper frame fell from the epoxy resin composition. It measures and converts into adhesive force value (MPa).

※ Package Peeling Measurement

Molded in a heat transfer molding machine (pressure = 70㎏ / ㎠, temperature = 175 ℃, curing time = 120 seconds) using an MQFP package (body size: 28 mm × 28 mm, 208 lead) mold with SiN chip attached After curing for 6 hours at 175 ° C. for 48 hours at constant temperature and humidity (85 ° C./85% RH), and applying IR-reflow (maximum temperature = 260 ° C.) three times in succession, ultrasonic flaw detector ( SAT) is used to determine the peel rate (%) of the package pad portion, that is, the interface between the encapsulant and the pad top and the surface of the SiN chip, and the interfacial peel rate (%) between the encapsulant and the lead frame below the pad, respectively. Measure the average value to get the average value.

As can be seen from the above examples and comparative examples, when encapsulating a semiconductor device with the epoxy resin composition according to the present invention, the adhesion between the lead frame and the epoxy resin composition is improved, and even after the solder reflow process, the interface peeling is performed. It can be seen that the reliability of the package is improved by decreasing.

Claims (2)

In the epoxy resin composition for encapsulating a semiconductor device consisting of an epoxy resin, a curing agent, a curing accelerator, an inorganic filler, a flame retardant, a coloring agent and other additives, the resin represented by the following formula (3) is used alone or as the epoxy resin or curing agent component, or Ortho cresol noblock type epoxy resin, biphenyl type epoxy resin, polyfunctional type epoxy resin, naphthalene type epoxy resin, dicyclopentadiene type epoxy resin, noblock type phenol resin, xylock type phenol resin, polyfunctional type phenol resin, naphthalene type phenol It is used by mixing with one resin selected from the group consisting of a resin and a diglogloadiene type phenol resin, characterized in that the resin represented by the following formula (3) is used in at least 10% by weight of the total amount of the epoxy resin or the curing agent Epoxy resin composition for sealing semiconductor elements: <Formula 3> Where R ₁ is OH or ego, R ₂ and R ₃ are simultaneously H, except H, or Wherein X and Y are one of O, S, N, P, n is an integer from 1 to 10. The method of claim 1, wherein the epoxy resin composition for sealing the semiconductor device is 5 to 15% by weight of epoxy resin, 3 to 15% by weight of the curing agent, 0.1 to 1.0% by weight of the curing accelerator, 70 to 90% by weight of the inorganic filler, An epoxy resin composition for encapsulating a semiconductor device, comprising a coloring agent within 1.0% by weight, a flame retardant within 2% by weight, and other additives in an amount of 1 to 5% by weight.