KR200161672Y1 - Socket opening and closing apparatus for device testing - Google Patents
Socket opening and closing apparatus for device testing Download PDFInfo
- Publication number
- KR200161672Y1 KR200161672Y1 KR2019940004974U KR19940004974U KR200161672Y1 KR 200161672 Y1 KR200161672 Y1 KR 200161672Y1 KR 2019940004974 U KR2019940004974 U KR 2019940004974U KR 19940004974 U KR19940004974 U KR 19940004974U KR 200161672 Y1 KR200161672 Y1 KR 200161672Y1
- Authority
- KR
- South Korea
- Prior art keywords
- socket
- cover
- cylinder
- burn
- open
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
본 고안은 디바이스를 테스트하는 소켓의 커버를 개폐작업을 자동으로 하여 작업시간의 단축은 물론 작업자의 피로감을 줄일수 있도록 한것이다.The present invention is to automatically open and close the cover of the socket for testing the device to shorten the working time and reduce the fatigue of the operator.
이를위해 본 고안은 베이스(1)의 양측에 설치되며 발광센서(2) 및 수광센서(2a)가 포함된 실린더(3)와, 상기 실린더에 의해서 상하로 이송되며 저면에는 소켓(6)의 커버를 개폐시키는 지그(8)가 고정된 플레이트(5)로 구성하여서 된것이다.To this end, the present invention is installed on both sides of the base (1) and the cylinder (3) including the light emitting sensor (2) and the light receiving sensor (2a), and is transported up and down by the cylinder, the bottom of the cover of the socket (6) It consists of the plate 5 fixed to the jig 8 to open and close.
Description
제1도는 종래 번인로드의 평면도.1 is a plan view of a conventional burn-in rod.
제2도는 종래 소켓의 측면도로서,2 is a side view of a conventional socket,
제2a도는 소켓이 개방된 상태도.Figure 2a is a state in which the socket is open.
제2b도는 소켓이 폐쇄된 상태도.Figure 2b is a state in which the socket is closed.
제3도는 본 고안에 의한 번인보드의 평면도.3 is a plan view of the burn-in board according to the present invention.
제4도는 제3도의 A-A선 단면도.4 is a cross-sectional view taken along the line A-A of FIG.
제5도는 본 고안에 의한 작용도로서,5 is a functional diagram according to the present invention,
제5a도는 소켓을 폐쇄시키는 상태도.5a is a state in which the socket is closed.
제5b도는 소켓을 개방시키는 상태도.Figure 5b is a state opening the socket.
* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings
1 : 베이스 2 : 발광센서1 Base 2 Light emitting sensor
2a : 수광센서 3 : 실린더2a: light receiving sensor 3: cylinder
5 : 플레이트 6 : 소켓5: plate 6: socket
7 : 커버 8 : 지그7: cover 8: jig
본 고안은 디바이스 테스트용 소켓 개폐 장치에 관한것으로서, 더욱 상세하게는 디바이스를 테스트하는 소켓의 커버를 자동으로 개폐시키기 위한 것이다.The present invention relates to a socket opening and closing device for a device test, and more particularly to automatically open and close the cover of the socket for testing the device.
종래에는 제1도 및 제2도에 도시한 바와같이 베이스(1)에 이동가능하게 번인보드(10)가 설치되어 있고 상기 번인보드(10)의 상면에는 디바이스(9)를 테스트하기 위한 소켓(6)이 삽입되어 있다.Conventionally, as illustrated in FIGS. 1 and 2, a burn-in board 10 is installed on a base 1 so as to be movable, and an upper surface of the burn-in board 10 is provided with a socket for testing the device 9 ( 6) is inserted.
상기 소켓(6)의 상부에는 커버(7)가 핀(6b)을 중심으로 회동가능하게 설치되어 있고 상기 커버(7)의 일측에는 잠금레버(12)가 설치되어 구성된다.The cover 7 is rotatably installed around the pin 6b at an upper portion of the socket 6, and a locking lever 12 is installed at one side of the cover 7.
따라서 종래에는 디바이스(9)를 테스트 하기 위해서는 제2a도와 같이 커버가 열린 소켓(6)에 디바이스(9)를 삽입하고 상기 커버를 화살표 방향으로 회동시키면 커버의 일측에 설치된 잠금레버(12)끝단의 잠금편(12a)이 소켓(6)에 형성된 잠금홈(6a)으로 삽입되어 커버(7)가 닫히게 되므로 상기 소켓(6)에 삽입된 디바이스(9)가 고정된다.Therefore, in order to test the device 9, the device 9 is inserted into the open socket 6 of the cover as shown in FIG. 2a, and the cover 9 is rotated in the direction of the arrow. Since the locking piece 12a is inserted into the locking groove 6a formed in the socket 6 and the cover 7 is closed, the device 9 inserted in the socket 6 is fixed.
상기와 같이 디바이스(9)를 소켓(6)에 전부 삽입완료하고 나면 번인보드를 번인테스터로 이송하여 소켓에 삽입된 디바이스의 번인 테스트를 하게 된다.After the device 9 is completely inserted into the socket 6 as described above, the burn-in board is transferred to the burn-in tester to perform a burn-in test of the device inserted into the socket.
그후 테스트가 완료된 디바이스(9)를 소켓(6)에서 꺼내기 위해서는 작업자가 손으로 잠금레버(12)의 일측을 눌러 잠금편(12a)을 잠금홈(6a)으로부터 이탈시킨 후 커버(7)를 회동시켜 디바이스(9)를 소켓(6)에서 인출시키게 된다.Then, in order to take out the tested device 9 from the socket 6, the worker presses one side of the locking lever 12 by hand to release the locking piece 12a from the locking groove 6a, and then rotates the cover 7. The device 9 is withdrawn from the socket 6.
그러나 이러한 종래의 장치는 소켓(6)의 커버(7)를 개폐시키기 위해서는 작업자가 수작업으로 소켓(6)의 커버를 하나씩 열고 닫아야 하므로 작업시간이 많이 소요되는 문제점이 있었다.However, such a conventional apparatus has a problem in that a long time is required for the operator to open and close the cover of the socket 6 one by one in order to open and close the cover 7 of the socket 6.
본 고안은 상기한 문제점을 해결하기 위해 안출한것으로서, 실린더를 이용하여 소켓의 커버를 동시에 개폐시키도록 하므로 작업시간을 단축할 수 있는 디바이스 테스터용 소켓 개폐장치를 제공하는데 그 목적이 있다.The present invention has been made to solve the above problems, it is to provide a socket opening and closing device for a device tester that can shorten the working time to open and close the cover of the socket at the same time using a cylinder.
상기한 목적을 달성하기 위한 본 고안의 형태에 따르면, 베이스의 양측에 설치되며 발광센서 또는 수광센서가 포함된 실린더와, 상기 실린더에 의해서 상하로 이송되며 저면에는 소켓의 커버를 개폐시키는 복수개의 지그가 고정된 플레이트로 구성된 디바이스 테스트용 소켓 개폐장치가 제공된다.According to an aspect of the present invention for achieving the above object, a cylinder which is provided on both sides of the base and includes a light emitting sensor or a light receiving sensor, and a plurality of jigs for moving up and down by the cylinder and opening and closing the cover of the socket on the bottom There is provided a socket opening and closing device for a device test, which consists of a plate to which is fixed.
이하, 본 고안을 일실시예로 도시한 첨부도면 제3도 내지 제5도를 참조하여 상세히 설명하면 다음과 같다.Hereinafter, with reference to Figures 3 to 5 of the accompanying drawings showing an embodiment of the present invention in detail as follows.
제3도는 본 고안에 의한 번인보드의 평면도이고, 제4도는 제3도의 A-A선 단면도이며, 제5도는 본 고안에 의한 작용도로서, 본 고안은 베이스(1)의 양측에 발광센서(2)와 수광센서(2a)가 각각 포함된 실린더(3)가 설치되어 있고 상기 실린더의 로드(4)에는 플레이트(5)가 고정되어 있으며 상기 플레이트(5)의 저면에는 소켓(6)의 커버(7)를 개폐시키기 위한 지그(8)가 복수개 고정되어 구성된다.3 is a plan view of the burn-in board according to the present invention, FIG. 4 is a cross-sectional view taken along line AA of FIG. 3, and FIG. And a cylinder 3 including a light receiving sensor 2a, respectively, and a plate 5 is fixed to the rod 4 of the cylinder, and a cover 7 of the socket 6 on the bottom of the plate 5. A plurality of jigs 8 for opening and closing the) are fixed and configured.
상기와 같이 구성된 본 고안은 디바이스(9)를 테스트 하기 위해서는 소켓(6)에 디바이스(9)를 삽입하고 번인보드(10)의 하부에 설치된 볼스크류(11)를 회전시켜 커버(7)의 잠금레버(12)가 제5a도와 같이 지그(8)의 하부에 위치시킨다.According to the present invention configured as described above, in order to test the device 9, the device 9 is inserted into the socket 6, and the ball screw 11 installed at the bottom of the burn-in board 10 is rotated to lock the cover 7. The lever 12 is positioned below the jig 8 as shown in FIG. 5A.
이러한 상태에서 실린더(3)의 일측에 설치된 발광센서(2) 및 수광센서(2a)에 의해 커버(7)가 열려있는 것이 감지되면 실린더(3)가 작동하여 플레이트를 하강시키게 되므로 플레이트(5)에 고정된 복수개의 지그(8)가 동시에 하부로 이송하면서 잠금레버(12)의 외측을 눌러주게 되어 잠금레버(12)의 잠금편(12a)이 소켓(6)의 잠금홈(6a)에 삽입된다.In this state, when the cover 7 is detected to be open by the light emitting sensor 2 and the light receiving sensor 2a installed on one side of the cylinder 3, the cylinder 3 is operated to lower the plate, so that the plate 5 The plurality of jigs 8 fixed to the bottom are simultaneously transferred to the lower side and press the outside of the locking lever 12 so that the locking piece 12a of the locking lever 12 is inserted into the locking groove 6a of the socket 6. do.
상기과 같이 커버(7)가 닫히게 되면 디바이스(9)를 테스트 할 수 있게 되므로 번인보드(10)는 또다른 소켓(6)의 커버(7)를 닫을수 있도록 일정거리 이동되어 상기와 같은 방법으로 번인보드(10)상부의 소켓(6)을 모두 닫아주게 된다.When the cover 7 is closed as described above, since the device 9 can be tested, the burn-in board 10 is moved a predetermined distance to close the cover 7 of another socket 6 and burn-in in the same manner as described above. All the sockets 6 on the board 10 are closed.
또한, 상기와 같이하여 디바이스의 번인테스트가 완료된후 소켓(6)에서 디바이스(9)를 꺼내기 위해 커버(7)를 열고자 할때는 제5b도와 같이 지그(8)의 하부에 소켓(6)이 위치된 상태에서 실린더(3)를 작동시켜 플레이트(5)에 설치된 지그(8)를 하방으로 이송시키게 되므로 상기 지그가 잠금레버(12)의 외측을 눌러 소켓(6)의 커버(7)를 열게 된다.In addition, when the cover 7 is to be opened to remove the device 9 from the socket 6 after the burn-in test of the device is completed as described above, the socket 6 is positioned under the jig 8 as shown in FIG. In this state, the cylinder 3 is operated to transfer the jig 8 installed in the plate 5 downward, so that the jig presses the outer side of the locking lever 12 to open the cover 7 of the socket 6. .
상기와 같이 소켓(6)의 커버가 열리면 번인보드(10)는 일정거리 이송되어 상기와 같은 동작으로 또다른 소켓(6)의 커버(7)를 열게 된다.When the cover of the socket 6 is opened as described above, the burn-in board 10 is transported a predetermined distance to open the cover 7 of another socket 6 in the same operation as described above.
이상에서와 같이 본 고안은 번인보드(10)상부에 삽입된 소켓(6)의 커버(7)를 개폐시 여러개를 한번에 개폐함은 물론 실린더의 작동으로 작업이 이루어지므로써 작업시간의 단축은 물론 작업자의 피로감을 줄여줄수 있는 매우 유용한 고안이다.As described above, the present invention opens and closes several at a time when opening and closing the cover 7 of the socket 6 inserted into the burn-in board 10, as well as shortening the working time by the operation of the cylinder. It is a very useful design that can reduce worker's fatigue.
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2019940004974U KR200161672Y1 (en) | 1994-03-11 | 1994-03-11 | Socket opening and closing apparatus for device testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2019940004974U KR200161672Y1 (en) | 1994-03-11 | 1994-03-11 | Socket opening and closing apparatus for device testing |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR950028680U KR950028680U (en) | 1995-10-20 |
| KR200161672Y1 true KR200161672Y1 (en) | 1999-12-01 |
Family
ID=19378823
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR2019940004974U KR200161672Y1 (en) | 1994-03-11 | 1994-03-11 | Socket opening and closing apparatus for device testing |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR200161672Y1 (en) |
-
1994
- 1994-03-11 KR KR2019940004974U patent/KR200161672Y1/en not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR950028680U (en) | 1995-10-20 |
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